FR2869456B1 - Solution de polissage de barriere - Google Patents
Solution de polissage de barriereInfo
- Publication number
- FR2869456B1 FR2869456B1 FR0551010A FR0551010A FR2869456B1 FR 2869456 B1 FR2869456 B1 FR 2869456B1 FR 0551010 A FR0551010 A FR 0551010A FR 0551010 A FR0551010 A FR 0551010A FR 2869456 B1 FR2869456 B1 FR 2869456B1
- Authority
- FR
- France
- Prior art keywords
- polishing solution
- barrier polishing
- barrier
- solution
- polishing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 230000004888 barrier function Effects 0.000 title 1
- 238000005498 polishing Methods 0.000 title 1
Classifications
-
- A—HUMAN NECESSITIES
- A47—FURNITURE; DOMESTIC ARTICLES OR APPLIANCES; COFFEE MILLS; SPICE MILLS; SUCTION CLEANERS IN GENERAL
- A47J—KITCHEN EQUIPMENT; COFFEE MILLS; SPICE MILLS; APPARATUS FOR MAKING BEVERAGES
- A47J37/00—Baking; Roasting; Grilling; Frying
- A47J37/06—Roasters; Grills; Sandwich grills
- A47J37/07—Roasting devices for outdoor use; Barbecues
- A47J37/0704—Roasting devices for outdoor use; Barbecues with horizontal fire box
- A47J37/0713—Roasting devices for outdoor use; Barbecues with horizontal fire box with gas burners
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09G—POLISHING COMPOSITIONS; SKI WAXES
- C09G1/00—Polishing compositions
- C09G1/02—Polishing compositions containing abrasives or grinding agents
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1454—Abrasive powders, suspensions and pastes for polishing
- C09K3/1463—Aqueous liquid suspensions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/3205—Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
- H01L21/321—After treatment
- H01L21/32115—Planarisation
- H01L21/3212—Planarisation by chemical mechanical polishing [CMP]
-
- A—HUMAN NECESSITIES
- A47—FURNITURE; DOMESTIC ARTICLES OR APPLIANCES; COFFEE MILLS; SPICE MILLS; SUCTION CLEANERS IN GENERAL
- A47J—KITCHEN EQUIPMENT; COFFEE MILLS; SPICE MILLS; APPARATUS FOR MAKING BEVERAGES
- A47J37/00—Baking; Roasting; Grilling; Frying
- A47J37/06—Roasters; Grills; Sandwich grills
- A47J37/07—Roasting devices for outdoor use; Barbecues
- A47J37/0786—Accessories
- A47J2037/0795—Adjustable food supports, e.g. for height adjustment
-
- A—HUMAN NECESSITIES
- A47—FURNITURE; DOMESTIC ARTICLES OR APPLIANCES; COFFEE MILLS; SPICE MILLS; SUCTION CLEANERS IN GENERAL
- A47J—KITCHEN EQUIPMENT; COFFEE MILLS; SPICE MILLS; APPARATUS FOR MAKING BEVERAGES
- A47J37/00—Baking; Roasting; Grilling; Frying
- A47J37/06—Roasters; Grills; Sandwich grills
- A47J37/07—Roasting devices for outdoor use; Barbecues
- A47J37/0786—Accessories
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Materials Engineering (AREA)
- Food Science & Technology (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/830,268 US7253111B2 (en) | 2004-04-21 | 2004-04-21 | Barrier polishing solution |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2869456A1 FR2869456A1 (fr) | 2005-10-28 |
FR2869456B1 true FR2869456B1 (fr) | 2006-11-10 |
Family
ID=34954976
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR0551010A Active FR2869456B1 (fr) | 2004-04-21 | 2005-04-20 | Solution de polissage de barriere |
Country Status (7)
Country | Link |
---|---|
US (1) | US7253111B2 (fr) |
JP (1) | JP4761815B2 (fr) |
KR (1) | KR101200566B1 (fr) |
CN (1) | CN1696235B (fr) |
DE (1) | DE102005016554A1 (fr) |
FR (1) | FR2869456B1 (fr) |
TW (1) | TWI363789B (fr) |
Families Citing this family (36)
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US7300480B2 (en) * | 2003-09-25 | 2007-11-27 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | High-rate barrier polishing composition |
KR20060016498A (ko) * | 2004-08-18 | 2006-02-22 | 삼성전자주식회사 | 슬러리 조성물, 이의 제조 방법 및 이를 이용한 가공물의연마방법 |
JP4814502B2 (ja) * | 2004-09-09 | 2011-11-16 | 株式会社フジミインコーポレーテッド | 研磨用組成物及びそれを用いた研磨方法 |
JP5026665B2 (ja) * | 2004-10-15 | 2012-09-12 | 株式会社フジミインコーポレーテッド | 研磨用組成物及びそれを用いた研磨方法 |
US7888302B2 (en) * | 2005-02-03 | 2011-02-15 | Air Products And Chemicals, Inc. | Aqueous based residue removers comprising fluoride |
US7731864B2 (en) * | 2005-06-29 | 2010-06-08 | Intel Corporation | Slurry for chemical mechanical polishing of aluminum |
US20070068901A1 (en) * | 2005-09-29 | 2007-03-29 | Wang Yuchun | Composition and method for enhancing pot life of hydrogen peroxide-containing CMP slurries |
EP1949422A1 (fr) * | 2005-10-21 | 2008-07-30 | Freescale Semiconductor, Inc. | Procede permettant de nettoyer une structure semi-conductrice et solution chimique correspondante |
US7435162B2 (en) * | 2005-10-24 | 2008-10-14 | 3M Innovative Properties Company | Polishing fluids and methods for CMP |
US7534753B2 (en) * | 2006-01-12 | 2009-05-19 | Air Products And Chemicals, Inc. | pH buffered aqueous cleaning composition and method for removing photoresist residue |
JP5030431B2 (ja) * | 2006-02-08 | 2012-09-19 | 富士フイルム株式会社 | 研磨用組成物 |
US7842192B2 (en) * | 2006-02-08 | 2010-11-30 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Multi-component barrier polishing solution |
US20070209287A1 (en) * | 2006-03-13 | 2007-09-13 | Cabot Microelectronics Corporation | Composition and method to polish silicon nitride |
US7732393B2 (en) * | 2006-03-20 | 2010-06-08 | Cabot Microelectronics Corporation | Oxidation-stabilized CMP compositions and methods |
CN101584028A (zh) * | 2006-04-26 | 2009-11-18 | Nxp股份有限公司 | 制造半导体器件的方法、由此获得的半导体器件和适合该方法中使用的浆料 |
KR101032504B1 (ko) * | 2006-06-30 | 2011-05-04 | 주식회사 엘지화학 | Cmp 슬러리 |
JP5335183B2 (ja) * | 2006-08-24 | 2013-11-06 | 株式会社フジミインコーポレーテッド | 研磨用組成物及び研磨方法 |
JP2009088243A (ja) * | 2007-09-28 | 2009-04-23 | Fujifilm Corp | 研磨液 |
JP2009088080A (ja) * | 2007-09-28 | 2009-04-23 | Fujifilm Corp | 化学的機械的研磨用研磨液 |
CN101451049A (zh) * | 2007-11-30 | 2009-06-10 | 安集微电子(上海)有限公司 | 一种化学机械抛光液 |
JP5441345B2 (ja) * | 2008-03-27 | 2014-03-12 | 富士フイルム株式会社 | 研磨液、及び研磨方法 |
EP2356192B1 (fr) * | 2008-09-19 | 2020-01-15 | Cabot Microelectronics Corporation | Pâte faisant barrière pour diélectriques à faible constante diélectrique |
CN102471686B (zh) * | 2009-07-22 | 2014-08-27 | 东友Fine-Chem股份有限公司 | 用于形成金属线的蚀刻组合物 |
DE102009040651A1 (de) | 2009-09-09 | 2011-04-14 | Bergmann, Henry, Prof. Dr. | Verfahren zur gemeinsamen und selektiven Herstellung von Bromat und Perbromat mittels anodischer Oxidation |
US8025813B2 (en) * | 2009-11-12 | 2011-09-27 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing composition and methods relating thereto |
US10176979B2 (en) | 2012-02-15 | 2019-01-08 | Entegris, Inc. | Post-CMP removal using compositions and method of use |
CN104968838A (zh) * | 2013-04-12 | 2015-10-07 | 三菱瓦斯化学株式会社 | 用于蚀刻含有铜和钛的多层膜的液体组合物、和使用该组合物的蚀刻方法、多层膜配线的制造方法、基板 |
US9388328B2 (en) * | 2013-08-23 | 2016-07-12 | Diamond Innovations, Inc. | Lapping slurry having a cationic surfactant |
CN104647197B (zh) * | 2013-11-22 | 2019-01-04 | 安集微电子(上海)有限公司 | 一种用于抛光钽的化学机械抛光方法 |
EP3080240A4 (fr) | 2013-12-11 | 2017-07-19 | FujiFilm Electronic Materials USA, Inc. | Formulation de nettoyage pour éliminer des résidus présents sur des surfaces |
WO2015119925A1 (fr) * | 2014-02-05 | 2015-08-13 | Advanced Technology Materials, Inc. | Compositions post-cmp sans amine et leur méthode d'utilisation |
US9275899B2 (en) | 2014-06-27 | 2016-03-01 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing composition and method for polishing tungsten |
KR101682085B1 (ko) * | 2015-07-09 | 2016-12-02 | 주식회사 케이씨텍 | 텅스텐 연마용 슬러리 조성물 |
SG10201904669TA (en) * | 2018-06-28 | 2020-01-30 | Kctech Co Ltd | Polishing Slurry Composition |
CN111378371B (zh) * | 2018-12-28 | 2022-05-13 | 安集微电子科技(上海)股份有限公司 | 一种焦性没食子酸在二氧化硅抛光中的用途 |
CN115101471A (zh) * | 2022-03-21 | 2022-09-23 | 康劲 | 一种用于多层铜互连cmp的工艺控制方法 |
Family Cites Families (55)
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US5614444A (en) | 1995-06-06 | 1997-03-25 | Sematech, Inc. | Method of using additives with silica-based slurries to enhance selectivity in metal CMP |
US5769689A (en) | 1996-02-28 | 1998-06-23 | Rodel, Inc. | Compositions and methods for polishing silica, silicates, and silicon nitride |
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AU7147798A (en) | 1997-04-23 | 1998-11-13 | Advanced Chemical Systems International, Inc. | Planarization compositions for cmp of interlayer dielectrics |
US6194317B1 (en) * | 1998-04-30 | 2001-02-27 | 3M Innovative Properties Company | Method of planarizing the upper surface of a semiconductor wafer |
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US7300480B2 (en) * | 2003-09-25 | 2007-11-27 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | High-rate barrier polishing composition |
US20050076580A1 (en) * | 2003-10-10 | 2005-04-14 | Air Products And Chemicals, Inc. | Polishing composition and use thereof |
US20050090104A1 (en) * | 2003-10-27 | 2005-04-28 | Kai Yang | Slurry compositions for chemical mechanical polishing of copper and barrier films |
JP5036955B2 (ja) * | 2003-12-19 | 2012-09-26 | ニッタ・ハース株式会社 | 金属膜研磨組成物および金属膜の研磨方法 |
-
2004
- 2004-04-21 US US10/830,268 patent/US7253111B2/en active Active
-
2005
- 2005-04-01 TW TW094110509A patent/TWI363789B/zh active
- 2005-04-11 DE DE102005016554A patent/DE102005016554A1/de not_active Ceased
- 2005-04-20 KR KR1020050032664A patent/KR101200566B1/ko active IP Right Grant
- 2005-04-20 CN CN200510067350.0A patent/CN1696235B/zh active Active
- 2005-04-20 FR FR0551010A patent/FR2869456B1/fr active Active
- 2005-04-21 JP JP2005123109A patent/JP4761815B2/ja active Active
Also Published As
Publication number | Publication date |
---|---|
JP4761815B2 (ja) | 2011-08-31 |
KR101200566B1 (ko) | 2012-11-13 |
US7253111B2 (en) | 2007-08-07 |
TWI363789B (en) | 2012-05-11 |
DE102005016554A1 (de) | 2005-11-10 |
TW200535203A (en) | 2005-11-01 |
US20050236601A1 (en) | 2005-10-27 |
JP2005328043A (ja) | 2005-11-24 |
KR20060047259A (ko) | 2006-05-18 |
FR2869456A1 (fr) | 2005-10-28 |
CN1696235B (zh) | 2014-04-09 |
CN1696235A (zh) | 2005-11-16 |
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