JP4693358B2 - X線検査システム及びそれを作動させる方法 - Google Patents
X線検査システム及びそれを作動させる方法 Download PDFInfo
- Publication number
- JP4693358B2 JP4693358B2 JP2004088223A JP2004088223A JP4693358B2 JP 4693358 B2 JP4693358 B2 JP 4693358B2 JP 2004088223 A JP2004088223 A JP 2004088223A JP 2004088223 A JP2004088223 A JP 2004088223A JP 4693358 B2 JP4693358 B2 JP 4693358B2
- Authority
- JP
- Japan
- Prior art keywords
- ray
- electron beam
- ray source
- detector
- anode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/24—Tubes wherein the point of impact of the cathode ray on the anode or anticathode is movable relative to the surface thereof
- H01J35/30—Tubes wherein the point of impact of the cathode ray on the anode or anticathode is movable relative to the surface thereof by deflection of the cathode ray
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/24—Tubes wherein the point of impact of the cathode ray on the anode or anticathode is movable relative to the surface thereof
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- X-Ray Techniques (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/400,177 US6826255B2 (en) | 2003-03-26 | 2003-03-26 | X-ray inspection system and method of operating |
| US10/400,177 | 2003-03-26 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2004294436A JP2004294436A (ja) | 2004-10-21 |
| JP2004294436A5 JP2004294436A5 (enExample) | 2007-05-10 |
| JP4693358B2 true JP4693358B2 (ja) | 2011-06-01 |
Family
ID=32824987
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004088223A Expired - Fee Related JP4693358B2 (ja) | 2003-03-26 | 2004-03-25 | X線検査システム及びそれを作動させる方法 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US6826255B2 (enExample) |
| EP (1) | EP1463085B1 (enExample) |
| JP (1) | JP4693358B2 (enExample) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7497620B2 (en) * | 2006-03-28 | 2009-03-03 | General Electric Company | Method and system for a multiple focal spot x-ray system |
| US7529336B2 (en) | 2007-05-31 | 2009-05-05 | Test Research, Inc. | System and method for laminography inspection |
| US8189742B2 (en) * | 2007-06-21 | 2012-05-29 | Koninklijke Philips Electronics Nv | Fast dose modulation using Z-deflection in a rotaring anode or rotaring frame tube |
| DE102009037688B4 (de) * | 2009-08-17 | 2011-06-16 | Siemens Aktiengesellschaft | Vorrichtung und Verfahren zur Steuerung eines Elektronenstrahls für die Erzeugung von Röntgenstrahlung sowie Röntgenröhre |
| DE102011082878A1 (de) | 2011-09-16 | 2013-03-21 | Siemens Aktiengesellschaft | Röntgendetektor einer gitterbasierten Phasenkontrast-Röntgenvorrichtung und Verfahren zum Betreiben einer gitterbasierten Phasenkontrast-Röntgenvorrichtung |
| WO2018073554A1 (en) * | 2016-10-19 | 2018-04-26 | Adaptix Ltd. | X-ray source |
| DE102020134487A1 (de) * | 2020-12-21 | 2022-06-23 | Helmut Fischer GmbH Institut für Elektronik und Messtechnik | Röntgenquelle und Betriebsverfahren hierfür |
| US12035451B2 (en) * | 2021-04-23 | 2024-07-09 | Carl Zeiss X-Ray Microscopy Inc. | Method and system for liquid cooling isolated x-ray transmission target |
| US11961694B2 (en) | 2021-04-23 | 2024-04-16 | Carl Zeiss X-ray Microscopy, Inc. | Fiber-optic communication for embedded electronics in x-ray generator |
| US11864300B2 (en) | 2021-04-23 | 2024-01-02 | Carl Zeiss X-ray Microscopy, Inc. | X-ray source with liquid cooled source coils |
Family Cites Families (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2335014A (en) * | 1942-01-13 | 1943-11-23 | Gen Electric | Magnetic induction accelerator |
| US2394070A (en) * | 1942-06-02 | 1946-02-05 | Gen Electric | Magnetic induction accelerator |
| NL270945A (enExample) * | 1961-03-02 | |||
| US3149257A (en) * | 1962-04-25 | 1964-09-15 | Dean E Wintermute | X-ray devices for use on the human body |
| US4048496A (en) * | 1972-05-08 | 1977-09-13 | Albert Richard D | Selectable wavelength X-ray source, spectrometer and assay method |
| US3822410A (en) * | 1972-05-08 | 1974-07-02 | J Madey | Stimulated emission of radiation in periodically deflected electron beam |
| US4007376A (en) * | 1975-08-07 | 1977-02-08 | Samuel Morton Zimmerman | Video x-ray imaging system and method |
| JPS5333594A (en) * | 1976-09-09 | 1978-03-29 | Jeol Ltd | X-ray photographing method |
| JPS5423492A (en) * | 1977-07-25 | 1979-02-22 | Jeol Ltd | X-ray generator |
| US4408338A (en) * | 1981-12-31 | 1983-10-04 | International Business Machines Corporation | Pulsed electromagnetic radiation source having a barrier for discharged debris |
| DE3222515C2 (de) * | 1982-06-16 | 1986-05-28 | Feinfocus Röntgensysteme GmbH, 3050 Wunstorf | Feinfokus-Röntgenröhre und Verfahren zu ihrem Betrieb |
| JPS59221093A (ja) * | 1983-05-31 | 1984-12-12 | Toshiba Corp | X線画像入力装置 |
| JPS59231985A (ja) * | 1983-06-15 | 1984-12-26 | Toshiba Corp | X線診断装置 |
| US4926452A (en) * | 1987-10-30 | 1990-05-15 | Four Pi Systems Corporation | Automated laminography system for inspection of electronics |
| JPH0184610U (enExample) * | 1987-11-27 | 1989-06-06 | ||
| JPH03183907A (ja) * | 1989-12-13 | 1991-08-09 | Fujitsu Ltd | 物体検査装置及び物体検査方法 |
| JPH03269299A (ja) * | 1990-03-19 | 1991-11-29 | Fujitsu Ltd | 物体検査装置 |
| US6167110A (en) * | 1997-11-03 | 2000-12-26 | General Electric Company | High voltage x-ray and conventional radiography imaging apparatus and method |
| WO1999039189A2 (en) * | 1998-01-28 | 1999-08-05 | American Science And Engineering, Inc. | Gated transmission and scatter detection for x-ray imaging |
| JP4127742B2 (ja) * | 1999-06-16 | 2008-07-30 | 浜松ホトニクス株式会社 | X線検査装置 |
| US6487274B2 (en) * | 2001-01-29 | 2002-11-26 | Siemens Medical Solutions Usa, Inc. | X-ray target assembly and radiation therapy systems and methods |
| DE10224292A1 (de) * | 2002-05-31 | 2003-12-11 | Philips Intellectual Property | Röntgenröhre |
-
2003
- 2003-03-26 US US10/400,177 patent/US6826255B2/en not_active Expired - Fee Related
-
2004
- 2004-03-25 JP JP2004088223A patent/JP4693358B2/ja not_active Expired - Fee Related
- 2004-03-26 EP EP04251830.8A patent/EP1463085B1/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JP2004294436A (ja) | 2004-10-21 |
| EP1463085B1 (en) | 2014-12-17 |
| US6826255B2 (en) | 2004-11-30 |
| US20040190675A1 (en) | 2004-09-30 |
| EP1463085A3 (en) | 2010-05-19 |
| EP1463085A2 (en) | 2004-09-29 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US9259194B2 (en) | Method and apparatus for advanced X-ray imaging | |
| US7580500B2 (en) | Computer tomography system having a ring-shaped stationary X-ray source enclosing a measuring field | |
| US7949102B2 (en) | Multiple focal spot X-ray tube with multiple electron beam manipulating units | |
| RU2446743C2 (ru) | Анодный сканер с модуляцией для компьютерной томографии | |
| US20100074392A1 (en) | X-ray tube with multiple electron sources and common electron deflection unit | |
| US20120033790A1 (en) | Method and apparatus for radiation resistant imaging | |
| JP5675794B2 (ja) | 2つの焦点スポットを生成するx線管及びこれを有する医療デバイス | |
| JP2009534669A (ja) | 離散供給源のアレイおよび複数の平行ビームを用いた荷物および人間のx線画像化 | |
| JP2014130815A (ja) | 分散型x線を発生するデバイス及びその方法 | |
| JP4693358B2 (ja) | X線検査システム及びそれを作動させる方法 | |
| US20110170663A1 (en) | Medical x-ray imaging system | |
| JP5295503B2 (ja) | X線発生装置およびx線ct装置 | |
| DE102013107736A1 (de) | Röntgenprüfvorrichtung für die Materialprüfung und Verfahren zur Erzeugung hochaufgelöster Projektionen eines Prüflings mittels Röntgenstrahlen | |
| CN103430630B (zh) | X射线管球以及x射线ct装置 | |
| WO2010094588A2 (en) | X-ray source comprising a field emission cathode | |
| JP5486762B2 (ja) | 複数焦点x線システムのための方法及びシステム | |
| US7643606B2 (en) | X-ray computed tomography apparatus with light beam-controlled x-ray source | |
| RU2578675C1 (ru) | Многолучевая рентгеновская трубка | |
| JPH10295682A (ja) | 高空間分解能高速x線ctスキャナ | |
| JP2006029886A (ja) | ステレオグラフ画像取得方法およびその装置 | |
| CN114732426B (zh) | 一种三维超快x光ct成像系统及成像方法 | |
| JP5853847B2 (ja) | 粒子線分布の測定方法及び装置 | |
| JP7662452B2 (ja) | X線診断装置およびトモシンセシス画像生成方法 | |
| JP3210357B2 (ja) | X線断層撮影装置 | |
| JPS63161944A (ja) | X線断層撮影装置 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20070315 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20070315 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20090703 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20090714 |
|
| A601 | Written request for extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A601 Effective date: 20091009 |
|
| RD02 | Notification of acceptance of power of attorney |
Free format text: JAPANESE INTERMEDIATE CODE: A7422 Effective date: 20091009 |
|
| RD04 | Notification of resignation of power of attorney |
Free format text: JAPANESE INTERMEDIATE CODE: A7424 Effective date: 20091009 |
|
| A602 | Written permission of extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A602 Effective date: 20091015 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20100108 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20100601 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20100825 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20110125 |
|
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20110222 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20140304 Year of fee payment: 3 |
|
| R150 | Certificate of patent or registration of utility model |
Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| LAPS | Cancellation because of no payment of annual fees |