ES2121752T3 - Metodo y aparato electroscopicos de estados transitorios para el analisis de metal fundido, durante el procesado. - Google Patents
Metodo y aparato electroscopicos de estados transitorios para el analisis de metal fundido, durante el procesado.Info
- Publication number
- ES2121752T3 ES2121752T3 ES90907995T ES90907995T ES2121752T3 ES 2121752 T3 ES2121752 T3 ES 2121752T3 ES 90907995 T ES90907995 T ES 90907995T ES 90907995 T ES90907995 T ES 90907995T ES 2121752 T3 ES2121752 T3 ES 2121752T3
- Authority
- ES
- Spain
- Prior art keywords
- molten metal
- plasma plume
- spectroscopic
- pulsed laser
- plasma
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000002184 metal Substances 0.000 title abstract 7
- 238000000034 method Methods 0.000 title abstract 3
- 230000001052 transient effect Effects 0.000 title abstract 2
- 239000000523 sample Substances 0.000 abstract 3
- 238000010521 absorption reaction Methods 0.000 abstract 1
- 238000005259 measurement Methods 0.000 abstract 1
- 230000005855 radiation Effects 0.000 abstract 1
- 230000003595 spectral effect Effects 0.000 abstract 1
- 238000004611 spectroscopical analysis Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/30—Measuring the intensity of spectral lines directly on the spectrum itself
- G01J3/36—Investigating two or more bands of a spectrum by separate detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
- G01J3/1809—Echelle gratings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0208—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/021—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using plane or convex mirrors, parallel phase plates, or particular reflectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0286—Constructional arrangements for compensating for fluctuations caused by temperature, humidity or pressure, or using cooling or temperature stabilization of parts of the device; Controlling the atmosphere inside a spectrometer, e.g. vacuum
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0291—Housings; Spectrometer accessories; Spatial arrangement of elements, e.g. folded path arrangements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/04—Slit arrangements slit adjustment
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/2889—Rapid scan spectrometers; Time resolved spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
- G01N21/718—Laser microanalysis, i.e. with formation of sample plasma
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
- G01J2003/1828—Generating the spectrum; Monochromators using diffraction elements, e.g. grating with order sorter or prefilter
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
- G01N21/69—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence specially adapted for fluids, e.g. molten metal
- G01N2021/695—Molten metals
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- Optics & Photonics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Plasma & Fusion (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Investigating And Analyzing Materials By Characteristic Methods (AREA)
- Pharmaceuticals Containing Other Organic And Inorganic Compounds (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
UN METODO Y APARATO PARA EL ANALISIS ESPECTROSCOPICO TRANSITORIO EN PROCESO DE METAL FUNDIDO, EN DONDE SE SUMERGE UNA SONDA (10) QUE CONTIENE UN LASER DE POTENCIA PULSADA (14) QUE PRODUCE UN RAYO LASER PULSADO QUE TIENE UNA FORMA DE ONDA DEL IMPULSO TRIANGULAR EN EL METAL FUNDIDO E IRRADIA UNA CANTIDAD REPRESENTATIVA DEL METAL FUNDIDO. EL RAYO LASER PULSADO VAPORIZA UNA PARTE DEL METAL FUNDIDO PARA PRODUCIR UNA PLUMA DE PLASMA QUE TIENE UNA COMPOSICION ELEMENTAL REPRESENTATIVA DE LA COMPOSICION ELEMENTAL DEL METAL FUNDIDO. ANTES DE QUE LA PLUMA DE PLASMA ALCANCE EL EQUILIBRIO TERMICO POCO DESPUES DE QUE TERMINE EL IMPULSO LASERICO, UN DETECTOR ESPECTROSCOPICO (24) QUE SE ENCUENTRA DENTRO DE LA SONDA (10) DETECTA LAS INVERSIONES DE RAYAS ESPECTRALES EN UNA PRIMERA VENTANA DE CORTA DURACION. DESPUES DE ESTO, CUANDO EL PLASMA DE PERSISTENCIA SE ENCUENTRA EN EQUILIBRIO TERMICO, UN SEGUNDO DETECTOR ESPECTROSCOPICO (242) QUE TAMBIEN SE ENCUENTRA EN LA SONDA (10) LLEVA A CABO UNA SEGUNDA MEDIDA ESPECTROSCOPICA DE CORTA DURACION. UN BUSCADOR DE DISTANCIAS (22) MIDE Y CONTROLA LA DISTANCIA ENTRE LA SUPERFICIE DE METAL FUNDIDO Y EL LASER PULSADO (14).
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07341748 US4986658B1 (en) | 1989-04-21 | 1989-04-21 | Transient spectroscopic method and apparatus for in-process analysis of molten metal |
Publications (1)
Publication Number | Publication Date |
---|---|
ES2121752T3 true ES2121752T3 (es) | 1998-12-16 |
Family
ID=23338867
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES90907995T Expired - Lifetime ES2121752T3 (es) | 1989-04-21 | 1990-04-20 | Metodo y aparato electroscopicos de estados transitorios para el analisis de metal fundido, durante el procesado. |
Country Status (16)
Country | Link |
---|---|
US (1) | US4986658B1 (es) |
EP (1) | EP0469083B1 (es) |
JP (1) | JPH04507136A (es) |
KR (1) | KR960012784B1 (es) |
AT (1) | ATE170627T1 (es) |
AU (1) | AU637795B2 (es) |
BR (1) | BR9007307A (es) |
CA (1) | CA2051125C (es) |
CZ (1) | CZ285316B6 (es) |
DE (1) | DE69032620T2 (es) |
ES (1) | ES2121752T3 (es) |
FI (1) | FI914935A0 (es) |
HU (1) | HUT61842A (es) |
PL (1) | PL164530B1 (es) |
WO (1) | WO1990013008A1 (es) |
ZA (1) | ZA902481B (es) |
Families Citing this family (53)
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WO1993007453A1 (en) * | 1991-10-03 | 1993-04-15 | Iowa State University Research Foundation, Inc. | Mobile inductively coupled plasma system |
NO177875C (no) * | 1993-07-26 | 1995-12-06 | Elkem As | Fremgangsmåte for direkte kjemisk analyse av smeltet metall |
DE4443407C2 (de) * | 1993-12-08 | 1999-07-22 | Fraunhofer Ges Forschung | Vorrichtung zur qualitativen und/oder quantitativen chemischen Analyse einer Substanz, insbesondere zur Analyse einer Metallschmelze |
DE4415381A1 (de) * | 1994-05-02 | 1995-11-09 | Nis Ingenieurgesellschaft Mbh | Lasergestütztes Verfahren zur Bestimmung von Edelmetallkonzentrationen in Metallen |
US5526110A (en) * | 1994-07-08 | 1996-06-11 | Iowa State University Research Foundation, Inc. | In situ calibration of inductively coupled plasma-atomic emission and mass spectroscopy |
US5567625A (en) * | 1994-10-19 | 1996-10-22 | International Business Machines Corporation | Apparatus and method for real-time spectral deconvolution of chemical mixtures |
US5586049A (en) * | 1994-10-19 | 1996-12-17 | International Business Machines Corporation | Apparatus and method for generating profiles of constituents of chemical mixtures |
US5585919A (en) * | 1994-10-19 | 1996-12-17 | International Business Machines Corporation | Error minimization apparatus and method for real-time spectral deconvolution of chemical mixtures |
US5751416A (en) * | 1996-08-29 | 1998-05-12 | Mississippi State University | Analytical method using laser-induced breakdown spectroscopy |
US6061641A (en) * | 1996-10-25 | 2000-05-09 | Hahn; David W. | Method for improving instrument response |
US5781289A (en) * | 1996-11-05 | 1998-07-14 | Sabsabi; Mohamad | Method and apparatus for rapid in situ analysis of preselected components of homogeneous solid compositions, especially pharmaceutical compositions |
ES2121702B1 (es) * | 1997-02-17 | 1999-06-16 | Univ Malaga | Sensor para monitorizacion on-line y remota de procesos automatizados de soldadura con laser. |
DE19753348A1 (de) * | 1997-12-03 | 1999-06-10 | Spectro Analytical Instr Gmbh | Vorrichtung zur Erfassung und Quantifizierung von Element-Konzentrationsverteilungen in Feststoffen |
AU2894399A (en) * | 1998-03-03 | 1999-09-20 | Baker Hughes Incorporated | Improved laser spectral analyzer with sample location detector |
US6008896A (en) * | 1998-07-01 | 1999-12-28 | National Research Council Of Canada | Method and apparatus for spectroscopic analysis of heterogeneous materials |
US5946089A (en) * | 1998-07-13 | 1999-08-31 | Jordan Valley Applied Radiation Ltd. | Plasma spectrometer with shutter assembly |
AUPP573098A0 (en) * | 1998-09-04 | 1998-10-01 | Generation Technology Research Pty Ltd | Apparatus and method for analyzing material |
US6313917B1 (en) | 1999-07-02 | 2001-11-06 | Ncr Corporation | Produce data collector and produce recognition system |
AT409553B (de) * | 2000-09-28 | 2002-09-25 | Voest Alpine Ind Anlagen | Vorrichtung zur chemischen analyse von materialproben sowie metallurgisches gefäss hierfür |
US6741345B2 (en) * | 2001-02-08 | 2004-05-25 | National Research Council Of Canada | Method and apparatus for in-process liquid analysis by laser induced plasma spectroscopy |
DE10155384B4 (de) * | 2001-11-10 | 2014-12-31 | Sms Siemag Aktiengesellschaft | Online Qualitätskontrolle von Stranggieß-Produkten mittels Laseranalyse |
US6784429B2 (en) * | 2002-04-19 | 2004-08-31 | Energy Research Company | Apparatus and method for in situ, real time measurements of properties of liquids |
US6909505B2 (en) | 2002-06-24 | 2005-06-21 | National Research Council Of Canada | Method and apparatus for molten material analysis by laser induced breakdown spectroscopy |
US20060006648A1 (en) * | 2003-03-06 | 2006-01-12 | Grimmett Harold M | Tubular goods with threaded integral joint connections |
US20070228729A1 (en) * | 2003-03-06 | 2007-10-04 | Grimmett Harold M | Tubular goods with threaded integral joint connections |
US7113277B2 (en) * | 2003-05-14 | 2006-09-26 | Lockheed Martin Corporation | System and method of aerosolized agent capture and detection |
US7169239B2 (en) * | 2003-05-16 | 2007-01-30 | Lone Star Steel Company, L.P. | Solid expandable tubular members formed from very low carbon steel and method |
KR101030103B1 (ko) * | 2003-12-17 | 2011-04-20 | 헤라우스 일렉트로-나이트 인터내셔날 엔. 브이. | 용융 재료의 분석 방법, 장치 및 액침 센서 |
BE1015940A3 (fr) * | 2004-02-13 | 2005-12-06 | Heraeus Electro Nite Int | Procede d'analyse par spectrometrie d'emission optique d'une substance en fusion. |
DE10359447B4 (de) * | 2003-12-17 | 2006-03-30 | Heraeus Electro-Nite International N.V. | Eintauchsensor |
AT413244B (de) * | 2004-03-30 | 2005-12-15 | Innsitec Laser Technologies Gm | Verfahren zur ermittlung und korrektur bzw. regelung des verlaufs eines laserlichtstrahls in einem hohlkörper |
JP2006266792A (ja) * | 2005-03-23 | 2006-10-05 | Jfe Steel Kk | 溶融金属の発光分光分析装置 |
US7530265B2 (en) * | 2005-09-26 | 2009-05-12 | Baker Hughes Incorporated | Method and apparatus for elemental analysis of a fluid downhole |
DE102006047765B3 (de) * | 2006-10-06 | 2007-12-20 | Heraeus Electro-Nite International N.V. | Eintauchlanze für die Analyse von Schmelzen und Flüssigkeiten |
US7394537B1 (en) * | 2006-12-22 | 2008-07-01 | Oxford Instruments Analytical Oy | Practical laser induced breakdown spectroscopy unit |
CA2679029A1 (en) * | 2007-02-23 | 2008-08-28 | Thermo Niton Analyzers Llc | Hand-held, self-contained optical emission spectroscopy (oes) analyzer |
JP5111914B2 (ja) * | 2007-03-26 | 2013-01-09 | Nuエコ・エンジニアリング株式会社 | 粒子密度測定プローブ及び粒子密度測定装置 |
JP2009210421A (ja) * | 2008-03-04 | 2009-09-17 | Sony Corp | テラヘルツ分光装置 |
KR101107095B1 (ko) * | 2010-07-30 | 2012-01-30 | 한국수력원자력 주식회사 | 고온 용융염 중의 우라늄농도 실시간 측정장치 |
DE102011014090B4 (de) * | 2011-03-16 | 2013-04-18 | Georgsmarienhütte Gmbh | Verfahren zur Ermittlung eines Betriebs- und/oder Werkstoffparameters in einem Elektrolichtbogenofen |
US8664589B2 (en) * | 2011-12-29 | 2014-03-04 | Electro Scientific Industries, Inc | Spectroscopy data display systems and methods |
JP6095901B2 (ja) * | 2012-05-24 | 2017-03-15 | 株式会社Ihi | 物質特定装置および物質特定方法 |
BE1020753A3 (fr) * | 2012-06-14 | 2014-04-01 | Centre Rech Metallurgique | Dispositif de focalisation d'un faisceau laser par camera. |
US20140268134A1 (en) * | 2013-03-15 | 2014-09-18 | Electro Scientific Industries, Inc. | Laser sampling methods for reducing thermal effects |
CN104297218B (zh) * | 2013-07-15 | 2016-09-14 | 中国科学院沈阳自动化研究所 | 远距离冶金液态金属成分的原位、在线检测装置及方法 |
US10024802B2 (en) | 2014-06-20 | 2018-07-17 | National Research Council Of Canada | Method for laser-induced breakdown spectroscopy and calibration |
US10300551B2 (en) | 2016-11-14 | 2019-05-28 | Matthew Fagan | Metal analyzing plasma CNC cutting machine and associated methods |
RU2664485C1 (ru) * | 2017-07-05 | 2018-08-17 | Александр Николаевич Забродин | Способ спектрального анализа химического состава расплавленных металлов и устройство для его осуществления |
EP3441214B1 (en) * | 2017-08-09 | 2022-09-28 | CL Schutzrechtsverwaltungs GmbH | Apparatus for additively manufacturing of three-dimensional objects |
US11099129B2 (en) | 2017-09-14 | 2021-08-24 | Brown University | Spatially resolved standoff trace chemical sensing using backwards transient absorption spectroscopy |
US10753878B2 (en) | 2017-09-20 | 2020-08-25 | Worcester Polytechnic Institute | Molten metal inclusion testing |
DE102018222792B4 (de) * | 2018-12-21 | 2021-12-02 | Thyssenkrupp Ag | Laserinduzierte Emissionsspektrometrie zur schnellen Gefügeuntersuchung |
WO2023010215A1 (en) * | 2021-08-05 | 2023-02-09 | National Research Council Of Canada | Refractory lance assembly and refractory lance tube |
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FR2079561A5 (es) * | 1970-02-05 | 1971-11-12 | Siderurgie Fse Inst Rech | |
DD127021B1 (de) * | 1976-04-29 | 1979-12-27 | Joachim Mohr | Vorrichtung fuer spektrochemische untersuchungen, insbesondere fuer die laser-mikrospektralanalyse |
US4182574A (en) * | 1976-05-27 | 1980-01-08 | Jenoptik Jena G.M.B.H. | Arrangement for carrying out laser spectral analysis |
JPS56114746A (en) * | 1980-02-14 | 1981-09-09 | Kawasaki Steel Corp | Direct analyzing method for molten metal with pulse laser light |
JPS6042644A (ja) * | 1983-08-17 | 1985-03-06 | Kawasaki Steel Corp | 精錬容器内溶湯の成分連続分析法 |
GB8403976D0 (en) * | 1984-02-15 | 1984-03-21 | British Steel Corp | Analysis of materials |
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-
1989
- 1989-04-21 US US07341748 patent/US4986658B1/en not_active Expired - Fee Related
-
1990
- 1990-03-30 ZA ZA902481A patent/ZA902481B/xx unknown
- 1990-04-20 KR KR1019910701393A patent/KR960012784B1/ko not_active IP Right Cessation
- 1990-04-20 EP EP90907995A patent/EP0469083B1/en not_active Expired - Lifetime
- 1990-04-20 JP JP2506818A patent/JPH04507136A/ja active Pending
- 1990-04-20 ES ES90907995T patent/ES2121752T3/es not_active Expired - Lifetime
- 1990-04-20 AU AU55322/90A patent/AU637795B2/en not_active Ceased
- 1990-04-20 AT AT90907995T patent/ATE170627T1/de not_active IP Right Cessation
- 1990-04-20 HU HU903754A patent/HUT61842A/hu unknown
- 1990-04-20 CZ CS901981A patent/CZ285316B6/cs not_active IP Right Cessation
- 1990-04-20 DE DE69032620T patent/DE69032620T2/de not_active Expired - Fee Related
- 1990-04-20 PL PL90284866A patent/PL164530B1/pl unknown
- 1990-04-20 BR BR909007307A patent/BR9007307A/pt not_active IP Right Cessation
- 1990-04-20 WO PCT/US1990/002078 patent/WO1990013008A1/en active IP Right Grant
- 1990-04-20 CA CA002051125A patent/CA2051125C/en not_active Expired - Fee Related
-
1991
- 1991-10-18 FI FI914935A patent/FI914935A0/fi not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
ZA902481B (en) | 1991-01-30 |
US4986658B1 (en) | 1996-06-25 |
CZ285316B6 (cs) | 1999-07-14 |
JPH04507136A (ja) | 1992-12-10 |
US4986658A (en) | 1991-01-22 |
CA2051125C (en) | 1999-11-30 |
PL164530B1 (pl) | 1994-08-31 |
HU903754D0 (en) | 1992-02-28 |
FI914935A0 (fi) | 1991-10-18 |
ATE170627T1 (de) | 1998-09-15 |
HUT61842A (en) | 1993-03-01 |
DE69032620D1 (de) | 1998-10-08 |
DE69032620T2 (de) | 1999-04-15 |
EP0469083B1 (en) | 1998-09-02 |
KR920701799A (ko) | 1992-08-12 |
AU5532290A (en) | 1990-11-16 |
KR960012784B1 (ko) | 1996-09-24 |
CA2051125A1 (en) | 1990-10-22 |
AU637795B2 (en) | 1993-06-10 |
EP0469083A1 (en) | 1992-02-05 |
CS198190A3 (en) | 1992-01-15 |
BR9007307A (pt) | 1992-03-24 |
EP0469083A4 (en) | 1992-06-03 |
WO1990013008A1 (en) | 1990-11-01 |
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