ES2028771T1 - Nvran con circuito nram y nv integrados. - Google Patents

Nvran con circuito nram y nv integrados.

Info

Publication number
ES2028771T1
ES2028771T1 ES199090909888T ES90909888T ES2028771T1 ES 2028771 T1 ES2028771 T1 ES 2028771T1 ES 199090909888 T ES199090909888 T ES 199090909888T ES 90909888 T ES90909888 T ES 90909888T ES 2028771 T1 ES2028771 T1 ES 2028771T1
Authority
ES
Spain
Prior art keywords
data
circuit
programmable
programmable devices
alternation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
ES199090909888T
Other languages
English (en)
Inventor
Christian E. Herdt
Albert A. Weiner
David A. Kamp
Klaus J. Dimmler
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agiga Tech Inc
Original Assignee
Agiga Tech Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agiga Tech Inc filed Critical Agiga Tech Inc
Publication of ES2028771T1 publication Critical patent/ES2028771T1/es
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C14/00Digital stores characterised by arrangements of cells having volatile and non-volatile storage properties for back-up when the power is down
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C14/00Digital stores characterised by arrangements of cells having volatile and non-volatile storage properties for back-up when the power is down
    • G11C14/0054Digital stores characterised by arrangements of cells having volatile and non-volatile storage properties for back-up when the power is down in which the volatile element is a SRAM cell
    • G11C14/0063Digital stores characterised by arrangements of cells having volatile and non-volatile storage properties for back-up when the power is down in which the volatile element is a SRAM cell and the nonvolatile element is an EEPROM element, e.g. a floating gate or MNOS transistor

Abstract

UNA CELULA DE MEMORIA DE ACCESO AL AZAR NO-VOLATIL (NVRAM) DE TAMAÑO CONDENSADO QUE EMPLEA UN PAR DE DISPOSITIVOS DE VOLTAGE DE UMBRAL PROGRAMABLE (40B, 42B), V.GR. TRANSISTORES DE PUERTA FLOTANTE O MNOS, SNOS, SONOS, EN EL QUE SE ESTABLECEN DISTINTOS NIVELES DE VOLTAGE DE UMBRAL DE ACUERDO CON LOS NIVELES DE SEÑAL DE DATOS EXISTENTES EN LOS NODULOS DE DATOS (DT, DC) DE UN CIRCUITO DE ALTERNANCIA (12), CUANDO LOS DATOS VOLATILES SE ALMACENAN EN LOS DISPOSITIVOS PROGRAMABLES. DURANTE LA LLAMADA DE LOS DATOS NO-VOLATILES ALMACENADOS A LOS NODOS DE DATOS DEL CIRCUITO DE ALTERNANCIA, LOS DISPOSITIVOS PROGRAMABLES (40B, 42B) CONDUCEN ACTIVAMENTE CORRIENTE A LOS NODOS DE DATOS (DT, DC) PARA AJUSTAR EL CIRCUITO DE ALTERNANCIA (12) EN EL MISMO ESTADO QUE EXISTIA CUANDO SE ALMACENARON LOS DATOS. LA CORRIENTE PARA EL CIRCUITO DE ALTERNANCIA SE SUMINISTRA INDEPENDIENTEMENTE DE LA CORRIENTE SUMINISTRADA A LOS DISPOSITIVOS PROGRAMABLES. UN SOLO CONDUCTOR DE POLISILICONA (28) FORMA PUERTAS DE TRANSISTORES (40C, 42C) QUE CONECTAN LOS DISPOSITIVOS PROGRAMABLES (40B, 42B) A LOS NODOS DE DATOS (DT, DC) Y LAS PUERTAS (20, 22) DE LOS TRANSISTORES DEL CIRCUITO DE ALTERNANCIA (16, 18). SE INTEGRA UN DISPOSITIVO DE CARGA (24, 26) PARA CADA NODO DE DATOS EN EL CONDUCTOR DE POLISILICONA UNICO (28). SE CONSIGUE UNA CAPACIDAD DE INHIBICION DE PROGRAMA DINAMICO EN CADA DISPOSITIVO PROGRAMABLE (40B, 42B) DURANTE LA OPERACION DE ALMACENAMIENTO APLICANDO UNA SERIE DE PULSOS DE SEÑAL DE PROGRAMACION.
ES199090909888T 1989-06-02 1990-06-01 Nvran con circuito nram y nv integrados. Pending ES2028771T1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/361,033 US5065362A (en) 1989-06-02 1989-06-02 Non-volatile ram with integrated compact static ram load configuration

Publications (1)

Publication Number Publication Date
ES2028771T1 true ES2028771T1 (es) 1992-07-16

Family

ID=23420384

Family Applications (1)

Application Number Title Priority Date Filing Date
ES199090909888T Pending ES2028771T1 (es) 1989-06-02 1990-06-01 Nvran con circuito nram y nv integrados.

Country Status (7)

Country Link
US (1) US5065362A (es)
EP (1) EP0474781A4 (es)
JP (1) JPH04505981A (es)
KR (1) KR0169738B1 (es)
AU (1) AU5859090A (es)
ES (1) ES2028771T1 (es)
WO (1) WO1990015414A1 (es)

Families Citing this family (66)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02185069A (ja) * 1988-12-02 1990-07-19 Motorola Inc 高エネルギー阻止能力及び温度補償された阻止電圧を具備する半導体デバイス
US5239510A (en) * 1991-11-25 1993-08-24 At&T Bell Laboratories Multiple voltage supplies for field programmable gate arrays and the like
US5440508A (en) * 1994-02-09 1995-08-08 Atmel Corporation Zero power high speed programmable circuit device architecture
US5488579A (en) * 1994-04-29 1996-01-30 Motorola Inc. Three-dimensionally integrated nonvolatile SRAM cell and process
US5602776A (en) * 1994-10-17 1997-02-11 Simtek Corporation Non-Volatile, static random access memory with current limiting
US6122191A (en) * 1996-05-01 2000-09-19 Cypress Semiconductor Corporation Semiconductor non-volatile device including embedded non-volatile elements
US5892712A (en) * 1996-05-01 1999-04-06 Nvx Corporation Semiconductor non-volatile latch device including embedded non-volatile elements
US5648930A (en) * 1996-06-28 1997-07-15 Symbios Logic Inc. Non-volatile memory which is programmable from a power source
US5828599A (en) * 1996-08-06 1998-10-27 Simtek Corporation Memory with electrically erasable and programmable redundancy
US5838616A (en) * 1996-09-30 1998-11-17 Symbios, Inc. Gate edge aligned EEPROM transistor
US5661687A (en) * 1996-09-30 1997-08-26 Symbios Logic Inc. Drain excluded EPROM cell
US5943268A (en) * 1997-12-31 1999-08-24 Programmable Microelectronics Corporation Non-volatile latch having PMOS floating gate memory cells
US6026018A (en) * 1998-08-20 2000-02-15 Simtek Corporation Non-volatile, static random access memory with store disturb immunity
US6097629A (en) * 1998-09-30 2000-08-01 Simtek Corporation Non-volatile, static random access memory with high speed store capability
US6021066A (en) * 1999-01-04 2000-02-01 International Business Machines Corporation NVRAM array architecture utilizing common bitline and wordline
US6330183B1 (en) 1999-03-04 2001-12-11 Pageant Technologies, Inc. (Micromem Technologies, Inc.) Dual conductor inductive sensor for a non-volatile random access ferromagnetic memory
US6288929B1 (en) * 1999-03-04 2001-09-11 Pageant Technologies, Inc. Magneto resistor sensor with differential collectors for a non-volatile random access ferromagnetic memory
US6556487B1 (en) 2000-09-20 2003-04-29 Cypress Semiconductor Corp. Non-volatile static memory cell
US6469930B1 (en) * 2000-10-30 2002-10-22 Cypress Semiconductor Corporation Compact nonvolatile circuit having margin testing capability
US6515895B2 (en) * 2001-01-31 2003-02-04 Motorola, Inc. Non-volatile magnetic register
US6414873B1 (en) 2001-03-16 2002-07-02 Simtek Corporation nvSRAM with multiple non-volatile memory cells for each SRAM memory cell
US20030190771A1 (en) * 2002-03-07 2003-10-09 02Ic, Ltd. Integrated ram and non-volatile memory cell method and structure
US20060007772A1 (en) * 2002-03-19 2006-01-12 O2Ic, Inc. Non-volatile memory device
KR100432889B1 (ko) * 2002-04-12 2004-05-22 삼성전자주식회사 2비트 기입가능한 비휘발성 메모리 소자, 그 구동방법 및그 제조방법
US7232717B1 (en) 2002-05-28 2007-06-19 O2Ic, Inc. Method of manufacturing non-volatile DRAM
CN100454440C (zh) * 2002-07-31 2009-01-21 连邦科技股份有限公司 组合静态随机存取存储器和掩膜只读存储器存储单元
KR100599106B1 (ko) * 2003-12-31 2006-07-12 동부일렉트로닉스 주식회사 비 휘발성 메모리 장치 및 그 구동방법
US7186612B2 (en) 2004-01-28 2007-03-06 O2Ic, Inc. Non-volatile DRAM and a method of making thereof
US20050170586A1 (en) * 2004-01-29 2005-08-04 O2Ic, Inc., (A California Corporation) Method of manufacturing non-volatile DRAM
US20050219913A1 (en) * 2004-04-06 2005-10-06 O2Ic, Inc. Non-volatile memory array
US7164608B2 (en) * 2004-07-28 2007-01-16 Aplus Flash Technology, Inc. NVRAM memory cell architecture that integrates conventional SRAM and flash cells
US20060193174A1 (en) * 2005-02-25 2006-08-31 O2Ic Non-volatile and static random access memory cells sharing the same bitlines
US7280397B2 (en) * 2005-07-11 2007-10-09 Sandisk 3D Llc Three-dimensional non-volatile SRAM incorporating thin-film device layer
US8072834B2 (en) 2005-08-25 2011-12-06 Cypress Semiconductor Corporation Line driver circuit and method with standby mode of operation
US7859925B1 (en) 2006-03-31 2010-12-28 Cypress Semiconductor Corporation Anti-fuse latch self-test circuit and method
DE102007028472B4 (de) * 2006-06-24 2014-02-13 Zentrum Mikroelektronik Dresden Ag Anordnung einer Doppelbitzelle in einem NV-SRAM Speicherschaltkreis
US7495492B2 (en) * 2006-09-12 2009-02-24 International Business Machines Corporation Dynamic latch state saving device and protocol
US7966589B2 (en) * 2006-09-12 2011-06-21 International Business Machines Corporation Structure for dynamic latch state saving device and protocol
US7821859B1 (en) 2006-10-24 2010-10-26 Cypress Semiconductor Corporation Adaptive current sense amplifier with direct array access capability
US20080151654A1 (en) 2006-12-22 2008-06-26 Allan James D Method and apparatus to implement a reset function in a non-volatile static random access memory
US7505303B2 (en) * 2006-12-22 2009-03-17 Cypress Semiconductor Corporation Method and apparatus to create an erase disturb on a non-volatile static random access memory cell
US8817536B2 (en) * 2007-03-22 2014-08-26 Cypress Semiconductor Corporation Current controlled recall schema
US7859906B1 (en) 2007-03-30 2010-12-28 Cypress Semiconductor Corporation Circuit and method to increase read margin in non-volatile memories using a differential sensing circuit
US7881118B2 (en) * 2007-05-25 2011-02-01 Cypress Semiconductor Corporation Sense transistor protection for memory programming
US8059458B2 (en) * 2007-12-31 2011-11-15 Cypress Semiconductor Corporation 3T high density nvDRAM cell
US8036032B2 (en) * 2007-12-31 2011-10-11 Cypress Semiconductor Corporation 5T high density NVDRAM cell
US8064255B2 (en) * 2007-12-31 2011-11-22 Cypress Semiconductor Corporation Architecture of a nvDRAM array and its sense regime
WO2009090892A1 (ja) * 2008-01-18 2009-07-23 Sharp Kabushiki Kaisha 不揮発性ランダムアクセスメモリ
US7791927B1 (en) * 2009-02-18 2010-09-07 Nscore Inc. Mis-transistor-based nonvolatile memory circuit with stable and enhanced performance
US8203880B2 (en) * 2009-07-01 2012-06-19 Cavendish Kinetics Inc. Binary logic utilizing MEMS devices
DE102009053977B3 (de) * 2009-11-23 2011-01-20 Anvo-Systems Dresden Gmbh Speicherzelle in einem NV-SRAM Speicherschaltkreis
US8471328B2 (en) 2010-07-26 2013-06-25 United Microelectronics Corp. Non-volatile memory and manufacturing method thereof
KR200464994Y1 (ko) * 2011-10-31 2013-01-29 충북대학교 산학협력단 멤리스터 소자를 적용한 비휘발성 정적 랜덤 액세스 메모리 셀
JP2013114731A (ja) * 2011-11-30 2013-06-10 Toshiba Corp 半導体記憶装置
US9177644B2 (en) 2012-08-15 2015-11-03 Aplus Flash Technology, Inc. Low-voltage fast-write PMOS NVSRAM cell
US8964470B2 (en) 2012-09-25 2015-02-24 Aplus Flash Technology, Inc. Method and architecture for improving defect detectability, coupling area, and flexibility of NVSRAM cells and arrays
US9001583B2 (en) 2012-10-15 2015-04-07 Aplus Flash Technology, Inc. On-chip HV and LV capacitors acting as the second back-up supplies for NVSRAM auto-store operation
US9177645B2 (en) 2012-10-19 2015-11-03 Aplus Flash Technology, Inc. 10T NVSRAM cell and cell operations
US8929136B2 (en) 2012-10-26 2015-01-06 Aplus Flash Technology, Inc. 8T NVSRAM cell and cell operations
US8971113B2 (en) 2012-10-30 2015-03-03 Aplus Flash Technology, Inc. Pseudo-8T NVSRAM cell with a charge-follower
US8976588B2 (en) 2012-11-01 2015-03-10 Aplus Flash Technology, Inc. NVSRAM cells with voltage flash charger
US8947122B2 (en) * 2013-01-14 2015-02-03 Cypress Semiconductor Corporation Non-volatile latch structures with small area for FPGA
US8897067B2 (en) * 2013-01-18 2014-11-25 Cypress Semiconductor Corporation Nonvolatile memory cells and methods of making such cells
US9208878B2 (en) 2014-03-25 2015-12-08 International Business Machines Corporation Non-volatile memory based on retention modulation
US9607695B1 (en) * 2015-11-13 2017-03-28 Cypress Semiconductor Corporation Multi-bit non-volatile random-access memory cells
CN107180649B (zh) 2016-03-11 2021-01-15 联华电子股份有限公司 半导体存储器元件及操作半导体存储器元件的方法

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3636530A (en) * 1969-09-10 1972-01-18 Litton Systems Inc Nonvolatile direct storage bistable circuit
JPS5327107B2 (es) * 1973-09-28 1978-08-05
JPS51129144A (en) * 1975-05-02 1976-11-10 Toshiba Corp Memory divice of non volatile information
GB1516134A (en) * 1975-05-20 1978-06-28 Plessey Co Ltd Electrical information store
JPS52153630A (en) * 1976-06-16 1977-12-20 Matsushita Electric Ind Co Ltd Semiconductor memory device
JPS5577088A (en) * 1978-12-07 1980-06-10 Toshiba Corp Nonvolatile semiconductor memory unit
US4370798A (en) * 1979-06-15 1983-02-01 Texas Instruments Incorporated Interlevel insulator for integrated circuit with implanted resistor element in second-level polycrystalline silicon
JPS5644194A (en) * 1979-09-19 1981-04-23 Toshiba Corp Memory device
US4271487A (en) * 1979-11-13 1981-06-02 Ncr Corporation Static volatile/non-volatile ram cell
US4403306A (en) * 1980-10-22 1983-09-06 Tokyo Shibaura Denki Kabushiki Kaisha Semiconductor memory operable as static RAM or EAROM
FR2517142A1 (fr) * 1981-11-20 1983-05-27 Efcis Bascule bistable a stockage non volatil et a repositionnement statique
US4675715A (en) * 1982-12-09 1987-06-23 American Telephone And Telegraph Company, At&T Bell Laboratories Semiconductor integrated circuit vertical geometry impedance element
JPS60136994A (ja) * 1983-12-26 1985-07-20 Hitachi Micro Comput Eng Ltd 半導体記憶装置
US4560419A (en) * 1984-05-30 1985-12-24 Inmos Corporation Method of making polysilicon resistors with a low thermal activation energy
US4679170A (en) * 1984-05-30 1987-07-07 Inmos Corporation Resistor with low thermal activation energy
US4774203A (en) * 1985-10-25 1988-09-27 Hitachi, Ltd. Method for making static random-access memory device
JPH0777078B2 (ja) * 1987-01-31 1995-08-16 株式会社東芝 不揮発性半導体メモリ

Also Published As

Publication number Publication date
EP0474781A4 (en) 1993-01-07
AU5859090A (en) 1991-01-07
JPH04505981A (ja) 1992-10-15
WO1990015414A1 (en) 1990-12-13
KR920701980A (ko) 1992-08-12
KR0169738B1 (ko) 1999-02-18
EP0474781A1 (en) 1992-03-18
US5065362A (en) 1991-11-12

Similar Documents

Publication Publication Date Title
ES2028771T1 (es) Nvran con circuito nram y nv integrados.
KR900010794A (ko) 불휘발성 반도체 메모리
US4638464A (en) Charge pump system for non-volatile ram
US6580654B2 (en) Boosted voltage supply
US4375086A (en) Volatile/non-volatile dynamic RAM system
EP0200480A3 (en) Non-volatile memory cell and non-volatile random access memory cell utilising the same
EP0143596B1 (en) Programmable read-only memory device
US3911464A (en) Nonvolatile semiconductor memory
JPS63501253A (ja) 電流計測装置
US4694314A (en) Semiconductor device
KR850006120A (ko) 집적 메모리 회로
IT1251623B (it) Dispositivo di memoria a semiconduttore
EP0144636B1 (en) A programmable oscillator with power down feature and frequency adjustment
US4185320A (en) Decoder circuit
RU2221286C2 (ru) Схема управления для энергонезависимого полупроводникового запоминающего устройства
US3849767A (en) Memory circuit
KR970051254A (ko) 반도체 메모리장치의 센스앰프 회로
EP0132536B1 (en) Transistor driver circuit
KR980006399A (ko) 불휘발성 반도체 메모리 장치의 소거방법
JPS55105892A (en) Semiconductor memory circuit
KR840005592A (ko) Ccd 입력소오스 펄스 발생회로
EP0345058A2 (en) Non-volatile static RAM circuit
SU773738A1 (ru) Запоминающий элемент
KR0166494B1 (ko) 반도체 소자의 워드라인 부스트랩 회로
KR890016752A (ko) 반도체 메모리 장치