ES2030742T3 - Metodo para fabricar un transistor de efecto de campo con puerta autoalineada. - Google Patents

Metodo para fabricar un transistor de efecto de campo con puerta autoalineada.

Info

Publication number
ES2030742T3
ES2030742T3 ES198787310792T ES87310792T ES2030742T3 ES 2030742 T3 ES2030742 T3 ES 2030742T3 ES 198787310792 T ES198787310792 T ES 198787310792T ES 87310792 T ES87310792 T ES 87310792T ES 2030742 T3 ES2030742 T3 ES 2030742T3
Authority
ES
Spain
Prior art keywords
field effect
effect transistor
self
manufacture
mask
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES198787310792T
Other languages
English (en)
Inventor
John Edward Cunningham
Erdmann F. Schubert
Won-Tien Tsang
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AT&T Corp
Original Assignee
American Telephone and Telegraph Co Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by American Telephone and Telegraph Co Inc filed Critical American Telephone and Telegraph Co Inc
Application granted granted Critical
Publication of ES2030742T3 publication Critical patent/ES2030742T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/66007—Multistep manufacturing processes
    • H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
    • H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
    • H01L29/66409—Unipolar field-effect transistors
    • H01L29/66848—Unipolar field-effect transistors with a Schottky gate, i.e. MESFET
    • H01L29/66856—Unipolar field-effect transistors with a Schottky gate, i.e. MESFET with an active layer made of a group 13/15 material
    • H01L29/66863—Lateral single gate transistors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
    • H01L21/308—Chemical or electrical treatment, e.g. electrolytic etching using masks
    • H01L21/3081—Chemical or electrical treatment, e.g. electrolytic etching using masks characterised by their composition, e.g. multilayer masks, materials
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00—Metal treatment
    • Y10S148/142—Semiconductor-metal-semiconductor
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00—Metal treatment
    • Y10S148/145—Shaped junctions

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Ceramic Engineering (AREA)
  • Junction Field-Effect Transistors (AREA)
  • Electrodes Of Semiconductors (AREA)

Abstract

SE REIVINDICA UN METODO DE FABRICACION DE TRANSISTORES DE EFECTO DE CAMPO DONDE SOLO SE USAN DOS PASOS DE ENMASCARAMIENTO EN EL DESARROLLO DEL DISPOSITIVO.EL SEMICONDUCTOR ENCAPSULADO USADO EN EL PROCESO TIENE EN LA CARA SUPERIOR UN CONTACTO,EL CUAL NO SOPORTA TEMPERATURAS SUPERIORES A 200 C. LA PRIMERA MASCARA SE USA PARA CREAR UNA ESTRUCTURA DE MESA CONVENCIONAL LA CUAL AISLA CADA TRANSISTOR DE EFECTO DE CAMPO DE LOS ADYACENTES.UNA SEGUNDA MASCARA ES USADA PARA DEFINIR LA FUENTE Y ELECTRODOS Y TAMBIEN PARA CREAR UNA DEPRESION A TRAVES DE LA CUAL SE RALIZA LA ESTRUCTURA DE ELECTRODO EN PUENTE. USANDO UNA MASCARA PARA CREAR LA FUENTE , LOS ELECTRODOS Y LA ESTRUCTURA EN PUENTE,UNA GRAN TOLERANCIA DE CIERRE SE OBTIENE ENTRE LA ESTRUCTURA DE PUENTE, LA FUENTE Y LAS REGIONES DE DRENAJE.FIG 4 Y FIG 7.
ES198787310792T 1986-12-19 1987-12-09 Metodo para fabricar un transistor de efecto de campo con puerta autoalineada. Expired - Lifetime ES2030742T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/944,457 US4784967A (en) 1986-12-19 1986-12-19 Method for fabricating a field-effect transistor with a self-aligned gate

Publications (1)

Publication Number Publication Date
ES2030742T3 true ES2030742T3 (es) 1992-11-16

Family

ID=25481431

Family Applications (1)

Application Number Title Priority Date Filing Date
ES198787310792T Expired - Lifetime ES2030742T3 (es) 1986-12-19 1987-12-09 Metodo para fabricar un transistor de efecto de campo con puerta autoalineada.

Country Status (8)

Country Link
US (1) US4784967A (es)
EP (1) EP0274866B1 (es)
JP (1) JPS63164477A (es)
CA (1) CA1271850A (es)
DE (1) DE3778861D1 (es)
ES (1) ES2030742T3 (es)
HK (1) HK108693A (es)
SG (1) SG123492G (es)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR920009718B1 (ko) * 1987-08-10 1992-10-22 스미도모덴기고오교오 가부시기가이샤 화합물반도체장치 및 그 제조방법
US5013685A (en) * 1989-11-02 1991-05-07 At&T Bell Laboratories Method of making a non-alloyed ohmic contact to III-V semiconductors-on-silicon
US6043143A (en) * 1998-05-04 2000-03-28 Motorola, Inc. Ohmic contact and method of manufacture
US6258616B1 (en) * 1998-05-22 2001-07-10 Lucent Technologies Inc. Method of making a semiconductor device having a non-alloyed ohmic contact to a buried doped layer
TW407309B (en) * 1999-01-29 2000-10-01 Nat Science Council MOSFET manufacturing process
US7483212B2 (en) * 2006-10-11 2009-01-27 Rensselaer Polytechnic Institute Optical thin film, semiconductor light emitting device having the same and methods of fabricating the same

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL167277C (nl) * 1970-08-29 1981-11-16 Philips Nv Halfgeleiderinrichting met een plaatvorming half- geleiderlichaam met over althans een deel van de dikte van het halfgeleiderlichaam afgeschuinde randen, dat is voorzien van een metalen elektrode die een gelijkrichtende overgang vormt met het halfgeleider- lichaam en werkwijze ter vervaardiging van de halfgeleiderinrichting.
US3993515A (en) * 1975-03-31 1976-11-23 Rca Corporation Method of forming raised electrical contacts on a semiconductor device
JPS5850428B2 (ja) * 1975-04-16 1983-11-10 株式会社東芝 メサ型半導体装置
US4029542A (en) * 1975-09-19 1977-06-14 Rca Corporation Method for sloping the sidewalls of multilayer P+ PN+ junction mesa structures
JPS52128078A (en) * 1976-04-21 1977-10-27 Mitsubishi Electric Corp Manufacture of field effect transistor
US4029562A (en) * 1976-04-29 1977-06-14 Ibm Corporation Forming feedthrough connections for multi-level interconnections metallurgy systems
JPS5412573A (en) * 1977-06-29 1979-01-30 Matsushita Electric Ind Co Ltd Junction type field effect transistor and production of the same
US4197551A (en) * 1977-09-14 1980-04-08 Raytheon Company Semiconductor device having improved Schottky-barrier junction
GB1602498A (en) * 1978-05-31 1981-11-11 Secr Defence Fet devices and their fabrication
GB1601059A (en) * 1978-05-31 1981-10-21 Secr Defence Fet devices and their fabrication
US4325181A (en) * 1980-12-17 1982-04-20 The United States Of America As Represented By The Secretary Of The Navy Simplified fabrication method for high-performance FET
FR2496982A1 (fr) * 1980-12-24 1982-06-25 Labo Electronique Physique Procede de fabrication de transistors a effet de champ, a grille auto-alignee, et transistors ainsi obtenus
JPS6089979A (ja) * 1983-10-24 1985-05-20 Fujitsu Ltd 半導体装置
FR2558647B1 (fr) * 1984-01-23 1986-05-09 Labo Electronique Physique Transistor a effet de champ de type schottky pour applications hyperfrequences et procede de realisation permettant d'obtenir un tel transistor
GB8413170D0 (en) * 1984-05-23 1984-06-27 British Telecomm Production of semiconductor devices
US4780748A (en) * 1986-06-06 1988-10-25 American Telephone & Telegraph Company, At&T Bell Laboratories Field-effect transistor having a delta-doped ohmic contact

Also Published As

Publication number Publication date
DE3778861D1 (de) 1992-06-11
EP0274866B1 (en) 1992-05-06
US4784967A (en) 1988-11-15
SG123492G (en) 1993-02-19
CA1271850A (en) 1990-07-17
HK108693A (en) 1993-10-22
JPS63164477A (ja) 1988-07-07
EP0274866A1 (en) 1988-07-20

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