JP3912345B2 - 質量分析装置 - Google Patents
質量分析装置 Download PDFInfo
- Publication number
- JP3912345B2 JP3912345B2 JP2003300707A JP2003300707A JP3912345B2 JP 3912345 B2 JP3912345 B2 JP 3912345B2 JP 2003300707 A JP2003300707 A JP 2003300707A JP 2003300707 A JP2003300707 A JP 2003300707A JP 3912345 B2 JP3912345 B2 JP 3912345B2
- Authority
- JP
- Japan
- Prior art keywords
- ions
- ion trap
- ion
- mass
- electric field
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 150000002500 ions Chemical class 0.000 claims description 109
- 238000005040 ion trap Methods 0.000 claims description 49
- 230000005684 electric field Effects 0.000 claims description 25
- 230000008859 change Effects 0.000 claims description 3
- 101100204059 Caenorhabditis elegans trap-2 gene Proteins 0.000 description 20
- 238000009792 diffusion process Methods 0.000 description 9
- 238000010586 diagram Methods 0.000 description 7
- 238000007599 discharging Methods 0.000 description 3
- 238000004949 mass spectrometry Methods 0.000 description 3
- 238000004458 analytical method Methods 0.000 description 2
- 238000001819 mass spectrum Methods 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000003111 delayed effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000010494 dissociation reaction Methods 0.000 description 1
- 230000005593 dissociations Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 238000000752 ionisation method Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 238000004451 qualitative analysis Methods 0.000 description 1
- 238000004445 quantitative analysis Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 238000012916 structural analysis Methods 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
- H01J49/424—Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/40—Time-of-flight spectrometers
Description
a)イオントラップを構成する電極に所定の電圧を印加する電圧印加手段と、
b)イオントラップの内部に形成された捕捉用電場によってイオンが該イオントラップ内部で収束する方向の又は収束した運動状態にあるときに該イオンがイオントラップから外側に排出されるように、そのイオンの極性に応じて捕捉用電場から排出用電場への切り替えのタイミングを変えるべく前記電圧印加手段を制御する制御手段と、
を備えることを特徴としている。
2…イオントラップ
21…リング電極
22、23…エンドキャップ電極
24…イオン捕捉空間
24a…収束領域
24b…拡散領域
25…イオン入射孔
26…イオン出射孔
27…電圧発生部
3…TOFMS
4…制御部
Claims (1)
- イオンを蓄積するためのイオントラップと、該イオントラップから排出されたイオンの質量数を分析する質量分析器とから成る質量分析装置において、
a)イオントラップを構成する電極に所定の電圧を印加する電圧印加手段と、
b)イオントラップの内部に形成された捕捉用電場によってイオンが該イオントラップ内部で収束する方向の又は収束した運動状態にあるときに該イオンがイオントラップから外側に排出されるように、そのイオンの極性に応じて捕捉用電場から排出用電場への切り替えのタイミングを変えるべく前記電圧印加手段を制御する制御手段と、
を備えることを特徴とする質量分析装置。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003300707A JP3912345B2 (ja) | 2003-08-26 | 2003-08-26 | 質量分析装置 |
US10/923,822 US7250600B2 (en) | 2003-08-26 | 2004-08-24 | Mass spectrometer with an ion trap |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003300707A JP3912345B2 (ja) | 2003-08-26 | 2003-08-26 | 質量分析装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2005071826A JP2005071826A (ja) | 2005-03-17 |
JP3912345B2 true JP3912345B2 (ja) | 2007-05-09 |
Family
ID=34213843
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2003300707A Expired - Lifetime JP3912345B2 (ja) | 2003-08-26 | 2003-08-26 | 質量分析装置 |
Country Status (2)
Country | Link |
---|---|
US (1) | US7250600B2 (ja) |
JP (1) | JP3912345B2 (ja) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4848657B2 (ja) * | 2005-03-28 | 2011-12-28 | 株式会社島津製作所 | Ms/ms型質量分析装置 |
US8334506B2 (en) | 2007-12-10 | 2012-12-18 | 1St Detect Corporation | End cap voltage control of ion traps |
US9103783B2 (en) * | 2008-03-17 | 2015-08-11 | Shimadzu Corporation | Ionization method and apparatus including applying converged shock waves to a spray |
JP5251232B2 (ja) * | 2008-04-25 | 2013-07-31 | 株式会社島津製作所 | 質量分析データ処理方法及び質量分析装置 |
US7973277B2 (en) | 2008-05-27 | 2011-07-05 | 1St Detect Corporation | Driving a mass spectrometer ion trap or mass filter |
GB201409074D0 (en) | 2014-05-21 | 2014-07-02 | Thermo Fisher Scient Bremen | Ion ejection from a quadrupole ion trap |
US11348778B2 (en) * | 2015-11-02 | 2022-05-31 | Purdue Research Foundation | Precursor and neutral loss scan in an ion trap |
CN112099004B (zh) * | 2019-09-05 | 2022-03-08 | 北京无线电测量研究所 | 一种机载干涉合成孔径雷达复杂场景高程反演方法及系统 |
GB202114780D0 (en) | 2021-10-15 | 2021-12-01 | Thermo Fisher Scient Bremen Gmbh | Ion transport between ion optical devices at different gas pressures |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3688215T3 (de) * | 1985-05-24 | 2005-08-25 | Thermo Finnigan Llc, San Jose | Steuerungsverfahren für eine Ionenfalle. |
US5381006A (en) * | 1992-05-29 | 1995-01-10 | Varian Associates, Inc. | Methods of using ion trap mass spectrometers |
GB2267385B (en) * | 1992-05-29 | 1995-12-13 | Finnigan Corp | Method of detecting the ions in an ion trap mass spectrometer |
JP3509267B2 (ja) * | 1995-04-03 | 2004-03-22 | 株式会社日立製作所 | イオントラップ質量分析方法および装置 |
US5783824A (en) * | 1995-04-03 | 1998-07-21 | Hitachi, Ltd. | Ion trapping mass spectrometry apparatus |
EP0871201B1 (en) * | 1995-07-03 | 2010-09-15 | Hitachi, Ltd. | Mass spectrometer |
US5714755A (en) * | 1996-03-01 | 1998-02-03 | Varian Associates, Inc. | Mass scanning method using an ion trap mass spectrometer |
JP3617662B2 (ja) * | 1997-02-28 | 2005-02-09 | 株式会社島津製作所 | 質量分析装置 |
GB9802112D0 (en) * | 1998-01-30 | 1998-04-01 | Shimadzu Res Lab Europe Ltd | Method of trapping ions in an ion trapping device |
US6124592A (en) * | 1998-03-18 | 2000-09-26 | Technispan Llc | Ion mobility storage trap and method |
JP2001351571A (ja) * | 2000-06-07 | 2001-12-21 | Hitachi Ltd | イオントラップ型質量分析方法及び質量分析装置 |
JP3690330B2 (ja) * | 2001-10-16 | 2005-08-31 | 株式会社島津製作所 | イオントラップ装置 |
JP3971958B2 (ja) * | 2002-05-28 | 2007-09-05 | 株式会社日立ハイテクノロジーズ | 質量分析装置 |
JP3752470B2 (ja) * | 2002-05-30 | 2006-03-08 | 株式会社日立ハイテクノロジーズ | 質量分析装置 |
-
2003
- 2003-08-26 JP JP2003300707A patent/JP3912345B2/ja not_active Expired - Lifetime
-
2004
- 2004-08-24 US US10/923,822 patent/US7250600B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
US7250600B2 (en) | 2007-07-31 |
JP2005071826A (ja) | 2005-03-17 |
US20050045816A1 (en) | 2005-03-03 |
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