JP2005257404A - 小径部材外表面検査方法 - Google Patents
小径部材外表面検査方法 Download PDFInfo
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- JP2005257404A JP2005257404A JP2004067904A JP2004067904A JP2005257404A JP 2005257404 A JP2005257404 A JP 2005257404A JP 2004067904 A JP2004067904 A JP 2004067904A JP 2004067904 A JP2004067904 A JP 2004067904A JP 2005257404 A JP2005257404 A JP 2005257404A
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- 238000007689 inspection Methods 0.000 title claims abstract description 259
- 238000000034 method Methods 0.000 title claims abstract description 116
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- 230000003287 optical effect Effects 0.000 claims abstract description 32
- 230000008569 process Effects 0.000 claims description 98
- 238000005286 illumination Methods 0.000 claims description 40
- 238000003708 edge detection Methods 0.000 claims description 25
- 230000002950 deficient Effects 0.000 claims description 14
- 238000004364 calculation method Methods 0.000 claims description 13
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- 230000002411 adverse Effects 0.000 description 1
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- 238000006243 chemical reaction Methods 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
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Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004067904A JP2005257404A (ja) | 2004-03-10 | 2004-03-10 | 小径部材外表面検査方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004067904A JP2005257404A (ja) | 2004-03-10 | 2004-03-10 | 小径部材外表面検査方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2005257404A true JP2005257404A (ja) | 2005-09-22 |
| JP2005257404A5 JP2005257404A5 (enrdf_load_stackoverflow) | 2006-02-09 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004067904A Pending JP2005257404A (ja) | 2004-03-10 | 2004-03-10 | 小径部材外表面検査方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2005257404A (enrdf_load_stackoverflow) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009257812A (ja) * | 2008-04-14 | 2009-11-05 | Mitsutoyo Corp | 形状測定方法及び形状測定装置 |
| JP2010085341A (ja) * | 2008-10-02 | 2010-04-15 | Ntn Corp | 球面形状測定装置および球面形状測定方法 |
| CN114274482A (zh) * | 2021-12-24 | 2022-04-05 | 博众精工科技股份有限公司 | 一种检测机构及无线充电垫片后处理系统 |
| CN115031679A (zh) * | 2022-08-09 | 2022-09-09 | 四川至臻光电有限公司 | 一种用于光学元件检测的调心方法、装置及系统 |
-
2004
- 2004-03-10 JP JP2004067904A patent/JP2005257404A/ja active Pending
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009257812A (ja) * | 2008-04-14 | 2009-11-05 | Mitsutoyo Corp | 形状測定方法及び形状測定装置 |
| JP2010085341A (ja) * | 2008-10-02 | 2010-04-15 | Ntn Corp | 球面形状測定装置および球面形状測定方法 |
| CN114274482A (zh) * | 2021-12-24 | 2022-04-05 | 博众精工科技股份有限公司 | 一种检测机构及无线充电垫片后处理系统 |
| CN115031679A (zh) * | 2022-08-09 | 2022-09-09 | 四川至臻光电有限公司 | 一种用于光学元件检测的调心方法、装置及系统 |
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