JP2002181738A - Ｘ線システム - Google Patents

Ｘ線システム

Info

Publication number
JP2002181738A
JP2002181738A JP2001290200A JP2001290200A JP2002181738A JP 2002181738 A JP2002181738 A JP 2002181738A JP 2001290200 A JP2001290200 A JP 2001290200A JP 2001290200 A JP2001290200 A JP 2001290200A JP 2002181738 A JP2002181738 A JP 2002181738A
Authority
JP
Japan
Prior art keywords
image
plane
carriage
support
imaging
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2001290200A
Other languages
English (en)
Japanese (ja)
Other versions
JP2002181738A5 (enExample
Inventor
Robert Sykes
サイクス ロバート
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
DIGI PRECISION IND Ltd
Original Assignee
DIGI PRECISION IND Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=26245036&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=JP2002181738(A) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Priority claimed from GB0023194A external-priority patent/GB0023194D0/en
Priority claimed from GB0106153A external-priority patent/GB0106153D0/en
Application filed by DIGI PRECISION IND Ltd filed Critical DIGI PRECISION IND Ltd
Publication of JP2002181738A publication Critical patent/JP2002181738A/ja
Publication of JP2002181738A5 publication Critical patent/JP2002181738A5/ja
Withdrawn legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/02—Constructional details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/64—Circuit arrangements for X-ray apparatus incorporating image intensifiers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Wire Bonding (AREA)
  • X-Ray Techniques (AREA)
JP2001290200A 2000-09-21 2001-09-21 Ｘ線システム Withdrawn JP2002181738A (ja)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
GB0023194.4 2000-09-21
GB0023194A GB0023194D0 (en) 2000-09-21 2000-09-21 X-ray system
GB0106153.0 2001-03-13
GB0106153A GB0106153D0 (en) 2001-03-13 2001-03-13 X-Ray system

Publications (2)

Publication Number Publication Date
JP2002181738A true JP2002181738A (ja) 2002-06-26
JP2002181738A5 JP2002181738A5 (enExample) 2009-11-12

Family

ID=26245036

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001290200A Withdrawn JP2002181738A (ja) 2000-09-21 2001-09-21 Ｘ線システム

Country Status (4)

Country Link
US (1) US6672761B2 (enExample)
EP (2) EP2063261A1 (enExample)
JP (1) JP2002181738A (enExample)
DE (2) DE20122889U1 (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006162335A (ja) * 2004-12-03 2006-06-22 Nagoya Electric Works Co Ltd Ｘ線検査装置、ｘ線検査方法およびｘ線検査プログラム
JP2017514147A (ja) * 2014-04-04 2017-06-01 ノードソン コーポレーションＮｏｒｄｓｏｎ Ｃｏｒｐｏｒａｔｉｏｎ Ｘ線検査装置

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7303334B2 (en) * 2004-03-25 2007-12-04 Worldwide Innovations & Technologies, Inc. Radiation attenuation system
DE102005020149A1 (de) 2005-04-29 2006-11-09 Yxlon International X-Ray Gmbh Verfahren zur automatischen Fehlererkennung in Prüfteilen mittels einer Röntgenprüfanlage
US9129715B2 (en) 2012-09-05 2015-09-08 SVXR, Inc. High speed x-ray inspection microscope
CN110095482B (zh) * 2019-06-18 2024-01-12 丹东华日理学电气有限公司 一种自定位固定管状物实时成像检测装置
US20250114051A1 (en) * 2023-10-09 2025-04-10 Kub Technologies, Inc. Dba Kubtec System and method for cabinet x-ray systems with 3-d optical imaging reconstruction

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3330552A1 (de) * 1983-08-24 1985-03-07 Siemens Ag Roentgendiagnostikanlage mit einer patientenlagerstatt und einer primaerstrahlenblende
US5132996A (en) * 1988-10-28 1992-07-21 Kermath Manufacturing Company X-ray imaging system with a sweeping linear detector
US5123056A (en) * 1990-02-02 1992-06-16 Siemens Medical Systems, Inc. Whole-leg x-ray image processing and display techniques
DE4005111A1 (de) * 1990-02-17 1991-08-22 Philips Patentverwaltung Roentgendiagnostikgeraet mit mitteln zur vergroesserten visuellen darstellung eines waehlbaren ausschnitts des gesamt-bildbereichs
JP3092828B2 (ja) * 1992-04-30 2000-09-25 株式会社日立製作所 Ｘ線透過像検出によるはんだ付け検査方法とその装置
DE4224615B4 (de) * 1992-07-25 2004-04-29 Instrumentarium Imaging Ziehm Gmbh Röntgendiagnostikeinrichtung mit Bildverstärker-Fernsehkette
EP0599345B1 (en) * 1992-11-27 2002-06-05 Fuji Photo Film Co., Ltd. Method for adjusting positions of radiation images
US5394455A (en) * 1993-04-30 1995-02-28 The Regents Of The University Of California Digitally aided microfluoroscopy and fluorospot system and method of using the same
US6501818B1 (en) * 1997-11-26 2002-12-31 Ge Medical Systems Global Technology Company, Llc Apparatus and methods for displaying computed tomography fluoroscopy images including data transfer provided over a network
DE19755764C2 (de) * 1997-12-16 2003-07-31 Instrumentarium Imaging Ziehm Verfahren zum Betrieb einer Röntgendiagnostikeinrichtung mit einer Röntgenbildwandler-Fernsehkette und Vorrichtung zur Durchführung eines solchen Verfahrens
US6088424A (en) * 1998-09-22 2000-07-11 Vf Works, Inc. Apparatus and method for producing a picture-in-a-picture motion x-ray image
US6421412B1 (en) * 1998-12-31 2002-07-16 General Electric Company Dual cardiac CT scanner
US6385283B1 (en) * 1999-11-24 2002-05-07 Hologic, Inc. Device and method for determining future fracture risk
US6396897B1 (en) * 2000-04-18 2002-05-28 Ge Medical Systems Global Technology Company, Llc Method and apparatus for selecting retrospective reconstruction parameters

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006162335A (ja) * 2004-12-03 2006-06-22 Nagoya Electric Works Co Ltd Ｘ線検査装置、ｘ線検査方法およびｘ線検査プログラム
JP2017514147A (ja) * 2014-04-04 2017-06-01 ノードソン コーポレーションＮｏｒｄｓｏｎ Ｃｏｒｐｏｒａｔｉｏｎ Ｘ線検査装置
JP2017516114A (ja) * 2014-04-04 2017-06-15 ノードソン コーポレーションＮｏｒｄｓｏｎ Ｃｏｒｐｏｒａｔｉｏｎ 半導体ウェハを検査するためのｘ線検査装置
US10393675B2 (en) 2014-04-04 2019-08-27 Nordson Corporation X-ray inspection apparatus
US10948425B2 (en) 2014-04-04 2021-03-16 Nordson Corporation X-ray inspection apparatus for inspecting semiconductor wafers

Also Published As

Publication number Publication date
US6672761B2 (en) 2004-01-06
US20020090057A1 (en) 2002-07-11
EP2063261A1 (en) 2009-05-27
DE20122889U1 (de) 2009-05-20
EP1191827A2 (en) 2002-03-27
EP1191827A3 (en) 2002-04-10
EP1191827B1 (en) 2009-03-18
DE60137996D1 (de) 2009-04-30

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