ES2028771T1 - Nvran con circuito nram y nv integrados. - Google Patents
Nvran con circuito nram y nv integrados.Info
- Publication number
- ES2028771T1 ES2028771T1 ES199090909888T ES90909888T ES2028771T1 ES 2028771 T1 ES2028771 T1 ES 2028771T1 ES 199090909888 T ES199090909888 T ES 199090909888T ES 90909888 T ES90909888 T ES 90909888T ES 2028771 T1 ES2028771 T1 ES 2028771T1
- Authority
- ES
- Spain
- Prior art keywords
- data
- circuit
- programmable
- programmable devices
- alternation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C14/00—Digital stores characterised by arrangements of cells having volatile and non-volatile storage properties for back-up when the power is down
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C14/00—Digital stores characterised by arrangements of cells having volatile and non-volatile storage properties for back-up when the power is down
- G11C14/0054—Digital stores characterised by arrangements of cells having volatile and non-volatile storage properties for back-up when the power is down in which the volatile element is a SRAM cell
- G11C14/0063—Digital stores characterised by arrangements of cells having volatile and non-volatile storage properties for back-up when the power is down in which the volatile element is a SRAM cell and the nonvolatile element is an EEPROM element, e.g. a floating gate or MNOS transistor
Abstract
UNA CELULA DE MEMORIA DE ACCESO AL AZAR NO-VOLATIL (NVRAM) DE TAMAÑO CONDENSADO QUE EMPLEA UN PAR DE DISPOSITIVOS DE VOLTAGE DE UMBRAL PROGRAMABLE (40B, 42B), V.GR. TRANSISTORES DE PUERTA FLOTANTE O MNOS, SNOS, SONOS, EN EL QUE SE ESTABLECEN DISTINTOS NIVELES DE VOLTAGE DE UMBRAL DE ACUERDO CON LOS NIVELES DE SEÑAL DE DATOS EXISTENTES EN LOS NODULOS DE DATOS (DT, DC) DE UN CIRCUITO DE ALTERNANCIA (12), CUANDO LOS DATOS VOLATILES SE ALMACENAN EN LOS DISPOSITIVOS PROGRAMABLES. DURANTE LA LLAMADA DE LOS DATOS NO-VOLATILES ALMACENADOS A LOS NODOS DE DATOS DEL CIRCUITO DE ALTERNANCIA, LOS DISPOSITIVOS PROGRAMABLES (40B, 42B) CONDUCEN ACTIVAMENTE CORRIENTE A LOS NODOS DE DATOS (DT, DC) PARA AJUSTAR EL CIRCUITO DE ALTERNANCIA (12) EN EL MISMO ESTADO QUE EXISTIA CUANDO SE ALMACENARON LOS DATOS. LA CORRIENTE PARA EL CIRCUITO DE ALTERNANCIA SE SUMINISTRA INDEPENDIENTEMENTE DE LA CORRIENTE SUMINISTRADA A LOS DISPOSITIVOS PROGRAMABLES. UN SOLO CONDUCTOR DE POLISILICONA (28) FORMA PUERTAS DE TRANSISTORES (40C, 42C) QUE CONECTAN LOS DISPOSITIVOS PROGRAMABLES (40B, 42B) A LOS NODOS DE DATOS (DT, DC) Y LAS PUERTAS (20, 22) DE LOS TRANSISTORES DEL CIRCUITO DE ALTERNANCIA (16, 18). SE INTEGRA UN DISPOSITIVO DE CARGA (24, 26) PARA CADA NODO DE DATOS EN EL CONDUCTOR DE POLISILICONA UNICO (28). SE CONSIGUE UNA CAPACIDAD DE INHIBICION DE PROGRAMA DINAMICO EN CADA DISPOSITIVO PROGRAMABLE (40B, 42B) DURANTE LA OPERACION DE ALMACENAMIENTO APLICANDO UNA SERIE DE PULSOS DE SEÑAL DE PROGRAMACION.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/361,033 US5065362A (en) | 1989-06-02 | 1989-06-02 | Non-volatile ram with integrated compact static ram load configuration |
Publications (1)
Publication Number | Publication Date |
---|---|
ES2028771T1 true ES2028771T1 (es) | 1992-07-16 |
Family
ID=23420384
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES199090909888T Pending ES2028771T1 (es) | 1989-06-02 | 1990-06-01 | Nvran con circuito nram y nv integrados. |
Country Status (7)
Country | Link |
---|---|
US (1) | US5065362A (es) |
EP (1) | EP0474781A4 (es) |
JP (1) | JPH04505981A (es) |
KR (1) | KR0169738B1 (es) |
AU (1) | AU5859090A (es) |
ES (1) | ES2028771T1 (es) |
WO (1) | WO1990015414A1 (es) |
Families Citing this family (66)
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JPH02185069A (ja) * | 1988-12-02 | 1990-07-19 | Motorola Inc | 高エネルギー阻止能力及び温度補償された阻止電圧を具備する半導体デバイス |
US5239510A (en) * | 1991-11-25 | 1993-08-24 | At&T Bell Laboratories | Multiple voltage supplies for field programmable gate arrays and the like |
US5440508A (en) * | 1994-02-09 | 1995-08-08 | Atmel Corporation | Zero power high speed programmable circuit device architecture |
US5488579A (en) * | 1994-04-29 | 1996-01-30 | Motorola Inc. | Three-dimensionally integrated nonvolatile SRAM cell and process |
US5602776A (en) * | 1994-10-17 | 1997-02-11 | Simtek Corporation | Non-Volatile, static random access memory with current limiting |
US6122191A (en) * | 1996-05-01 | 2000-09-19 | Cypress Semiconductor Corporation | Semiconductor non-volatile device including embedded non-volatile elements |
US5892712A (en) * | 1996-05-01 | 1999-04-06 | Nvx Corporation | Semiconductor non-volatile latch device including embedded non-volatile elements |
US5648930A (en) * | 1996-06-28 | 1997-07-15 | Symbios Logic Inc. | Non-volatile memory which is programmable from a power source |
US5828599A (en) * | 1996-08-06 | 1998-10-27 | Simtek Corporation | Memory with electrically erasable and programmable redundancy |
US5838616A (en) * | 1996-09-30 | 1998-11-17 | Symbios, Inc. | Gate edge aligned EEPROM transistor |
US5661687A (en) * | 1996-09-30 | 1997-08-26 | Symbios Logic Inc. | Drain excluded EPROM cell |
US5943268A (en) * | 1997-12-31 | 1999-08-24 | Programmable Microelectronics Corporation | Non-volatile latch having PMOS floating gate memory cells |
US6026018A (en) * | 1998-08-20 | 2000-02-15 | Simtek Corporation | Non-volatile, static random access memory with store disturb immunity |
US6097629A (en) * | 1998-09-30 | 2000-08-01 | Simtek Corporation | Non-volatile, static random access memory with high speed store capability |
US6021066A (en) * | 1999-01-04 | 2000-02-01 | International Business Machines Corporation | NVRAM array architecture utilizing common bitline and wordline |
US6330183B1 (en) | 1999-03-04 | 2001-12-11 | Pageant Technologies, Inc. (Micromem Technologies, Inc.) | Dual conductor inductive sensor for a non-volatile random access ferromagnetic memory |
US6288929B1 (en) * | 1999-03-04 | 2001-09-11 | Pageant Technologies, Inc. | Magneto resistor sensor with differential collectors for a non-volatile random access ferromagnetic memory |
US6556487B1 (en) | 2000-09-20 | 2003-04-29 | Cypress Semiconductor Corp. | Non-volatile static memory cell |
US6469930B1 (en) * | 2000-10-30 | 2002-10-22 | Cypress Semiconductor Corporation | Compact nonvolatile circuit having margin testing capability |
US6515895B2 (en) * | 2001-01-31 | 2003-02-04 | Motorola, Inc. | Non-volatile magnetic register |
US6414873B1 (en) | 2001-03-16 | 2002-07-02 | Simtek Corporation | nvSRAM with multiple non-volatile memory cells for each SRAM memory cell |
US20030190771A1 (en) * | 2002-03-07 | 2003-10-09 | 02Ic, Ltd. | Integrated ram and non-volatile memory cell method and structure |
US20060007772A1 (en) * | 2002-03-19 | 2006-01-12 | O2Ic, Inc. | Non-volatile memory device |
KR100432889B1 (ko) * | 2002-04-12 | 2004-05-22 | 삼성전자주식회사 | 2비트 기입가능한 비휘발성 메모리 소자, 그 구동방법 및그 제조방법 |
US7232717B1 (en) | 2002-05-28 | 2007-06-19 | O2Ic, Inc. | Method of manufacturing non-volatile DRAM |
CN100454440C (zh) * | 2002-07-31 | 2009-01-21 | 连邦科技股份有限公司 | 组合静态随机存取存储器和掩膜只读存储器存储单元 |
KR100599106B1 (ko) * | 2003-12-31 | 2006-07-12 | 동부일렉트로닉스 주식회사 | 비 휘발성 메모리 장치 및 그 구동방법 |
US7186612B2 (en) | 2004-01-28 | 2007-03-06 | O2Ic, Inc. | Non-volatile DRAM and a method of making thereof |
US20050170586A1 (en) * | 2004-01-29 | 2005-08-04 | O2Ic, Inc., (A California Corporation) | Method of manufacturing non-volatile DRAM |
US20050219913A1 (en) * | 2004-04-06 | 2005-10-06 | O2Ic, Inc. | Non-volatile memory array |
US7164608B2 (en) * | 2004-07-28 | 2007-01-16 | Aplus Flash Technology, Inc. | NVRAM memory cell architecture that integrates conventional SRAM and flash cells |
US20060193174A1 (en) * | 2005-02-25 | 2006-08-31 | O2Ic | Non-volatile and static random access memory cells sharing the same bitlines |
US7280397B2 (en) * | 2005-07-11 | 2007-10-09 | Sandisk 3D Llc | Three-dimensional non-volatile SRAM incorporating thin-film device layer |
US8072834B2 (en) | 2005-08-25 | 2011-12-06 | Cypress Semiconductor Corporation | Line driver circuit and method with standby mode of operation |
US7859925B1 (en) | 2006-03-31 | 2010-12-28 | Cypress Semiconductor Corporation | Anti-fuse latch self-test circuit and method |
DE102007028472B4 (de) * | 2006-06-24 | 2014-02-13 | Zentrum Mikroelektronik Dresden Ag | Anordnung einer Doppelbitzelle in einem NV-SRAM Speicherschaltkreis |
US7495492B2 (en) * | 2006-09-12 | 2009-02-24 | International Business Machines Corporation | Dynamic latch state saving device and protocol |
US7966589B2 (en) * | 2006-09-12 | 2011-06-21 | International Business Machines Corporation | Structure for dynamic latch state saving device and protocol |
US7821859B1 (en) | 2006-10-24 | 2010-10-26 | Cypress Semiconductor Corporation | Adaptive current sense amplifier with direct array access capability |
US20080151654A1 (en) | 2006-12-22 | 2008-06-26 | Allan James D | Method and apparatus to implement a reset function in a non-volatile static random access memory |
US7505303B2 (en) * | 2006-12-22 | 2009-03-17 | Cypress Semiconductor Corporation | Method and apparatus to create an erase disturb on a non-volatile static random access memory cell |
US8817536B2 (en) * | 2007-03-22 | 2014-08-26 | Cypress Semiconductor Corporation | Current controlled recall schema |
US7859906B1 (en) | 2007-03-30 | 2010-12-28 | Cypress Semiconductor Corporation | Circuit and method to increase read margin in non-volatile memories using a differential sensing circuit |
US7881118B2 (en) * | 2007-05-25 | 2011-02-01 | Cypress Semiconductor Corporation | Sense transistor protection for memory programming |
US8059458B2 (en) * | 2007-12-31 | 2011-11-15 | Cypress Semiconductor Corporation | 3T high density nvDRAM cell |
US8036032B2 (en) * | 2007-12-31 | 2011-10-11 | Cypress Semiconductor Corporation | 5T high density NVDRAM cell |
US8064255B2 (en) * | 2007-12-31 | 2011-11-22 | Cypress Semiconductor Corporation | Architecture of a nvDRAM array and its sense regime |
WO2009090892A1 (ja) * | 2008-01-18 | 2009-07-23 | Sharp Kabushiki Kaisha | 不揮発性ランダムアクセスメモリ |
US7791927B1 (en) * | 2009-02-18 | 2010-09-07 | Nscore Inc. | Mis-transistor-based nonvolatile memory circuit with stable and enhanced performance |
US8203880B2 (en) * | 2009-07-01 | 2012-06-19 | Cavendish Kinetics Inc. | Binary logic utilizing MEMS devices |
DE102009053977B3 (de) * | 2009-11-23 | 2011-01-20 | Anvo-Systems Dresden Gmbh | Speicherzelle in einem NV-SRAM Speicherschaltkreis |
US8471328B2 (en) | 2010-07-26 | 2013-06-25 | United Microelectronics Corp. | Non-volatile memory and manufacturing method thereof |
KR200464994Y1 (ko) * | 2011-10-31 | 2013-01-29 | 충북대학교 산학협력단 | 멤리스터 소자를 적용한 비휘발성 정적 랜덤 액세스 메모리 셀 |
JP2013114731A (ja) * | 2011-11-30 | 2013-06-10 | Toshiba Corp | 半導体記憶装置 |
US9177644B2 (en) | 2012-08-15 | 2015-11-03 | Aplus Flash Technology, Inc. | Low-voltage fast-write PMOS NVSRAM cell |
US8964470B2 (en) | 2012-09-25 | 2015-02-24 | Aplus Flash Technology, Inc. | Method and architecture for improving defect detectability, coupling area, and flexibility of NVSRAM cells and arrays |
US9001583B2 (en) | 2012-10-15 | 2015-04-07 | Aplus Flash Technology, Inc. | On-chip HV and LV capacitors acting as the second back-up supplies for NVSRAM auto-store operation |
US9177645B2 (en) | 2012-10-19 | 2015-11-03 | Aplus Flash Technology, Inc. | 10T NVSRAM cell and cell operations |
US8929136B2 (en) | 2012-10-26 | 2015-01-06 | Aplus Flash Technology, Inc. | 8T NVSRAM cell and cell operations |
US8971113B2 (en) | 2012-10-30 | 2015-03-03 | Aplus Flash Technology, Inc. | Pseudo-8T NVSRAM cell with a charge-follower |
US8976588B2 (en) | 2012-11-01 | 2015-03-10 | Aplus Flash Technology, Inc. | NVSRAM cells with voltage flash charger |
US8947122B2 (en) * | 2013-01-14 | 2015-02-03 | Cypress Semiconductor Corporation | Non-volatile latch structures with small area for FPGA |
US8897067B2 (en) * | 2013-01-18 | 2014-11-25 | Cypress Semiconductor Corporation | Nonvolatile memory cells and methods of making such cells |
US9208878B2 (en) | 2014-03-25 | 2015-12-08 | International Business Machines Corporation | Non-volatile memory based on retention modulation |
US9607695B1 (en) * | 2015-11-13 | 2017-03-28 | Cypress Semiconductor Corporation | Multi-bit non-volatile random-access memory cells |
CN107180649B (zh) | 2016-03-11 | 2021-01-15 | 联华电子股份有限公司 | 半导体存储器元件及操作半导体存储器元件的方法 |
Family Cites Families (17)
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US3636530A (en) * | 1969-09-10 | 1972-01-18 | Litton Systems Inc | Nonvolatile direct storage bistable circuit |
JPS5327107B2 (es) * | 1973-09-28 | 1978-08-05 | ||
JPS51129144A (en) * | 1975-05-02 | 1976-11-10 | Toshiba Corp | Memory divice of non volatile information |
GB1516134A (en) * | 1975-05-20 | 1978-06-28 | Plessey Co Ltd | Electrical information store |
JPS52153630A (en) * | 1976-06-16 | 1977-12-20 | Matsushita Electric Ind Co Ltd | Semiconductor memory device |
JPS5577088A (en) * | 1978-12-07 | 1980-06-10 | Toshiba Corp | Nonvolatile semiconductor memory unit |
US4370798A (en) * | 1979-06-15 | 1983-02-01 | Texas Instruments Incorporated | Interlevel insulator for integrated circuit with implanted resistor element in second-level polycrystalline silicon |
JPS5644194A (en) * | 1979-09-19 | 1981-04-23 | Toshiba Corp | Memory device |
US4271487A (en) * | 1979-11-13 | 1981-06-02 | Ncr Corporation | Static volatile/non-volatile ram cell |
US4403306A (en) * | 1980-10-22 | 1983-09-06 | Tokyo Shibaura Denki Kabushiki Kaisha | Semiconductor memory operable as static RAM or EAROM |
FR2517142A1 (fr) * | 1981-11-20 | 1983-05-27 | Efcis | Bascule bistable a stockage non volatil et a repositionnement statique |
US4675715A (en) * | 1982-12-09 | 1987-06-23 | American Telephone And Telegraph Company, At&T Bell Laboratories | Semiconductor integrated circuit vertical geometry impedance element |
JPS60136994A (ja) * | 1983-12-26 | 1985-07-20 | Hitachi Micro Comput Eng Ltd | 半導体記憶装置 |
US4560419A (en) * | 1984-05-30 | 1985-12-24 | Inmos Corporation | Method of making polysilicon resistors with a low thermal activation energy |
US4679170A (en) * | 1984-05-30 | 1987-07-07 | Inmos Corporation | Resistor with low thermal activation energy |
US4774203A (en) * | 1985-10-25 | 1988-09-27 | Hitachi, Ltd. | Method for making static random-access memory device |
JPH0777078B2 (ja) * | 1987-01-31 | 1995-08-16 | 株式会社東芝 | 不揮発性半導体メモリ |
-
1989
- 1989-06-02 US US07/361,033 patent/US5065362A/en not_active Expired - Lifetime
-
1990
- 1990-06-01 KR KR1019910701746A patent/KR0169738B1/ko not_active IP Right Cessation
- 1990-06-01 JP JP2509830A patent/JPH04505981A/ja active Pending
- 1990-06-01 EP EP19900909888 patent/EP0474781A4/en not_active Withdrawn
- 1990-06-01 WO PCT/US1990/003122 patent/WO1990015414A1/en not_active Application Discontinuation
- 1990-06-01 ES ES199090909888T patent/ES2028771T1/es active Pending
- 1990-06-01 AU AU58590/90A patent/AU5859090A/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
EP0474781A4 (en) | 1993-01-07 |
AU5859090A (en) | 1991-01-07 |
JPH04505981A (ja) | 1992-10-15 |
WO1990015414A1 (en) | 1990-12-13 |
KR920701980A (ko) | 1992-08-12 |
KR0169738B1 (ko) | 1999-02-18 |
EP0474781A1 (en) | 1992-03-18 |
US5065362A (en) | 1991-11-12 |
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