JP4526891B2 - 遅延量測定方法、及び測定装置 - Google Patents
遅延量測定方法、及び測定装置 Download PDFInfo
- Publication number
- JP4526891B2 JP4526891B2 JP2004205178A JP2004205178A JP4526891B2 JP 4526891 B2 JP4526891 B2 JP 4526891B2 JP 2004205178 A JP2004205178 A JP 2004205178A JP 2004205178 A JP2004205178 A JP 2004205178A JP 4526891 B2 JP4526891 B2 JP 4526891B2
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- JP
- Japan
- Prior art keywords
- output signal
- input signal
- digital data
- signal
- electronic device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/30—Marginal testing, e.g. by varying supply voltage
- G01R31/3016—Delay or race condition test, e.g. race hazard test
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- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Measurement Of Unknown Time Intervals (AREA)
Description
Claims (5)
- 入力信号に応じて出力信号を出力する電子デバイスにおける遅延量を測定する遅延量測定方法であって、
前記入力信号及び前記出力信号をデジタルデータに変換する変換段階と、
前記入力信号又は前記出力信号のいずれかの前記デジタルデータを時間方向に順次シフトさせるシフト段階と、
前記入力信号のデジタルデータと、前記出力信号のデジタルデータとの二乗誤差を、前記シフト段階におけるシフト量のそれぞれに対して算出する誤差算出段階と、
前記二乗誤差が極小値となる前記シフト量を非線形最小二乗法によって算出し、算出した前記シフト量を前記電子デバイスにおける遅延量とする遅延量算出段階と
を備える遅延量測定方法。 - 入力信号に応じて出力信号を出力する電子デバイスにおける遅延量を測定する測定装置であって、
前記入力信号及び前記出力信号をデジタルデータに変換するアナログデジタルコンバータと、
前記入力信号又は前記出力信号のいずれかの前記デジタルデータを時間方向に順次シフトさせ、前記入力信号のデジタルデータと、前記出力信号のデジタルデータとの二乗誤差をシフト量のそれぞれに対して算出し、前記二乗誤差が極小値となる前記シフト量を非線形最小二乗法によって算出し、算出した前記シフト量を前記電子デバイスにおける遅延量とする演算部と
を備える測定装置。 - 前記演算部は、前記入力信号又は前記出力信号のいずれかの前記デジタルデータを、前記アナログデジタルコンバータのサンプリング周期の整数倍のシフト量で、時間方向に順次シフトさせる
請求項2に記載の測定装置。 - 前記演算部は、
前記入力信号又は前記出力信号のいずれかの前記デジタルデータを周波数領域の複素信号に変換し、
前記周波数領域の複素信号の位相を、前記シフト量に応じたシフトさせ、
位相をシフトさせた前記周波数領域の複素信号を逆フーリエ変換して、時間領域の信号に変換することにより、
前記入力信号又は前記出力信号のいずれかの前記デジタルデータを、前記アナログデジタルコンバータのサンプリング周期のより小さいシフト量で、時間方向にシフトさせる
請求項2に記載の測定装置。 - 前記シフト量は、測定した遅延時間の精度に応じて予め定められる
請求項2に記載の測定装置。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004205178A JP4526891B2 (ja) | 2004-07-12 | 2004-07-12 | 遅延量測定方法、及び測定装置 |
DE112005001590T DE112005001590T5 (de) | 2004-07-12 | 2005-06-22 | Verzögerungsmessverfahren |
PCT/JP2005/011439 WO2006006354A1 (ja) | 2004-07-12 | 2005-06-22 | 遅延量測定方法 |
US11/251,600 US7197413B2 (en) | 2004-07-12 | 2005-10-25 | Delay amount measurement method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004205178A JP4526891B2 (ja) | 2004-07-12 | 2004-07-12 | 遅延量測定方法、及び測定装置 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2006029826A JP2006029826A (ja) | 2006-02-02 |
JP2006029826A5 JP2006029826A5 (ja) | 2007-04-19 |
JP4526891B2 true JP4526891B2 (ja) | 2010-08-18 |
Family
ID=35783703
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2004205178A Expired - Fee Related JP4526891B2 (ja) | 2004-07-12 | 2004-07-12 | 遅延量測定方法、及び測定装置 |
Country Status (4)
Country | Link |
---|---|
US (1) | US7197413B2 (ja) |
JP (1) | JP4526891B2 (ja) |
DE (1) | DE112005001590T5 (ja) |
WO (1) | WO2006006354A1 (ja) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5119016B2 (ja) * | 2008-03-14 | 2013-01-16 | 株式会社リコー | ベルト駆動制御装置及び画像形成装置 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6214525A (ja) * | 1985-07-11 | 1987-01-23 | Yokogawa Hewlett Packard Ltd | タイミング較正方法 |
JPH04120472A (ja) * | 1990-09-11 | 1992-04-21 | Matsushita Electric Ind Co Ltd | 信号比較装置 |
JP2002040099A (ja) * | 2000-07-24 | 2002-02-06 | Advantest Corp | 近似波形生成方法及び半導体試験装置 |
JP2003014786A (ja) * | 2001-06-27 | 2003-01-15 | Iwatsu Electric Co Ltd | トリガ信号生成装置 |
-
2004
- 2004-07-12 JP JP2004205178A patent/JP4526891B2/ja not_active Expired - Fee Related
-
2005
- 2005-06-22 DE DE112005001590T patent/DE112005001590T5/de not_active Withdrawn
- 2005-06-22 WO PCT/JP2005/011439 patent/WO2006006354A1/ja active Application Filing
- 2005-10-25 US US11/251,600 patent/US7197413B2/en not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6214525A (ja) * | 1985-07-11 | 1987-01-23 | Yokogawa Hewlett Packard Ltd | タイミング較正方法 |
JPH04120472A (ja) * | 1990-09-11 | 1992-04-21 | Matsushita Electric Ind Co Ltd | 信号比較装置 |
JP2002040099A (ja) * | 2000-07-24 | 2002-02-06 | Advantest Corp | 近似波形生成方法及び半導体試験装置 |
JP2003014786A (ja) * | 2001-06-27 | 2003-01-15 | Iwatsu Electric Co Ltd | トリガ信号生成装置 |
Also Published As
Publication number | Publication date |
---|---|
DE112005001590T5 (de) | 2007-05-31 |
US20060161383A1 (en) | 2006-07-20 |
US7197413B2 (en) | 2007-03-27 |
JP2006029826A (ja) | 2006-02-02 |
WO2006006354A1 (ja) | 2006-01-19 |
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