JP2005519286A - テスト回路を有する集積回路 - Google Patents
テスト回路を有する集積回路 Download PDFInfo
- Publication number
- JP2005519286A JP2005519286A JP2003573435A JP2003573435A JP2005519286A JP 2005519286 A JP2005519286 A JP 2005519286A JP 2003573435 A JP2003573435 A JP 2003573435A JP 2003573435 A JP2003573435 A JP 2003573435A JP 2005519286 A JP2005519286 A JP 2005519286A
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- test
- test pattern
- integrated circuit
- logic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/31813—Test pattern generators
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
- G01R31/318385—Random or pseudo-random test pattern
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318544—Scanning methods, algorithms and patterns
- G01R31/318547—Data generators or compressors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318572—Input/Output interfaces
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Semiconductor Integrated Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
Description
Claims (6)
- テスト対象のアプリケーション回路と、前記アプリケーション回路をテストするために設けられ、且つテストの目的で前記アプリケーション回路に適用される望ましいテストパターンを生成する構成を含むセルフテスト回路とを有する集積回路であって、
前記アプリケーション回路を通過するテストパターンに基づいて発生する出力信号はシグネチャレジスタによって評価され、
前記望ましいテストパターンを生成する構成はビット変更回路を含み、
前記ビット変更回路は、シフトレジスタによって供給されるテストパターンの疑似ランダムシーケンスが変更されるように組み合わせ論理の第1の制御入力を個別に制御して、近似により望ましいテストパターンを獲得し、且つ前記組み合わせ論理の第2の制御入力を制御し、それによって第1の制御入力を阻止することができ、この結果、前記組み合わせ論理の前記第1の制御入力を制御することによって、前記シフトレジスタによって供給され且つ既に望ましいテストパターンであるテストパターンは前記ビット変更回路により変更されない、集積回路。 - 前記ビット変更回路はハードウェア回路として形成されることを特徴とする、請求項1に記載の集積回路。
- マスキングロジックは、前記マスキングロジックへ信号を供給するテストパターンカウンタと関連し、前記信号はテスト中に前記マスキングロジックへ有効テストパターンの特性値を常時供給することを特徴とする、請求項1に記載の集積回路。
- 前記マスキングロジックには、このマスキングロジックに信号を供給するシフトサイクルカウンタが設けられ、前記信号は前記アプリケーション回路内のシフトレジスタのシフト状態を示すことを特徴とする、請求項1に記載の集積回路。
- マスキングロジックが設けられ、前記マスキングロジックは、前記アプリケーション回路の回路構造に基づいて不確定な状態である前記アプリケーション回路の出力信号のビットをテスト中に阻止し、他のビットのみを前記シグネチャレジスタへ供給することを特徴とする、請求項1に記載の集積回路。
- 前記ビット変更回路は前記組み合わせ論理の前記第2の制御入力の制御のための別個の出力を有しておらず、前記組み合わせ論理の前記第2の制御入力の前記制御は、前記第1の制御入力を制御する前記ビット変更回路9の出力に統一化されていることを特徴とする、請求項1に記載の集積回路。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10209078A DE10209078A1 (de) | 2002-03-01 | 2002-03-01 | Integrierter Schaltkreis mit Testschaltung |
PCT/IB2003/000760 WO2003075028A1 (en) | 2002-03-01 | 2003-02-26 | Integrated circuit with test circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2005519286A true JP2005519286A (ja) | 2005-06-30 |
Family
ID=27762582
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2003573435A Ceased JP2005519286A (ja) | 2002-03-01 | 2003-02-26 | テスト回路を有する集積回路 |
Country Status (8)
Country | Link |
---|---|
US (1) | US7139953B2 (ja) |
EP (1) | EP1483596B1 (ja) |
JP (1) | JP2005519286A (ja) |
CN (1) | CN100357754C (ja) |
AT (1) | ATE384957T1 (ja) |
AU (1) | AU2003206075A1 (ja) |
DE (2) | DE10209078A1 (ja) |
WO (1) | WO2003075028A1 (ja) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7234092B2 (en) | 2002-06-11 | 2007-06-19 | On-Chip Technologies, Inc. | Variable clocked scan test circuitry and method |
TWI242121B (en) * | 2004-08-20 | 2005-10-21 | Via Tech Inc | Testing method for reconstructing unit |
WO2008096209A1 (en) * | 2007-02-09 | 2008-08-14 | Freescale Semiconductor, Inc. | Device and method for testing a circuit |
US7996749B2 (en) * | 2007-07-03 | 2011-08-09 | Altera Corporation | Signal loss detector for high-speed serial interface of a programmable logic device |
US8566656B2 (en) * | 2009-12-22 | 2013-10-22 | Nxp B.V. | Testing circuit and method |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4503537A (en) * | 1982-11-08 | 1985-03-05 | International Business Machines Corporation | Parallel path self-testing system |
JPS6329276A (ja) * | 1986-07-23 | 1988-02-06 | Hitachi Ltd | 論理lsi |
US4974184A (en) * | 1988-05-05 | 1990-11-27 | Honeywell Inc. | Maximum length pseudo-random test pattern generator via feedback network modification |
CA1298668C (en) * | 1988-05-05 | 1992-04-07 | Lanae Avra | Maximum length pseudo-random test pattern generator via feedback network modification |
JP3308099B2 (ja) * | 1993-06-16 | 2002-07-29 | 花王株式会社 | キャップ |
KR100208043B1 (ko) * | 1996-01-12 | 1999-07-15 | 오우라 히로시 | 시험 패턴 발생기 |
KR100245795B1 (ko) * | 1997-06-30 | 2000-03-02 | 윤종용 | 테스트의 동작 오류 검사 방법 |
DE19917884C1 (de) * | 1999-04-20 | 2000-11-16 | Siemens Ag | Schaltung mit eingebautem Selbsttest |
DE10038327A1 (de) * | 2000-08-05 | 2002-02-14 | Philips Corp Intellectual Pty | Integrierter Schaltkreis mit Selbsttest-Schaltung |
-
2002
- 2002-03-01 DE DE10209078A patent/DE10209078A1/de not_active Withdrawn
-
2003
- 2003-02-26 AT AT03702959T patent/ATE384957T1/de not_active IP Right Cessation
- 2003-02-26 US US10/506,234 patent/US7139953B2/en not_active Expired - Fee Related
- 2003-02-26 AU AU2003206075A patent/AU2003206075A1/en not_active Abandoned
- 2003-02-26 JP JP2003573435A patent/JP2005519286A/ja not_active Ceased
- 2003-02-26 DE DE60318820T patent/DE60318820T2/de not_active Expired - Lifetime
- 2003-02-26 EP EP03702959A patent/EP1483596B1/en not_active Expired - Lifetime
- 2003-02-26 CN CNB038048787A patent/CN100357754C/zh not_active Expired - Fee Related
- 2003-02-26 WO PCT/IB2003/000760 patent/WO2003075028A1/en active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
CN100357754C (zh) | 2007-12-26 |
DE10209078A1 (de) | 2003-09-18 |
AU2003206075A1 (en) | 2003-09-16 |
EP1483596A1 (en) | 2004-12-08 |
DE60318820D1 (de) | 2008-03-13 |
WO2003075028A1 (en) | 2003-09-12 |
CN1639581A (zh) | 2005-07-13 |
EP1483596B1 (en) | 2008-01-23 |
US7139953B2 (en) | 2006-11-21 |
ATE384957T1 (de) | 2008-02-15 |
DE60318820T2 (de) | 2009-01-22 |
US20050160338A1 (en) | 2005-07-21 |
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