JP2004524683A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2004524683A5 JP2004524683A5 JP2002562518A JP2002562518A JP2004524683A5 JP 2004524683 A5 JP2004524683 A5 JP 2004524683A5 JP 2002562518 A JP2002562518 A JP 2002562518A JP 2002562518 A JP2002562518 A JP 2002562518A JP 2004524683 A5 JP2004524683 A5 JP 2004524683A5
- Authority
- JP
- Japan
- Prior art keywords
- article
- microstructure
- abrasive
- microstructures
- rigid
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000758 substrate Substances 0.000 claims 8
- 229910052751 metal Inorganic materials 0.000 claims 6
- 239000002184 metal Substances 0.000 claims 6
- 239000002245 particle Substances 0.000 claims 6
- 238000000034 method Methods 0.000 claims 5
- 239000000919 ceramic Substances 0.000 claims 3
- 239000011521 glass Substances 0.000 claims 3
- 239000000203 mixture Substances 0.000 claims 3
- 238000005498 polishing Methods 0.000 claims 3
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims 2
- 239000011230 binding agent Substances 0.000 claims 2
- 239000004065 semiconductor Substances 0.000 claims 2
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 claims 1
- 239000000853 adhesive Substances 0.000 claims 1
- 230000001070 adhesive effect Effects 0.000 claims 1
- 229910052804 chromium Inorganic materials 0.000 claims 1
- 239000011651 chromium Substances 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 claims 1
- 229910052759 nickel Inorganic materials 0.000 claims 1
- -1 polytetrafluoroethylene Polymers 0.000 claims 1
- 229920001343 polytetrafluoroethylene Polymers 0.000 claims 1
- 239000004810 polytetrafluoroethylene Substances 0.000 claims 1
- 229910001220 stainless steel Inorganic materials 0.000 claims 1
- 239000010935 stainless steel Substances 0.000 claims 1
- 229920001169 thermoplastic Polymers 0.000 claims 1
- 229920001187 thermosetting polymer Polymers 0.000 claims 1
- 239000004634 thermosetting polymer Substances 0.000 claims 1
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/778,530 US6612917B2 (en) | 2001-02-07 | 2001-02-07 | Abrasive article suitable for modifying a semiconductor wafer |
| PCT/US2001/019188 WO2002062527A1 (en) | 2001-02-07 | 2001-06-14 | Abrasive article suitable for modifying a semiconductor wafer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2004524683A JP2004524683A (ja) | 2004-08-12 |
| JP2004524683A5 true JP2004524683A5 (enExample) | 2008-07-31 |
Family
ID=25113664
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2002562518A Pending JP2004524683A (ja) | 2001-02-07 | 2001-06-14 | 半導体ウエハを改質するために好適な研磨物品 |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US6612917B2 (enExample) |
| EP (1) | EP1360033B1 (enExample) |
| JP (1) | JP2004524683A (enExample) |
| KR (1) | KR100721883B1 (enExample) |
| AT (1) | ATE355933T1 (enExample) |
| DE (1) | DE60127179T2 (enExample) |
| MY (1) | MY122784A (enExample) |
| TW (1) | TW586986B (enExample) |
| WO (1) | WO2002062527A1 (enExample) |
Families Citing this family (39)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20050266226A1 (en) * | 2000-11-29 | 2005-12-01 | Psiloquest | Chemical mechanical polishing pad and method for selective metal and barrier polishing |
| US6684704B1 (en) * | 2002-09-12 | 2004-02-03 | Psiloquest, Inc. | Measuring the surface properties of polishing pads using ultrasonic reflectance |
| US6632129B2 (en) * | 2001-02-15 | 2003-10-14 | 3M Innovative Properties Company | Fixed abrasive article for use in modifying a semiconductor wafer |
| US7160173B2 (en) * | 2002-04-03 | 2007-01-09 | 3M Innovative Properties Company | Abrasive articles and methods for the manufacture and use of same |
| DE10228344B4 (de) * | 2002-06-25 | 2007-02-08 | Infineon Technologies Ag | Verfahren zur Herstellung von Mikrostrukturen sowie Anordnung von Mikrostrukturen |
| US6838169B2 (en) * | 2002-09-11 | 2005-01-04 | Psiloquest, Inc. | Polishing pad resistant to delamination |
| CN100551623C (zh) | 2003-01-10 | 2009-10-21 | 3M创新有限公司 | 应用于化学机械平面化的垫结构 |
| US6908366B2 (en) | 2003-01-10 | 2005-06-21 | 3M Innovative Properties Company | Method of using a soft subpad for chemical mechanical polishing |
| US7089081B2 (en) * | 2003-01-31 | 2006-08-08 | 3M Innovative Properties Company | Modeling an abrasive process to achieve controlled material removal |
| KR100504941B1 (ko) * | 2003-05-09 | 2005-08-02 | 매그나칩 반도체 유한회사 | 화학적 기계적 연마 장치 |
| US6997777B2 (en) * | 2003-06-17 | 2006-02-14 | Cabot Microelectronics Corporation | Ultrasonic welding method for the manufacture of a polishing pad comprising an optically transmissive region |
| US7160178B2 (en) * | 2003-08-07 | 2007-01-09 | 3M Innovative Properties Company | In situ activation of a three-dimensional fixed abrasive article |
| KR100590202B1 (ko) * | 2003-08-29 | 2006-06-15 | 삼성전자주식회사 | 연마 패드 및 그 형성방법 |
| US8066552B2 (en) * | 2003-10-03 | 2011-11-29 | Applied Materials, Inc. | Multi-layer polishing pad for low-pressure polishing |
| US7654885B2 (en) * | 2003-10-03 | 2010-02-02 | Applied Materials, Inc. | Multi-layer polishing pad |
| CN100341667C (zh) * | 2003-11-21 | 2007-10-10 | 联华电子股份有限公司 | 研磨构件 |
| US6951509B1 (en) * | 2004-03-09 | 2005-10-04 | 3M Innovative Properties Company | Undulated pad conditioner and method of using same |
| US7086939B2 (en) * | 2004-03-19 | 2006-08-08 | Saint-Gobain Performance Plastics Corporation | Chemical mechanical polishing retaining ring with integral polymer backing |
| US7485028B2 (en) | 2004-03-19 | 2009-02-03 | Saint-Gobain Performance Plastics Corporation | Chemical mechanical polishing retaining ring, apparatuses and methods incorporating same |
| US20050227590A1 (en) * | 2004-04-09 | 2005-10-13 | Chien-Min Sung | Fixed abrasive tools and associated methods |
| US7198549B2 (en) * | 2004-06-16 | 2007-04-03 | Cabot Microelectronics Corporation | Continuous contour polishing of a multi-material surface |
| US7179159B2 (en) * | 2005-05-02 | 2007-02-20 | Applied Materials, Inc. | Materials for chemical mechanical polishing |
| US7837888B2 (en) * | 2006-11-13 | 2010-11-23 | Cabot Microelectronics Corporation | Composition and method for damascene CMP |
| US20100009606A1 (en) * | 2008-07-10 | 2010-01-14 | 3M Innovative Properties Company | Conversion assemblage adaptable for use in combination with a surface modifying apparatus and method thereof |
| US20100009607A1 (en) * | 2008-07-10 | 2010-01-14 | 3M Innovative Properties Company | Conversion assemblage adaptable for use in combination with a surface modifying apparatus and method thereof |
| US8469775B2 (en) * | 2008-07-10 | 2013-06-25 | 3M Innovative Properties Company | Conversion assemblage adaptable for use in combination with a surface modifying apparatus and method thereof |
| KR20100096459A (ko) * | 2009-02-24 | 2010-09-02 | 삼성전자주식회사 | 화학적 기계적 연마장치 |
| US9221148B2 (en) | 2009-04-30 | 2015-12-29 | Rdc Holdings, Llc | Method and apparatus for processing sliders for disk drives, and to various processing media for the same |
| US20110104989A1 (en) * | 2009-04-30 | 2011-05-05 | First Principles LLC | Dressing bar for embedding abrasive particles into substrates |
| US8801497B2 (en) * | 2009-04-30 | 2014-08-12 | Rdc Holdings, Llc | Array of abrasive members with resilient support |
| US20100330890A1 (en) | 2009-06-30 | 2010-12-30 | Zine-Eddine Boutaghou | Polishing pad with array of fluidized gimballed abrasive members |
| JP5617387B2 (ja) * | 2010-07-06 | 2014-11-05 | 富士電機株式会社 | 垂直磁気記録媒体用基板の製造方法、および、該製造方法により製造される垂直磁気記録媒体用基板 |
| JP5687118B2 (ja) * | 2011-04-15 | 2015-03-18 | 富士紡ホールディングス株式会社 | 研磨パッド及びその製造方法 |
| CN102658522A (zh) * | 2012-05-16 | 2012-09-12 | 南京英星光学仪器有限公司 | 球面光学元件加工用固结磨料研磨抛光垫 |
| JP6279309B2 (ja) * | 2013-12-20 | 2018-02-14 | スリーエム イノベイティブ プロパティズ カンパニー | 研磨用クッション、研磨装置、研磨方法、及び当該研磨方法により研磨された対象物を含む物品 |
| CN106457508B (zh) * | 2014-05-21 | 2019-05-31 | 富士纺控股株式会社 | 研磨垫及其制造方法 |
| US10613258B2 (en) * | 2016-09-13 | 2020-04-07 | Ubright Optronics Corporation | Optical assembly and the method to make the same |
| JP7273796B2 (ja) * | 2017-08-25 | 2023-05-15 | スリーエム イノベイティブ プロパティズ カンパニー | 表面突起研磨パッド |
| US11331767B2 (en) | 2019-02-01 | 2022-05-17 | Micron Technology, Inc. | Pads for chemical mechanical planarization tools, chemical mechanical planarization tools, and related methods |
Family Cites Families (40)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4576850A (en) | 1978-07-20 | 1986-03-18 | Minnesota Mining And Manufacturing Company | Shaped plastic articles having replicated microstructure surfaces |
| US4244775A (en) | 1979-04-30 | 1981-01-13 | Bell Telephone Laboratories, Incorporated | Process for the chemical etch polishing of semiconductors |
| US4374077A (en) | 1980-02-01 | 1983-02-15 | Minnesota Mining And Manufacturing Company | Process for making information carrying discs |
| CH669138A5 (de) * | 1982-11-22 | 1989-02-28 | Schweizer Schmirgel Schleif | Schleifmittel auf dehnbarer und flexibler unterlage. |
| US4588258A (en) | 1983-09-12 | 1986-05-13 | Minnesota Mining And Manufacturing Company | Cube-corner retroreflective articles having wide angularity in multiple viewing planes |
| US5183597A (en) | 1989-02-10 | 1993-02-02 | Minnesota Mining And Manufacturing Company | Method of molding microstructure bearing composite plastic articles |
| US5109638A (en) * | 1989-03-13 | 1992-05-05 | Microsurface Finishing Products, Inc. | Abrasive sheet material with non-slip backing |
| US5177908A (en) | 1990-01-22 | 1993-01-12 | Micron Technology, Inc. | Polishing pad |
| US5020283A (en) | 1990-01-22 | 1991-06-04 | Micron Technology, Inc. | Polishing pad with uniform abrasion |
| US5230184A (en) | 1991-07-05 | 1993-07-27 | Motorola, Inc. | Distributed polishing head |
| US5212910A (en) | 1991-07-09 | 1993-05-25 | Intel Corporation | Composite polishing pad for semiconductor process |
| US5287663A (en) | 1992-01-21 | 1994-02-22 | National Semiconductor Corporation | Polishing pad and method for polishing semiconductor wafers |
| US6022264A (en) | 1997-02-10 | 2000-02-08 | Rodel Inc. | Polishing pad and methods relating thereto |
| CA2113318A1 (en) * | 1993-01-28 | 1994-07-29 | Robert J. Jantschek | Abrasive attachment system for rotative abrading applications |
| JPH06262532A (ja) * | 1993-03-05 | 1994-09-20 | Fuji Photo Film Co Ltd | 研磨体 |
| JP2891083B2 (ja) * | 1993-12-14 | 1999-05-17 | 信越半導体株式会社 | シート状研磨部材およびウエーハ研磨装置 |
| AU686335B2 (en) | 1994-02-22 | 1998-02-05 | Minnesota Mining And Manufacturing Company | Abrasive article, a method of making same, and a method of using same for finishing |
| US5489233A (en) | 1994-04-08 | 1996-02-06 | Rodel, Inc. | Polishing pads and methods for their use |
| US5607341A (en) | 1994-08-08 | 1997-03-04 | Leach; Michael A. | Method and structure for polishing a wafer during manufacture of integrated circuits |
| BR9509116A (pt) * | 1994-09-30 | 1997-11-18 | Minnesota Mining & Mfg | Artigo abrasivo revestido processos para produzir o mesmo e processo para desbastar uma peça dura |
| US5575707A (en) | 1994-10-11 | 1996-11-19 | Ontrak Systems, Inc. | Polishing pad cluster for polishing a semiconductor wafer |
| DE69606168T2 (de) | 1995-03-02 | 2000-09-28 | Minnesota Mining And Mfg. Co., Saint Paul | Verfahren zur strukturierung eines substates unter verwendung eines strukturierten schleifartikels |
| US5897424A (en) | 1995-07-10 | 1999-04-27 | The United States Of America As Represented By The Secretary Of Commerce | Renewable polishing lap |
| JP3329644B2 (ja) * | 1995-07-21 | 2002-09-30 | 株式会社東芝 | 研磨パッド、研磨装置及び研磨方法 |
| US5958794A (en) | 1995-09-22 | 1999-09-28 | Minnesota Mining And Manufacturing Company | Method of modifying an exposed surface of a semiconductor wafer |
| US5609517A (en) | 1995-11-20 | 1997-03-11 | International Business Machines Corporation | Composite polishing pad |
| US5725421A (en) * | 1996-02-27 | 1998-03-10 | Minnesota Mining And Manufacturing Company | Apparatus for rotative abrading applications |
| JPH09248756A (ja) * | 1996-03-08 | 1997-09-22 | Chiyoda Kk | 研磨布 |
| TW349896B (en) | 1996-05-02 | 1999-01-11 | Applied Materials Inc | Apparatus and chemical mechanical polishing system for polishing a substrate |
| US5692950A (en) | 1996-08-08 | 1997-12-02 | Minnesota Mining And Manufacturing Company | Abrasive construction for semiconductor wafer modification |
| US5897930A (en) | 1996-12-31 | 1999-04-27 | Minnesota Mining And Manufacturing Company | Multiple embossed webs |
| CA2287404C (en) | 1997-04-30 | 2007-10-16 | David A. Kaisaki | Method of planarizing the upper surface of a semiconductor wafer |
| US6019666A (en) | 1997-05-09 | 2000-02-01 | Rodel Holdings Inc. | Mosaic polishing pads and methods relating thereto |
| JPH10329005A (ja) * | 1997-06-03 | 1998-12-15 | Toshiba Corp | 研磨布及び研磨装置 |
| AU9122298A (en) | 1997-08-26 | 1999-03-16 | Ning Wang | A pad for chemical-mechanical polishing and apparatus and methods of manufacturethereof |
| JPH11156699A (ja) | 1997-11-25 | 1999-06-15 | Speedfam Co Ltd | 平面研磨用パッド |
| US6059850A (en) * | 1998-07-15 | 2000-05-09 | 3M Innovative Properties Company | Resilient abrasive article with hard anti-loading size coating |
| US6206759B1 (en) | 1998-11-30 | 2001-03-27 | Micron Technology, Inc. | Polishing pads and planarizing machines for mechanical or chemical-mechanical planarization of microelectronic-device substrate assemblies, and methods for making and using such pads and machines |
| US6217426B1 (en) * | 1999-04-06 | 2001-04-17 | Applied Materials, Inc. | CMP polishing pad |
| US6234875B1 (en) * | 1999-06-09 | 2001-05-22 | 3M Innovative Properties Company | Method of modifying a surface |
-
2001
- 2001-02-07 US US09/778,530 patent/US6612917B2/en not_active Expired - Lifetime
- 2001-06-14 AT AT01948381T patent/ATE355933T1/de not_active IP Right Cessation
- 2001-06-14 DE DE60127179T patent/DE60127179T2/de not_active Expired - Lifetime
- 2001-06-14 WO PCT/US2001/019188 patent/WO2002062527A1/en not_active Ceased
- 2001-06-14 EP EP01948381A patent/EP1360033B1/en not_active Expired - Lifetime
- 2001-06-14 JP JP2002562518A patent/JP2004524683A/ja active Pending
- 2001-06-14 KR KR1020037010437A patent/KR100721883B1/ko not_active Expired - Fee Related
-
2002
- 2002-02-04 TW TW091101881A patent/TW586986B/zh not_active IP Right Cessation
- 2002-02-06 MY MYPI20020402A patent/MY122784A/en unknown
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP2004524683A5 (enExample) | ||
| NL1027081C2 (nl) | Schuurgereedschappen vervaardigd met een zelfontwijkende schuurkorrelmatrix. | |
| JP2004524697A5 (enExample) | ||
| JP7139463B2 (ja) | 積層造形プロセスを用いて形成される研磨パッド及びそれに関連する方法 | |
| EP0972612B1 (en) | Polishing pad | |
| US7659182B2 (en) | Method of wafer-to-wafer bonding | |
| CN110788743B (zh) | 一种磁场可控的缓释磁性物质稠化液流抛光垫及抛光方法 | |
| TWI379735B (en) | Three-dimensional network for chemical mechanical polishing | |
| US20150209933A1 (en) | Abrasive element precursor with precisely shaped features and method of making thereof | |
| JP2002057130A (ja) | Cmp用研磨パッド | |
| CA2596700A1 (en) | Rapid tooling system and methods for manufacturing abrasive articles | |
| JP2004524683A (ja) | 半導体ウエハを改質するために好適な研磨物品 | |
| JP2004524173A5 (enExample) | ||
| TW200927382A (en) | CMP pad conditioners with mosaic abrasive segments and associated methods | |
| CN105364715A (zh) | 抛光修整器 | |
| TWI291212B (en) | Chucking system for nano-manufacturing | |
| CN116963870A (zh) | 用于原位重新生成表面纹理的使用增材制造处理形成的结构 | |
| WO2019069847A1 (ja) | 立体構造砥石とその製造方法 | |
| US20160176017A1 (en) | Grinding Tool and Method of Manufacturing the Same | |
| JP2020531298A5 (enExample) | ||
| JP7704355B2 (ja) | カーボンナノチューブで結束された高耐摩耗性薄膜コーティングを含む複合研磨パッド及びその製造方法 | |
| HK1094176B (en) | Abrasive tools made with a self-avoiding abrasive grain array | |
| JPH05285764A (ja) | 真空チャック | |
| IE84217B1 (en) | Abrasive tools made with a self-avoiding abrasive grain array |