JP2004294436A5 - - Google Patents

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Publication number
JP2004294436A5
JP2004294436A5 JP2004088223A JP2004088223A JP2004294436A5 JP 2004294436 A5 JP2004294436 A5 JP 2004294436A5 JP 2004088223 A JP2004088223 A JP 2004088223A JP 2004088223 A JP2004088223 A JP 2004088223A JP 2004294436 A5 JP2004294436 A5 JP 2004294436A5
Authority
JP
Japan
Prior art keywords
electron beam
ray
detector
anode
generates
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2004088223A
Other languages
English (en)
Japanese (ja)
Other versions
JP2004294436A (ja
JP4693358B2 (ja
Filing date
Publication date
Priority claimed from US10/400,177 external-priority patent/US6826255B2/en
Application filed filed Critical
Publication of JP2004294436A publication Critical patent/JP2004294436A/ja
Publication of JP2004294436A5 publication Critical patent/JP2004294436A5/ja
Application granted granted Critical
Publication of JP4693358B2 publication Critical patent/JP4693358B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

JP2004088223A 2003-03-26 2004-03-25 Ｘ線検査システム及びそれを作動させる方法 Expired - Fee Related JP4693358B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/400,177 US6826255B2 (en) 2003-03-26 2003-03-26 X-ray inspection system and method of operating
US10/400,177 2003-03-26

Publications (3)

Publication Number Publication Date
JP2004294436A JP2004294436A (ja) 2004-10-21
JP2004294436A5 true JP2004294436A5 (enExample) 2007-05-10
JP4693358B2 JP4693358B2 (ja) 2011-06-01

Family

ID=32824987

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004088223A Expired - Fee Related JP4693358B2 (ja) 2003-03-26 2004-03-25 Ｘ線検査システム及びそれを作動させる方法

Country Status (3)

Country Link
US (1) US6826255B2 (enExample)
EP (1) EP1463085B1 (enExample)
JP (1) JP4693358B2 (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7497620B2 (en) * 2006-03-28 2009-03-03 General Electric Company Method and system for a multiple focal spot x-ray system
US7529336B2 (en) 2007-05-31 2009-05-05 Test Research, Inc. System and method for laminography inspection
US8189742B2 (en) * 2007-06-21 2012-05-29 Koninklijke Philips Electronics Nv Fast dose modulation using Z-deflection in a rotaring anode or rotaring frame tube
DE102009037688B4 (de) * 2009-08-17 2011-06-16 Siemens Aktiengesellschaft Vorrichtung und Verfahren zur Steuerung eines Elektronenstrahls für die Erzeugung von Röntgenstrahlung sowie Röntgenröhre
DE102011082878A1 (de) 2011-09-16 2013-03-21 Siemens Aktiengesellschaft Röntgendetektor einer gitterbasierten Phasenkontrast-Röntgenvorrichtung und Verfahren zum Betreiben einer gitterbasierten Phasenkontrast-Röntgenvorrichtung
WO2018073554A1 (en) * 2016-10-19 2018-04-26 Adaptix Ltd. X-ray source
DE102020134487A1 (de) * 2020-12-21 2022-06-23 Helmut Fischer GmbH Institut für Elektronik und Messtechnik Röntgenquelle und Betriebsverfahren hierfür
US12035451B2 (en) * 2021-04-23 2024-07-09 Carl Zeiss X-Ray Microscopy Inc. Method and system for liquid cooling isolated x-ray transmission target
US11961694B2 (en) 2021-04-23 2024-04-16 Carl Zeiss X-ray Microscopy, Inc. Fiber-optic communication for embedded electronics in x-ray generator
US11864300B2 (en) 2021-04-23 2024-01-02 Carl Zeiss X-ray Microscopy, Inc. X-ray source with liquid cooled source coils

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2335014A (en) * 1942-01-13 1943-11-23 Gen Electric Magnetic induction accelerator
US2394070A (en) * 1942-06-02 1946-02-05 Gen Electric Magnetic induction accelerator
NL270945A (enExample) * 1961-03-02
US3149257A (en) * 1962-04-25 1964-09-15 Dean E Wintermute X-ray devices for use on the human body
US4048496A (en) * 1972-05-08 1977-09-13 Albert Richard D Selectable wavelength X-ray source, spectrometer and assay method
US3822410A (en) * 1972-05-08 1974-07-02 J Madey Stimulated emission of radiation in periodically deflected electron beam
US4007376A (en) * 1975-08-07 1977-02-08 Samuel Morton Zimmerman Video x-ray imaging system and method
JPS5333594A (en) * 1976-09-09 1978-03-29 Jeol Ltd X-ray photographing method
JPS5423492A (en) * 1977-07-25 1979-02-22 Jeol Ltd X-ray generator
US4408338A (en) * 1981-12-31 1983-10-04 International Business Machines Corporation Pulsed electromagnetic radiation source having a barrier for discharged debris
DE3222515C2 (de) * 1982-06-16 1986-05-28 Feinfocus Röntgensysteme GmbH, 3050 Wunstorf Feinfokus-Röntgenröhre und Verfahren zu ihrem Betrieb
JPS59221093A (ja) * 1983-05-31 1984-12-12 Toshiba Corp Ｘ線画像入力装置
JPS59231985A (ja) * 1983-06-15 1984-12-26 Toshiba Corp Ｘ線診断装置
US4926452A (en) * 1987-10-30 1990-05-15 Four Pi Systems Corporation Automated laminography system for inspection of electronics
JPH0184610U (enExample) * 1987-11-27 1989-06-06
JPH03183907A (ja) * 1989-12-13 1991-08-09 Fujitsu Ltd 物体検査装置及び物体検査方法
JPH03269299A (ja) * 1990-03-19 1991-11-29 Fujitsu Ltd 物体検査装置
US6167110A (en) * 1997-11-03 2000-12-26 General Electric Company High voltage x-ray and conventional radiography imaging apparatus and method
WO1999039189A2 (en) * 1998-01-28 1999-08-05 American Science And Engineering, Inc. Gated transmission and scatter detection for x-ray imaging
JP4127742B2 (ja) * 1999-06-16 2008-07-30 浜松ホトニクス株式会社 Ｘ線検査装置
US6487274B2 (en) * 2001-01-29 2002-11-26 Siemens Medical Solutions Usa, Inc. X-ray target assembly and radiation therapy systems and methods
DE10224292A1 (de) * 2002-05-31 2003-12-11 Philips Intellectual Property Röntgenröhre

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