FR2839156B1 - Circuit et procede utilisant de multiples chaines d'acces serie pour le test de cirucuits integres - Google Patents

Circuit et procede utilisant de multiples chaines d'acces serie pour le test de cirucuits integres

Info

Publication number
FR2839156B1
FR2839156B1 FR0209758A FR0209758A FR2839156B1 FR 2839156 B1 FR2839156 B1 FR 2839156B1 FR 0209758 A FR0209758 A FR 0209758A FR 0209758 A FR0209758 A FR 0209758A FR 2839156 B1 FR2839156 B1 FR 2839156B1
Authority
FR
France
Prior art keywords
circuit
integrated circuits
access channels
multiple series
testing integrated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
FR0209758A
Other languages
English (en)
Other versions
FR2839156A1 (fr
Inventor
Gyoo Chan Sim
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Electronics Co Ltd
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of FR2839156A1 publication Critical patent/FR2839156A1/fr
Application granted granted Critical
Publication of FR2839156B1 publication Critical patent/FR2839156B1/fr
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3177—Testing of logic operation, e.g. by logic analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2891—Features relating to contacting the IC under test, e.g. probe heads; chucks related to sensing or controlling of force, position, temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318536—Scan chain arrangements, e.g. connections, test bus, analog signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318541—Scan latches or cell details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318552—Clock circuits details

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
FR0209758A 2002-04-30 2002-07-31 Circuit et procede utilisant de multiples chaines d'acces serie pour le test de cirucuits integres Expired - Lifetime FR2839156B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/136,670 US7249298B2 (en) 2002-04-30 2002-04-30 Multiple scan chains with pin sharing

Publications (2)

Publication Number Publication Date
FR2839156A1 FR2839156A1 (fr) 2003-10-31
FR2839156B1 true FR2839156B1 (fr) 2006-07-07

Family

ID=22473846

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0209758A Expired - Lifetime FR2839156B1 (fr) 2002-04-30 2002-07-31 Circuit et procede utilisant de multiples chaines d'acces serie pour le test de cirucuits integres

Country Status (7)

Country Link
US (1) US7249298B2 (fr)
JP (1) JP4202165B2 (fr)
KR (1) KR100486275B1 (fr)
FR (1) FR2839156B1 (fr)
GB (1) GB2388199B (fr)
NL (1) NL1021104C2 (fr)
TW (1) TWI231372B (fr)

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US7082560B2 (en) * 2002-05-24 2006-07-25 Sun Microsystems, Inc. Scan capable dual edge-triggered state element for application of combinational and sequential scan test patterns
JP4274806B2 (ja) * 2003-01-28 2009-06-10 株式会社リコー 半導体集積回路およびスキャンテスト法
US7975197B2 (en) * 2003-03-31 2011-07-05 Lsi Corporation On-chip scan clock generator for ASIC testing
US7584392B2 (en) * 2003-05-23 2009-09-01 Cadence Design Systems, Inc. Test compaction using linear-matrix driven scan chains
US7657809B1 (en) * 2003-11-19 2010-02-02 Cadence Design Systems, Inc. Dual scan chain design method and apparatus
US7055118B1 (en) 2004-03-01 2006-05-30 Sun Microsystems, Inc. Scan chain verification using symbolic simulation
US7263642B1 (en) 2005-09-15 2007-08-28 Azul Systems, Inc Testing replicated sub-systems in a yield-enhancing chip-test environment using on-chip compare to expected results for parallel scan chains testing critical and repairable sections of each sub-system
US7529294B2 (en) 2006-02-28 2009-05-05 International Business Machines Corporation Testing of multiple asynchronous logic domains
US7441171B2 (en) * 2006-03-24 2008-10-21 International Business Machines Corporation Efficient scan chain insertion using broadcast scan for reduced bit collisions
US7831877B2 (en) * 2007-03-08 2010-11-09 Silicon Image, Inc. Circuitry to prevent peak power problems during scan shift
US7975307B2 (en) * 2007-09-07 2011-07-05 Freescale Semiconductor, Inc. Securing proprietary functions from scan access
US7962819B2 (en) * 2008-01-24 2011-06-14 Sandisk Corporation Test mode soft reset circuitry and methods
US7908534B2 (en) * 2008-02-25 2011-03-15 International Business Machines Corporation Diagnosable general purpose test registers scan chain design
US8555123B2 (en) 2008-07-23 2013-10-08 Industrial Technology Research Institute Test device and method for the SoC test architecture
US7937634B2 (en) * 2009-02-17 2011-05-03 Almukhaizim Sobeeh A Circuit and method providing dynamic scan chain partitioning
TWI405969B (zh) * 2009-05-08 2013-08-21 Accton Wireless Broadband Corp 管線式元件測試系統及其方法
JP2011149775A (ja) * 2010-01-20 2011-08-04 Renesas Electronics Corp 半導体集積回路及びコアテスト回路
US8793546B2 (en) * 2011-06-20 2014-07-29 Lsi Corporation Integrated circuit comprising scan test circuitry with parallel reordered scan chains
US9377510B2 (en) 2012-12-28 2016-06-28 Nvidia Corporation System for reducing peak power during scan shift at the global level for scan based tests
US9222981B2 (en) 2012-12-28 2015-12-29 Nvidia Corporation Global low power capture scheme for cores
US9395414B2 (en) 2012-12-28 2016-07-19 Nvidia Corporation System for reducing peak power during scan shift at the local level for scan based tests
US10379161B2 (en) * 2013-06-17 2019-08-13 Mentor Graphics Corporation Scan chain stitching for test-per-clock
US10310015B2 (en) * 2013-07-19 2019-06-04 Advanced Micro Devices, Inc. Method and apparatus for providing clock signals for a scan chain
TWI507989B (zh) * 2013-08-08 2015-11-11 Nat Univ Tsing Hua 資源導向之嵌入式系統功率消耗分析方法
CN105572573B (zh) * 2014-10-30 2018-08-24 国际商业机器公司 用于存储器时序测试的扫描链、扫描链构建方法和相应装置
US9347991B1 (en) * 2014-11-12 2016-05-24 Texas Instruments Incorporated Scan throughput enhancement in scan testing of a device-under-test
CN106680688B (zh) 2015-11-11 2020-09-25 恩智浦美国有限公司 利用并行扫描测试数据输入和输出测试多核集成电路
TWI625534B (zh) * 2015-12-21 2018-06-01 瑞昱半導體股份有限公司 透過掃描測試的掃描鏈所執行的除錯方法及相關電路系統
US10613142B2 (en) * 2017-02-22 2020-04-07 International Business Machines Corporation Non-destructive recirculation test support for integrated circuits
CN113454471A (zh) * 2019-03-13 2021-09-28 美商新思科技有限公司 用于多个链缺陷的单次通过诊断
US11073557B2 (en) * 2019-05-08 2021-07-27 Texas Instruments Incorporated Phase controlled codec block scan of a partitioned circuit device
US11366162B2 (en) 2020-04-16 2022-06-21 Mediatek Inc. Scan output flip-flop with power saving feature

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US4701921A (en) 1985-10-23 1987-10-20 Texas Instruments Incorporated Modularized scan path for serially tested logic circuit
US4701621A (en) * 1986-02-10 1987-10-20 General Electric Company Monitor for airborne radioactive particles
US4947357A (en) * 1988-02-24 1990-08-07 Stellar Computer, Inc. Scan testing a digital system using scan chains in integrated circuits
JPH01270683A (ja) * 1988-04-22 1989-10-27 Mitsubishi Electric Corp 半導体集積回路
US4989209A (en) * 1989-03-24 1991-01-29 Motorola, Inc. Method and apparatus for testing high pin count integrated circuits
US5412260A (en) 1991-05-03 1995-05-02 Lattice Semiconductor Corporation Multiplexed control pins for in-system programming and boundary scan state machines in a high density programmable logic device
US5592493A (en) 1994-09-13 1997-01-07 Motorola Inc. Serial scan chain architecture for a data processing system and method of operation
US5909451A (en) * 1996-11-21 1999-06-01 Sun Microsystems, Inc. System and method for providing scan chain for digital electronic device having multiple clock domains
JPH1138100A (ja) * 1997-07-18 1999-02-12 Advantest Corp 半導体試験装置
US6049901A (en) * 1997-09-16 2000-04-11 Stock; Mary C. Test system for integrated circuits using a single memory for both the parallel and scan modes of testing
US6070260A (en) 1998-09-17 2000-05-30 Xilinx, Inc. Test methodology based on multiple skewed scan clocks
US6418545B1 (en) * 1999-06-04 2002-07-09 Koninklijke Philips Electronics N.V. System and method to reduce scan test pins on an integrated circuit
TW484016B (en) * 1999-07-28 2002-04-21 Hitachi Ltd Semiconductor integrated circuit and recording medium
KR100697264B1 (ko) * 1999-12-02 2007-03-21 삼성전자주식회사 딜레이 체인 회로를 이용한 반도체 장치의 테스트 회로 및그의 테스트 방법
US6516432B1 (en) * 1999-12-22 2003-02-04 International Business Machines Corporation AC scan diagnostic method
KR100448903B1 (ko) 2000-01-28 2004-09-16 삼성전자주식회사 스캔신호 변환회로를 구비한 반도체 집적회로 장치
US6766487B2 (en) * 2000-03-09 2004-07-20 Texas Instruments Incorporated Divided scan path with decode logic receiving select control signals
US6591388B1 (en) * 2000-04-18 2003-07-08 International Business Machines Corporation High speed sink/source register to reduce level sensitive scan design test time
US6691268B1 (en) * 2000-06-30 2004-02-10 Oak Technology, Inc. Method and apparatus for swapping state data with scan cells
US6877119B2 (en) * 2001-09-14 2005-04-05 Stmicroelectronics Limited Circuit scan output arrangement

Also Published As

Publication number Publication date
GB2388199B (en) 2004-09-01
GB2388199A (en) 2003-11-05
NL1021104C2 (nl) 2005-09-07
US20030204802A1 (en) 2003-10-30
JP4202165B2 (ja) 2008-12-24
JP2003329742A (ja) 2003-11-19
US7249298B2 (en) 2007-07-24
FR2839156A1 (fr) 2003-10-31
TWI231372B (en) 2005-04-21
GB0216628D0 (en) 2002-08-28
KR100486275B1 (ko) 2005-04-29
KR20030085459A (ko) 2003-11-05
NL1021104A1 (nl) 2003-10-31

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