FR2753273B1 - Circuits d'excitation pour systeme de test de circuits integres - Google Patents

Circuits d'excitation pour systeme de test de circuits integres

Info

Publication number
FR2753273B1
FR2753273B1 FR9711143A FR9711143A FR2753273B1 FR 2753273 B1 FR2753273 B1 FR 2753273B1 FR 9711143 A FR9711143 A FR 9711143A FR 9711143 A FR9711143 A FR 9711143A FR 2753273 B1 FR2753273 B1 FR 2753273B1
Authority
FR
France
Prior art keywords
integrated circuit
test system
drive circuits
circuit test
circuits
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9711143A
Other languages
English (en)
Other versions
FR2753273A1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Schlumberger Technologies Inc
Original Assignee
Schlumberger Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Schlumberger Technologies Inc filed Critical Schlumberger Technologies Inc
Publication of FR2753273A1 publication Critical patent/FR2753273A1/fr
Application granted granted Critical
Publication of FR2753273B1 publication Critical patent/FR2753273B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
    • H03K17/74—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of diodes
    • H03K17/76—Switching arrangements with several input- or output-terminals, e.g. multiplexers, distributors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Logic Circuits (AREA)
FR9711143A 1996-09-11 1997-09-08 Circuits d'excitation pour systeme de test de circuits integres Expired - Fee Related FR2753273B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/710,032 US5745003A (en) 1996-09-11 1996-09-11 Driver circuits for IC tester

Publications (2)

Publication Number Publication Date
FR2753273A1 FR2753273A1 (fr) 1998-03-13
FR2753273B1 true FR2753273B1 (fr) 1999-01-22

Family

ID=24852334

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9711143A Expired - Fee Related FR2753273B1 (fr) 1996-09-11 1997-09-08 Circuits d'excitation pour systeme de test de circuits integres

Country Status (5)

Country Link
US (1) US5745003A (fr)
JP (1) JPH10132898A (fr)
KR (1) KR19980024195A (fr)
FR (1) FR2753273B1 (fr)
TW (1) TW344797B (fr)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6037828A (en) * 1997-10-09 2000-03-14 Exar Corporation Transmission line driver with high output impedance at power off
US6363507B1 (en) * 1998-10-19 2002-03-26 Teradyne, Inc. Integrated multi-channel analog test instrument architecture providing flexible triggering
US6360180B1 (en) * 1999-05-10 2002-03-19 Teradyne, Inc. Driver with transmission path loss compensation
US6229377B1 (en) * 1999-06-22 2001-05-08 Bechtel Bwxt Idaho, Llc Dual amplitude pulse generator for radiation detectors
US6442718B1 (en) * 1999-08-23 2002-08-27 Sun Microsystems, Inc. Memory module test system with reduced driver output impedance
US6377073B1 (en) * 1999-11-30 2002-04-23 Texas Instruments Incorporated Structure and method for reduction of power consumption in integrated circuit logic
WO2002047268A1 (fr) * 2000-12-05 2002-06-13 Advantest Corporation Circuit de commande
DE10207676A1 (de) * 2002-02-22 2003-09-04 Philips Intellectual Property Schaltungsanordnung für einen stromgesteuerten Widerstand mit erweitertem Linearitätsbereich
DE10207675A1 (de) * 2002-02-22 2003-09-04 Philips Intellectual Property Schaltungsanordnung für einen stromgesteuerten Widerstand mit erweitertem Linearitätsbereich
KR100988487B1 (ko) * 2002-03-08 2010-10-20 주식회사 아도반테스토 반도체 시험 장치
US6717450B1 (en) * 2002-05-13 2004-04-06 Telasic Communications, Inc. Monolithic I-load architecture for automatic test equipment
US20050146320A1 (en) * 2003-12-31 2005-07-07 Gohel Tushar K. Differential active load
JP4932328B2 (ja) * 2006-05-29 2012-05-16 ルネサスエレクトロニクス株式会社 送信回路及びその制御方法
US8026740B2 (en) 2008-03-21 2011-09-27 Micron Technology, Inc. Multi-level signaling for low power, short channel applications
US8259461B2 (en) * 2008-11-25 2012-09-04 Micron Technology, Inc. Apparatus for bypassing faulty connections
KR101388804B1 (ko) * 2012-12-13 2014-04-23 에스티엑스조선해양 주식회사 용접용 와이어 송급장치
US8901972B2 (en) 2013-01-08 2014-12-02 Analog Devices, Inc. Pin driver circuit with improved swing fidelity
KR102101334B1 (ko) * 2013-06-05 2020-04-16 삼성전자주식회사 멀티 레벨 드라이버를 구비한 입력 장치 및 이를 포함하는 사용자 기기
US10209307B2 (en) 2016-05-23 2019-02-19 Analog Devices, Inc. Multiple-level driver circuit with non-commutating bridge
US11940496B2 (en) 2020-02-24 2024-03-26 Analog Devices, Inc. Output voltage glitch reduction in ate systems

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4605894A (en) * 1983-08-29 1986-08-12 Genrad Semiconductor Test, Inc. High density test head
US4885545A (en) * 1988-08-08 1989-12-05 Tektronix, Inc. High speed circuit with supporting auxiliary circuit
US5036219A (en) * 1989-05-31 1991-07-30 Harris Corporation Precise, high speed CMOS track (sample)/hold circuits
JPH03277983A (ja) * 1990-03-28 1991-12-09 Ando Electric Co Ltd Ｄｂ型ａｓによるｄｕｔ負荷切換回路
EP0542321A3 (en) * 1991-09-23 1993-06-09 Schlumberger Technologies, Inc. Method and circuit for controlling voltage reflections on transmission lines
US5430400A (en) * 1993-08-03 1995-07-04 Schlumberger Technologies Inc. Driver circuits for IC tester
US5521493A (en) * 1994-11-21 1996-05-28 Megatest Corporation Semiconductor test system including a novel driver/load circuit

Also Published As

Publication number Publication date
FR2753273A1 (fr) 1998-03-13
TW344797B (en) 1998-11-11
JPH10132898A (ja) 1998-05-22
US5745003A (en) 1998-04-28
KR19980024195A (ko) 1998-07-06

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Legal Events

Date Code Title Description
CA Change of address
CD Change of name or company name
TP Transmission of property
ST Notification of lapse

Effective date: 20090529