JP2003347373A5 - - Google Patents

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Publication number
JP2003347373A5
JP2003347373A5 JP2003133508A JP2003133508A JP2003347373A5 JP 2003347373 A5 JP2003347373 A5 JP 2003347373A5 JP 2003133508 A JP2003133508 A JP 2003133508A JP 2003133508 A JP2003133508 A JP 2003133508A JP 2003347373 A5 JP2003347373 A5 JP 2003347373A5
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2003133508A
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JP2003347373A (ja
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Publication date
Priority claimed from US10/155,651 external-priority patent/US7412639B2/en
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Publication of JP2003347373A publication Critical patent/JP2003347373A/ja
Publication of JP2003347373A5 publication Critical patent/JP2003347373A5/ja
Pending legal-status Critical Current

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JP2003133508A 2002-05-24 2003-05-12 ウエハ上の回路を試験するシステム及び方法 Pending JP2003347373A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/155,651 US7412639B2 (en) 2002-05-24 2002-05-24 System and method for testing circuitry on a wafer
US155651 2002-05-24

Publications (2)

Publication Number Publication Date
JP2003347373A JP2003347373A (ja) 2003-12-05
JP2003347373A5 true JP2003347373A5 (ja) 2006-06-15

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ID=22556237

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003133508A Pending JP2003347373A (ja) 2002-05-24 2003-05-12 ウエハ上の回路を試験するシステム及び方法

Country Status (3)

Country Link
US (1) US7412639B2 (ja)
JP (1) JP2003347373A (ja)
GB (1) GB2391706B (ja)

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JP5269896B2 (ja) * 2008-06-02 2013-08-21 株式会社アドバンテスト 試験用ウエハユニット、および、試験システム
JP4335961B1 (ja) * 2008-09-01 2009-09-30 Ｎｅｃエレクトロニクス株式会社 テスト回路
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US10451653B2 (en) * 2014-12-19 2019-10-22 Teradyne, Inc. Controlling a per-pin measurement unit
US9824774B2 (en) 2015-03-16 2017-11-21 Nxp Usa, Inc. Magnetic field programming of electronic devices on a wafer
US9607911B2 (en) 2015-03-16 2017-03-28 Nxp Usa, Inc. Optical programming of electronic devices on a wafer
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US10429441B2 (en) * 2017-05-24 2019-10-01 Qualcomm Incorporated Efficient test architecture for multi-die chips
GB2581861B (en) * 2018-09-14 2022-10-05 Sino Ic Tech Co Ltd IC Test Information Management System Based on Industrial Internet
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