ES2168953B1 - Derivados de oxima y su uso como acidos latentes - Google Patents
Derivados de oxima y su uso como acidos latentesInfo
- Publication number
- ES2168953B1 ES2168953B1 ES200000798A ES200000798A ES2168953B1 ES 2168953 B1 ES2168953 B1 ES 2168953B1 ES 200000798 A ES200000798 A ES 200000798A ES 200000798 A ES200000798 A ES 200000798A ES 2168953 B1 ES2168953 B1 ES 2168953B1
- Authority
- ES
- Spain
- Prior art keywords
- sub
- substituted
- unsubstituted
- radicals
- halogen
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03G—ELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
- G03G7/00—Selection of materials for use in image-receiving members, i.e. for reversal by physical contact; Manufacture thereof
- G03G7/0006—Cover layers for image-receiving members; Strippable coversheets
- G03G7/002—Organic components thereof
- G03G7/0026—Organic components thereof being macromolecular
- G03G7/004—Organic components thereof being macromolecular obtained by reactions only involving carbon-to-carbon unsaturated bonds
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C251/00—Compounds containing nitrogen atoms doubly-bound to a carbon skeleton
- C07C251/32—Oximes
- C07C251/62—Oximes having oxygen atoms of oxyimino groups esterified
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C309/00—Sulfonic acids; Halides, esters, or anhydrides thereof
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C309/00—Sulfonic acids; Halides, esters, or anhydrides thereof
- C07C309/63—Esters of sulfonic acids
- C07C309/64—Esters of sulfonic acids having sulfur atoms of esterified sulfo groups bound to acyclic carbon atoms
- C07C309/65—Esters of sulfonic acids having sulfur atoms of esterified sulfo groups bound to acyclic carbon atoms of a saturated carbon skeleton
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C317/00—Sulfones; Sulfoxides
- C07C317/26—Sulfones; Sulfoxides having sulfone or sulfoxide groups and nitrogen atoms, not being part of nitro or nitroso groups, bound to the same carbon skeleton
- C07C317/32—Sulfones; Sulfoxides having sulfone or sulfoxide groups and nitrogen atoms, not being part of nitro or nitroso groups, bound to the same carbon skeleton with sulfone or sulfoxide groups bound to carbon atoms of six-membered aromatic rings of the carbon skeleton
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C323/00—Thiols, sulfides, hydropolysulfides or polysulfides substituted by halogen, oxygen or nitrogen atoms, or by sulfur atoms not being part of thio groups
- C07C323/23—Thiols, sulfides, hydropolysulfides or polysulfides substituted by halogen, oxygen or nitrogen atoms, or by sulfur atoms not being part of thio groups containing thio groups and nitrogen atoms, not being part of nitro or nitroso groups, bound to the same carbon skeleton
- C07C323/46—Thiols, sulfides, hydropolysulfides or polysulfides substituted by halogen, oxygen or nitrogen atoms, or by sulfur atoms not being part of thio groups containing thio groups and nitrogen atoms, not being part of nitro or nitroso groups, bound to the same carbon skeleton having at least one of the nitrogen atoms, not being part of nitro or nitroso groups, further bound to other hetero atoms
- C07C323/47—Thiols, sulfides, hydropolysulfides or polysulfides substituted by halogen, oxygen or nitrogen atoms, or by sulfur atoms not being part of thio groups containing thio groups and nitrogen atoms, not being part of nitro or nitroso groups, bound to the same carbon skeleton having at least one of the nitrogen atoms, not being part of nitro or nitroso groups, further bound to other hetero atoms to oxygen atoms
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C381/00—Compounds containing carbon and sulfur and having functional groups not covered by groups C07C301/00 - C07C337/00
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07D—HETEROCYCLIC COMPOUNDS
- C07D319/00—Heterocyclic compounds containing six-membered rings having two oxygen atoms as the only ring hetero atoms
- C07D319/10—1,4-Dioxanes; Hydrogenated 1,4-dioxanes
- C07D319/14—1,4-Dioxanes; Hydrogenated 1,4-dioxanes condensed with carbocyclic rings or ring systems
- C07D319/16—1,4-Dioxanes; Hydrogenated 1,4-dioxanes condensed with carbocyclic rings or ring systems condensed with one six-membered ring
- C07D319/18—Ethylenedioxybenzenes, not substituted on the hetero ring
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07D—HETEROCYCLIC COMPOUNDS
- C07D333/00—Heterocyclic compounds containing five-membered rings having one sulfur atom as the only ring hetero atom
- C07D333/02—Heterocyclic compounds containing five-membered rings having one sulfur atom as the only ring hetero atom not condensed with other rings
- C07D333/04—Heterocyclic compounds containing five-membered rings having one sulfur atom as the only ring hetero atom not condensed with other rings not substituted on the ring sulphur atom
- C07D333/06—Heterocyclic compounds containing five-membered rings having one sulfur atom as the only ring hetero atom not condensed with other rings not substituted on the ring sulphur atom with only hydrogen atoms, hydrocarbon or substituted hydrocarbon radicals, directly attached to the ring carbon atoms
- C07D333/22—Radicals substituted by doubly bound hetero atoms, or by two hetero atoms other than halogen singly bound to the same carbon atom
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/0045—Photosensitive materials with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C2602/00—Systems containing two condensed rings
- C07C2602/36—Systems containing two condensed rings the rings having more than two atoms in common
- C07C2602/42—Systems containing two condensed rings the rings having more than two atoms in common the bicyclo ring system containing seven carbon atoms
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S430/00—Radiation imagery chemistry: process, composition, or product thereof
- Y10S430/1053—Imaging affecting physical property or radiation sensitive material, or producing nonplanar or printing surface - process, composition, or product: radiation sensitive composition or product or process of making binder containing
- Y10S430/1055—Radiation sensitive composition or product or process of making
- Y10S430/114—Initiator containing
- Y10S430/12—Nitrogen compound containing
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP99810273 | 1999-03-31 | ||
EP99810287 | 1999-04-07 | ||
EP99810779 | 1999-08-30 |
Publications (2)
Publication Number | Publication Date |
---|---|
ES2168953A1 ES2168953A1 (es) | 2002-06-16 |
ES2168953B1 true ES2168953B1 (es) | 2003-10-16 |
Family
ID=27240245
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES200000798A Expired - Fee Related ES2168953B1 (es) | 1999-03-31 | 2000-03-30 | Derivados de oxima y su uso como acidos latentes |
Country Status (12)
Families Citing this family (68)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI272451B (en) * | 2000-09-25 | 2007-02-01 | Ciba Sc Holding Ag | Chemically amplified photoresist composition, process for preparation of a photoresist, and use of said chemically amplified photoresist composition |
KR100801457B1 (ko) * | 2001-06-11 | 2008-02-11 | 시바 스페셜티 케미칼스 홀딩 인크. | 결합된 구조를 가지는 옥심 에스테르 광개시제 |
US6824954B2 (en) * | 2001-08-23 | 2004-11-30 | Jsr Corporation | Sulfonyloxime compound, and radiation sensitive acid generator, positive type radiation sensitive resin composition and negative type radiation sensitive resin composition using same |
MXPA04006581A (es) * | 2002-02-06 | 2004-10-04 | Ciba Sc Holding Ag | Derivados de sulfonato y su empleo como acidos latentes. |
US6875480B2 (en) * | 2002-02-27 | 2005-04-05 | Industrial Technology Research Institute | Method of enhancement of electrical conductivity for conductive polymer by use of field effect control |
JP3841405B2 (ja) * | 2002-03-29 | 2006-11-01 | 富士写真フイルム株式会社 | ネガ型レジスト組成物 |
JP4560507B2 (ja) * | 2003-02-19 | 2010-10-13 | チバ ホールディング インコーポレーテッド | ハロゲン化オキシム誘導体及び潜在的酸としてのそれらの使用 |
US7098463B2 (en) * | 2003-03-03 | 2006-08-29 | Heuris Pharma, Llc | Three-dimensional dosimeter for penetrating radiation and method of use |
WO2006008250A2 (en) * | 2004-07-20 | 2006-01-26 | Ciba Specialty Chemicals Holding Inc. | Oxime derivatives and the use therof as latent acids |
TWI332122B (en) | 2005-04-06 | 2010-10-21 | Shinetsu Chemical Co | Novel sulfonate salts and derivatives, photoacid generators, resist compositions and patterning process |
JP4626758B2 (ja) * | 2005-07-07 | 2011-02-09 | 信越化学工業株式会社 | 含フッ素環状構造を有するケイ素化合物及びシリコーン樹脂、それを用いたレジスト組成物、及びパターン形成方法 |
US20070077452A1 (en) * | 2005-10-04 | 2007-04-05 | Jie Liu | Organic light emitting devices having latent activated layers and methods of fabricating the same |
KR100814231B1 (ko) * | 2005-12-01 | 2008-03-17 | 주식회사 엘지화학 | 옥심 에스테르를 포함하는 트리아진계 광활성 화합물을포함하는 투명한 감광성 조성물 |
US20070176167A1 (en) * | 2006-01-27 | 2007-08-02 | General Electric Company | Method of making organic light emitting devices |
TWI406840B (zh) * | 2006-02-24 | 2013-09-01 | Fujifilm Corp | 肟衍生物、光聚合性組成物、彩色濾光片及其製法 |
US8293436B2 (en) * | 2006-02-24 | 2012-10-23 | Fujifilm Corporation | Oxime derivative, photopolymerizable composition, color filter, and process for producing the same |
US7771913B2 (en) * | 2006-04-04 | 2010-08-10 | Shin-Etsu Chemical Co., Ltd. | Resist composition and patterning process using the same |
JP4548617B2 (ja) * | 2006-06-09 | 2010-09-22 | 信越化学工業株式会社 | 化学増幅レジスト材料用光酸発生剤、及び該光酸発生剤を含有するレジスト材料、並びにこれを用いたパターン形成方法 |
JP4623311B2 (ja) * | 2006-06-14 | 2011-02-02 | 信越化学工業株式会社 | 化学増幅レジスト材料用光酸発生剤、及び該光酸発生剤を含有するレジスト材料、並びにこれを用いたパターン形成方法 |
JP2009541254A (ja) * | 2006-06-20 | 2009-11-26 | チバ ホールディング インコーポレーテッド | オキシムスルホネート及び潜酸としてのその使用 |
JP4509080B2 (ja) * | 2006-09-28 | 2010-07-21 | 信越化学工業株式会社 | シルセスキオキサン系化合物混合物及び加水分解性シラン化合物、その製造方法及びそれを用いたレジスト組成物並びにパターン形成方法及び基板の加工方法 |
US7527912B2 (en) * | 2006-09-28 | 2009-05-05 | Shin-Etsu Chemical Co., Ltd. | Photoacid generators, resist compositions, and patterning process |
US7771914B2 (en) * | 2006-10-17 | 2010-08-10 | Shin-Etsu Chemical Co., Ltd. | Resist composition and patterning process |
JP4784760B2 (ja) * | 2006-10-20 | 2011-10-05 | 信越化学工業株式会社 | レジスト材料及びパターン形成方法 |
JP4288520B2 (ja) * | 2006-10-24 | 2009-07-01 | 信越化学工業株式会社 | レジスト材料及びこれを用いたパターン形成方法 |
US7618764B2 (en) * | 2006-11-22 | 2009-11-17 | Shin-Etsu Chemical Co., Ltd. | Positive resist compositions and patterning process |
JP2008129389A (ja) * | 2006-11-22 | 2008-06-05 | Shin Etsu Chem Co Ltd | ポジ型レジスト材料及びパターン形成方法 |
JP4314494B2 (ja) * | 2006-11-29 | 2009-08-19 | 信越化学工業株式会社 | ポジ型レジスト材料及びパターン形成方法 |
JP4910662B2 (ja) * | 2006-11-29 | 2012-04-04 | 信越化学工業株式会社 | ポジ型レジスト材料及びパターン形成方法 |
JP4435196B2 (ja) * | 2007-03-29 | 2010-03-17 | 信越化学工業株式会社 | レジスト材料及びこれを用いたパターン形成方法 |
US8466096B2 (en) * | 2007-04-26 | 2013-06-18 | Afton Chemical Corporation | 1,3,2-dioxaphosphorinane, 2-sulfide derivatives for use as anti-wear additives in lubricant compositions |
US20080268839A1 (en) * | 2007-04-27 | 2008-10-30 | Ayers John I | Reducing a number of registration termination massages in a network for cellular devices |
JP5035560B2 (ja) * | 2007-07-04 | 2012-09-26 | 信越化学工業株式会社 | レジスト材料及びこれを用いたパターン形成方法 |
JP4475435B2 (ja) * | 2007-07-30 | 2010-06-09 | 信越化学工業株式会社 | 含フッ素単量体、含フッ素高分子化合物、レジスト材料及びパターン形成方法 |
JP5035562B2 (ja) * | 2007-08-22 | 2012-09-26 | 信越化学工業株式会社 | パターン形成方法 |
JP5019071B2 (ja) * | 2007-09-05 | 2012-09-05 | 信越化学工業株式会社 | 新規光酸発生剤並びにこれを用いたレジスト材料及びパターン形成方法 |
JP5013119B2 (ja) * | 2007-09-20 | 2012-08-29 | 信越化学工業株式会社 | パターン形成方法並びにこれに用いるレジスト材料 |
JP4993138B2 (ja) * | 2007-09-26 | 2012-08-08 | 信越化学工業株式会社 | レジスト材料及びこれを用いたパターン形成方法 |
JP4513990B2 (ja) | 2008-01-18 | 2010-07-28 | 信越化学工業株式会社 | ポジ型レジスト材料及びパターン形成方法 |
JP4844761B2 (ja) * | 2008-01-18 | 2011-12-28 | 信越化学工業株式会社 | ポジ型レジスト材料及びパターン形成方法 |
JP4513989B2 (ja) | 2008-01-18 | 2010-07-28 | 信越化学工業株式会社 | ポジ型レジスト材料及びパターン形成方法 |
JP5071658B2 (ja) * | 2008-02-14 | 2012-11-14 | 信越化学工業株式会社 | レジスト材料、レジスト保護膜材料、及びパターン形成方法 |
JP5131461B2 (ja) * | 2008-02-14 | 2013-01-30 | 信越化学工業株式会社 | 高分子化合物、レジスト材料、及びパターン形成方法 |
WO2009103611A1 (en) * | 2008-02-21 | 2009-08-27 | Basf Se | Uv-dose indicator films |
JP5177432B2 (ja) * | 2008-02-21 | 2013-04-03 | 信越化学工業株式会社 | パターン形成方法 |
JP4623324B2 (ja) * | 2008-03-18 | 2011-02-02 | 信越化学工業株式会社 | 水酸基を有する単量体、高分子化合物、レジスト材料及びパターン形成方法 |
JP5245956B2 (ja) * | 2008-03-25 | 2013-07-24 | 信越化学工業株式会社 | 新規光酸発生剤並びにこれを用いたレジスト材料及びパターン形成方法 |
JP4569786B2 (ja) | 2008-05-01 | 2010-10-27 | 信越化学工業株式会社 | 新規光酸発生剤並びにこれを用いたレジスト材料及びパターン形成方法 |
JP4650644B2 (ja) * | 2008-05-12 | 2011-03-16 | 信越化学工業株式会社 | レジスト材料及びパターン形成方法 |
JP5381298B2 (ja) * | 2008-05-12 | 2014-01-08 | 信越化学工業株式会社 | レジスト保護膜材料及びパターン形成方法 |
JP4743450B2 (ja) * | 2008-09-05 | 2011-08-10 | 信越化学工業株式会社 | ポジ型レジスト材料及びパターン形成方法 |
JP4771101B2 (ja) * | 2008-09-05 | 2011-09-14 | 信越化学工業株式会社 | ポジ型レジスト材料及びパターン形成方法 |
JP4743451B2 (ja) * | 2008-09-05 | 2011-08-10 | 信越化学工業株式会社 | ポジ型レジスト材料及びパターン形成方法 |
JP4655128B2 (ja) * | 2008-09-05 | 2011-03-23 | 信越化学工業株式会社 | ポジ型レジスト材料及びパターン形成方法 |
WO2010030350A2 (en) * | 2008-09-09 | 2010-03-18 | Herman Myburgh | Nail driving tool mechanism |
KR20110137821A (ko) * | 2009-03-30 | 2011-12-23 | 바스프 에스이 | Uv-조사량 인디케이터 필름 |
JP5177434B2 (ja) * | 2009-04-08 | 2013-04-03 | 信越化学工業株式会社 | パターン形成方法 |
US8691925B2 (en) | 2011-09-23 | 2014-04-08 | Az Electronic Materials (Luxembourg) S.A.R.L. | Compositions of neutral layer for directed self assembly block copolymers and processes thereof |
US8686109B2 (en) | 2012-03-09 | 2014-04-01 | Az Electronic Materials (Luxembourg) S.A.R.L. | Methods and materials for removing metals in block copolymers |
US8835581B2 (en) | 2012-06-08 | 2014-09-16 | Az Electronic Materials (Luxembourg) S.A.R.L. | Neutral layer polymer composition for directed self assembly and processes thereof |
US10457088B2 (en) | 2013-05-13 | 2019-10-29 | Ridgefield Acquisition | Template for self assembly and method of making a self assembled pattern |
US9093263B2 (en) | 2013-09-27 | 2015-07-28 | Az Electronic Materials (Luxembourg) S.A.R.L. | Underlayer composition for promoting self assembly and method of making and using |
US9181449B2 (en) | 2013-12-16 | 2015-11-10 | Az Electronic Materials (Luxembourg) S.A.R.L. | Underlayer composition for promoting self assembly and method of making and using |
KR101491975B1 (ko) | 2014-03-14 | 2015-02-11 | (주)휴넷플러스 | 화학 증폭형 포지티브 감광성 경화 수지 조성물, 이를 이용한 경화막의 제조 방법 및 경화막을 포함하는 전자소자 |
KR102537349B1 (ko) | 2015-02-02 | 2023-05-26 | 바스프 에스이 | 잠재성 산 및 그의 용도 |
TWI754661B (zh) | 2016-08-18 | 2022-02-11 | 德商馬克專利公司 | 用於自組裝應用之聚合物組合物 |
EP3559053B1 (en) | 2016-12-21 | 2022-04-13 | Merck Patent GmbH | Compositions and processes for self-assembly of block copolymers |
US11226560B2 (en) * | 2017-02-23 | 2022-01-18 | Hd Microsystems, Ltd. | Photosensitive resin composition, cured pattern production method, cured product, interlayer insulating film, cover coat layer, surface protective layer, and electronic component |
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-
2000
- 2000-03-02 NL NL1014545A patent/NL1014545C2/nl not_active IP Right Cessation
- 2000-03-10 MY MYPI20000951A patent/MY116074A/en unknown
- 2000-03-27 CH CH00595/00A patent/CH694663A5/de not_active IP Right Cessation
- 2000-03-28 SE SE0001090A patent/SE522082C2/sv not_active IP Right Cessation
- 2000-03-29 CA CA002302875A patent/CA2302875A1/en not_active Abandoned
- 2000-03-30 BE BE2000/0228A patent/BE1013627A3/fr not_active IP Right Cessation
- 2000-03-30 ES ES200000798A patent/ES2168953B1/es not_active Expired - Fee Related
- 2000-03-30 AU AU24200/00A patent/AU766803B2/en not_active Ceased
- 2000-03-30 AT AT0054200A patent/AT410262B/de not_active IP Right Cessation
- 2000-03-30 KR KR1020000016548A patent/KR100700901B1/ko active IP Right Grant
- 2000-03-30 IT IT2000MI000662A patent/IT1318431B1/it active
-
2001
- 2001-03-28 US US09/820,115 patent/US6512020B1/en not_active Expired - Lifetime
-
2002
- 2002-02-15 NL NL1019981A patent/NL1019981C2/nl not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
SE522082C2 (sv) | 2004-01-13 |
CH694663A5 (de) | 2005-05-31 |
NL1019981A1 (nl) | 2002-04-11 |
AT410262B (de) | 2003-03-25 |
NL1014545C2 (nl) | 2002-02-26 |
KR100700901B1 (ko) | 2007-03-29 |
SE0001090L (sv) | 2000-10-01 |
NL1019981C2 (nl) | 2002-10-03 |
MY116074A (en) | 2003-10-31 |
AU2420000A (en) | 2000-10-05 |
US6512020B1 (en) | 2003-01-28 |
NL1014545A1 (nl) | 2000-10-03 |
ATA5422000A (de) | 2002-07-15 |
ES2168953A1 (es) | 2002-06-16 |
CA2302875A1 (en) | 2000-09-30 |
SE0001090D0 (sv) | 2000-03-28 |
BE1013627A3 (fr) | 2002-05-07 |
AU766803B2 (en) | 2003-10-23 |
KR20000063080A (ko) | 2000-10-25 |
IT1318431B1 (it) | 2003-08-25 |
ITMI20000662A1 (it) | 2001-09-30 |
ITMI20000662A0 (it) | 2000-03-30 |
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