JPS5744953A - Flying time type mass analyzer - Google Patents

Flying time type mass analyzer

Info

Publication number
JPS5744953A
JPS5744953A JP56101388A JP10138881A JPS5744953A JP S5744953 A JPS5744953 A JP S5744953A JP 56101388 A JP56101388 A JP 56101388A JP 10138881 A JP10138881 A JP 10138881A JP S5744953 A JPS5744953 A JP S5744953A
Authority
JP
Japan
Prior art keywords
mass analyzer
time type
type mass
flying time
flying
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56101388A
Other languages
Japanese (ja)
Other versions
JPH0351053B2 (en
Inventor
Buoruniku Heruman
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of JPS5744953A publication Critical patent/JPS5744953A/en
Publication of JPH0351053B2 publication Critical patent/JPH0351053B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/34Dynamic spectrometers
    • H01J49/40Time-of-flight spectrometers
    • H01J49/406Time-of-flight spectrometers with multiple reflections

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP56101388A 1980-07-08 1981-07-01 Flying time type mass analyzer Granted JPS5744953A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19803025764 DE3025764C2 (en) 1980-07-08 1980-07-08 Time of flight mass spectrometer

Publications (2)

Publication Number Publication Date
JPS5744953A true JPS5744953A (en) 1982-03-13
JPH0351053B2 JPH0351053B2 (en) 1991-08-05

Family

ID=6106638

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56101388A Granted JPS5744953A (en) 1980-07-08 1981-07-01 Flying time type mass analyzer

Country Status (4)

Country Link
JP (1) JPS5744953A (en)
DE (1) DE3025764C2 (en)
FR (1) FR2486713B1 (en)
GB (1) GB2080021B (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001312995A (en) * 2000-03-03 2001-11-09 Micromass Ltd Drift length selectable time-of-flight mass spectrometer
JP2006511912A (en) * 2002-12-20 2006-04-06 パーセプティブ バイオシステムズ,インコーポレイテッド Time-of-flight mass analyzer with multiple flight paths
JP2007526596A (en) * 2003-06-21 2007-09-13 レコ コーポレイション Multiple reflection time-of-flight mass spectrometer and method of use thereof
JP2008529221A (en) * 2005-01-24 2008-07-31 アプレラ コーポレイション Ion optics system
JP2009094020A (en) * 2007-10-12 2009-04-30 Topcon Corp Charged particle beam reflector and electron microscope
JP2010512631A (en) * 2006-12-11 2010-04-22 株式会社島津製作所 Coaxial time-of-flight mass spectrometer
JP2013175481A (en) * 2007-12-21 2013-09-05 Thermo Fisher Scientific (Bremen) Gmbh Multireflection time-of-flight mass spectrometer
JP2016035922A (en) * 2010-12-29 2016-03-17 レコ コーポレイションLeco Corporation Improved electrostatic trap mass spectrometer for ion implantation.

Families Citing this family (68)

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FR2548448B1 (en) * 1983-06-28 1986-04-25 Inst Nat Sciences Appliq ELECTROSTATIC TIME OF FLIGHT FOCUSING MIRROR OF CHARGED PARTICLES AND ITS APPLICATION TO MASS SPECTROMETRY
DE3524536A1 (en) * 1985-07-10 1987-01-22 Bruker Analytische Messtechnik FLIGHT TIME MASS SPECTROMETER WITH AN ION REFLECTOR
GB8915972D0 (en) * 1989-07-12 1989-08-31 Kratos Analytical Ltd An ion mirror for a time-of-flight mass spectrometer
US6002127A (en) * 1995-05-19 1999-12-14 Perseptive Biosystems, Inc. Time-of-flight mass spectrometry analysis of biomolecules
DE10005698B4 (en) 2000-02-09 2007-03-01 Bruker Daltonik Gmbh Gridless reflector time-of-flight mass spectrometer for orthogonal ion injection
DE10116536A1 (en) * 2001-04-03 2002-10-17 Wollnik Hermann Flight time mass spectrometer has significantly greater ion energy on substantially rotation symmetrical electrostatic accelerating lens axis near central electrodes than for rest of flight path
US6744042B2 (en) * 2001-06-18 2004-06-01 Yeda Research And Development Co., Ltd. Ion trapping
US7385187B2 (en) 2003-06-21 2008-06-10 Leco Corporation Multi-reflecting time-of-flight mass spectrometer and method of use
DE102004045315A1 (en) * 2004-09-17 2006-03-30 Gesellschaft zur Förderung angewandter Optik, Optoelektronik, Quantenelektronik und Spektroskopie e.V. Time of Flight Mass Spectrometer
GB0513047D0 (en) * 2005-06-27 2005-08-03 Thermo Finnigan Llc Electronic ion trap
CA2639903C (en) 2006-04-13 2012-01-03 Thermo Fisher Scientific (Bremen) Gmbh Ion energy spread reduction for mass spectrometer
GB0607542D0 (en) 2006-04-13 2006-05-24 Thermo Finnigan Llc Mass spectrometer
GB0620398D0 (en) * 2006-10-13 2006-11-22 Shimadzu Corp Multi-reflecting time-of-flight mass analyser and a time-of-flight mass spectrometer including the time-of-flight mass analyser
GB0622689D0 (en) 2006-11-14 2006-12-27 Thermo Electron Bremen Gmbh Method of operating a multi-reflection ion trap
JP5259169B2 (en) 2007-01-10 2013-08-07 日本電子株式会社 Tandem time-of-flight mass spectrometer and method
GB0712252D0 (en) 2007-06-22 2007-08-01 Shimadzu Corp A multi-reflecting ion optical device
JP5628165B2 (en) 2008-07-16 2014-11-19 レコ コーポレイションLeco Corporation Quasi-planar multiple reflection time-of-flight mass spectrometer
CN101752179A (en) 2008-12-22 2010-06-23 岛津分析技术研发(上海)有限公司 Mass spectrum analyzer
GB2470600B (en) 2009-05-29 2012-06-13 Thermo Fisher Scient Bremen Charged particle analysers and methods of separating charged particles
GB2470599B (en) 2009-05-29 2014-04-02 Thermo Fisher Scient Bremen Charged particle analysers and methods of separating charged particles
US20110168880A1 (en) 2010-01-13 2011-07-14 Agilent Technologies, Inc. Time-of-flight mass spectrometer with curved ion mirrors
GB2476964A (en) 2010-01-15 2011-07-20 Anatoly Verenchikov Electrostatic trap mass spectrometer
GB2478300A (en) 2010-03-02 2011-09-07 Anatoly Verenchikov A planar multi-reflection time-of-flight mass spectrometer
JP2011210698A (en) 2010-03-11 2011-10-20 Jeol Ltd Tandem time-of-flight mass spectrometer
JP5555582B2 (en) 2010-09-22 2014-07-23 日本電子株式会社 Tandem time-of-flight mass spectrometry and apparatus
JP2012084299A (en) 2010-10-08 2012-04-26 Jeol Ltd Tandem time-of-flight mass spectrometer
JP2012243667A (en) 2011-05-23 2012-12-10 Jeol Ltd Device and method for time-of-flight mass spectrometry
GB2495899B (en) * 2011-07-04 2018-05-16 Thermo Fisher Scient Bremen Gmbh Identification of samples using a multi pass or multi reflection time of flight mass spectrometer
GB2495127B (en) 2011-09-30 2016-10-19 Thermo Fisher Scient (Bremen) Gmbh Method and apparatus for mass spectrometry
GB201118279D0 (en) 2011-10-21 2011-12-07 Shimadzu Corp Mass analyser, mass spectrometer and associated methods
WO2013063587A2 (en) 2011-10-28 2013-05-02 Leco Corporation Electrostatic ion mirrors
GB201201403D0 (en) 2012-01-27 2012-03-14 Thermo Fisher Scient Bremen Multi-reflection mass spectrometer
GB201201405D0 (en) 2012-01-27 2012-03-14 Thermo Fisher Scient Bremen Multi-reflection mass spectrometer
GB2499587B (en) 2012-02-21 2016-06-01 Thermo Fisher Scient (Bremen) Gmbh Apparatus and methods for ion mobility spectrometry
JP5972651B2 (en) 2012-04-25 2016-08-17 日本電子株式会社 Time-of-flight mass spectrometer
JP5972662B2 (en) 2012-05-15 2016-08-17 日本電子株式会社 Tandem time-of-flight mass spectrometer
JP6088645B2 (en) * 2012-06-18 2017-03-01 レコ コーポレイションLeco Corporation Tandem time-of-flight mass spectrometry with non-uniform sampling
JP5993677B2 (en) 2012-09-14 2016-09-14 日本電子株式会社 Time-of-flight mass spectrometer and control method of time-of-flight mass spectrometer
US9941107B2 (en) * 2012-11-09 2018-04-10 Leco Corporation Cylindrical multi-reflecting time-of-flight mass spectrometer
JP6321132B2 (en) 2013-03-14 2018-05-09 レコ コーポレイションLeco Corporation Multiple reflection mass spectrometer
DE112014007095B4 (en) 2014-10-23 2021-02-18 Leco Corporation Multi-reflective time-of-flight analyzer
GB201507363D0 (en) 2015-04-30 2015-06-17 Micromass Uk Ltd And Leco Corp Multi-reflecting TOF mass spectrometer
GB201520134D0 (en) 2015-11-16 2015-12-30 Micromass Uk Ltd And Leco Corp Imaging mass spectrometer
GB201520130D0 (en) 2015-11-16 2015-12-30 Micromass Uk Ltd And Leco Corp Imaging mass spectrometer
GB201520540D0 (en) 2015-11-23 2016-01-06 Micromass Uk Ltd And Leco Corp Improved ion mirror and ion-optical lens for imaging
GB201613988D0 (en) 2016-08-16 2016-09-28 Micromass Uk Ltd And Leco Corp Mass analyser having extended flight path
GB2555609B (en) 2016-11-04 2019-06-12 Thermo Fisher Scient Bremen Gmbh Multi-reflection mass spectrometer with deceleration stage
GB2567794B (en) 2017-05-05 2023-03-08 Micromass Ltd Multi-reflecting time-of-flight mass spectrometers
GB2563571B (en) 2017-05-26 2023-05-24 Micromass Ltd Time of flight mass analyser with spatial focussing
GB2563077A (en) 2017-06-02 2018-12-05 Thermo Fisher Scient Bremen Gmbh Mass error correction due to thermal drift in a time of flight mass spectrometer
GB2563604B (en) 2017-06-20 2021-03-10 Thermo Fisher Scient Bremen Gmbh Mass spectrometer and method for time-of-flight mass spectrometry
US11211238B2 (en) 2017-08-06 2021-12-28 Micromass Uk Limited Multi-pass mass spectrometer
WO2019030471A1 (en) 2017-08-06 2019-02-14 Anatoly Verenchikov Ion guide within pulsed converters
US11295944B2 (en) 2017-08-06 2022-04-05 Micromass Uk Limited Printed circuit ion mirror with compensation
WO2019030473A1 (en) 2017-08-06 2019-02-14 Anatoly Verenchikov Fields for multi-reflecting tof ms
CN111164731B (en) 2017-08-06 2022-11-18 英国质谱公司 Ion implantation into a multichannel mass spectrometer
EP3662501A1 (en) 2017-08-06 2020-06-10 Micromass UK Limited Ion mirror for multi-reflecting mass spectrometers
WO2019030477A1 (en) 2017-08-06 2019-02-14 Anatoly Verenchikov Accelerator for multi-pass mass spectrometers
GB201806507D0 (en) 2018-04-20 2018-06-06 Verenchikov Anatoly Gridless ion mirrors with smooth fields
GB201807626D0 (en) 2018-05-10 2018-06-27 Micromass Ltd Multi-reflecting time of flight mass analyser
GB201807605D0 (en) 2018-05-10 2018-06-27 Micromass Ltd Multi-reflecting time of flight mass analyser
GB201808530D0 (en) 2018-05-24 2018-07-11 Verenchikov Anatoly TOF MS detection system with improved dynamic range
GB201810573D0 (en) 2018-06-28 2018-08-15 Verenchikov Anatoly Multi-pass mass spectrometer with improved duty cycle
GB201901411D0 (en) 2019-02-01 2019-03-20 Micromass Ltd Electrode assembly for mass spectrometer
GB201903779D0 (en) 2019-03-20 2019-05-01 Micromass Ltd Multiplexed time of flight mass spectrometer
CN113921373B (en) * 2021-09-23 2024-10-25 中国科学院国家空间科学中心 Multi-specular reflection flight time detection device
GB2612574A (en) 2021-10-26 2023-05-10 Thermo Fisher Scient Bremen Gmbh Method for correcting mass spectral data
GB202307711D0 (en) 2023-05-23 2023-07-05 Thermo Fisher Scient Bremen Gmbh Method for calibrating a time-of-flight mass analyser and time-of-flight mass analyser

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3745337A (en) * 1971-05-12 1973-07-10 Jeol Ltd Apparatus for separating charged particles according to their respective ranges
US3727047A (en) * 1971-07-22 1973-04-10 Avco Corp Time of flight mass spectrometer comprising a reflecting means which equalizes time of flight of ions having same mass to charge ratio

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001312995A (en) * 2000-03-03 2001-11-09 Micromass Ltd Drift length selectable time-of-flight mass spectrometer
JP2006511912A (en) * 2002-12-20 2006-04-06 パーセプティブ バイオシステムズ,インコーポレイテッド Time-of-flight mass analyzer with multiple flight paths
JP2007526596A (en) * 2003-06-21 2007-09-13 レコ コーポレイション Multiple reflection time-of-flight mass spectrometer and method of use thereof
JP4763601B2 (en) * 2003-06-21 2011-08-31 レコ コーポレイション Multiple reflection time-of-flight mass spectrometer and method of use thereof
JP2008529221A (en) * 2005-01-24 2008-07-31 アプレラ コーポレイション Ion optics system
JP2010512631A (en) * 2006-12-11 2010-04-22 株式会社島津製作所 Coaxial time-of-flight mass spectrometer
JP2009094020A (en) * 2007-10-12 2009-04-30 Topcon Corp Charged particle beam reflector and electron microscope
JP2013175481A (en) * 2007-12-21 2013-09-05 Thermo Fisher Scientific (Bremen) Gmbh Multireflection time-of-flight mass spectrometer
JP2013179083A (en) * 2007-12-21 2013-09-09 Thermo Fisher Scientific (Bremen) Gmbh Multiple reflection time of flight mass spectrometry
JP2016035922A (en) * 2010-12-29 2016-03-17 レコ コーポレイションLeco Corporation Improved electrostatic trap mass spectrometer for ion implantation.

Also Published As

Publication number Publication date
JPH0351053B2 (en) 1991-08-05
GB2080021A (en) 1982-01-27
FR2486713B1 (en) 1985-07-05
FR2486713A1 (en) 1982-01-15
DE3025764C2 (en) 1984-04-19
DE3025764A1 (en) 1982-01-28
GB2080021B (en) 1984-11-21

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