FI112559B - Pietsosähköinen oskillaattori, jänniteohjattu oskillaattori, ja niiden valmistusmenetelmä - Google Patents
Pietsosähköinen oskillaattori, jänniteohjattu oskillaattori, ja niiden valmistusmenetelmäInfo
- Publication number
- FI112559B FI112559B FI960668A FI960668A FI112559B FI 112559 B FI112559 B FI 112559B FI 960668 A FI960668 A FI 960668A FI 960668 A FI960668 A FI 960668A FI 112559 B FI112559 B FI 112559B
- Authority
- FI
- Finland
- Prior art keywords
- oscillator
- manufacture
- voltage controlled
- piezoelectric
- controlled oscillator
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/05—Holders; Supports
- H03H9/0538—Constructional combinations of supports or holders with electromechanical or other electronic elements
- H03H9/0542—Constructional combinations of supports or holders with electromechanical or other electronic elements consisting of a lateral arrangement
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03B—GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS
- H03B5/00—Generation of oscillations using amplifier with regenerative feedback from output to input
- H03B5/30—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element being electromechanical resonator
- H03B5/32—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element being electromechanical resonator being a piezoelectric resonator
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/45144—Gold (Au) as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
- H01L2224/491—Disposition
- H01L2224/4912—Layout
- H01L2224/49171—Fan-out arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01079—Gold [Au]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
- H01L2924/1901—Structure
- H01L2924/1904—Component type
- H01L2924/19041—Component type being a capacitor
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03B—GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS
- H03B2201/00—Aspects of oscillators relating to varying the frequency of the oscillations
- H03B2201/02—Varying the frequency of the oscillations by electronic means
- H03B2201/0208—Varying the frequency of the oscillations by electronic means the means being an element with a variable capacitance, e.g. capacitance diode
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03B—GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS
- H03B2201/00—Aspects of oscillators relating to varying the frequency of the oscillations
- H03B2201/02—Varying the frequency of the oscillations by electronic means
- H03B2201/0275—Varying the frequency of the oscillations by electronic means the means delivering several selected voltages or currents
- H03B2201/0283—Varying the frequency of the oscillations by electronic means the means delivering several selected voltages or currents the means functioning digitally
- H03B2201/0291—Varying the frequency of the oscillations by electronic means the means delivering several selected voltages or currents the means functioning digitally and being controlled by a processing device, e.g. a microprocessor
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03B—GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS
- H03B5/00—Generation of oscillations using amplifier with regenerative feedback from output to input
- H03B5/30—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element being electromechanical resonator
- H03B5/32—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element being electromechanical resonator being a piezoelectric resonator
- H03B5/36—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element being electromechanical resonator being a piezoelectric resonator active element in amplifier being semiconductor device
- H03B5/366—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element being electromechanical resonator being a piezoelectric resonator active element in amplifier being semiconductor device and comprising means for varying the frequency by a variable voltage or current
- H03B5/368—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element being electromechanical resonator being a piezoelectric resonator active element in amplifier being semiconductor device and comprising means for varying the frequency by a variable voltage or current the means being voltage variable capacitance diodes
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03J—TUNING RESONANT CIRCUITS; SELECTING RESONANT CIRCUITS
- H03J2200/00—Indexing scheme relating to tuning resonant circuits and selecting resonant circuits
- H03J2200/10—Tuning of a resonator by means of digitally controlled capacitor bank
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/42—Piezoelectric device making
Landscapes
- Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
- Oscillators With Electromechanical Resonators (AREA)
- Wire Bonding (AREA)
- Lead Frames For Integrated Circuits (AREA)
- Inductance-Capacitance Distribution Constants And Capacitance-Resistance Oscillators (AREA)
- Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2717095 | 1995-02-15 | ||
JP25662395 | 1995-10-03 | ||
JP00269396A JP3421747B2 (ja) | 1995-02-15 | 1996-01-10 | 圧電発振器及び電圧制御発振器 |
Publications (3)
Publication Number | Publication Date |
---|---|
FI960668A0 FI960668A0 (fi) | 1996-02-14 |
FI960668A FI960668A (fi) | 1996-08-16 |
FI112559B true FI112559B (fi) | 2003-12-15 |
Family
ID=27275483
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FI960668A FI112559B (fi) | 1995-02-15 | 1996-02-14 | Pietsosähköinen oskillaattori, jänniteohjattu oskillaattori, ja niiden valmistusmenetelmä |
Country Status (6)
Country | Link |
---|---|
US (2) | US5631609A (ja) |
EP (1) | EP0727872B1 (ja) |
JP (1) | JP3421747B2 (ja) |
CN (1) | CN1099754C (ja) |
DE (1) | DE69611046T2 (ja) |
FI (1) | FI112559B (ja) |
Families Citing this family (64)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5912592A (en) * | 1994-07-04 | 1999-06-15 | Seiko Epson Corporation | Piezoelectric oscillator |
JP2974622B2 (ja) * | 1996-09-20 | 1999-11-10 | 松下電器産業株式会社 | 発振器 |
US6081164A (en) * | 1997-01-09 | 2000-06-27 | Seiko Epson Corporation | PLL oscillator package and production method thereof |
GB2330711B (en) * | 1997-10-21 | 2000-06-28 | Lsi Logic Corp | Controllable reactance circuit for an integrated circuit |
JP3337970B2 (ja) * | 1998-03-06 | 2002-10-28 | 日本プレシジョン・サーキッツ株式会社 | 水晶発振回路および水晶発振用集積回路装置 |
JP3829525B2 (ja) * | 1998-04-02 | 2006-10-04 | セイコーエプソン株式会社 | 容量アレイユニット及び発振回路 |
US6590314B1 (en) | 1998-08-07 | 2003-07-08 | Seiko Epson Corporation | Piezoelectric resonator container, piezoelectric resonator using the same, circuit board mounting piezoelectric resonator thereon, and method for manufacturing piezoelectric resonator |
US6268778B1 (en) * | 1999-05-03 | 2001-07-31 | Silicon Wave, Inc. | Method and apparatus for fully integrating a voltage controlled oscillator on an integrated circuit |
US6211745B1 (en) | 1999-05-03 | 2001-04-03 | Silicon Wave, Inc. | Method and apparatus for digitally controlling the capacitance of an integrated circuit device using mos-field effect transistors |
WO2001031774A1 (en) * | 1999-10-26 | 2001-05-03 | Analog Devices, Inc. | Apparatus and method for changing crystal oscillator frequency |
US6271733B1 (en) * | 1999-12-13 | 2001-08-07 | Agere Systems Guardian Corp. | Integrated oscillator circuit with a memory based frequency control circuit and associated methods |
EP1146640A1 (de) * | 2000-04-10 | 2001-10-17 | Infineon Technologies AG | Integrierter Hochfrequenzschwingkreis mit Abgleichkondensatoren |
JP2002135053A (ja) * | 2000-10-26 | 2002-05-10 | Murata Mfg Co Ltd | 圧電発振器及びその製造方法、及び圧電発振器を用いた電子装置 |
JP3921362B2 (ja) * | 2001-07-30 | 2007-05-30 | 日本電波工業株式会社 | 温度補償水晶発振器 |
US7098748B2 (en) | 2001-09-21 | 2006-08-29 | Schmidt Dominik J | Integrated CMOS high precision piezo-electrically driven clock |
CN1300812C (zh) * | 2001-10-31 | 2007-02-14 | 中国科学院上海冶金研究所 | 一种高容量电化学电容器的制造方法 |
DE10162912B4 (de) * | 2001-12-20 | 2006-09-28 | Infineon Technologies Ag | Quarzoszillatorschaltung |
US6853261B1 (en) | 2002-05-07 | 2005-02-08 | Rfmd Wpan, Inc. | Method and apparatus for calibrating voltage-controlled devices |
JP3764877B2 (ja) * | 2002-10-16 | 2006-04-12 | 株式会社日立製作所 | レーダ装置 |
JP4222147B2 (ja) * | 2002-10-23 | 2009-02-12 | セイコーエプソン株式会社 | 圧電発振器及び圧電発振器を利用した携帯電話装置および圧電発振器を利用した電子機器 |
DE10308087A1 (de) * | 2003-02-24 | 2004-09-09 | Endress + Hauser Gmbh + Co. Kg | Schutz vor den Effekten von Kondensatbrücken |
JP4314999B2 (ja) | 2003-03-13 | 2009-08-19 | セイコーエプソン株式会社 | 圧電発振器及び圧電発振器を利用した携帯電話装置および圧電発振器を利用した電子機器 |
CN100334803C (zh) * | 2003-04-15 | 2007-08-29 | 泰艺电子股份有限公司 | 同步制造多个压电振荡器的方法 |
US20040246039A1 (en) * | 2003-06-03 | 2004-12-09 | Chi-Ming Hsiao | Switched capacitor circuit capable of minimizing clock feedthrough effect in a voltage controlled oscillator circuit |
JP3783235B2 (ja) * | 2003-06-16 | 2006-06-07 | セイコーエプソン株式会社 | 圧電発振器とその製造方法ならびに圧電発振器を利用した携帯電話装置および圧電発振器を利用した電子機器 |
US7015742B2 (en) * | 2003-06-20 | 2006-03-21 | Media Tek Inc. | Switched capacitor circuit capable of eliminating clock feedthrough by complementary control signals for digital tuning VCO |
US7266869B2 (en) * | 2003-07-30 | 2007-09-11 | Kyocera Corporation | Method for manufacturing a piezoelectric oscillator |
KR100756131B1 (ko) * | 2003-09-02 | 2007-09-05 | 산요덴키가부시키가이샤 | 회로 장치 및 그 제조 방법 |
TWI349439B (en) | 2004-03-22 | 2011-09-21 | Integrated Device Tech | Monolithic clock generator and timing/frequency reference |
US7719371B2 (en) | 2004-03-22 | 2010-05-18 | Integrated Device Technology, Inc. | Spread spectrum clock and reference signal generator |
US8095813B2 (en) | 2004-03-22 | 2012-01-10 | Integrated Device Technology, Inc | Integrated circuit systems having processor-controlled clock signal generators therein that support efficient power management |
JP4763477B2 (ja) * | 2005-02-25 | 2011-08-31 | セイコーインスツル株式会社 | リードフレーム及びそれを用いた表面実装型圧電振動子の製造方法、及び圧電振動子の樹脂モールド構造 |
US20060267701A1 (en) * | 2005-05-27 | 2006-11-30 | Robert Eilers | Method and system for dynamically calculating values for tuning of voltage-controlled crystal oscillators |
US20070004362A1 (en) * | 2005-06-30 | 2007-01-04 | Lawrence Der | Methods and apparatus to generate small frequency changes |
EP1791252A1 (en) * | 2005-11-24 | 2007-05-30 | Telefonaktiebolaget LM Ericsson (publ) | Oscillator comprising a startup control device |
KR20080069262A (ko) * | 2005-11-24 | 2008-07-25 | 텔레폰악티에볼라겟엘엠에릭슨(펍) | 시동 제어 장치를 구비한 발진기 |
US20070188053A1 (en) * | 2006-02-14 | 2007-08-16 | Robert Bosch Gmbh | Injection molded energy harvesting device |
EP2044685A4 (en) * | 2006-07-21 | 2009-08-12 | Ecole Technologie Superieure | VOLTAGE-CONTROLLED OSCILLATOR (VCO) |
JP5076440B2 (ja) * | 2006-10-16 | 2012-11-21 | 富士電機株式会社 | 半導体装置及び半導体装置の製造方法 |
JP5164532B2 (ja) * | 2007-11-14 | 2013-03-21 | オンセミコンダクター・トレーディング・リミテッド | 半導体モジュールおよび撮像装置 |
US7978017B2 (en) | 2007-12-05 | 2011-07-12 | Integrated Device Technology, Inc. | Control voltage generator for a clock, frequency reference, and other reference signal generator |
US8093958B2 (en) | 2007-12-05 | 2012-01-10 | Integrated Device Technology, Inc. | Clock, frequency reference, and other reference signal generator with a controlled quality factor |
US8134414B2 (en) | 2009-04-24 | 2012-03-13 | Integrated Device Technology, Inc. | Clock, frequency reference, and other reference signal generator with frequency stability over temperature variation |
US9106378B2 (en) * | 2009-06-10 | 2015-08-11 | Qualcomm Incorporated | Systems, apparatus and methods for communicating downlink information |
US8164159B1 (en) | 2009-07-18 | 2012-04-24 | Intergrated Device Technologies, inc. | Semiconductor resonators with electromagnetic and environmental shielding and methods of forming same |
US9144037B2 (en) * | 2009-08-11 | 2015-09-22 | Qualcomm Incorporated | Interference mitigation by puncturing transmission of interfering cells |
US8724563B2 (en) * | 2009-08-24 | 2014-05-13 | Qualcomm Incorporated | Method and apparatus that facilitates detecting system information blocks in a heterogeneous network |
US9277566B2 (en) | 2009-09-14 | 2016-03-01 | Qualcomm Incorporated | Cross-subframe control channel design |
JP4998620B2 (ja) | 2009-09-14 | 2012-08-15 | 株式会社村田製作所 | 圧電振動装置の製造方法 |
US8942192B2 (en) | 2009-09-15 | 2015-01-27 | Qualcomm Incorporated | Methods and apparatus for subframe interlacing in heterogeneous networks |
US9226288B2 (en) | 2010-04-13 | 2015-12-29 | Qualcomm Incorporated | Method and apparatus for supporting communications in a heterogeneous network |
US9125072B2 (en) | 2010-04-13 | 2015-09-01 | Qualcomm Incorporated | Heterogeneous network (HetNet) user equipment (UE) radio resource management (RRM) measurements |
US9271167B2 (en) | 2010-04-13 | 2016-02-23 | Qualcomm Incorporated | Determination of radio link failure with enhanced interference coordination and cancellation |
US9392608B2 (en) | 2010-04-13 | 2016-07-12 | Qualcomm Incorporated | Resource partitioning information for enhanced interference coordination |
CN102332891A (zh) * | 2010-07-14 | 2012-01-25 | 鸿富锦精密工业(深圳)有限公司 | 具有可调频功能的晶振电路 |
US8886190B2 (en) | 2010-10-08 | 2014-11-11 | Qualcomm Incorporated | Method and apparatus for measuring cells in the presence of interference |
TWI420810B (zh) | 2010-12-17 | 2013-12-21 | Ind Tech Res Inst | 石英振盪器及其製造方法 |
US8638131B2 (en) * | 2011-02-23 | 2014-01-28 | Qualcomm Incorporated | Dynamic feedback-controlled output driver with minimum slew rate variation from process, temperature and supply |
CN103166674A (zh) * | 2011-12-14 | 2013-06-19 | 无锡国科微纳传感网科技有限公司 | 一种信号频率的校正方法和装置 |
JP6129671B2 (ja) * | 2013-07-19 | 2017-05-17 | ルネサスエレクトロニクス株式会社 | 半導体装置の製造方法 |
US10069502B2 (en) * | 2014-07-31 | 2018-09-04 | Samsung Display Co., Ltd. | Method for PPL and CDR designs for achieving specific bandwidth and phase margin requirements |
JP6910134B2 (ja) * | 2016-11-30 | 2021-07-28 | 京セラ株式会社 | 圧電振動素子及び圧電振動デバイス |
US10291180B2 (en) * | 2017-10-06 | 2019-05-14 | Realtek Semiconductor Corp. | Crystal oscillator circuit and method thereof |
TWI662683B (zh) * | 2017-11-14 | 2019-06-11 | 矽萊克電子股份有限公司 | 電晶體之串聯裝置 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6119204A (ja) * | 1984-07-05 | 1986-01-28 | Matsushima Kogyo Co Ltd | 水晶発振器 |
US5592130A (en) * | 1987-02-27 | 1997-01-07 | Seiko Epson Corporation | Piezoelectric oscillator including a piezoelectric resonator with outer lead |
US5392006A (en) * | 1987-02-27 | 1995-02-21 | Seiko Epson Corporation | Pressure seal type piezoelectric resonator |
JPS63232603A (ja) * | 1987-03-20 | 1988-09-28 | Nec Corp | 温度補償型圧電発振器 |
US4916413A (en) * | 1987-11-20 | 1990-04-10 | Matsushima Kogyo Kabushiki Kaisha | Package for piezo-oscillator |
US4827226A (en) * | 1988-05-31 | 1989-05-02 | Motorola, Inc. | Fully integrated, adjustable oscillator for use with a crystal |
US5030926A (en) * | 1990-07-10 | 1991-07-09 | At&T Bell Laboratories | Voltage controlled balanced crystal oscillator circuit |
JP3099382B2 (ja) * | 1991-02-14 | 2000-10-16 | セイコーエプソン株式会社 | 小型発振器 |
JP3178068B2 (ja) * | 1991-05-31 | 2001-06-18 | セイコーエプソン株式会社 | 圧電発振器 |
JP3079786B2 (ja) * | 1991-10-21 | 2000-08-21 | セイコーエプソン株式会社 | 圧電発振器、及びこれを用いたリアルタイムクロック、pll発振器 |
US5229640A (en) * | 1992-09-01 | 1993-07-20 | Avx Corporation | Surface mountable clock oscillator module |
JPH0799413A (ja) * | 1993-01-22 | 1995-04-11 | Citizen Watch Co Ltd | 水晶発振器およびその製造方法ならびに発振周波数調整方法 |
-
1996
- 1996-01-10 JP JP00269396A patent/JP3421747B2/ja not_active Expired - Lifetime
- 1996-02-12 EP EP96101993A patent/EP0727872B1/en not_active Expired - Lifetime
- 1996-02-12 DE DE69611046T patent/DE69611046T2/de not_active Expired - Lifetime
- 1996-02-14 US US08/601,087 patent/US5631609A/en not_active Expired - Lifetime
- 1996-02-14 CN CN96101425A patent/CN1099754C/zh not_active Expired - Lifetime
- 1996-02-14 FI FI960668A patent/FI112559B/fi not_active IP Right Cessation
-
1997
- 1997-01-21 US US08/785,299 patent/US5745012A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0727872A1 (en) | 1996-08-21 |
DE69611046D1 (de) | 2001-01-04 |
FI960668A (fi) | 1996-08-16 |
JP3421747B2 (ja) | 2003-06-30 |
CN1135680A (zh) | 1996-11-13 |
US5631609A (en) | 1997-05-20 |
US5745012A (en) | 1998-04-28 |
FI960668A0 (fi) | 1996-02-14 |
JPH09162345A (ja) | 1997-06-20 |
CN1099754C (zh) | 2003-01-22 |
EP0727872B1 (en) | 2000-11-29 |
DE69611046T2 (de) | 2001-05-31 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MA | Patent expired |