JP2006511912A - 複数の飛行経路を有する飛行時間型質量分析器 - Google Patents

複数の飛行経路を有する飛行時間型質量分析器 Download PDF

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Publication number
JP2006511912A
JP2006511912A JP2004563709A JP2004563709A JP2006511912A JP 2006511912 A JP2006511912 A JP 2006511912A JP 2004563709 A JP2004563709 A JP 2004563709A JP 2004563709 A JP2004563709 A JP 2004563709A JP 2006511912 A JP2006511912 A JP 2006511912A
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ion
tof mass
mass
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JP2006511912A5 (enExample
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マービン エル． ベスタル，
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Applied Biosystems LLC
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PerSeptive Biosystems Inc
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/025—Detectors specially adapted to particle spectrometers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/061—Ion deflecting means, e.g. ion gates

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2004563709A 2002-12-20 2003-12-17 複数の飛行経路を有する飛行時間型質量分析器 Pending JP2006511912A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/327,471 US6933497B2 (en) 2002-12-20 2002-12-20 Time-of-flight mass analyzer with multiple flight paths
PCT/US2003/040276 WO2004059693A2 (en) 2002-12-20 2003-12-17 Time-of-flight mass analyzer with multiple flight paths

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JP2006511912A true JP2006511912A (ja) 2006-04-06
JP2006511912A5 JP2006511912A5 (enExample) 2010-02-12

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JP2004563709A Pending JP2006511912A (ja) 2002-12-20 2003-12-17 複数の飛行経路を有する飛行時間型質量分析器

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US (1) US6933497B2 (enExample)
EP (1) EP1584099A2 (enExample)
JP (1) JP2006511912A (enExample)
WO (1) WO2004059693A2 (enExample)

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WO2007138679A1 (ja) * 2006-05-30 2007-12-06 Shimadzu Corporation 質量分析装置
JP2008282571A (ja) * 2007-05-08 2008-11-20 Shimadzu Corp 飛行時間型質量分析計
WO2009081444A1 (ja) * 2007-12-20 2009-07-02 Shimadzu Corporation 質量分析装置
JP2013532886A (ja) * 2010-07-30 2013-08-19 イオン−トフ テクノロジーズ ゲーエムベーハー イオン又は後にイオン化される中性粒子を試料から検出する方法、質量分析計、及びその使用
JP2018511052A (ja) * 2015-03-25 2018-04-19 トフヴェルク アクチエンゲゼルシャフトＴｏｆｗｅｒｋ Ａｇ マススペクトロメトリーのための装置および方法
JP2023527044A (ja) * 2020-05-27 2023-06-26 スミスズ ディテクション－ワトフォード リミテッド イオンシャッタ、イオンシャッタのコントロール方法、及び検知方法及び装置
JP2023184506A (ja) * 2022-06-17 2023-12-28 サーモ フィッシャー サイエンティフィック （ブレーメン） ゲーエムベーハー 標識された分析物分子の飛行時間型質量分析

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US7564028B2 (en) * 2007-05-01 2009-07-21 Virgin Instruments Corporation Vacuum housing system for MALDI-TOF mass spectrometry
US7667195B2 (en) * 2007-05-01 2010-02-23 Virgin Instruments Corporation High performance low cost MALDI MS-MS
US7564026B2 (en) * 2007-05-01 2009-07-21 Virgin Instruments Corporation Linear TOF geometry for high sensitivity at high mass
US7663100B2 (en) * 2007-05-01 2010-02-16 Virgin Instruments Corporation Reversed geometry MALDI TOF
US7838824B2 (en) * 2007-05-01 2010-11-23 Virgin Instruments Corporation TOF-TOF with high resolution precursor selection and multiplexed MS-MS
DE102007049640B3 (de) * 2007-10-17 2009-04-02 Bruker Daltonik Gmbh Messung von Tochterionenspektren aus einer MALDI-Ionisierung
JP5072682B2 (ja) * 2008-03-28 2012-11-14 富士フイルム株式会社 質量分析用デバイス、これを用いる質量分析装置および質量分析方法
GB2467548B (en) * 2009-02-04 2013-02-27 Nu Instr Ltd Detection arrangements in mass spectrometers
US8847155B2 (en) 2009-08-27 2014-09-30 Virgin Instruments Corporation Tandem time-of-flight mass spectrometry with simultaneous space and velocity focusing
WO2011127091A1 (en) 2010-04-05 2011-10-13 Indiana University Research And Technology Corporation Method for enhancement of mass resolution over a limited mass range for time-of-flight spectrometry
WO2011140040A1 (en) * 2010-05-04 2011-11-10 Indiana University Research And Technology Corporation Combined distance-of-flight and time-of-flight mass spectrometer
DE102011004725A1 (de) 2011-02-25 2012-08-30 Helmholtz-Zentrum Potsdam Deutsches GeoForschungsZentrum - GFZ Stiftung des Öffentlichen Rechts des Landes Brandenburg Verfahren und Vorrichtung zur Erhöhung des Durchsatzes bei Flugzeitmassenspektrometern
WO2013134165A1 (en) * 2012-03-08 2013-09-12 Virgin Instruments Corporation Tandem time-of-flight mass spectrometry with simultaneous space and velocity focusing
WO2013171501A2 (en) * 2012-05-18 2013-11-21 Micromass Uk Limited Orthogonal acceleration coaxial cylinder time of flight mass analyser
US20160148793A1 (en) * 2013-01-03 2016-05-26 Asta Co., Ltd. Method for obtaining mass spectrum of ions generated at constant temperature by measuring total ion count, and use of matrix for quantitative analysis using maldi mass spectrometry
US8735810B1 (en) 2013-03-15 2014-05-27 Virgin Instruments Corporation Time-of-flight mass spectrometer with ion source and ion detector electrically connected
US9543138B2 (en) 2013-08-19 2017-01-10 Virgin Instruments Corporation Ion optical system for MALDI-TOF mass spectrometer
US9870911B2 (en) * 2013-12-23 2018-01-16 Dh Technologies Development Pte. Ltd. Method and apparatus for processing ions
JP6437002B2 (ja) * 2013-12-24 2018-12-12 ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド 高速極性スイッチ飛行時間型質量分析計
DE102014104451B4 (de) * 2014-03-28 2018-11-15 Krohne Messtechnik Gmbh Massenspektrometer
WO2015150808A1 (en) 2014-04-01 2015-10-08 Micromass Uk Limited Orthogonal acceleration coaxial cylinder mass analyser
GB2535754A (en) * 2015-02-26 2016-08-31 Nu Instr Ltd Mass spectrometers
GB201507363D0 (en) 2015-04-30 2015-06-17 Micromass Uk Ltd And Leco Corp Multi-reflecting TOF mass spectrometer
GB2541383B (en) * 2015-08-14 2018-12-12 Thermo Fisher Scient Bremen Gmbh Mirror lens for directing an ion beam
GB201520130D0 (en) 2015-11-16 2015-12-30 Micromass Uk Ltd And Leco Corp Imaging mass spectrometer
GB201520134D0 (en) 2015-11-16 2015-12-30 Micromass Uk Ltd And Leco Corp Imaging mass spectrometer
GB201520540D0 (en) 2015-11-23 2016-01-06 Micromass Uk Ltd And Leco Corp Improved ion mirror and ion-optical lens for imaging
GB201613988D0 (en) 2016-08-16 2016-09-28 Micromass Uk Ltd And Leco Corp Mass analyser having extended flight path
KR102258865B1 (ko) * 2016-08-22 2021-05-31 하이랜드 이노베이션 인코포레이티드 매트릭스 지원 레이저 탈착/이온화 비행 시간 질량 분광계를 사용한 샷 단위 샘플링
US10319574B2 (en) 2016-08-22 2019-06-11 Highland Innovations Inc. Categorization data manipulation using a matrix-assisted laser desorption/ionization time-of-flight mass spectrometer
US10192727B2 (en) * 2017-03-28 2019-01-29 Varian Semiconductor Equipment Associates, Inc. Electrodynamic mass analysis
GB2567794B (en) 2017-05-05 2023-03-08 Micromass Ltd Multi-reflecting time-of-flight mass spectrometers
GB2563571B (en) 2017-05-26 2023-05-24 Micromass Ltd Time of flight mass analyser with spatial focussing
US11205568B2 (en) 2017-08-06 2021-12-21 Micromass Uk Limited Ion injection into multi-pass mass spectrometers
US11817303B2 (en) 2017-08-06 2023-11-14 Micromass Uk Limited Accelerator for multi-pass mass spectrometers
US11081332B2 (en) 2017-08-06 2021-08-03 Micromass Uk Limited Ion guide within pulsed converters
WO2019030474A1 (en) 2017-08-06 2019-02-14 Anatoly Verenchikov IONIC MIRROR WITH PRINTED CIRCUIT WITH COMPENSATION
US11211238B2 (en) 2017-08-06 2021-12-28 Micromass Uk Limited Multi-pass mass spectrometer
WO2019030473A1 (en) 2017-08-06 2019-02-14 Anatoly Verenchikov FIELDS FOR SMART REFLECTIVE TOF SM
EP3662501A1 (en) 2017-08-06 2020-06-10 Micromass UK Limited Ion mirror for multi-reflecting mass spectrometers
WO2019169125A1 (en) * 2018-02-28 2019-09-06 Ionpath, Inc. Source-detector synchronization in multiplexed secondary ion mass spectrometry
GB201806507D0 (en) 2018-04-20 2018-06-06 Verenchikov Anatoly Gridless ion mirrors with smooth fields
GB201807626D0 (en) 2018-05-10 2018-06-27 Micromass Ltd Multi-reflecting time of flight mass analyser
GB201807605D0 (en) 2018-05-10 2018-06-27 Micromass Ltd Multi-reflecting time of flight mass analyser
GB201808530D0 (en) 2018-05-24 2018-07-11 Verenchikov Anatoly TOF MS detection system with improved dynamic range
GB201810573D0 (en) 2018-06-28 2018-08-15 Verenchikov Anatoly Multi-pass mass spectrometer with improved duty cycle
GB201901411D0 (en) 2019-02-01 2019-03-20 Micromass Ltd Electrode assembly for mass spectrometer
GB201903779D0 (en) 2019-03-20 2019-05-01 Micromass Ltd Multiplexed time of flight mass spectrometer

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JPS5744953A (en) * 1980-07-08 1982-03-13 Buoruniku Heruman Flying time type mass analyzer
JPS6182652A (ja) * 1984-09-29 1986-04-26 Shimadzu Corp 飛行時間型衝突解離質量分析装置
JPH09326243A (ja) * 1996-06-05 1997-12-16 Shimadzu Corp Ｍａｌｄｉ−ｔｏｆ質量分析装置
WO1999001889A1 (en) * 1997-07-02 1999-01-14 Merck & Co., Inc. Novel mass spectrometer
JPH11185697A (ja) * 1997-12-18 1999-07-09 Shimadzu Corp 飛行時間型質量分析装置
JP2002503020A (ja) * 1998-02-06 2002-01-29 パーセプティブ バイオシステムズ，インコーポレイテッド 遅延引き出し付きタンデム飛行時間型質量分析計および使用方法
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Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007138679A1 (ja) * 2006-05-30 2007-12-06 Shimadzu Corporation 質量分析装置
US7858937B2 (en) 2006-05-30 2010-12-28 Shimadzu Corporation Mass spectrometer
JP4973659B2 (ja) * 2006-05-30 2012-07-11 株式会社島津製作所 質量分析装置
JP2008282571A (ja) * 2007-05-08 2008-11-20 Shimadzu Corp 飛行時間型質量分析計
WO2009081444A1 (ja) * 2007-12-20 2009-07-02 Shimadzu Corporation 質量分析装置
JP4894929B2 (ja) * 2007-12-20 2012-03-14 株式会社島津製作所 質量分析装置
JP2013532886A (ja) * 2010-07-30 2013-08-19 イオン−トフ テクノロジーズ ゲーエムベーハー イオン又は後にイオン化される中性粒子を試料から検出する方法、質量分析計、及びその使用
JP2015084347A (ja) * 2010-07-30 2015-04-30 イオン−トフ テクノロジーズ ゲーエムベーハー イオン又は後にイオン化される中性粒子を試料から検出する方法、質量分析計、及びその使用
JP2018511052A (ja) * 2015-03-25 2018-04-19 トフヴェルク アクチエンゲゼルシャフトＴｏｆｗｅｒｋ Ａｇ マススペクトロメトリーのための装置および方法
JP2023527044A (ja) * 2020-05-27 2023-06-26 スミスズ ディテクション－ワトフォード リミテッド イオンシャッタ、イオンシャッタのコントロール方法、及び検知方法及び装置
JP2023184506A (ja) * 2022-06-17 2023-12-28 サーモ フィッシャー サイエンティフィック （ブレーメン） ゲーエムベーハー 標識された分析物分子の飛行時間型質量分析
JP7634599B2 (ja) 2022-06-17 2025-02-21 サーモ フィッシャー サイエンティフィック （ブレーメン） ゲーエムベーハー 標識された分析物分子の飛行時間型質量分析

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US6933497B2 (en) 2005-08-23
US20040119012A1 (en) 2004-06-24
WO2004059693A3 (en) 2005-11-17
EP1584099A2 (en) 2005-10-12
WO2004059693A2 (en) 2004-07-15

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