HK1023622A1 - Microscope with adaptive optics system - Google Patents

Microscope with adaptive optics system

Info

Publication number
HK1023622A1
HK1023622A1 HK00100413A HK00100413A HK1023622A1 HK 1023622 A1 HK1023622 A1 HK 1023622A1 HK 00100413 A HK00100413 A HK 00100413A HK 00100413 A HK00100413 A HK 00100413A HK 1023622 A1 HK1023622 A1 HK 1023622A1
Authority
HK
Hong Kong
Prior art keywords
microscope
optics system
adaptive optics
adaptive
optics
Prior art date
Application number
HK00100413A
Other languages
English (en)
Inventor
Ulrich Simon
Martin Gluch
Ralf Wolleschensky
Robert Grub
Andreas Faulstich
Martin Volcker
Original Assignee
Zeiss Carl Jena Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=7837611&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=HK1023622(A1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Zeiss Carl Jena Gmbh filed Critical Zeiss Carl Jena Gmbh
Publication of HK1023622A1 publication Critical patent/HK1023622A1/xx

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/241—Devices for focusing
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/06—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the phase of light

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Microscoopes, Condenser (AREA)
HK00100413A 1997-08-01 2000-01-21 Microscope with adaptive optics system HK1023622A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19733193A DE19733193B4 (de) 1997-08-01 1997-08-01 Mikroskop mit adaptiver Optik
PCT/EP1998/004801 WO1999006856A2 (de) 1997-08-01 1998-07-31 Mikroskop mit adaptiver optik

Publications (1)

Publication Number Publication Date
HK1023622A1 true HK1023622A1 (en) 2000-09-15

Family

ID=7837611

Family Applications (1)

Application Number Title Priority Date Filing Date
HK00100413A HK1023622A1 (en) 1997-08-01 2000-01-21 Microscope with adaptive optics system

Country Status (8)

Country Link
EP (2) EP0929826B1 (xx)
JP (1) JPH11101942A (xx)
KR (1) KR20000068681A (xx)
AU (1) AU9256698A (xx)
CA (1) CA2267431A1 (xx)
DE (3) DE19733193B4 (xx)
HK (1) HK1023622A1 (xx)
WO (1) WO1999006856A2 (xx)

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DE19930532C2 (de) * 1999-06-30 2002-03-28 Zeiss Carl Jena Gmbh Anordnung zur Optimierung der Pulsform in einem Laser-Scanning-Mikroskop
DE19942998B4 (de) * 1999-09-09 2012-02-09 Carl Zeiss Jena Gmbh Mikroskop zur Auf- und Durchlichtmikroskopie
DE19958436B4 (de) 1999-12-03 2014-07-17 Carl Zeiss Meditec Ag Vorrichtung und Verfahren zur aktiven, physiologisch bewerteten, umfassenden Korrektur der Aberrationen des menschlichen Auges
JP4531895B2 (ja) 1999-12-06 2010-08-25 オリンパス株式会社 レーザ集光光学系及びそれを用いたレーザ走査型顕微鏡
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DE10049296B4 (de) * 2000-08-03 2013-06-20 Leica Microsystems Cms Gmbh Optische Anordnung und Verfahren zur Ablenkung eines Lichtstrahls
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DE10063276C2 (de) * 2000-12-19 2002-11-07 Leica Microsystems Scanmikroskop
JP3797874B2 (ja) 2000-12-26 2006-07-19 オリンパス株式会社 走査型光学顕微鏡
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DE10150424B4 (de) * 2001-10-11 2004-07-29 Siemens Ag Reflexionssystem und Verwendung des Reflexionssystems
DE10227120A1 (de) * 2002-06-15 2004-03-04 Carl Zeiss Jena Gmbh Mikroskop, insbesondere Laserscanningmikroskop mit adaptiver optischer Einrichtung
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DE102004034954A1 (de) 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh Verfahren zur Erfassung mindestens eines Probenbereiches mit einem Lichtrastermikroskop
DE102004034979A1 (de) 2004-07-16 2006-02-16 Carl Zeiss Jena Gmbh Verfahren zur Erfassung mindestens eines Probenbereiches mit einem Lichtrastermikroskop mit punktförmiger Lichtquellenverteilung
US7345816B2 (en) 2005-01-11 2008-03-18 Olympus Corporation Optical microscope
US7326899B2 (en) 2005-07-11 2008-02-05 Olympus Corporation Laser scanning microscope and image acquiring method of laser scanning microscope
DE102005047884A1 (de) * 2005-10-06 2007-04-26 Leica Microsystems Cms Gmbh Scanmikroskop und Scanverfahren mit einem Scanmikroskop
FR2902202B1 (fr) * 2006-06-08 2008-09-26 Centre Nat Rech Scient Microscope confocal interferometrique
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DE102008022724B4 (de) 2008-05-06 2010-02-11 Freie Universität Berlin Pulsshaper und Infrarotlaser mit Pulsshaper
FR2933209B1 (fr) * 2008-06-27 2010-07-30 Ecole Polytech Procede et systeme de microscopie non-lineaire coherente a modulation de volume focal pour sonder la nanostructuration de materiaux organises
JP2010026165A (ja) * 2008-07-17 2010-02-04 Olympus Corp レーザー走査型顕微鏡
FR2941787B1 (fr) 2009-02-04 2011-04-15 Ecole Polytech Procede et dispositif d'acquisition de signaux en microscopie laser a balayage.
JP5718329B2 (ja) * 2009-07-09 2015-05-13 ホワルド フグヘス メドイクアル インストイトウテ 適応光学系を有する顕微鏡検査法
CN101806957B (zh) * 2010-03-10 2012-07-11 中国科学院光电技术研究所 自适应光学系统中波前传感器与校正器对准装置
WO2011125370A1 (ja) * 2010-04-05 2011-10-13 国立大学法人大阪大学 観察装置及び観察方法
DE102010055882A1 (de) 2010-12-22 2012-06-28 Carl Zeiss Microlmaging Gmbh Pinhole für ein konfokales Laser-Scanning Mikroskop
JP5616824B2 (ja) 2011-03-10 2014-10-29 オリンパス株式会社 顕微鏡装置
EP2732326B1 (en) * 2011-07-14 2020-11-18 Howard Hughes Medical Institute Microscopy with adaptive optics
JP6061958B2 (ja) * 2012-02-29 2017-01-18 アジレント・テクノロジーズ・インクＡｇｉｌｅｎｔ Ｔｅｃｈｎｏｌｏｇｉｅｓ， Ｉｎｃ． ソフトウェア定義式顕微鏡
DE102012101778A1 (de) 2012-03-02 2013-09-05 Leica Microsystems Cms Gmbh Scanmikroskopisches Verfahren und Scanmikroskop
JP6242906B2 (ja) 2012-10-12 2017-12-06 ソルラブス、インコーポレイテッド コンパクトで低分散および低収差の補償光学走査システム
JP6196825B2 (ja) 2013-07-09 2017-09-13 オリンパス株式会社 顕微鏡システム、及び、試料の屈折率測定方法
JP6127818B2 (ja) * 2013-08-02 2017-05-17 株式会社ニコン 補償光学素子の設定方法及び顕微鏡
DE102013218795A1 (de) 2013-09-19 2015-03-19 Carl Zeiss Microscopy Gmbh Laserscanningmikroskop und Verfahren zur Korrektur von Abbildungsfehlern insbesondere in der hochauflösenden Scanning-Mikroskopie
CN106716220B (zh) 2014-09-25 2019-03-29 西铁城时计株式会社 相位调制设备及激光显微镜
JP6772442B2 (ja) * 2015-09-14 2020-10-21 株式会社ニコン 顕微鏡装置および観察方法
DE102016214695B3 (de) * 2016-08-08 2017-10-19 Carl Zeiss Smt Gmbh Optisches System und Verfahren zur Korrektur von Maskenfehlern mit diesem System
DE102017100904B4 (de) 2017-01-18 2023-01-19 Carl Zeiss Microscopy Gmbh Bildwandlungsmodul für ein Mikroskop und Mikroskop
DE102017101188B4 (de) 2017-01-23 2021-09-30 Carl Zeiss Microscopy Gmbh Mikroskop und Verfahren zum Mikroskopieren einer Probe
EP3486706B1 (en) 2017-11-16 2024-05-08 SD Optics, Inc. Functional module and microscope equipped with the same
EP3816692A1 (en) 2019-10-30 2021-05-05 Carl Zeiss Microscopy GmbH Image conversion module with a microelectromechanical optical system and method for applying the same
CN111077078A (zh) * 2020-01-02 2020-04-28 哈工大机器人(中山)无人装备与人工智能研究院 一种结合自适应再扫描技术的双光子显微成像系统
EP4060394A1 (en) 2021-03-17 2022-09-21 Carl Zeiss Microscopy GmbH Microscope and method for forming a microscopic image with an extended depth of field

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Also Published As

Publication number Publication date
DE59806811D1 (de) 2003-02-06
KR20000068681A (ko) 2000-11-25
CA2267431A1 (en) 1999-02-01
DE19733193B4 (de) 2005-09-08
AU9256698A (en) 1999-02-22
EP0929826B1 (de) 2003-01-02
DE59813436D1 (de) 2006-05-11
WO1999006856A2 (de) 1999-02-11
WO1999006856A3 (de) 1999-04-08
EP1253457B1 (de) 2006-03-15
JPH11101942A (ja) 1999-04-13
DE19733193A1 (de) 1999-02-04
EP0929826A2 (de) 1999-07-21
EP1253457A1 (de) 2002-10-30

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Legal Events

Date Code Title Description
PF Patent in force
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20060731