JPS523487A - Testing method and device of the bonding quality on the electric part of metal - Google Patents

Testing method and device of the bonding quality on the electric part of metal

Info

Publication number
JPS523487A
JPS523487A JP7986875A JP7986875A JPS523487A JP S523487 A JPS523487 A JP S523487A JP 7986875 A JP7986875 A JP 7986875A JP 7986875 A JP7986875 A JP 7986875A JP S523487 A JPS523487 A JP S523487A
Authority
JP
Japan
Prior art keywords
metal
bonding quality
testing method
electric part
bonding
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7986875A
Other languages
Japanese (ja)
Inventor
Wataru Shimada
Mitsuhito Kamei
Takashi Kondo
Mieko Nakamura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP7986875A priority Critical patent/JPS523487A/en
Publication of JPS523487A publication Critical patent/JPS523487A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:Irradiating LASER ray into the surface to be connected, measuring the intensity of reflected diffraction pattern, to judge the bonding quality simply and quckly.
JP7986875A 1975-06-26 1975-06-26 Testing method and device of the bonding quality on the electric part of metal Pending JPS523487A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7986875A JPS523487A (en) 1975-06-26 1975-06-26 Testing method and device of the bonding quality on the electric part of metal

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7986875A JPS523487A (en) 1975-06-26 1975-06-26 Testing method and device of the bonding quality on the electric part of metal

Publications (1)

Publication Number Publication Date
JPS523487A true JPS523487A (en) 1977-01-11

Family

ID=13702175

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7986875A Pending JPS523487A (en) 1975-06-26 1975-06-26 Testing method and device of the bonding quality on the electric part of metal

Country Status (1)

Country Link
JP (1) JPS523487A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0430095A2 (en) * 1989-11-24 1991-06-05 Kabushiki Kaisha Toshiba Inner lead bonding inspecting method and inspection apparatus therefor
US5427472A (en) * 1992-10-29 1995-06-27 Ono; Taisaburo Underwater truss structure
US10466145B2 (en) 2016-12-13 2019-11-05 Heraeus Electro-Nite International N.V. Direct analysis sampler

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0430095A2 (en) * 1989-11-24 1991-06-05 Kabushiki Kaisha Toshiba Inner lead bonding inspecting method and inspection apparatus therefor
US5331397A (en) * 1989-11-24 1994-07-19 Kabushiki Kaisha Toshiba Inner lead bonding inspecting method and inspection apparatus therefor
US5427472A (en) * 1992-10-29 1995-06-27 Ono; Taisaburo Underwater truss structure
US10466145B2 (en) 2016-12-13 2019-11-05 Heraeus Electro-Nite International N.V. Direct analysis sampler

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