IN189781B - - Google Patents

Info

Publication number
IN189781B
IN189781B IN1728CA1996A IN189781B IN 189781 B IN189781 B IN 189781B IN 1728CA1996 A IN1728CA1996 A IN 1728CA1996A IN 189781 B IN189781 B IN 189781B
Authority
IN
India
Application number
Other languages
English (en)
Inventor
Melvin G Oster
Brian Fuchs
Kenneth Reid
Original Assignee
Bae Systems Aircraft Controls
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bae Systems Aircraft Controls filed Critical Bae Systems Aircraft Controls
Publication of IN189781B publication Critical patent/IN189781B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2844—Fault-finding or characterising using test interfaces, e.g. adapters, test boxes, switches, PIN drivers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
IN1728CA1996 1995-12-15 1996-09-30 IN189781B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/573,026 US5793218A (en) 1995-12-15 1995-12-15 Generic interface test adapter

Publications (1)

Publication Number Publication Date
IN189781B true IN189781B (zh) 2003-04-19

Family

ID=24290357

Family Applications (1)

Application Number Title Priority Date Filing Date
IN1728CA1996 IN189781B (zh) 1995-12-15 1996-09-30

Country Status (11)

Country Link
US (1) US5793218A (zh)
EP (1) EP0866977B1 (zh)
KR (1) KR100479136B1 (zh)
AU (1) AU7112896A (zh)
DE (1) DE69621152T2 (zh)
ES (1) ES2175129T3 (zh)
HK (1) HK1011223A1 (zh)
IN (1) IN189781B (zh)
PT (1) PT866977E (zh)
TW (1) TW312747B (zh)
WO (1) WO1997022886A1 (zh)

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US6272562B1 (en) * 1999-05-28 2001-08-07 Cross Match Technologies, Inc. Access control unit interface
US6239592B1 (en) * 1999-06-02 2001-05-29 Sun Microsystems, Inc. Test fixture with quick connect and release board interconnect mechanism
US6886104B1 (en) 1999-06-25 2005-04-26 Cross Match Technologies Rechargeable mobile hand-held fingerprint scanner with a data and power communication interface
US6744910B1 (en) 1999-06-25 2004-06-01 Cross Match Technologies, Inc. Hand-held fingerprint scanner with on-board image normalization data storage
US7162060B1 (en) 1999-08-09 2007-01-09 Cross Match Technologies Method, system, and computer program product for control of platen movement during a live scan
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WO2001011550A1 (en) * 1999-08-09 2001-02-15 Cross Match Technologties, Inc. Method, system, and computer program product for a gui to fingerprint scanner interface
US6658164B1 (en) 1999-08-09 2003-12-02 Cross Match Technologies, Inc. Calibration and correction in a fingerprint scanner
US6483932B1 (en) 1999-08-19 2002-11-19 Cross Match Technologies, Inc. Method and apparatus for rolled fingerprint capture
AU2178400A (en) 1999-10-22 2001-05-08 Cross Match Technologies, Inc. Adjustable, rotatable finger guide in a tenprint scanner with movable prism platen
DE60027207T2 (de) * 2000-08-18 2006-11-16 Cross Match Technologies, Inc., Palm Beach Gardens System und verfahren zum automatischen steuern eines fingerabdruckabtasters
US6611152B1 (en) 2000-10-31 2003-08-26 The Boeing Company Test adapter for configuring the electrical communication between a unit under test and an electronic test station and associated separator plate
TW561263B (en) * 2001-03-10 2003-11-11 Samsung Electronics Co Ltd Parallel test board used in testing semiconductor memory devices
US6504730B1 (en) * 2001-07-23 2003-01-07 Hamilton Sundstrand Corporation Serviceable power modules for a power distribution assembly
US6841990B2 (en) * 2001-10-31 2005-01-11 Agilent Technologies, Inc. Mechanical interface for rapid replacement of RF fixture components
ATE406626T1 (de) 2002-01-17 2008-09-15 Cross Match Technologies Inc Fingerabdruck-workstation und verfahren
US6954260B2 (en) 2002-01-17 2005-10-11 Cross Match Technologies, Inc. Systems and methods for illuminating a platen in a print scanner
JP2003307552A (ja) * 2002-04-17 2003-10-31 Tokyo Electron Ltd 信号検出用接触体及び信号校正装置
AU2003254280A1 (en) * 2002-08-02 2004-02-23 Cross Match Technologies, Inc. System and method for counting ridges in a captured print image
US6906544B1 (en) * 2003-02-14 2005-06-14 Cisco Technology, Inc. Methods and apparatus for testing a circuit board using a surface mountable adaptor
US7164440B2 (en) * 2003-02-28 2007-01-16 Cross Match Technologies, Inc. Dynamic image adaptation method for adjusting the quality of digital prints
EP1612571A4 (en) * 2003-04-04 2010-03-03 Advantest Corp CONNECTION UNIT, TEST HEAD AND TEST UNIT
US7082676B2 (en) * 2003-08-05 2006-08-01 Qualitau, Inc. Electrostatic discharge (ESD) tool for electronic device under test (DUT) boards
US20050047631A1 (en) * 2003-08-26 2005-03-03 Cross Match Technologies, Inc. Method and apparatus for rolled fingerprint image capture with variable blending
TWI273248B (en) 2006-01-26 2007-02-11 Au Optronics Corp Universal probing apparatus for TFT array test
WO2008128286A1 (en) * 2007-04-18 2008-10-30 Tiip Pty Ltd Test instrument enclosure
US20080295090A1 (en) * 2007-05-24 2008-11-27 Lockheed Martin Corporation Software configuration manager
US7866784B2 (en) * 2008-08-19 2011-01-11 Silverbrook Research Pty Ltd Diagnostic probe assembly for printhead integrated circuitry
DE102012103893A1 (de) * 2012-05-03 2013-11-07 Turbodynamics Gmbh Modul zum Austauschen einer Schnittstelleneinheit in einem Testsystem zum Testen von Halbleiterelementen und Testsystem mit einem solchen Modul
FR2996367B1 (fr) * 2012-10-01 2014-10-03 Airbus Operations Sas Systeme de connexion pour connecter un equipement electronique, en particulier pour aeronef, a une unite de test.
CN106324460B (zh) * 2016-11-08 2024-03-22 沈小晴 一种可换针盘式通用测试机构
CN107608842B (zh) * 2017-10-31 2023-11-21 江苏特创科技有限公司 一种接口测试组件及接口测试装置
KR102107111B1 (ko) 2019-09-19 2020-05-06 한화시스템 주식회사 Lru 결합형 sru 시험 장치 및 방법
KR102466483B1 (ko) * 2021-12-20 2022-11-11 한화시스템 주식회사 다중 신호를 사용하는 sru를 위한 시험 장치 및 방법
CN116027124A (zh) * 2022-10-21 2023-04-28 深圳市朗科智能电气股份有限公司 一种可拆式模块化测试平台

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US4718064A (en) * 1986-02-28 1988-01-05 Western Digital Corporation Automatic test system
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Also Published As

Publication number Publication date
EP0866977B1 (en) 2002-05-08
AU7112896A (en) 1997-07-14
TW312747B (zh) 1997-08-11
WO1997022886A1 (en) 1997-06-26
EP0866977A1 (en) 1998-09-30
ES2175129T3 (es) 2002-11-16
PT866977E (pt) 2002-09-30
DE69621152T2 (de) 2003-01-02
KR100479136B1 (ko) 2005-05-16
DE69621152D1 (de) 2002-06-13
KR20000064402A (ko) 2000-11-06
HK1011223A1 (en) 1999-07-09
US5793218A (en) 1998-08-11

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