FR2356276A1 - Dispositif semi-conducteur a tension de rupture elevee - Google Patents
Dispositif semi-conducteur a tension de rupture eleveeInfo
- Publication number
- FR2356276A1 FR2356276A1 FR7718467A FR7718467A FR2356276A1 FR 2356276 A1 FR2356276 A1 FR 2356276A1 FR 7718467 A FR7718467 A FR 7718467A FR 7718467 A FR7718467 A FR 7718467A FR 2356276 A1 FR2356276 A1 FR 2356276A1
- Authority
- FR
- France
- Prior art keywords
- semiconductor device
- layers
- zone
- layer
- reduced thickness
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title abstract 6
- 230000015556 catabolic process Effects 0.000 abstract 1
- 230000008878 coupling Effects 0.000 abstract 1
- 238000010168 coupling process Methods 0.000 abstract 1
- 238000005859 coupling reaction Methods 0.000 abstract 1
- 239000012535 impurity Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
- H01L29/0657—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by the shape of the body
- H01L29/0661—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by the shape of the body specially adapted for altering the breakdown voltage by removing semiconductor material at, or in the neighbourhood of, a reverse biased junction, e.g. by bevelling, moat etching, depletion etching
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Thyristors (AREA)
- Bipolar Transistors (AREA)
- Electrodes Of Semiconductors (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US69801476A | 1976-06-21 | 1976-06-21 |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2356276A1 true FR2356276A1 (fr) | 1978-01-20 |
FR2356276B1 FR2356276B1 (nl) | 1983-02-04 |
Family
ID=24803556
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7718467A Granted FR2356276A1 (fr) | 1976-06-21 | 1977-06-16 | Dispositif semi-conducteur a tension de rupture elevee |
Country Status (5)
Country | Link |
---|---|
JP (1) | JPS538069A (nl) |
DE (1) | DE2727487C2 (nl) |
FR (1) | FR2356276A1 (nl) |
NL (1) | NL180265C (nl) |
SE (1) | SE7707190L (nl) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2449971A1 (fr) * | 1979-02-22 | 1980-09-19 | Rca Corp | Procede d'attaque en une fois pour former une structure mesa ayant une paroi a plusieurs etages |
EP0144876A2 (de) * | 1983-12-07 | 1985-06-19 | BBC Brown Boveri AG | Halbleiterbauelement |
EP0164645A2 (de) * | 1984-06-14 | 1985-12-18 | Asea Brown Boveri Aktiengesellschaft | Silizium-Halbleiterbauelement mit ätztechnisch hergestellter Randkontur und Verfahren zur Herstellung dieses Bauelementes |
EP0389863A1 (de) * | 1989-03-29 | 1990-10-03 | Siemens Aktiengesellschaft | Verfahren zur Herstellung eines planaren pn-Übergangs hoher Spannungsfestigkeit |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6190463A (ja) * | 1984-10-11 | 1986-05-08 | Hitachi Ltd | 半導体装置 |
DE10349908C5 (de) * | 2003-10-25 | 2009-02-12 | Semikron Elektronik Gmbh & Co. Kg | Verfahren zur Herstellung eines zweifach passivierten Leistungshalbleiterbauelements mit einer MESA Randstruktur |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1052661A (nl) * | 1963-01-30 | 1900-01-01 | ||
DE1539961A1 (de) * | 1965-03-17 | 1970-01-22 | Fuji Electric Co Ltd | Halbleiterbauelement mit mindestens zwei pn-UEbergaengen im einkristallinen Halbleiterkoerper |
DE1276207B (de) * | 1966-09-09 | 1968-08-29 | Licentia Gmbh | Halbleiterbauelement |
-
1977
- 1977-06-10 NL NLAANVRAGE7706389,A patent/NL180265C/nl not_active IP Right Cessation
- 1977-06-16 FR FR7718467A patent/FR2356276A1/fr active Granted
- 1977-06-18 DE DE2727487A patent/DE2727487C2/de not_active Expired
- 1977-06-21 JP JP7290177A patent/JPS538069A/ja active Granted
- 1977-06-21 SE SE7707190A patent/SE7707190L/xx unknown
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2449971A1 (fr) * | 1979-02-22 | 1980-09-19 | Rca Corp | Procede d'attaque en une fois pour former une structure mesa ayant une paroi a plusieurs etages |
EP0144876A2 (de) * | 1983-12-07 | 1985-06-19 | BBC Brown Boveri AG | Halbleiterbauelement |
EP0144876A3 (en) * | 1983-12-07 | 1985-07-03 | Bbc Aktiengesellschaft Brown, Boveri & Cie. | Semiconductor device |
EP0164645A2 (de) * | 1984-06-14 | 1985-12-18 | Asea Brown Boveri Aktiengesellschaft | Silizium-Halbleiterbauelement mit ätztechnisch hergestellter Randkontur und Verfahren zur Herstellung dieses Bauelementes |
EP0164645A3 (de) * | 1984-06-14 | 1987-09-30 | Asea Brown Boveri Aktiengesellschaft | Silizium-Halbleiterbauelement mit ätztechnisch hergestellter Randkontur und Verfahren zur Herstellung dieses Bauelementes |
EP0389863A1 (de) * | 1989-03-29 | 1990-10-03 | Siemens Aktiengesellschaft | Verfahren zur Herstellung eines planaren pn-Übergangs hoher Spannungsfestigkeit |
Also Published As
Publication number | Publication date |
---|---|
NL180265B (nl) | 1986-08-18 |
SE7707190L (sv) | 1977-12-22 |
DE2727487A1 (de) | 1977-12-29 |
DE2727487C2 (de) | 1985-05-15 |
JPS5639057B2 (nl) | 1981-09-10 |
FR2356276B1 (nl) | 1983-02-04 |
JPS538069A (en) | 1978-01-25 |
NL7706389A (nl) | 1977-12-23 |
NL180265C (nl) | 1987-01-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |