JP4526891B2 - 遅延量測定方法、及び測定装置 - Google Patents

遅延量測定方法、及び測定装置 Download PDF

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Publication number
JP4526891B2
JP4526891B2 JP2004205178A JP2004205178A JP4526891B2 JP 4526891 B2 JP4526891 B2 JP 4526891B2 JP 2004205178 A JP2004205178 A JP 2004205178A JP 2004205178 A JP2004205178 A JP 2004205178A JP 4526891 B2 JP4526891 B2 JP 4526891B2
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JP
Japan
Prior art keywords
output signal
input signal
digital data
signal
electronic device
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2004205178A
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English (en)
Japanese (ja)
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JP2006029826A (ja
JP2006029826A5 (enExample
Inventor
幸司 浅見
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Advantest Corp
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Advantest Corp
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Priority to JP2004205178A priority Critical patent/JP4526891B2/ja
Priority to PCT/JP2005/011439 priority patent/WO2006006354A1/ja
Priority to DE112005001590T priority patent/DE112005001590T5/de
Priority to US11/251,600 priority patent/US7197413B2/en
Publication of JP2006029826A publication Critical patent/JP2006029826A/ja
Publication of JP2006029826A5 publication Critical patent/JP2006029826A5/ja
Application granted granted Critical
Publication of JP4526891B2 publication Critical patent/JP4526891B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3016—Delay or race condition test, e.g. race hazard test

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Measurement Of Unknown Time Intervals (AREA)
JP2004205178A 2004-07-12 2004-07-12 遅延量測定方法、及び測定装置 Expired - Fee Related JP4526891B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2004205178A JP4526891B2 (ja) 2004-07-12 2004-07-12 遅延量測定方法、及び測定装置
PCT/JP2005/011439 WO2006006354A1 (ja) 2004-07-12 2005-06-22 遅延量測定方法
DE112005001590T DE112005001590T5 (de) 2004-07-12 2005-06-22 Verzögerungsmessverfahren
US11/251,600 US7197413B2 (en) 2004-07-12 2005-10-25 Delay amount measurement method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004205178A JP4526891B2 (ja) 2004-07-12 2004-07-12 遅延量測定方法、及び測定装置

Publications (3)

Publication Number Publication Date
JP2006029826A JP2006029826A (ja) 2006-02-02
JP2006029826A5 JP2006029826A5 (enExample) 2007-04-19
JP4526891B2 true JP4526891B2 (ja) 2010-08-18

Family

ID=35783703

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004205178A Expired - Fee Related JP4526891B2 (ja) 2004-07-12 2004-07-12 遅延量測定方法、及び測定装置

Country Status (4)

Country Link
US (1) US7197413B2 (enExample)
JP (1) JP4526891B2 (enExample)
DE (1) DE112005001590T5 (enExample)
WO (1) WO2006006354A1 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5119016B2 (ja) * 2008-03-14 2013-01-16 株式会社リコー ベルト駆動制御装置及び画像形成装置
CN114578207B (zh) * 2022-02-16 2025-04-18 重庆中科渝芯电子有限公司 一种高精密集成运放非线性度测试系统和测试方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2561816B2 (ja) * 1985-07-11 1996-12-11 日本ヒューレット・パッカード株式会社 タイミング較正方法
JP2589864B2 (ja) * 1990-09-11 1997-03-12 松下電器産業株式会社 信号比較装置
JP2002040099A (ja) * 2000-07-24 2002-02-06 Advantest Corp 近似波形生成方法及び半導体試験装置
JP2003014786A (ja) * 2001-06-27 2003-01-15 Iwatsu Electric Co Ltd トリガ信号生成装置

Also Published As

Publication number Publication date
US20060161383A1 (en) 2006-07-20
US7197413B2 (en) 2007-03-27
JP2006029826A (ja) 2006-02-02
DE112005001590T5 (de) 2007-05-31
WO2006006354A1 (ja) 2006-01-19

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