JP2006349546A - X線検査設備 - Google Patents

X線検査設備 Download PDF

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Publication number
JP2006349546A
JP2006349546A JP2005177363A JP2005177363A JP2006349546A JP 2006349546 A JP2006349546 A JP 2006349546A JP 2005177363 A JP2005177363 A JP 2005177363A JP 2005177363 A JP2005177363 A JP 2005177363A JP 2006349546 A JP2006349546 A JP 2006349546A
Authority
JP
Japan
Prior art keywords
inspection
ray
exit
ray inspection
moving means
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2005177363A
Other languages
English (en)
Japanese (ja)
Inventor
Masamitsu Nakaya
雅光 仲谷
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kobe Steel Ltd
Original Assignee
Kobe Steel Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kobe Steel Ltd filed Critical Kobe Steel Ltd
Priority to JP2005177363A priority Critical patent/JP2006349546A/ja
Priority to TW095111272A priority patent/TW200700718A/zh
Priority to CNA2006100935885A priority patent/CN1880948A/zh
Priority to KR1020060053996A priority patent/KR100891765B1/ko
Publication of JP2006349546A publication Critical patent/JP2006349546A/ja
Withdrawn legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/10Different kinds of radiation or particles
    • G01N2223/101Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016X-ray
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/60Specific applications or type of materials
    • G01N2223/631Specific applications or type of materials large structures, walls

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2005177363A 2005-06-17 2005-06-17 X線検査設備 Withdrawn JP2006349546A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2005177363A JP2006349546A (ja) 2005-06-17 2005-06-17 X線検査設備
TW095111272A TW200700718A (en) 2005-06-17 2006-03-30 X-ray inspection equipment
CNA2006100935885A CN1880948A (zh) 2005-06-17 2006-06-06 X线检查设备
KR1020060053996A KR100891765B1 (ko) 2005-06-17 2006-06-15 Ⅹ선 검사 설비

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005177363A JP2006349546A (ja) 2005-06-17 2005-06-17 X線検査設備

Publications (1)

Publication Number Publication Date
JP2006349546A true JP2006349546A (ja) 2006-12-28

Family

ID=37519221

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005177363A Withdrawn JP2006349546A (ja) 2005-06-17 2005-06-17 X線検査設備

Country Status (4)

Country Link
JP (1) JP2006349546A (enrdf_load_stackoverflow)
KR (1) KR100891765B1 (enrdf_load_stackoverflow)
CN (1) CN1880948A (enrdf_load_stackoverflow)
TW (1) TW200700718A (enrdf_load_stackoverflow)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102226773A (zh) * 2011-03-30 2011-10-26 马军 X射线探伤机检测试验台
CN102879408A (zh) * 2012-09-27 2013-01-16 南京奥特电气股份有限公司 管道焊缝探伤驱动装置
JP2014145616A (ja) * 2013-01-28 2014-08-14 Ihi Inspection & Instrumentation Co Ltd X線検査装置及び方法
JP2014153099A (ja) * 2013-02-06 2014-08-25 Ihi Inspection & Instrumentation Co Ltd X線検査用車両搬送装置
JP2014153235A (ja) * 2013-02-12 2014-08-25 Ihi Inspection & Instrumentation Co Ltd X線検査用車両搬送装置
JP2015003777A (ja) * 2013-06-19 2015-01-08 株式会社Ihi検査計測 X線検査用車両の搬送装置
JP2018159661A (ja) * 2017-03-23 2018-10-11 三菱電機プラントエンジニアリング株式会社 車両汚染検査装置

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101374634B1 (ko) * 2012-08-10 2014-03-17 주식회사 쎄크 인라인 엑스-레이 차폐 도어유닛 및 이를 구비한 엑스-레이 검사시스템

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IL86229A (en) * 1987-05-26 1990-09-17 Science Applic Int Corp Explosive detection system
JPH02101254U (enrdf_load_stackoverflow) * 1989-01-30 1990-08-13
JP3313755B2 (ja) * 1992-04-30 2002-08-12 東芝アイティー・コントロールシステム株式会社 断層撮影装置

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102226773A (zh) * 2011-03-30 2011-10-26 马军 X射线探伤机检测试验台
CN102879408A (zh) * 2012-09-27 2013-01-16 南京奥特电气股份有限公司 管道焊缝探伤驱动装置
JP2014145616A (ja) * 2013-01-28 2014-08-14 Ihi Inspection & Instrumentation Co Ltd X線検査装置及び方法
JP2014153099A (ja) * 2013-02-06 2014-08-25 Ihi Inspection & Instrumentation Co Ltd X線検査用車両搬送装置
JP2014153235A (ja) * 2013-02-12 2014-08-25 Ihi Inspection & Instrumentation Co Ltd X線検査用車両搬送装置
JP2015003777A (ja) * 2013-06-19 2015-01-08 株式会社Ihi検査計測 X線検査用車両の搬送装置
JP2018159661A (ja) * 2017-03-23 2018-10-11 三菱電機プラントエンジニアリング株式会社 車両汚染検査装置

Also Published As

Publication number Publication date
TW200700718A (en) 2007-01-01
KR20060132469A (ko) 2006-12-21
CN1880948A (zh) 2006-12-20
KR100891765B1 (ko) 2009-04-07
TWI309298B (enrdf_load_stackoverflow) 2009-05-01

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