JP2005533254A5 - - Google Patents

Download PDF

Info

Publication number
JP2005533254A5
JP2005533254A5 JP2004521866A JP2004521866A JP2005533254A5 JP 2005533254 A5 JP2005533254 A5 JP 2005533254A5 JP 2004521866 A JP2004521866 A JP 2004521866A JP 2004521866 A JP2004521866 A JP 2004521866A JP 2005533254 A5 JP2005533254 A5 JP 2005533254A5
Authority
JP
Japan
Prior art keywords
electrical
contactor
interposer
test
terminal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2004521866A
Other languages
English (en)
Japanese (ja)
Other versions
JP2005533254A (ja
Filing date
Publication date
Priority claimed from US10/197,104 external-priority patent/US6867608B2/en
Priority claimed from US10/197,133 external-priority patent/US6853209B1/en
Application filed filed Critical
Priority claimed from PCT/US2003/022125 external-priority patent/WO2004008163A2/en
Publication of JP2005533254A publication Critical patent/JP2005533254A/ja
Publication of JP2005533254A5 publication Critical patent/JP2005533254A5/ja
Pending legal-status Critical Current

Links

JP2004521866A 2002-07-16 2003-07-15 被試験部品上の電気回路を試験するために被試験部品を試験機械に電気的に接続するための組立体 Pending JP2005533254A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US10/197,104 US6867608B2 (en) 2002-07-16 2002-07-16 Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component
US10/197,133 US6853209B1 (en) 2002-07-16 2002-07-16 Contactor assembly for testing electrical circuits
PCT/US2003/022125 WO2004008163A2 (en) 2002-07-16 2003-07-15 Assembly for connecting a test device to an object to be tested

Publications (2)

Publication Number Publication Date
JP2005533254A JP2005533254A (ja) 2005-11-04
JP2005533254A5 true JP2005533254A5 (https=) 2006-08-17

Family

ID=30117843

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004521866A Pending JP2005533254A (ja) 2002-07-16 2003-07-15 被試験部品上の電気回路を試験するために被試験部品を試験機械に電気的に接続するための組立体

Country Status (6)

Country Link
EP (1) EP1523685A2 (https=)
JP (1) JP2005533254A (https=)
KR (1) KR20050029215A (https=)
CN (1) CN100523826C (https=)
AU (1) AU2003249276A1 (https=)
WO (1) WO2004008163A2 (https=)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100956472B1 (ko) 2005-04-27 2010-05-07 에어 테스트 시스템즈 전자 장치들을 테스트하기 위한 장치
CN101051067B (zh) * 2006-04-03 2010-08-11 航天科工防御技术研究试验中心 电连接器综合检测控制装置设计方法
MY152599A (en) 2007-02-14 2014-10-31 Eles Semiconductor Equipment S P A Test of electronic devices at package level using test boards without sockets
EP1959265A1 (en) * 2007-02-16 2008-08-20 Eles Semiconductor Equipment S.P.A. Testing integrated circuits on a wafer with a cartridge leaving exposed a surface thereof
US7557594B2 (en) * 2007-08-14 2009-07-07 Electro Scientific Industries, Inc. Automated contact alignment tool
US7800382B2 (en) 2007-12-19 2010-09-21 AEHR Test Ststems System for testing an integrated circuit of a device and its method of use
CN101545926B (zh) * 2008-03-25 2011-05-11 旺矽科技股份有限公司 探针测试装置
DE102009012021B4 (de) * 2009-03-10 2011-02-03 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Messvorrichtung zur elektrischen Vermessung einer einseitig an einer Messseite elektrisch kontaktierbaren Messstruktur
US8030957B2 (en) 2009-03-25 2011-10-04 Aehr Test Systems System for testing an integrated circuit of a device and its method of use
TWI440412B (zh) * 2011-12-28 2014-06-01 巨擘科技股份有限公司 超薄多層基板之封裝方法
CN103808979A (zh) * 2012-11-08 2014-05-21 富泰华工业（深圳）有限公司 用于承载待测试电子装置的治具
CN103808969A (zh) * 2012-11-08 2014-05-21 富泰华工业（深圳）有限公司 用于承载待测试电子装置的治具
CN105548859A (zh) * 2015-12-09 2016-05-04 上海精密计量测试研究所 用于环境测试的测试设备及方法
TWI729056B (zh) 2016-01-08 2021-06-01 美商艾爾測試系統 測試器設備及測試微電子裝置的方法
CN106200239B (zh) * 2016-09-14 2019-03-15 海信集团有限公司 光机照明系统
US10782316B2 (en) * 2017-01-09 2020-09-22 Delta Design, Inc. Socket side thermal system
EP4632390A3 (en) 2017-03-03 2026-01-14 AEHR Test Systems Electronics tester
CN120254561B (zh) 2020-10-07 2026-03-03 雅赫测试系统公司 电子测试器
US11774486B2 (en) 2021-06-30 2023-10-03 Delta Design Inc. Temperature control system including contactor assembly
JP2026501645A (ja) 2022-12-30 2026-01-16 エイアー テスト システムズ 電子試験器

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5148103A (en) * 1990-10-31 1992-09-15 Hughes Aircraft Company Apparatus for testing integrated circuits
JPH0763788A (ja) * 1993-08-21 1995-03-10 Hewlett Packard Co <Hp> プローブおよび電気部品／回路検査装置ならびに電気部品／回路検査方法
US6483328B1 (en) * 1995-11-09 2002-11-19 Formfactor, Inc. Probe card for probing wafers with raised contact elements
US6028437A (en) * 1997-05-19 2000-02-22 Si Diamond Technology, Inc. Probe head assembly
US6137297A (en) * 1999-01-06 2000-10-24 Vertest Systemsn Corp. Electronic test probe interface assembly and method of manufacture
JP2001013208A (ja) * 1999-06-30 2001-01-19 Mitsubishi Electric Corp 半導体テスト治工具

Similar Documents

Publication Publication Date Title
JP2005533254A5 (https=)
JP4496456B2 (ja) プローバ装置
US6572396B1 (en) Low or zero insertion force connector for printed circuit boards and electrical devices
US6707311B2 (en) Contact structure with flexible cable and probe contact assembly using same
JP6060253B2 (ja) 位置整列が容易なテスト用ソケット
CN100526901C (zh) 用于探测具有突起的接触元件的晶片的探测卡
US20040051541A1 (en) Contact structure with flexible cable and probe contact assembly using same
CN106841691A (zh) 插脚和半导体封装件测试系统
JP4545742B2 (ja) 電気的接続装置
KR101230148B1 (ko) 실장 부품, 전자 기기 및 실장 방법
CN113495177A (zh) 具有3d电路的微机电探针测试头及探针卡
CN114200279B (zh) 一种薄膜探针卡及其探针头
TWI855898B (zh) 內置組件的橡膠插座
JP2004150927A (ja) プロービング装置
KR101007817B1 (ko) 커넥터 장치
US7261570B1 (en) Method for attaching cable to circuit substrate
CN216625717U (zh) 一种高灵敏度的无线接收模块
CN100536244C (zh) 电连接器端子及使用该电连接器端子的电连接器组件
KR101465399B1 (ko) 멀티 타입 프로브 카드
JP3929123B2 (ja) 超音波探触子用コネクタ及びそれを用いた超音波診断装置
JP2000150096A (ja) コネクタ装置
CN113937025B (zh) 转接装置及转接装置的制造方法
JP3018064B2 (ja) コンタクト装置とその製造方法
JP7217293B2 (ja) １または複数の被テストデバイスをテストするための自動テスト装置、および、自動テスト装置を操作するための方法
KR100771476B1 (ko) 전기적 접속장치