JPS6431471A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPS6431471A
JPS6431471A JP18835987A JP18835987A JPS6431471A JP S6431471 A JPS6431471 A JP S6431471A JP 18835987 A JP18835987 A JP 18835987A JP 18835987 A JP18835987 A JP 18835987A JP S6431471 A JPS6431471 A JP S6431471A
Authority
JP
Japan
Prior art keywords
region
back gate
channel
gate region
concentration
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18835987A
Other languages
Japanese (ja)
Inventor
Akira Arakawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP18835987A priority Critical patent/JPS6431471A/en
Publication of JPS6431471A publication Critical patent/JPS6431471A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To reduce the capacitance between a channel gate region and a back gate region by forming a layer having higher concentration than a dopant concentration of a back gate region at an interval of a predetermined distance from the junction face of a channel region in the back gate region. CONSTITUTION:An epitaxial region 7 made of a p<-> type back gate region 2, an n-channel channel region 3 and a p-type top gate region 4 is formed on a p-type semiconductor substrate 1. A dopant injected layer 5 is formed at a position isolated at a predetermined distance (e.g., 1mum) from a junction face J with the region 3 in the region 2. An SiO2 film 6 is formed on the region 7, and a contact hole is opened at a position corresponding to the regions 2, 3, 4 at the film 6. A back gate electrode 2a, a source electrode 3a, a drain electrode 3b and a top gate electrode 4a are respectively formed at the holes. Here, the concentration of the region 2 is considerably lower value than that of the region 3 to reduce the capacitance between the regions 2 and 3.
JP18835987A 1987-07-27 1987-07-27 Semiconductor device Pending JPS6431471A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18835987A JPS6431471A (en) 1987-07-27 1987-07-27 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18835987A JPS6431471A (en) 1987-07-27 1987-07-27 Semiconductor device

Publications (1)

Publication Number Publication Date
JPS6431471A true JPS6431471A (en) 1989-02-01

Family

ID=16222242

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18835987A Pending JPS6431471A (en) 1987-07-27 1987-07-27 Semiconductor device

Country Status (1)

Country Link
JP (1) JPS6431471A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004112150A1 (en) * 2003-06-13 2004-12-23 Sumitomo Electric Industries, Ltd. Field effect transistor
JP2009010433A (en) * 2008-10-16 2009-01-15 Sumitomo Electric Ind Ltd Lateral junction field effect transistor, and method of manufacturing the same
CN103367414A (en) * 2012-04-09 2013-10-23 上海华虹Nec电子有限公司 Structure of vertically pinched-off junction field-effect transistor and manufacturing method thereof
US8921903B2 (en) 2006-12-18 2014-12-30 Sumitomo Electric Industries, Ltd. Lateral junction field-effect transistor

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004112150A1 (en) * 2003-06-13 2004-12-23 Sumitomo Electric Industries, Ltd. Field effect transistor
EP1635400A1 (en) * 2003-06-13 2006-03-15 Sumitomo Electric Industries, Ltd. Field effect transistor
EP1635400A4 (en) * 2003-06-13 2007-09-26 Sumitomo Electric Industries Field effect transistor
US8921903B2 (en) 2006-12-18 2014-12-30 Sumitomo Electric Industries, Ltd. Lateral junction field-effect transistor
JP2009010433A (en) * 2008-10-16 2009-01-15 Sumitomo Electric Ind Ltd Lateral junction field effect transistor, and method of manufacturing the same
CN103367414A (en) * 2012-04-09 2013-10-23 上海华虹Nec电子有限公司 Structure of vertically pinched-off junction field-effect transistor and manufacturing method thereof

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