ES2031085T3 - Dispositivo para verificar una pieza de ensayo transparente en lo referente a defectos superficiales e inclusiones. - Google Patents

Dispositivo para verificar una pieza de ensayo transparente en lo referente a defectos superficiales e inclusiones.

Info

Publication number
ES2031085T3
ES2031085T3 ES198787107993T ES87107993T ES2031085T3 ES 2031085 T3 ES2031085 T3 ES 2031085T3 ES 198787107993 T ES198787107993 T ES 198787107993T ES 87107993 T ES87107993 T ES 87107993T ES 2031085 T3 ES2031085 T3 ES 2031085T3
Authority
ES
Spain
Prior art keywords
component
light beam
focusing lens
inclusions
disposed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES198787107993T
Other languages
English (en)
Inventor
Harald Dr. Schmalfuss
Friedel Sinsel
Reinhold Bolz
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Battelle Institut eV
Original Assignee
Battelle Institut eV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Battelle Institut eV filed Critical Battelle Institut eV
Application granted granted Critical
Publication of ES2031085T3 publication Critical patent/ES2031085T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9511—Optical elements other than lenses, e.g. mirrors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/10—Scanning
    • G01N2201/104—Mechano-optical scan, i.e. object and beam moving
    • G01N2201/1045—Spiral scan

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Mechanical Optical Scanning Systems (AREA)

Abstract

PARA LA VERIFICACION DE ERRORES SUPERFICIALES E INCLUSIONES NO METALICAS EN PIEZAS DE CONSTRUCCION DE MATERIAL TRANSPARENTE SE EMPLEA UN DISPOSITIVO PARA ILUMINARLO. PARA LA PIEZA DE CONSTRUCCION A VERIFICAR SE DISPONE UN EJE GIRABLE Y MEDIANTE UNAS RADIACIONES DE LUZ MOVIBLES PUNTIFORMES SE EXPLORA LA PIEZA. PARA LA GENERACION DE RADIACIONES DE LUZ EXPLOTADAS SE UTILIZA UN MANANTIAL DE LUZ QUE GENERA UNOS HACES DE LUZ PARALELOS (UN LASER) Y UN EXPLORADOR PERIODICO DE ESTOS HACES DE LUZ INCLINABLE LINEALMENTE CON UNA FRECUENCIA ELEVADA CONTRA EL GIRO DE LAS PIEZAS DE CONSTRUCCION. EN LA DIRECCION DE LUZ MIRADA DETRAS DEL EXPLORADOR ESTA PREVISTA UNA LENTE CONVERGENTE FORMADA COMO LENTE TETA Y CUYO FOCO DESCANSA EN UN PUNTO DE GIRO DEL EXPLOTADOR. LA INCLINACION ANGULAR DE LOS HACES DE LUZ SUMINISTRADOS POR EL LASER A TRAVES DEL EXPLORADOR SE TRANSMITE DETRAS DE LA LENTE CONVERGENTE EN UN DESPLAZAMIENTO PARALELO DE LOS HACES DE LUZ ENTRE DOS POSICIONES EXTREMOS. ENTRE LA LENTE CONVERGENTE YLA PIEZA DE TRABAJO A VERIFICAR SE DISPONE UN JUEGO BASCULANTE AJUSTABLE PARA CAMBIAR DE DIRECCION A LA PIEZA DE CONSTRUCCION, MEDIANTE ESTOS JUEGOS BASCULANTES SE PUEDE SELECCIONAR LA POSICION DE INCIDENCIA Y EL ANGULO DE INCIDENCIA DE LOS HACES DE LUZ EXPLORADA CORRESPONDIENTE A LAS PIEZAS DE VERIFICACION.
ES198787107993T 1986-06-14 1987-06-03 Dispositivo para verificar una pieza de ensayo transparente en lo referente a defectos superficiales e inclusiones. Expired - Lifetime ES2031085T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19863620108 DE3620108A1 (de) 1986-06-14 1986-06-14 Vorrichtung zum beleuchten von bauteilen aus transparentem material bei der fehlerpruefung

Publications (1)

Publication Number Publication Date
ES2031085T3 true ES2031085T3 (es) 1992-12-01

Family

ID=6303042

Family Applications (1)

Application Number Title Priority Date Filing Date
ES198787107993T Expired - Lifetime ES2031085T3 (es) 1986-06-14 1987-06-03 Dispositivo para verificar una pieza de ensayo transparente en lo referente a defectos superficiales e inclusiones.

Country Status (7)

Country Link
US (1) US4822165A (es)
EP (1) EP0249800B1 (es)
JP (1) JPS6352032A (es)
AT (1) ATE76506T1 (es)
DE (2) DE3620108A1 (es)
ES (1) ES2031085T3 (es)
GR (1) GR3004812T3 (es)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107271143A (zh) * 2016-03-31 2017-10-20 韩国电子通信研究院 光通信透镜特性评价装置及光通信透镜特性评价方法

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3831401A1 (de) * 1988-09-15 1990-03-29 Kolb Gmbh & Co Hans Verfahren und vorrichtung zur automatisierten beruehrungsfreien oberflaechenkontrolle von zylindrischen teilen
DE4003699A1 (de) * 1990-02-07 1991-08-22 Wild Heerbrugg Ag Verfahren und anordnung zur pruefung optischer komponenten oder systeme
US6314199B1 (en) * 1991-12-18 2001-11-06 Novartis Ag Process and apparatus for examining optical components, especially optical components for the eye and device for illuminating clear-transparent
IL100972A0 (en) * 1992-02-17 1992-11-15 Optomic Techn Corp Ltd Device for testing optical elements
AT402860B (de) * 1993-06-22 1997-09-25 Oesterr Forsch Seibersdorf Verfahren und vorrichtung zur prüfung von transparenten gegenständen
US5578331A (en) * 1994-06-10 1996-11-26 Vision Products, Inc. Automated apparatus for preparing contact lenses for inspection and packaging
US5814134A (en) * 1994-06-10 1998-09-29 Johnson & Johnson Vision Products, Inc. Apparatus and method for degassing deionized water for inspection and packaging
IL110618A (en) * 1994-08-10 1996-12-05 Optomic Techn Corp Ltd Device for testing optical elements
US6072570A (en) * 1997-07-24 2000-06-06 Innotech Image quality mapper for progressive eyeglasses
US5945685A (en) * 1997-11-19 1999-08-31 International Business Machines Corporation Glass substrate inspection tool having a telecentric lens assembly
EP1126273A1 (en) * 2000-02-09 2001-08-22 Orbis Oy Method and arrangement for inspecting a transparent object for flaws
JP2001296206A (ja) * 2000-04-13 2001-10-26 Nikon Corp 複屈折測定装置及び複屈折測定方法
JP4901118B2 (ja) * 2005-03-04 2012-03-21 株式会社ニデック レンズメータ
JP2008057983A (ja) * 2006-08-29 2008-03-13 Ulvac Japan Ltd レンズ研磨精度評価装置及び評価方法
EP4231001A1 (en) 2022-02-16 2023-08-23 Carl Zeiss Vision International GmbH Testing device and testing method

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1403911A (en) * 1972-07-26 1975-08-28 Sira Institute Method and apparatus for testing optical components
US3988068A (en) * 1974-05-09 1976-10-26 Itek Corporation Method and apparatus for detecting cosmetic defects in opthalmic lenses
US3947127A (en) * 1974-11-11 1976-03-30 The United States Of America As Represented By The Secretary Of The Navy Optical component functional tester
JPS55125439A (en) * 1979-03-22 1980-09-27 Hajime Sangyo Kk Defect inspection device
JPS5766345A (en) * 1980-10-09 1982-04-22 Hitachi Ltd Inspection device for defect
JPS57193876A (en) * 1981-05-22 1982-11-29 Canon Inc Detection for flaw and defect due to multiple taking-in of television picture
DE3237511A1 (de) * 1982-10-09 1984-04-12 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 8000 München Verfahren zur pruefung von glaserzeugnissen
DE3484982D1 (de) * 1983-11-26 1991-10-02 Toshiba Kawasaki Kk Apparat zum nachweis von oberflaechenfehlern.
DE3422143A1 (de) * 1984-06-14 1985-12-19 Josef Prof. Dr. Bille Geraet zur wafer-inspektion
SU1242780A1 (ru) * 1985-01-02 1986-07-07 Ленинградский Ордена Трудового Красного Знамени Институт Точной Механики И Оптики Устройство дл контрол дефектов поверхностей оптических деталей

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107271143A (zh) * 2016-03-31 2017-10-20 韩国电子通信研究院 光通信透镜特性评价装置及光通信透镜特性评价方法

Also Published As

Publication number Publication date
EP0249800A2 (de) 1987-12-23
DE3779184D1 (de) 1992-06-25
EP0249800A3 (en) 1989-12-13
EP0249800B1 (de) 1992-05-20
US4822165A (en) 1989-04-18
JPS6352032A (ja) 1988-03-05
DE3620108A1 (de) 1987-12-17
GR3004812T3 (es) 1993-04-28
ATE76506T1 (de) 1992-06-15

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