ATE384957T1 - Integerierte schaltung mit prüfschaltung - Google Patents

Integerierte schaltung mit prüfschaltung

Info

Publication number
ATE384957T1
ATE384957T1 AT03702959T AT03702959T ATE384957T1 AT E384957 T1 ATE384957 T1 AT E384957T1 AT 03702959 T AT03702959 T AT 03702959T AT 03702959 T AT03702959 T AT 03702959T AT E384957 T1 ATE384957 T1 AT E384957T1
Authority
AT
Austria
Prior art keywords
circuit
test patterns
control inputs
application circuit
test
Prior art date
Application number
AT03702959T
Other languages
English (en)
Inventor
Friedrich Hapke
Original Assignee
Nxp Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nxp Bv filed Critical Nxp Bv
Application granted granted Critical
Publication of ATE384957T1 publication Critical patent/ATE384957T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/31813—Test pattern generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318385—Random or pseudo-random test pattern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318544—Scanning methods, algorithms and patterns
    • G01R31/318547—Data generators or compressors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318572—Input/Output interfaces
AT03702959T 2002-03-01 2003-02-26 Integerierte schaltung mit prüfschaltung ATE384957T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE10209078A DE10209078A1 (de) 2002-03-01 2002-03-01 Integrierter Schaltkreis mit Testschaltung

Publications (1)

Publication Number Publication Date
ATE384957T1 true ATE384957T1 (de) 2008-02-15

Family

ID=27762582

Family Applications (1)

Application Number Title Priority Date Filing Date
AT03702959T ATE384957T1 (de) 2002-03-01 2003-02-26 Integerierte schaltung mit prüfschaltung

Country Status (8)

Country Link
US (1) US7139953B2 (de)
EP (1) EP1483596B1 (de)
JP (1) JP2005519286A (de)
CN (1) CN100357754C (de)
AT (1) ATE384957T1 (de)
AU (1) AU2003206075A1 (de)
DE (2) DE10209078A1 (de)
WO (1) WO2003075028A1 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7234092B2 (en) 2002-06-11 2007-06-19 On-Chip Technologies, Inc. Variable clocked scan test circuitry and method
TWI242121B (en) * 2004-08-20 2005-10-21 Via Tech Inc Testing method for reconstructing unit
WO2008096209A1 (en) * 2007-02-09 2008-08-14 Freescale Semiconductor, Inc. Device and method for testing a circuit
US7996749B2 (en) * 2007-07-03 2011-08-09 Altera Corporation Signal loss detector for high-speed serial interface of a programmable logic device
US8566656B2 (en) * 2009-12-22 2013-10-22 Nxp B.V. Testing circuit and method

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4503537A (en) * 1982-11-08 1985-03-05 International Business Machines Corporation Parallel path self-testing system
JPS6329276A (ja) * 1986-07-23 1988-02-06 Hitachi Ltd 論理ｌｓｉ
US4974184A (en) * 1988-05-05 1990-11-27 Honeywell Inc. Maximum length pseudo-random test pattern generator via feedback network modification
CA1298668C (en) * 1988-05-05 1992-04-07 Lanae Avra Maximum length pseudo-random test pattern generator via feedback network modification
JP3308099B2 (ja) * 1993-06-16 2002-07-29 花王株式会社 キャップ
KR100208043B1 (ko) * 1996-01-12 1999-07-15 오우라 히로시 시험 패턴 발생기
KR100245795B1 (ko) * 1997-06-30 2000-03-02 윤종용 테스트의 동작 오류 검사 방법
DE19917884C1 (de) * 1999-04-20 2000-11-16 Siemens Ag Schaltung mit eingebautem Selbsttest
DE10038327A1 (de) * 2000-08-05 2002-02-14 Philips Corp Intellectual Pty Integrierter Schaltkreis mit Selbsttest-Schaltung

Also Published As

Publication number Publication date
EP1483596A1 (de) 2004-12-08
JP2005519286A (ja) 2005-06-30
DE60318820D1 (de) 2008-03-13
AU2003206075A1 (en) 2003-09-16
CN1639581A (zh) 2005-07-13
DE10209078A1 (de) 2003-09-18
US7139953B2 (en) 2006-11-21
EP1483596B1 (de) 2008-01-23
CN100357754C (zh) 2007-12-26
DE60318820T2 (de) 2009-01-22
WO2003075028A1 (en) 2003-09-12
US20050160338A1 (en) 2005-07-21

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Legal Events

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