JP2006029826A5 - - Google Patents

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Publication number
JP2006029826A5
JP2006029826A5 JP2004205178A JP2004205178A JP2006029826A5 JP 2006029826 A5 JP2006029826 A5 JP 2006029826A5 JP 2004205178 A JP2004205178 A JP 2004205178A JP 2004205178 A JP2004205178 A JP 2004205178A JP 2006029826 A5 JP2006029826 A5 JP 2006029826A5
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JP
Japan
Prior art keywords
digital data
output signal
input signal
signal
shift amount
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2004205178A
Other languages
English (en)
Japanese (ja)
Other versions
JP4526891B2 (ja
JP2006029826A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2004205178A priority Critical patent/JP4526891B2/ja
Priority claimed from JP2004205178A external-priority patent/JP4526891B2/ja
Priority to PCT/JP2005/011439 priority patent/WO2006006354A1/ja
Priority to DE112005001590T priority patent/DE112005001590T5/de
Priority to US11/251,600 priority patent/US7197413B2/en
Publication of JP2006029826A publication Critical patent/JP2006029826A/ja
Publication of JP2006029826A5 publication Critical patent/JP2006029826A5/ja
Application granted granted Critical
Publication of JP4526891B2 publication Critical patent/JP4526891B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2004205178A 2004-07-12 2004-07-12 遅延量測定方法、及び測定装置 Expired - Fee Related JP4526891B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2004205178A JP4526891B2 (ja) 2004-07-12 2004-07-12 遅延量測定方法、及び測定装置
PCT/JP2005/011439 WO2006006354A1 (ja) 2004-07-12 2005-06-22 遅延量測定方法
DE112005001590T DE112005001590T5 (de) 2004-07-12 2005-06-22 Verzögerungsmessverfahren
US11/251,600 US7197413B2 (en) 2004-07-12 2005-10-25 Delay amount measurement method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004205178A JP4526891B2 (ja) 2004-07-12 2004-07-12 遅延量測定方法、及び測定装置

Publications (3)

Publication Number Publication Date
JP2006029826A JP2006029826A (ja) 2006-02-02
JP2006029826A5 true JP2006029826A5 (enExample) 2007-04-19
JP4526891B2 JP4526891B2 (ja) 2010-08-18

Family

ID=35783703

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004205178A Expired - Fee Related JP4526891B2 (ja) 2004-07-12 2004-07-12 遅延量測定方法、及び測定装置

Country Status (4)

Country Link
US (1) US7197413B2 (enExample)
JP (1) JP4526891B2 (enExample)
DE (1) DE112005001590T5 (enExample)
WO (1) WO2006006354A1 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5119016B2 (ja) * 2008-03-14 2013-01-16 株式会社リコー ベルト駆動制御装置及び画像形成装置
CN114578207B (zh) * 2022-02-16 2025-04-18 重庆中科渝芯电子有限公司 一种高精密集成运放非线性度测试系统和测试方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2561816B2 (ja) * 1985-07-11 1996-12-11 日本ヒューレット・パッカード株式会社 タイミング較正方法
JP2589864B2 (ja) * 1990-09-11 1997-03-12 松下電器産業株式会社 信号比較装置
JP2002040099A (ja) * 2000-07-24 2002-02-06 Advantest Corp 近似波形生成方法及び半導体試験装置
JP2003014786A (ja) * 2001-06-27 2003-01-15 Iwatsu Electric Co Ltd トリガ信号生成装置

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