EP2342739A4 - MANAGEMENT OF THE HEAT BUDGET ON LIGHTING OF SUBSTRATES - Google Patents
MANAGEMENT OF THE HEAT BUDGET ON LIGHTING OF SUBSTRATESInfo
- Publication number
- EP2342739A4 EP2342739A4 EP09814993.3A EP09814993A EP2342739A4 EP 2342739 A4 EP2342739 A4 EP 2342739A4 EP 09814993 A EP09814993 A EP 09814993A EP 2342739 A4 EP2342739 A4 EP 2342739A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- thermal budget
- budget management
- substrate recovery
- recovery
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 238000011084 recovery Methods 0.000 title 1
- 239000000758 substrate Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/324—Thermal treatment for modifying the properties of semiconductor bodies, e.g. annealing, sintering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67115—Apparatus for thermal treatment mainly by radiation
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Recrystallisation Techniques (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Furnace Details (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/212,214 US8314369B2 (en) | 2008-09-17 | 2008-09-17 | Managing thermal budget in annealing of substrates |
| US12/212,157 US20100068898A1 (en) | 2008-09-17 | 2008-09-17 | Managing thermal budget in annealing of substrates |
| PCT/US2009/055838 WO2010033389A1 (en) | 2008-09-17 | 2009-09-03 | Managing thermal budget in annealing of substrates |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| EP2342739A1 EP2342739A1 (en) | 2011-07-13 |
| EP2342739A4 true EP2342739A4 (en) | 2013-05-22 |
Family
ID=42039812
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP09814993.3A Withdrawn EP2342739A4 (en) | 2008-09-17 | 2009-09-03 | MANAGEMENT OF THE HEAT BUDGET ON LIGHTING OF SUBSTRATES |
Country Status (7)
| Country | Link |
|---|---|
| EP (1) | EP2342739A4 (enExample) |
| JP (1) | JP5611212B2 (enExample) |
| KR (2) | KR101868378B1 (enExample) |
| CN (1) | CN102160157B (enExample) |
| SG (2) | SG193882A1 (enExample) |
| TW (3) | TWI549190B (enExample) |
| WO (1) | WO2010033389A1 (enExample) |
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8546805B2 (en) * | 2012-01-27 | 2013-10-01 | Ultratech, Inc. | Two-beam laser annealing with improved temperature performance |
| US9376731B2 (en) * | 2012-05-08 | 2016-06-28 | Applied Materials, Inc. | Magneto-thermal processing apparatus and methods |
| US9239192B2 (en) * | 2013-02-20 | 2016-01-19 | Taiwan Semiconductor Manufacturing Co., Ltd. | Substrate rapid thermal heating system and methods |
| CN104752174A (zh) * | 2013-12-30 | 2015-07-01 | 上海微电子装备有限公司 | 一种激光退火装置及方法 |
| TW201610215A (zh) * | 2014-03-27 | 2016-03-16 | 應用材料股份有限公司 | 用於低熱預算處理的循環尖峰退火化學曝露 |
| CN107112548A (zh) * | 2014-10-31 | 2017-08-29 | 应用材料公司 | 激光处理与电化学元件层沉积的整合 |
| KR102494614B1 (ko) * | 2015-03-20 | 2023-02-02 | 어플라이드 머티어리얼스, 인코포레이티드 | 3d 형상추종성 처리를 위한 원자 층 프로세스 챔버 |
| KR102531865B1 (ko) * | 2015-07-29 | 2023-05-16 | 어플라이드 머티어리얼스, 인코포레이티드 | 회전하는 기판의 레이저 어닐링 |
| JP6887234B2 (ja) | 2016-09-21 | 2021-06-16 | 株式会社日本製鋼所 | レーザ照射装置、レーザ照射方法、及び半導体装置の製造方法 |
| KR102099890B1 (ko) * | 2017-05-18 | 2020-04-14 | 세메스 주식회사 | 기판 처리 장치 및 기판 처리 방법 |
| KR102061424B1 (ko) * | 2018-07-27 | 2019-12-31 | 주식회사 코윈디에스티 | 로이 유리 어닐링 장치 |
| KR102180311B1 (ko) | 2018-07-27 | 2020-11-18 | 주식회사 코윈디에스티 | 레이저 어닐링 장치 |
| CN112038223A (zh) * | 2020-08-27 | 2020-12-04 | 上海华力集成电路制造有限公司 | 一种改善双激光退火过程中晶圆表面热分布的方法 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58106836A (ja) * | 1981-12-18 | 1983-06-25 | Hitachi Ltd | レ−ザ−アニ−ル装置 |
| EP0091806A2 (en) * | 1982-04-09 | 1983-10-19 | Fujitsu Limited | A method for producing a single crystalline semiconductor layer |
| US6187616B1 (en) * | 1998-02-13 | 2001-02-13 | Seiko Epson Corporation | Method for fabricating semiconductor device and heat treatment apparatus |
| US20080045040A1 (en) * | 2006-08-17 | 2008-02-21 | Toshiba America Electronic Components, Inc. | Laser Spike Anneal With Plural Light Sources |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5696835A (en) * | 1979-12-29 | 1981-08-05 | Fujitsu Ltd | Manufacture of semiconductor device |
| JPH03266424A (ja) * | 1990-03-16 | 1991-11-27 | Sony Corp | 半導体基板のアニール方法 |
| US5643801A (en) * | 1992-11-06 | 1997-07-01 | Semiconductor Energy Laboratory Co., Ltd. | Laser processing method and alignment |
| US6423585B1 (en) * | 1997-03-11 | 2002-07-23 | Semiconductor Energy Laboratory Co., Ltd. | Heating treatment device, heating treatment method and fabrication method of semiconductor device |
| US6771895B2 (en) * | 1999-01-06 | 2004-08-03 | Mattson Technology, Inc. | Heating device for heating semiconductor wafers in thermal processing chambers |
| TW457553B (en) * | 1999-01-08 | 2001-10-01 | Sony Corp | Process for producing thin film semiconductor device and laser irradiation apparatus |
| WO2001064591A1 (en) * | 2000-03-01 | 2001-09-07 | Heraeus Amersil, Inc. | Method, apparatus, and article of manufacture for determining an amount of energy needed to bring a quartz workpiece to a fusion weldable condition |
| JP2003045820A (ja) * | 2001-07-30 | 2003-02-14 | Semiconductor Energy Lab Co Ltd | レーザ照射装置およびレーザ照射方法、並びに半導体装置の作製方法 |
| US6987240B2 (en) | 2002-04-18 | 2006-01-17 | Applied Materials, Inc. | Thermal flux processing by scanning |
| JP2004128421A (ja) * | 2002-10-07 | 2004-04-22 | Semiconductor Energy Lab Co Ltd | レーザ照射方法およびレーザ照射装置、並びに半導体装置の作製方法 |
| US7098155B2 (en) * | 2003-09-29 | 2006-08-29 | Ultratech, Inc. | Laser thermal annealing of lightly doped silicon substrates |
| TWI297521B (en) * | 2004-01-22 | 2008-06-01 | Ultratech Inc | Laser thermal annealing of lightly doped silicon substrates |
| US7482254B2 (en) * | 2005-09-26 | 2009-01-27 | Ultratech, Inc. | Apparatus and methods for thermally processing undoped and lightly doped substrates without pre-heating |
| JP2008080371A (ja) * | 2006-09-27 | 2008-04-10 | Sumitomo Heavy Ind Ltd | レーザ加工方法、及び、レーザ加工装置 |
-
2009
- 2009-09-03 EP EP09814993.3A patent/EP2342739A4/en not_active Withdrawn
- 2009-09-03 JP JP2011526919A patent/JP5611212B2/ja not_active Expired - Fee Related
- 2009-09-03 SG SG2013069232A patent/SG193882A1/en unknown
- 2009-09-03 KR KR1020177033214A patent/KR101868378B1/ko not_active Expired - Fee Related
- 2009-09-03 CN CN200980136613.5A patent/CN102160157B/zh not_active Expired - Fee Related
- 2009-09-03 SG SG10201807844VA patent/SG10201807844VA/en unknown
- 2009-09-03 KR KR1020117008790A patent/KR101800404B1/ko not_active Expired - Fee Related
- 2009-09-03 WO PCT/US2009/055838 patent/WO2010033389A1/en not_active Ceased
- 2009-09-09 TW TW102122198A patent/TWI549190B/zh not_active IP Right Cessation
- 2009-09-09 TW TW098130387A patent/TWI419234B/zh not_active IP Right Cessation
- 2009-09-09 TW TW102141287A patent/TWI549191B/zh not_active IP Right Cessation
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58106836A (ja) * | 1981-12-18 | 1983-06-25 | Hitachi Ltd | レ−ザ−アニ−ル装置 |
| EP0091806A2 (en) * | 1982-04-09 | 1983-10-19 | Fujitsu Limited | A method for producing a single crystalline semiconductor layer |
| US6187616B1 (en) * | 1998-02-13 | 2001-02-13 | Seiko Epson Corporation | Method for fabricating semiconductor device and heat treatment apparatus |
| US20080045040A1 (en) * | 2006-08-17 | 2008-02-21 | Toshiba America Electronic Components, Inc. | Laser Spike Anneal With Plural Light Sources |
Non-Patent Citations (1)
| Title |
|---|
| See also references of WO2010033389A1 * |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI549191B (zh) | 2016-09-11 |
| EP2342739A1 (en) | 2011-07-13 |
| TW201013789A (en) | 2010-04-01 |
| TWI549190B (zh) | 2016-09-11 |
| TW201342480A (zh) | 2013-10-16 |
| CN102160157A (zh) | 2011-08-17 |
| TW201415558A (zh) | 2014-04-16 |
| JP2012503311A (ja) | 2012-02-02 |
| SG193882A1 (en) | 2013-10-30 |
| KR101800404B1 (ko) | 2017-11-22 |
| CN102160157B (zh) | 2015-11-25 |
| TWI419234B (zh) | 2013-12-11 |
| KR20170130616A (ko) | 2017-11-28 |
| JP5611212B2 (ja) | 2014-10-22 |
| WO2010033389A1 (en) | 2010-03-25 |
| SG10201807844VA (en) | 2018-10-30 |
| KR20110053387A (ko) | 2011-05-20 |
| KR101868378B1 (ko) | 2018-06-18 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
| 17P | Request for examination filed |
Effective date: 20110415 |
|
| AK | Designated contracting states |
Kind code of ref document: A1 Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO SE SI SK SM TR |
|
| AX | Request for extension of the european patent |
Extension state: AL BA RS |
|
| RIN1 | Information on inventor provided before grant (corrected) |
Inventor name: MOFFATT, STEPHEN Inventor name: MAYUR, ABHILASH, J. Inventor name: HUNTER, AARON Inventor name: RAMAMURTHY, SUNDAR Inventor name: RANISH, JOSEPH |
|
| DAX | Request for extension of the european patent (deleted) | ||
| A4 | Supplementary search report drawn up and despatched |
Effective date: 20130422 |
|
| RIC1 | Information provided on ipc code assigned before grant |
Ipc: H01L 21/67 20060101ALI20130416BHEP Ipc: H01L 21/324 20060101AFI20130416BHEP |
|
| 17Q | First examination report despatched |
Effective date: 20160610 |
|
| GRAP | Despatch of communication of intention to grant a patent |
Free format text: ORIGINAL CODE: EPIDOSNIGR1 |
|
| INTG | Intention to grant announced |
Effective date: 20181120 |
|
| STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWN |
|
| 18D | Application deemed to be withdrawn |
Effective date: 20190402 |