JP2003064307A5 - - Google Patents

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Publication number
JP2003064307A5
JP2003064307A5 JP2001257113A JP2001257113A JP2003064307A5 JP 2003064307 A5 JP2003064307 A5 JP 2003064307A5 JP 2001257113 A JP2001257113 A JP 2001257113A JP 2001257113 A JP2001257113 A JP 2001257113A JP 2003064307 A5 JP2003064307 A5 JP 2003064307A5
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JP
Japan
Prior art keywords
group
silica
resin
less
based film
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Pending
Application number
JP2001257113A
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English (en)
Japanese (ja)
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JP2003064307A (ja
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Application filed filed Critical
Priority to JP2001257113A priority Critical patent/JP2003064307A/ja
Priority claimed from JP2001257113A external-priority patent/JP2003064307A/ja
Publication of JP2003064307A publication Critical patent/JP2003064307A/ja
Publication of JP2003064307A5 publication Critical patent/JP2003064307A5/ja
Pending legal-status Critical Current

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JP2001257113A 2001-08-28 2001-08-28 シリカ系被膜、シリカ系被膜形成用組成物、シリカ系被膜の製造方法及び電子部品 Pending JP2003064307A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001257113A JP2003064307A (ja) 2001-08-28 2001-08-28 シリカ系被膜、シリカ系被膜形成用組成物、シリカ系被膜の製造方法及び電子部品

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001257113A JP2003064307A (ja) 2001-08-28 2001-08-28 シリカ系被膜、シリカ系被膜形成用組成物、シリカ系被膜の製造方法及び電子部品

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2012106042A Division JP2012188668A (ja) 2012-05-07 2012-05-07 シリカ系被膜、シリカ系被膜形成用組成物、シリカ系被膜の製造方法及び電子部品

Publications (2)

Publication Number Publication Date
JP2003064307A JP2003064307A (ja) 2003-03-05
JP2003064307A5 true JP2003064307A5 (enExample) 2005-10-13

Family

ID=19084825

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001257113A Pending JP2003064307A (ja) 2001-08-28 2001-08-28 シリカ系被膜、シリカ系被膜形成用組成物、シリカ系被膜の製造方法及び電子部品

Country Status (1)

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JP (1) JP2003064307A (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8557877B2 (en) 2009-06-10 2013-10-15 Honeywell International Inc. Anti-reflective coatings for optically transparent substrates
US8864898B2 (en) 2011-05-31 2014-10-21 Honeywell International Inc. Coating formulations for optical elements
US8901268B2 (en) 2004-08-03 2014-12-02 Ahila Krishnamoorthy Compositions, layers and films for optoelectronic devices, methods of production and uses thereof

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7682701B2 (en) 2002-02-27 2010-03-23 Hitachi Chemical Co., Ltd. Composition for forming silica based coating film, silica based coating film and method for preparation thereof, and electronic parts
CN1320073C (zh) * 2002-02-27 2007-06-06 日立化成工业株式会社 二氧化硅涂膜形成用组合物、二氧化硅涂膜及其制造方法、以及电子部件
US7687590B2 (en) 2002-02-27 2010-03-30 Hitachi Chemical Company, Ltd. Composition for forming silica based coating film, silica based coating film and method for preparation thereof, and electronic parts
JP2004277502A (ja) * 2003-03-13 2004-10-07 Hitachi Chem Co Ltd シリカ系被膜形成用組成物、シリカ系被膜及びその形成方法並びにシリカ系被膜を備える電子部品
TW200605220A (en) * 2004-06-21 2006-02-01 Hitachi Chemical Co Ltd Organic siloxane film, semiconductor device using same, flat panel display and raw material liquid
US20060047034A1 (en) 2004-09-02 2006-03-02 Haruaki Sakurai Composition for forming silica-based film, method of forming silica-based film, and electronic component provided with silica-based film
WO2006068181A1 (ja) * 2004-12-21 2006-06-29 Hitachi Chemical Company, Ltd. 被膜、シリカ系被膜及びその形成方法、シリカ系被膜形成用組成物、並びに電子部品
JP2006213908A (ja) * 2004-12-21 2006-08-17 Hitachi Chem Co Ltd シリカ系被膜形成用組成物、シリカ系被膜の形成方法、シリカ系被膜、及び、電子部品
JP4757525B2 (ja) * 2005-04-13 2011-08-24 東京応化工業株式会社 シリカ系被膜形成用組成物
KR100930854B1 (ko) * 2005-04-13 2009-12-10 도오꾜오까고오교 가부시끼가이샤 실리카계 피막 형성용 조성물
JP4757524B2 (ja) * 2005-04-13 2011-08-24 東京応化工業株式会社 シリカ系被膜形成用組成物
CN101631745B (zh) 2007-03-13 2012-10-17 三菱化学株式会社 二氧化硅多孔质体、光学用途层积体和组合物、以及二氧化硅多孔质体的制造方法
JP6803842B2 (ja) 2015-04-13 2020-12-23 ハネウェル・インターナショナル・インコーポレーテッドHoneywell International Inc. オプトエレクトロニクス用途のためのポリシロキサン製剤及びコーティング

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3287119B2 (ja) * 1994-07-13 2002-05-27 住友化学工業株式会社 シリカ系絶縁膜形成用塗布液
JP3328545B2 (ja) * 1997-05-28 2002-09-24 東レ・ダウコーニング・シリコーン株式会社 半導体装置の製造方法
US6592980B1 (en) * 1999-12-07 2003-07-15 Air Products And Chemicals, Inc. Mesoporous films having reduced dielectric constants
JP4195773B2 (ja) * 2000-04-10 2008-12-10 Jsr株式会社 層間絶縁膜形成用組成物、層間絶縁膜の形成方法およびシリカ系層間絶縁膜
US6576568B2 (en) * 2000-04-04 2003-06-10 Applied Materials, Inc. Ionic additives for extreme low dielectric constant chemical formulations

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8901268B2 (en) 2004-08-03 2014-12-02 Ahila Krishnamoorthy Compositions, layers and films for optoelectronic devices, methods of production and uses thereof
US8557877B2 (en) 2009-06-10 2013-10-15 Honeywell International Inc. Anti-reflective coatings for optically transparent substrates
US8784985B2 (en) 2009-06-10 2014-07-22 Honeywell International Inc. Anti-reflective coatings for optically transparent substrates
US8864898B2 (en) 2011-05-31 2014-10-21 Honeywell International Inc. Coating formulations for optical elements

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