HK1011223A1 - Generic interface test adapter - Google Patents

Generic interface test adapter

Info

Publication number
HK1011223A1
HK1011223A1 HK98112440A HK98112440A HK1011223A1 HK 1011223 A1 HK1011223 A1 HK 1011223A1 HK 98112440 A HK98112440 A HK 98112440A HK 98112440 A HK98112440 A HK 98112440A HK 1011223 A1 HK1011223 A1 HK 1011223A1
Authority
HK
Hong Kong
Prior art keywords
interface test
test adapter
generic interface
generic
adapter
Prior art date
Application number
HK98112440A
Other languages
English (en)
Inventor
Melvin G Oster
Brian Fuchs
Kenneth Reid
Original Assignee
Bae Systems Aircraft Controls
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bae Systems Aircraft Controls filed Critical Bae Systems Aircraft Controls
Publication of HK1011223A1 publication Critical patent/HK1011223A1/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2844—Fault-finding or characterising using test interfaces, e.g. adapters, test boxes, switches, PIN drivers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
  • Tests Of Electronic Circuits (AREA)
HK98112440A 1995-12-15 1998-11-28 Generic interface test adapter HK1011223A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/573,026 US5793218A (en) 1995-12-15 1995-12-15 Generic interface test adapter
PCT/US1996/014949 WO1997022886A1 (en) 1995-12-15 1996-09-18 Generic interface test adapter

Publications (1)

Publication Number Publication Date
HK1011223A1 true HK1011223A1 (en) 1999-07-09

Family

ID=24290357

Family Applications (1)

Application Number Title Priority Date Filing Date
HK98112440A HK1011223A1 (en) 1995-12-15 1998-11-28 Generic interface test adapter

Country Status (11)

Country Link
US (1) US5793218A (ko)
EP (1) EP0866977B1 (ko)
KR (1) KR100479136B1 (ko)
AU (1) AU7112896A (ko)
DE (1) DE69621152T2 (ko)
ES (1) ES2175129T3 (ko)
HK (1) HK1011223A1 (ko)
IN (1) IN189781B (ko)
PT (1) PT866977E (ko)
TW (1) TW312747B (ko)
WO (1) WO1997022886A1 (ko)

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TW561263B (en) * 2001-03-10 2003-11-11 Samsung Electronics Co Ltd Parallel test board used in testing semiconductor memory devices
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US6906544B1 (en) * 2003-02-14 2005-06-14 Cisco Technology, Inc. Methods and apparatus for testing a circuit board using a surface mountable adaptor
US7164440B2 (en) * 2003-02-28 2007-01-16 Cross Match Technologies, Inc. Dynamic image adaptation method for adjusting the quality of digital prints
WO2004090561A1 (ja) * 2003-04-04 2004-10-21 Advantest Corporation 接続ユニット、テストヘッド、および試験装置
US7082676B2 (en) * 2003-08-05 2006-08-01 Qualitau, Inc. Electrostatic discharge (ESD) tool for electronic device under test (DUT) boards
US20050047631A1 (en) * 2003-08-26 2005-03-03 Cross Match Technologies, Inc. Method and apparatus for rolled fingerprint image capture with variable blending
TWI273248B (en) 2006-01-26 2007-02-11 Au Optronics Corp Universal probing apparatus for TFT array test
WO2008128286A1 (en) * 2007-04-18 2008-10-30 Tiip Pty Ltd Test instrument enclosure
US20080295090A1 (en) * 2007-05-24 2008-11-27 Lockheed Martin Corporation Software configuration manager
US7866784B2 (en) * 2008-08-19 2011-01-11 Silverbrook Research Pty Ltd Diagnostic probe assembly for printhead integrated circuitry
DE102012103893A1 (de) 2012-05-03 2013-11-07 Turbodynamics Gmbh Modul zum Austauschen einer Schnittstelleneinheit in einem Testsystem zum Testen von Halbleiterelementen und Testsystem mit einem solchen Modul
FR2996367B1 (fr) * 2012-10-01 2014-10-03 Airbus Operations Sas Systeme de connexion pour connecter un equipement electronique, en particulier pour aeronef, a une unite de test.
CN106324460B (zh) * 2016-11-08 2024-03-22 沈小晴 一种可换针盘式通用测试机构
CN107608842B (zh) * 2017-10-31 2023-11-21 江苏特创科技有限公司 一种接口测试组件及接口测试装置
KR102107111B1 (ko) 2019-09-19 2020-05-06 한화시스템 주식회사 Lru 결합형 sru 시험 장치 및 방법
KR102466483B1 (ko) * 2021-12-20 2022-11-11 한화시스템 주식회사 다중 신호를 사용하는 sru를 위한 시험 장치 및 방법
CN116027124A (zh) * 2022-10-21 2023-04-28 深圳市朗科智能电气股份有限公司 一种可拆式模块化测试平台
US12117481B2 (en) * 2022-12-27 2024-10-15 Intelligent Memory Limited Autonomous detection of memory insertion into test equipment without requiring power to the tester unit

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Also Published As

Publication number Publication date
PT866977E (pt) 2002-09-30
KR20000064402A (ko) 2000-11-06
TW312747B (ko) 1997-08-11
WO1997022886A1 (en) 1997-06-26
EP0866977B1 (en) 2002-05-08
EP0866977A1 (en) 1998-09-30
IN189781B (ko) 2003-04-19
KR100479136B1 (ko) 2005-05-16
ES2175129T3 (es) 2002-11-16
DE69621152D1 (de) 2002-06-13
AU7112896A (en) 1997-07-14
DE69621152T2 (de) 2003-01-02
US5793218A (en) 1998-08-11

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Legal Events

Date Code Title Description
PF Patent in force
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20050918