JPS523487A - Testing method and device of the bonding quality on the electric part of metal - Google Patents
Testing method and device of the bonding quality on the electric part of metalInfo
- Publication number
- JPS523487A JPS523487A JP7986875A JP7986875A JPS523487A JP S523487 A JPS523487 A JP S523487A JP 7986875 A JP7986875 A JP 7986875A JP 7986875 A JP7986875 A JP 7986875A JP S523487 A JPS523487 A JP S523487A
- Authority
- JP
- Japan
- Prior art keywords
- metal
- bonding quality
- testing method
- electric part
- bonding
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
PURPOSE:Irradiating LASER ray into the surface to be connected, measuring the intensity of reflected diffraction pattern, to judge the bonding quality simply and quckly.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7986875A JPS523487A (en) | 1975-06-26 | 1975-06-26 | Testing method and device of the bonding quality on the electric part of metal |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7986875A JPS523487A (en) | 1975-06-26 | 1975-06-26 | Testing method and device of the bonding quality on the electric part of metal |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS523487A true JPS523487A (en) | 1977-01-11 |
Family
ID=13702175
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7986875A Pending JPS523487A (en) | 1975-06-26 | 1975-06-26 | Testing method and device of the bonding quality on the electric part of metal |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS523487A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0430095A2 (en) * | 1989-11-24 | 1991-06-05 | Kabushiki Kaisha Toshiba | Inner lead bonding inspecting method and inspection apparatus therefor |
US5427472A (en) * | 1992-10-29 | 1995-06-27 | Ono; Taisaburo | Underwater truss structure |
US10466145B2 (en) | 2016-12-13 | 2019-11-05 | Heraeus Electro-Nite International N.V. | Direct analysis sampler |
-
1975
- 1975-06-26 JP JP7986875A patent/JPS523487A/en active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0430095A2 (en) * | 1989-11-24 | 1991-06-05 | Kabushiki Kaisha Toshiba | Inner lead bonding inspecting method and inspection apparatus therefor |
US5331397A (en) * | 1989-11-24 | 1994-07-19 | Kabushiki Kaisha Toshiba | Inner lead bonding inspecting method and inspection apparatus therefor |
US5427472A (en) * | 1992-10-29 | 1995-06-27 | Ono; Taisaburo | Underwater truss structure |
US10466145B2 (en) | 2016-12-13 | 2019-11-05 | Heraeus Electro-Nite International N.V. | Direct analysis sampler |
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