EP1158562B1 - Tube radiogène à cathode plane - Google Patents

Tube radiogène à cathode plane Download PDF

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Publication number
EP1158562B1
EP1158562B1 EP01000176A EP01000176A EP1158562B1 EP 1158562 B1 EP1158562 B1 EP 1158562B1 EP 01000176 A EP01000176 A EP 01000176A EP 01000176 A EP01000176 A EP 01000176A EP 1158562 B1 EP1158562 B1 EP 1158562B1
Authority
EP
European Patent Office
Prior art keywords
electron emitter
ray tube
anode
electrode
electron
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
EP01000176A
Other languages
German (de)
English (en)
Other versions
EP1158562A1 (fr
Inventor
Robert Dr. Hess
Frank Demuth
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Philips Intellectual Property and Standards GmbH
Koninklijke Philips NV
Original Assignee
Philips Intellectual Property and Standards GmbH
Koninklijke Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Intellectual Property and Standards GmbH, Koninklijke Philips Electronics NV filed Critical Philips Intellectual Property and Standards GmbH
Publication of EP1158562A1 publication Critical patent/EP1158562A1/fr
Application granted granted Critical
Publication of EP1158562B1 publication Critical patent/EP1158562B1/fr
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/06—Cathodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/06—Cathodes
    • H01J35/064—Details of the emitter, e.g. material or structure
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/06—Cathodes
    • H01J35/066—Details of electron optical components, e.g. cathode cups
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/14—Arrangements for concentrating, focusing, or directing the cathode ray
    • H01J35/147—Spot size control
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/14—Arrangements for concentrating, focusing, or directing the cathode ray
    • H01J35/153—Spot position control

Definitions

  • the invention relates to an X-ray tube with an anode and with a cathode arrangement which has a cathode pot for electron focusing, a flat, apertured electron emitter and an electrode which is arranged on the side facing away from the anode side of the electron emitter.
  • a cathode pot for electron focusing a cathode pot for electron focusing
  • a flat, apertured electron emitter an electrode which is arranged on the side facing away from the anode side of the electron emitter.
  • the electrode emitter is a flat, flat and meandering metal band. Between the reciprocating webs of this metal band so breakthroughs are present.
  • the potential of the cathode pot is variable with respect to the electron emitter, so that errors in the manufacturing process have no effect on the dimensions of the focal spot. If the potential at the cathode pot is more positive by a certain amount than at the electron emitter, electrons from the lateral regions or from the back of the electron emitter can reach the cathode pot and heat it up. Therefore, in one embodiment, a small distance from the electron emitter, an electrode is provided which shields the back and the lateral regions of the electron emitter and whose potential corresponds at least approximately to the potential of the electron emitter.
  • the advantage of such a flat electron emitter over an electron emitter made of a helically wound wire is that the electron trajectories can be better focused so that a focal spot with a more favorable electron density distribution is produced on the anode. Nevertheless, the achievable electron density distribution in the focal spot does not match that of an ideal flat emitter.
  • the ideal flat emitter is a flat emitter with zero thickness and no openings.
  • Object of the present invention is to provide an X-ray tube of the type mentioned in such a way that the characteristic of the ideal flat emitter at least Object of the present invention is to provide an X-ray tube of the type mentioned in such a way that the characteristic of the ideal flat emitter results at least approximately.
  • the electrode in the operating state of the X-ray tube leads to the electron emitter negative potential of such magnitude that the amount of electric field strength in the space between the electrode and the electron emitter at least 20% - preferably at least 100% - of the amount the field strength is on the anode-facing side of the electron emitter.
  • the invention is based on the finding that in the known X-ray tube, the electric field reaches into the apertures, so that the equipotential lines are drawn into the apertures at the surface of the electron emitter facing the anode. In the area of the openings, therefore, electron paths are obtained which deviate from those of an ideal flat emitter and prevent the characteristic of this ideal flat emitter from being achieved. As a result of the fact that the electrode has a negative potential on the rear side of the electron emitter remote from the anode, the equipotential lines are forced back out of the openings. With a suitable choice of the potential can be achieved that the equipotential surfaces on the anode facing the front of the electron emitter are almost flat. The electron paths then run in the vicinity of the electron emitter everywhere straight and perpendicular to its surface.
  • Another advantage resulting from the invention is that the position and / or size of the Make it easier to control focal spots.
  • a preferred embodiment is specified in claim 2.
  • the electron emitter may have a different shape than that of a meander (e.g., the shape of a spiral), a meander is easier to manufacture.
  • a better penetration of the electrode located at the back of the electron emitter is achieved on the front of the electron emitter. At a constant distance between the electron emitter and the electrode, the electrical voltage between these parts can be reduced.
  • a preferred embodiment is specified in claim 4.
  • another form is possible, for example. a curved shape of the electron emitter.
  • the electrode would have to be adapted to this curvature.
  • position of the electron emitter electron emitter and cathode pot can lead the same potential.
  • An X-ray device with an X-ray tube according to claim 1 is specified in claim 7.
  • the embodiment according to claim 8 has the effect that the bias voltage of the electrode is varied in dependence on the tube voltage (that is to say the voltage between anode and cathode) so that the optimal field profile always results in the region of the electron emitter.
  • the rotating anode X-ray tube shown has an anode disc 1 rotating in the operating state and a cathode assembly 2.
  • the cathode assembly 2 is connected via an insulator 3 to the metal housing 4 of the X-ray tube.
  • the anode 1 may be connected via an insulator to the housing 4 or lead the potential of the (grounded) housing.
  • the electrons emitted from the cathode strike the anode in a focal spot and generate there X-radiation, which can leave the X-ray tube through a window 5.
  • the invention is also applicable to x-ray tubes with fixed anodes or x-ray tubes used in the non-medical field.
  • Fig. 2 shows the cathode assembly in a cross section. It can be seen a cathode pot 201, which is provided with a die 202, which serves to focus the electron beam. At the bottom in the middle of the die is a slot 204, the longitudinal direction of which extends radially to the axis of rotation of the anode disk 1.
  • slot is a flat, flat electron emitter 203, the front side of which (that is, the side facing the anode 1) is in one plane with the bottom of the die.
  • the electron emitter has the shape of a meander whose individual ridges are perpendicular to the Plane of the Fig. 3 - And thus extend in the longitudinal direction of the slot 204.
  • the openings between adjacent lands have a dimension of about 0.1 mm, while the width of the lands (that is, the dimension in the vertical direction in the plane of the drawing) is about 0.2 mm.
  • the webs 203 may also extend perpendicular to the longitudinal direction of the web 204 - similar to the U.S. Patent 4,344,011 , They can then be easier to produce.
  • the electron emitter 203 is heated by an electric current flowing through it in the operating state, so that it can emit electrons.
  • an electrode 205 is arranged in the slot on the rear side of the electron emitter 203, which leads to a negative potential with respect to the electron emitter 203.
  • FIG. 2 shows a highly simplified, schematic block diagram of an X-ray device with the X-ray tube according to the invention. This is connected to the output of a first rectifier 91, which supplies a DC voltage in the range between 40 and 125 kV.
  • a second rectifier 92 to whose positive output terminal the electron emitter 203 and to its negative output terminal the electrode 205 are connected, supplies the negative kV of the electrode 205 to the electron emitter 203.
  • a heating current source heats the electron emitter so that electrons are emitted therefrom can not be shown for the sake of simplicity.
  • the negative bias of the electrode 205 with respect to the electron emitter 203 is now chosen so that on the front of the electron emitter - and also in the region of the openings between the webs - an approximately flat course of Equipotential surfaces results.
  • the x-ray generator feeding the x-ray tube 100 may also have a different structure. It is essential that it contains an (additional) DC voltage source for generating a DC voltage between electron emitter 203 and electrode 205, which preferably changes proportionally in accordance with the high voltage between the anode and the cathode. (This condition is taken from the in Fig. 4 simplified circuit shown with the connected with its primary winding 81 to an inverter transformer 8, at the Sekundärväddungm 82 and 83, the rectifier 91, 92 are connected, met only with restrictions.)
  • the electric field at the backside of the electron emitter must be stronger than at the front side. How much it needs to be stronger depends on the thickness of the webs (these are the ones in the drawing plane of Fig. 3 horizontally extending dimensions), from their width and from their mutual distance.
  • One way to improve the penetration of the electric field generated by the electrode 205 on the front of the electron emitter is to bevel the side surfaces of the individual webs of the electron emitter, so that they taper towards the electrode 203 or the openings to the electrode expand.
  • the electric field strength behind the electron emitter is just as large as the electric field strength in front of the electron emitter, then complete compensation of the fissures caused by the apertures in the electron emitter is not possible, but there is still a positive effect.
  • the negatively biased electrode 205 is practically ineffective.
  • Fig. 5a shows the electron trajectories in a helically wound wire 203 'as an electron emitter (whose cross section appears elliptical because of the distorted representation).
  • the course of the electron orbits depends on where the electron emitters the electron emit. Despite focusing (not shown in detail), the electrons therefore meet in a comparatively large cross-section.
  • Fig. 5b are compared with the conditions in an ideal surface emitter. All electron orbits start perpendicular to the surface of the emitter until they meet under the effect of a focusing field in a focal spot of minimum size.
  • Fig. 5c shows the conditions in a real meandering electron emitter.
  • the electron paths are curved, which, in spite of the focusing, leads to an enlargement of the focal spot (in comparison to the ideal surface emitter).
  • the focal spot is significantly smaller than in a helically wound electron emitter.

Claims (8)

  1. Système de dialogue automatique pour des interrogations orales dans une entrée de base de données qui contient plusieurs éléments disponibles pour l'interrogation, dans lequel la reconnaissance de parole (3) d'un énoncé oral pour interroger une entrée de base de données est supportée par un modèle linguistique (6) qui est préparé avant le début du dialogue auquel l'énoncé oral appartient et qui modélise l'occurrence corrélée des éléments de l'entrée de base de données fournie pour l'interrogation dans l'énoncé oral du dialogue.
  2. Système de dialogue automatique pour des interrogations de base de données orales suivant la revendication 1, caractérisé en ce que
    le modèle linguistique (6) attribue la note 1 ("admis") à l'occurrence de plusieurs éléments d'un enregistrement de données dans l'énoncé oral qui est contenu dans la base de données interrogée, et
    le modèle linguistique (6) attribue la note 0 ("non admis") à l'occurrence de plusieurs éléments d'un enregistrement de données dans l'énoncé oral qui n'est pas contenu dans la base de données interrogée.
  3. Système de dialogue automatique pour des interrogations de base de données orales suivant la revendication 1, caractérisé en ce que
    le modèle linguistique (6) attribue à l'occurrence de plusieurs éléments d'un enregistrement de données dans l'énoncé oral qui est contenu dans la base de données interrogée une note par rapport à leur fréquence relative dans la base de données interrogée, et
    le modèle linguistique (6) attribue la note 0 ("non admis") à l'occurrence de plusieurs éléments d'un enregistrement de données dans l'énoncé oral qui n'est pas contenu dans la base de données interrogée.
  4. Système de dialogue automatique pour des interrogations de base de données orales suivant la revendication 1, caractérisé en ce que
    le modèle linguistique (6) attribue à l'occurrence de plusieurs éléments d'un enregistrement de données dans l'énoncé oral qui est contenu dans la base de données interrogée une note par rapport à leur fréquence relative dans la base de données interrogée, et
    le modèle linguistique (6) attribue à l'occurrence de plusieurs éléments d'un enregistrement de données dans l'énoncé oral qui n'est pas contenu dans la base de données interrogée une note par rapport à la fréquence relative d'un énoncé oral de ce type.
  5. Système reconnaissance de parole (3) destiné à reconnaître un énoncé oral pour interroger oralement une entrée de base de données qui comprend plusieurs éléments disponibles pour l'interrogation, dans lequel le système de reconnaissance de parole (3) est supporté par un modèle linguistique (6) qui est préparé avant le début du dialogue auquel l'énoncé oral appartient et qui modélise l'occurrence corrélée des éléments de l'entrée de base de données fournie pour l'interrogation dans l'énoncé oral du dialogue.
  6. Procédé destiné à obtenir un modèle linguistique (6) destiné à supporter la reconnaissance de parole (3) d'un énoncé oral pour interroger oralement une entrée de base de données qui comprend plusieurs éléments disponibles pour l'interrogation, dans lequel le procédé prépare le modèle linguistique (6) avant le début du dialogue auquel l'énoncé oral appartient, et dans lequel le procédé obtient le modèle linguistique (6) en modélisant l'occurrence corrélée des éléments de l'entrée de base de données fournie pour l'interrogation dans l'énoncé oral du dialogue.
  7. Procédé destiné à interroger oralement une entrée de base de données qui comprend plusieurs éléments disponibles pour l'interrogation, dans lequel la reconnaissance de parole (3) d'un énoncé oral pour interroger une entrée de base de données est supportée par un modèle linguistique (6) qui est construit avant le début du dialogue auquel l'énoncé oral appartient et qui modélise l'occurrence corrélée de l'élément de l'entrée de base de données fournie pour l'interrogation dans l'énoncé oral du dialogue.
  8. Modèle linguistique (6) obtenu par le procédé suivant la revendication 6.
EP01000176A 2000-05-24 2001-05-22 Tube radiogène à cathode plane Expired - Lifetime EP1158562B1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10025807 2000-05-24
DE10025807A DE10025807A1 (de) 2000-05-24 2000-05-24 Röntgenröhre mit Flachkathode

Publications (2)

Publication Number Publication Date
EP1158562A1 EP1158562A1 (fr) 2001-11-28
EP1158562B1 true EP1158562B1 (fr) 2008-08-13

Family

ID=7643462

Family Applications (1)

Application Number Title Priority Date Filing Date
EP01000176A Expired - Lifetime EP1158562B1 (fr) 2000-05-24 2001-05-22 Tube radiogène à cathode plane

Country Status (4)

Country Link
US (1) US6556656B2 (fr)
EP (1) EP1158562B1 (fr)
JP (1) JP2002033063A (fr)
DE (2) DE10025807A1 (fr)

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US6028190A (en) * 1994-02-01 2000-02-22 The Regents Of The University Of California Probes labeled with energy transfer coupled dyes
JP3699666B2 (ja) * 2001-09-19 2005-09-28 株式会社リガク Ｘ線管の熱陰極
US6785359B2 (en) * 2002-07-30 2004-08-31 Ge Medical Systems Global Technology Company, Llc Cathode for high emission x-ray tube
DE10314537A1 (de) * 2003-03-31 2004-10-28 Siemens Ag Vorrichtung zur Erzeugung von Röntgenstrahlen
US7447298B2 (en) 2003-04-01 2008-11-04 Cabot Microelectronics Corporation Decontamination and sterilization system using large area x-ray source
US7280636B2 (en) 2003-10-03 2007-10-09 Illinois Institute Of Technology Device and method for producing a spatially uniformly intense source of x-rays
US7839979B2 (en) * 2006-10-13 2010-11-23 Koninklijke Philips Electronics N.V. Electron optical apparatus, X-ray emitting device and method of producing an electron beam
CN106206223B (zh) * 2013-10-29 2019-06-14 万睿视影像有限公司 发射特点可调节以及磁性操控和聚焦的具有平面发射器的x射线管
DE102013225589B4 (de) * 2013-12-11 2015-10-08 Siemens Aktiengesellschaft Röntgenstrahler
US9865423B2 (en) 2014-07-30 2018-01-09 General Electric Company X-ray tube cathode with shaped emitter
GB2531326B (en) * 2014-10-16 2020-08-05 Adaptix Ltd An X-Ray emitter panel and a method of designing such an X-Ray emitter panel
US10991539B2 (en) * 2016-03-31 2021-04-27 Nano-X Imaging Ltd. X-ray tube and a conditioning method thereof
US10636608B2 (en) 2017-06-05 2020-04-28 General Electric Company Flat emitters with stress compensation features
EP3518266A1 (fr) 2018-01-30 2019-07-31 Siemens Healthcare GmbH Dispositif d'émission thermionique

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US4764947A (en) * 1985-12-04 1988-08-16 The Machlett Laboratories, Incorporated Cathode focusing arrangement
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US5007074A (en) * 1989-07-25 1991-04-09 Picker International, Inc. X-ray tube anode focusing by low voltage bias
DE3929888A1 (de) * 1989-09-08 1991-03-14 Philips Patentverwaltung Roentgengenerator zum betrieb einer roentgenroehre mit an masse angeschlossenen roehrenteilen
JP2713860B2 (ja) * 1994-04-26 1998-02-16 浜松ホトニクス株式会社 Ｘ線管装置
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US6229876B1 (en) * 1999-07-29 2001-05-08 Kevex X-Ray, Inc. X-ray tube

Also Published As

Publication number Publication date
EP1158562A1 (fr) 2001-11-28
JP2002033063A (ja) 2002-01-31
DE10025807A1 (de) 2001-11-29
US6556656B2 (en) 2003-04-29
DE50114206D1 (de) 2008-09-25
US20020009179A1 (en) 2002-01-24

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