JP2001067892A - 半導体記憶装置と半導体装置 - Google Patents

半導体記憶装置と半導体装置

Info

Publication number
JP2001067892A
JP2001067892A JP24237199A JP24237199A JP2001067892A JP 2001067892 A JP2001067892 A JP 2001067892A JP 24237199 A JP24237199 A JP 24237199A JP 24237199 A JP24237199 A JP 24237199A JP 2001067892 A JP2001067892 A JP 2001067892A
Authority
JP
Japan
Prior art keywords
address
circuit
memory
address signal
defective
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP24237199A
Other languages
English (en)
Japanese (ja)
Other versions
JP2001067892A5 (enExample
Inventor
Shinji Horiguchi
真志 堀口
Riichi Tachibana
利一 立花
Yozo Saiki
陽造 齋木
Toshinori Taruishi
敏伯 垂石
Yoshinobu Nakagome
儀延 中込
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Japan Display Inc
Original Assignee
Hitachi Device Engineering Co Ltd
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Device Engineering Co Ltd, Hitachi Ltd filed Critical Hitachi Device Engineering Co Ltd
Priority to JP24237199A priority Critical patent/JP2001067892A/ja
Publication of JP2001067892A publication Critical patent/JP2001067892A/ja
Publication of JP2001067892A5 publication Critical patent/JP2001067892A5/ja
Pending legal-status Critical Current

Links

Landscapes

  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Dram (AREA)
JP24237199A 1999-08-30 1999-08-30 半導体記憶装置と半導体装置 Pending JP2001067892A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP24237199A JP2001067892A (ja) 1999-08-30 1999-08-30 半導体記憶装置と半導体装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24237199A JP2001067892A (ja) 1999-08-30 1999-08-30 半導体記憶装置と半導体装置

Publications (2)

Publication Number Publication Date
JP2001067892A true JP2001067892A (ja) 2001-03-16
JP2001067892A5 JP2001067892A5 (enExample) 2005-08-25

Family

ID=17088188

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24237199A Pending JP2001067892A (ja) 1999-08-30 1999-08-30 半導体記憶装置と半導体装置

Country Status (1)

Country Link
JP (1) JP2001067892A (enExample)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100467367B1 (ko) * 2002-06-11 2005-01-24 주식회사 하이닉스반도체 반도체 기억 장치의 컬럼 리던던시 회로
JP2005339674A (ja) * 2004-05-27 2005-12-08 Hitachi Ltd 半導体記憶装置
JP2007158237A (ja) * 2005-12-08 2007-06-21 Elpida Memory Inc 積層型半導体装置
US7567476B2 (en) 2005-03-30 2009-07-28 Elpida Memory, Inc. Semiconductor memory device and testing method thereof
US7602659B2 (en) 2004-04-28 2009-10-13 Hynix Semiconductor Inc. Memory device having shared fail-repairing circuit capable of repairing row or column fails in memory cell arrays of memory banks
WO2018173851A1 (ja) * 2017-03-24 2018-09-27 ソニーセミコンダクタソリューションズ株式会社 記憶装置
CN111755038A (zh) * 2019-03-29 2020-10-09 拉碧斯半导体株式会社 半导体存储装置
US20230176754A1 (en) * 2021-12-07 2023-06-08 Micron Technology, Inc. Shared components in fuse match logic

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100467367B1 (ko) * 2002-06-11 2005-01-24 주식회사 하이닉스반도체 반도체 기억 장치의 컬럼 리던던시 회로
US7602659B2 (en) 2004-04-28 2009-10-13 Hynix Semiconductor Inc. Memory device having shared fail-repairing circuit capable of repairing row or column fails in memory cell arrays of memory banks
JP2005339674A (ja) * 2004-05-27 2005-12-08 Hitachi Ltd 半導体記憶装置
US7567476B2 (en) 2005-03-30 2009-07-28 Elpida Memory, Inc. Semiconductor memory device and testing method thereof
JP2007158237A (ja) * 2005-12-08 2007-06-21 Elpida Memory Inc 積層型半導体装置
WO2018173851A1 (ja) * 2017-03-24 2018-09-27 ソニーセミコンダクタソリューションズ株式会社 記憶装置
JPWO2018173851A1 (ja) * 2017-03-24 2020-01-23 ソニーセミコンダクタソリューションズ株式会社 記憶装置
US10943668B2 (en) 2017-03-24 2021-03-09 Sony Semiconductor Solutions Corporation Storage device for storing data using a resistive random access storage element
CN111755038A (zh) * 2019-03-29 2020-10-09 拉碧斯半导体株式会社 半导体存储装置
US20230176754A1 (en) * 2021-12-07 2023-06-08 Micron Technology, Inc. Shared components in fuse match logic
US11954338B2 (en) * 2021-12-07 2024-04-09 Micron Technology, Inc. Shared components in fuse match logic

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