FI914935A0 - Korttidsspektroskopisk metod och apparat foer analys av under processering varande smaelt metall. - Google Patents

Korttidsspektroskopisk metod och apparat foer analys av under processering varande smaelt metall.

Info

Publication number
FI914935A0
FI914935A0 FI914935A FI914935A FI914935A0 FI 914935 A0 FI914935 A0 FI 914935A0 FI 914935 A FI914935 A FI 914935A FI 914935 A FI914935 A FI 914935A FI 914935 A0 FI914935 A0 FI 914935A0
Authority
FI
Finland
Prior art keywords
molten metal
plasma plume
analysis
spectroscopic
pulsed laser
Prior art date
Application number
FI914935A
Other languages
English (en)
Finnish (fi)
Inventor
Yong W Kim
Original Assignee
Univ Lehigh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ Lehigh filed Critical Univ Lehigh
Publication of FI914935A0 publication Critical patent/FI914935A0/fi

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12Generating the spectrum; Monochromators
    • G01J3/18Generating the spectrum; Monochromators using diffraction elements, e.g. grating
    • G01J3/1809Echelle gratings
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/30Measuring the intensity of spectral lines directly on the spectrum itself
    • G01J3/36Investigating two or more bands of a spectrum by separate detectors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0208Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/021Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using plane or convex mirrors, parallel phase plates, or particular reflectors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0286Constructional arrangements for compensating for fluctuations caused by temperature, humidity or pressure, or using cooling or temperature stabilization of parts of the device; Controlling the atmosphere inside a spectrometer, e.g. vacuum
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0291Housings; Spectrometer accessories; Spatial arrangement of elements, e.g. folded path arrangements
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/04Slit arrangements slit adjustment
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/2889Rapid scan spectrometers; Time resolved spectrometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/718Laser microanalysis, i.e. with formation of sample plasma
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12Generating the spectrum; Monochromators
    • G01J3/18Generating the spectrum; Monochromators using diffraction elements, e.g. grating
    • G01J2003/1828Generating the spectrum; Monochromators using diffraction elements, e.g. grating with order sorter or prefilter
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G01N21/69Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence specially adapted for fluids, e.g. molten metal
    • G01N2021/695Molten metals

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • Optics & Photonics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Plasma & Fusion (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating And Analyzing Materials By Characteristic Methods (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Pharmaceuticals Containing Other Organic And Inorganic Compounds (AREA)
FI914935A 1989-04-21 1991-10-18 Korttidsspektroskopisk metod och apparat foer analys av under processering varande smaelt metall. FI914935A0 (fi)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07341748 US4986658B1 (en) 1989-04-21 1989-04-21 Transient spectroscopic method and apparatus for in-process analysis of molten metal
PCT/US1990/002078 WO1990013008A1 (en) 1989-04-21 1990-04-20 Transient spectroscopic method and apparatus for in-process analysis of molten metal

Publications (1)

Publication Number Publication Date
FI914935A0 true FI914935A0 (fi) 1991-10-18

Family

ID=23338867

Family Applications (1)

Application Number Title Priority Date Filing Date
FI914935A FI914935A0 (fi) 1989-04-21 1991-10-18 Korttidsspektroskopisk metod och apparat foer analys av under processering varande smaelt metall.

Country Status (16)

Country Link
US (1) US4986658B1 (cs)
EP (1) EP0469083B1 (cs)
JP (1) JPH04507136A (cs)
KR (1) KR960012784B1 (cs)
AT (1) ATE170627T1 (cs)
AU (1) AU637795B2 (cs)
BR (1) BR9007307A (cs)
CA (1) CA2051125C (cs)
CZ (1) CZ285316B6 (cs)
DE (1) DE69032620T2 (cs)
ES (1) ES2121752T3 (cs)
FI (1) FI914935A0 (cs)
HU (1) HUT61842A (cs)
PL (1) PL164530B1 (cs)
WO (1) WO1990013008A1 (cs)
ZA (1) ZA902481B (cs)

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US5567625A (en) * 1994-10-19 1996-10-22 International Business Machines Corporation Apparatus and method for real-time spectral deconvolution of chemical mixtures
US5751416A (en) * 1996-08-29 1998-05-12 Mississippi State University Analytical method using laser-induced breakdown spectroscopy
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ES2121702B1 (es) * 1997-02-17 1999-06-16 Univ Malaga Sensor para monitorizacion on-line y remota de procesos automatizados de soldadura con laser.
DE19753348A1 (de) * 1997-12-03 1999-06-10 Spectro Analytical Instr Gmbh Vorrichtung zur Erfassung und Quantifizierung von Element-Konzentrationsverteilungen in Feststoffen
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US6008896A (en) * 1998-07-01 1999-12-28 National Research Council Of Canada Method and apparatus for spectroscopic analysis of heterogeneous materials
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AUPP573098A0 (en) * 1998-09-04 1998-10-01 Generation Technology Research Pty Ltd Apparatus and method for analyzing material
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AT409553B (de) * 2000-09-28 2002-09-25 Voest Alpine Ind Anlagen Vorrichtung zur chemischen analyse von materialproben sowie metallurgisches gefäss hierfür
US6741345B2 (en) 2001-02-08 2004-05-25 National Research Council Of Canada Method and apparatus for in-process liquid analysis by laser induced plasma spectroscopy
DE10155384B4 (de) * 2001-11-10 2014-12-31 Sms Siemag Aktiengesellschaft Online Qualitätskontrolle von Stranggieß-Produkten mittels Laseranalyse
US6784429B2 (en) 2002-04-19 2004-08-31 Energy Research Company Apparatus and method for in situ, real time measurements of properties of liquids
US6909505B2 (en) 2002-06-24 2005-06-21 National Research Council Of Canada Method and apparatus for molten material analysis by laser induced breakdown spectroscopy
US20060006648A1 (en) * 2003-03-06 2006-01-12 Grimmett Harold M Tubular goods with threaded integral joint connections
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US7113277B2 (en) * 2003-05-14 2006-09-26 Lockheed Martin Corporation System and method of aerosolized agent capture and detection
US7169239B2 (en) * 2003-05-16 2007-01-30 Lone Star Steel Company, L.P. Solid expandable tubular members formed from very low carbon steel and method
BE1015940A3 (fr) * 2004-02-13 2005-12-06 Heraeus Electro Nite Int Procede d'analyse par spectrometrie d'emission optique d'une substance en fusion.
CA2539844C (en) 2003-12-17 2012-01-31 Heraeus Electro-Nite International N.V. Method for analysis of a fused material device and dipping sensor
DE10359447B4 (de) * 2003-12-17 2006-03-30 Heraeus Electro-Nite International N.V. Eintauchsensor
AT413244B (de) * 2004-03-30 2005-12-15 Innsitec Laser Technologies Gm Verfahren zur ermittlung und korrektur bzw. regelung des verlaufs eines laserlichtstrahls in einem hohlkörper
JP2006266792A (ja) * 2005-03-23 2006-10-05 Jfe Steel Kk 溶融金属の発光分光分析装置
US7530265B2 (en) * 2005-09-26 2009-05-12 Baker Hughes Incorporated Method and apparatus for elemental analysis of a fluid downhole
DE102006047765B3 (de) * 2006-10-06 2007-12-20 Heraeus Electro-Nite International N.V. Eintauchlanze für die Analyse von Schmelzen und Flüssigkeiten
US7394537B1 (en) * 2006-12-22 2008-07-01 Oxford Instruments Analytical Oy Practical laser induced breakdown spectroscopy unit
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Also Published As

Publication number Publication date
HU903754D0 (en) 1992-02-28
CA2051125C (en) 1999-11-30
EP0469083A4 (en) 1992-06-03
DE69032620T2 (de) 1999-04-15
ZA902481B (en) 1991-01-30
BR9007307A (pt) 1992-03-24
EP0469083B1 (en) 1998-09-02
PL164530B1 (pl) 1994-08-31
ATE170627T1 (de) 1998-09-15
CZ285316B6 (cs) 1999-07-14
KR920701799A (ko) 1992-08-12
AU5532290A (en) 1990-11-16
DE69032620D1 (de) 1998-10-08
US4986658B1 (en) 1996-06-25
US4986658A (en) 1991-01-22
KR960012784B1 (ko) 1996-09-24
CS198190A3 (en) 1992-01-15
HUT61842A (en) 1993-03-01
AU637795B2 (en) 1993-06-10
CA2051125A1 (en) 1990-10-22
EP0469083A1 (en) 1992-02-05
WO1990013008A1 (en) 1990-11-01
ES2121752T3 (es) 1998-12-16
JPH04507136A (ja) 1992-12-10

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