EP0862147A2 - Münzprüfvorrichtung - Google Patents
Münzprüfvorrichtung Download PDFInfo
- Publication number
- EP0862147A2 EP0862147A2 EP98100034A EP98100034A EP0862147A2 EP 0862147 A2 EP0862147 A2 EP 0862147A2 EP 98100034 A EP98100034 A EP 98100034A EP 98100034 A EP98100034 A EP 98100034A EP 0862147 A2 EP0862147 A2 EP 0862147A2
- Authority
- EP
- European Patent Office
- Prior art keywords
- coin
- checking device
- probes
- test probes
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Classifications
-
- G—PHYSICS
- G07—CHECKING-DEVICES
- G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
- G07D5/00—Testing specially adapted to determine the identity or genuineness of coins, e.g. for segregating coins which are unacceptable or alien to a currency
-
- G—PHYSICS
- G07—CHECKING-DEVICES
- G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
- G07D5/00—Testing specially adapted to determine the identity or genuineness of coins, e.g. for segregating coins which are unacceptable or alien to a currency
- G07D5/08—Testing the magnetic or electric properties
Definitions
- the invention relates to a coin testing device according to the preamble of claim 1.
- Soil probes are particularly advantageous for so-called Bicolour coins made from a core with one around it put around ring. Ring and cores have a different one Color, hence the name mentioned. Also the material chosen for the ring and core is different.
- the invention is therefore based on the object of a coin testing device to create that is also able to create bicolour coins better discriminate and the overall the Test security also increased for other coins.
- test probes vertically on a common axis so arranged that, for example, the damping curves which generate the measurement signals of both test probes, occur simultaneously.
- the test probes which are, for example, inductive probes, can be on a Side of a coin channel arranged and the rolling past Be assigned to the area of the coins.
- one of the Test probes point-shaped and the other flat be.
- one of the test probes is also conceivable as an edge test probe by placing it in the bottom of the Coin runway is sunk. Such a soil test probe is known per se.
- the coils are arranged so that mutual overcoupling is avoided becomes.
- the parallel processing of the sensor signals is possible because the coin run past the probes takes significantly longer than the analog-digital conversion a measurement signal. For example, the coin run on the Probes past 50 ms while the analog to digital conversion of a Measurement signal in the order of 10 microseconds takes place. Because of this time ratio results when the evaluation is ongoing at least of two signal curves occurring at the same time a variety of evaluation criteria, for example Differential and partial areas, intersections and combinations from these events. Because of the acceleration of probes arranged exactly one above the other can also the slopes at certain points on the signal curves be used for evaluation.
- the coin validation device has a number of benefits. So due to the arrangement of the probes Intersection points are generated automatically and for example the distance of the intersection points from the symmetrical Timeline can be determined, which is a statement of authenticity of the tested coin. Furthermore, difference areas or individual partial areas are examined, also in Connection with programmable offsets. Especially at As already mentioned, bicolour coins arise above all with surface probes, small differences in damping between Ring and core material. Accordingly, you only have smaller ones Slumps in the rise and fall of the coin curve can be expected. These slope changes can usually be made difficult to evaluate. When using a second on the same Axis arranged test probe, for example only the When viewed in a ring, there is a multitude with the first curve of combinations of evaluation criteria.
- a coin track 10 is indicated, which is usually is attached to a raceway support plate 12 (Fig. 2). Between the raceway support plate 12 and a main plate 14 a coin channel 16 is formed, with on the Coin runway 10 Roll coins along in coin channel 16. In 1 and 2, a coin is marked with 18.
- inductive test probes 20, 22, 24 In the main plate 14 there are three inductive test probes 20, 22, 24 arranged one above the other. Your measuring axes lie on one Axis 26, which is perpendicular to the plane of the coin track 10 stands. Another test probe 28 is in the coin track 10 arranged. Your measuring axis coincides with axis 26.
- the test probes 20 to 24 are so-called area probes "view" part of the area of the coins 18, with the Example the probes 20, 24 the ring 30 of the bicolour coin 28 and probe 22 "looks" at core 32. Probes 20 to 28 are inductive probes. The test probe 28 is used for the examination the edge of the coin 18th
- the signal curve 40 is, for example, the sensor 28 shown for example for a coin with a value of 1 euro.
- a curve 42 shows the signal profile of a test probe, as represented by one of the probes 20 to 24. It can be seen that the curves 40, 42 are largely symmetrical are to the time axis 44. The overlap of the curves 40, 42 results thus, for example, two partial areas 46, 48, their difference for example for authenticity checks can. Furthermore, there are s1, s2 above intersection points an area 50, which is also used for the authenticity check can be. The position of the intersections s1, s2 can also be used for the authenticity check can be used, for example by measuring the distance to the axis of symmetry 44.
- a further curve 42 ' is indicated by dash-dotted lines, to show that there can be curve shapes, in which due to the high slope of the measurement curve 40 Intersection s1 and s1 'of curve 40 with curves 42 and 42 'may have relevant amplitude differences U1, U2, while the measured values S1, S1 'are close in time, i.e. form a ⁇ U that cannot be evaluated.
- the curve 5 is that of a floor sensor, corresponding to the sensor 28, generated signal curve designated 52 and that for one Area sensor with 54.
- the curve 52 corresponds approximately to that Course of curve 40 according to FIG. 1 and is characteristic for the formation of the edge of a bicoloured mune.
- the curve 54 is obtained, for example, from a sensor such as it is designated 22 in Figs. 1 and 2, i.e., when painting of coin surface sections both in the core 32 and also in edge 30 of coin 18.
- intersection points s3 and s4 for the coin check can be used.
- a third curve 52 ' is indicated in FIG curve 54 intersects at s3 '.
- the reverse Fall as in curve 42 ' i.e. the amplitude values U1 and U2 have a negligible difference, while the temporal position, expressed by T1 and T2 clearly is different.
- 58 again designates one Curve by a soil sensor, corresponding to soil sensor 28, is generated.
- curve 60 stems from one Sensor forth, as it is designated in Fig. 1 with 20 or 24, i.e. only one material is also measured.
- the overlapped areas can be used for evaluation or alternatively the slopes, approximately on both sides of the symmetry time axis 44 ′′ have to be the same.
- FIG 3 is a first sensor by a probe 70 in the main plate 14a and a second Sensor formed by probes 72, 72 'in the raceway support plate 12a are arranged.
- the probes 70, 72 are coaxial, but have a different diameter.
- Such a pair of sensors also generates signal curves at the same time when passing coins, that described in the above Be used to form authenticity criteria can.
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Coins (AREA)
Abstract
Description
- Fig. 1
- zeigt schematisch eine Münzprüfvorrichtung nach der Erfindung.
- Fig. 2
- zeigt einen Schnitt durch die Münzprüfvorrichtung nach der Erfindung.
- Fig. 3
- zeigt eine andere Ausführungsform einer Münzprüfvorrichtung nach der Erfindung im Schnitt.
- Fign. 4 bis 6
- zeigen die Meßsignalkurven von zwei Prüfsonden einer Münzprüfvorrichtung nach der Erfindung.
Claims (9)
- Münzprüfvorrichtung, mit zwei oder mehr Prüfsonden, die einer Münzlaufbahn, auf der die Münzen entlangrollen, zugeordnet sind, und einer Auswertevorrichtung, in die die Signale der Prüfsonden gegeben werden und in der charakteristische Abschnitte der Signale mit gespeicherten Referenzwerten verglichen werden zur Erzeugung eines Echtheitssignals, dadurch gekennzeichnet, daß die Meßachsen von mindestens zwei Prüfsonden (20, 22, 24, 28) in einer Ebene (26) angeordnet sind, die senkrecht auf der Ebene der Münzlaufbahn steht und die Auswertevorrichtung zeitgleich Abschnitte der Meßsignale von beiden Prüfsonden in gleichem Abstand zur zeitlichen Symmtrieachse (44, 44', 44'') der Meßsignale für die Auswertung verwendet.
- Münzprüfvorrichtung nach Anspruch 1, dadurch gekennzeichnet, daß die Schnittpunkte (s1 is s4) der Meßsignale verglichen werden.
- Münzprüfvorrichtung nach Anspruch 1, dadurch gekennzeichnet, daß Flächenabschnitte (46, 48, 50, 56) zwischen den überlappenden Meßsignalkurven verglichen werden.
- Münzprüfvorrichtung nach Anspruch 1, dadurch gekennzeichnet, daß Steigungen der Meßsignalkurven verglichen werden.
- Münzprüfvorrichtung nach einem der Ansprüche 1 bis 4, dadurch gekennzeichnet, daß eine Prüfsonde (28) in der Münzlaufbahn (10) angeordnet ist mit senkrecht auf dem Rand der Münze (18) stehender Meßachse.
- Münzprüfvorrichtung nach einem der Ansprüche 1 bis 4, dadurch gekennzeichnet, daß die Prüfsonden (20, 22, 24) so angeordnet sind, daß sie auf die Fläche der Münzen (18) gerichtet sind.
- Münzprüfvorrichtung nach einem der Ansprüche 1 bis 4, dadurch gekennzeichnet, daß die Prüfsonden an einer einen Münzkanal (16) begrenzenden Wand (12, 14) angeordnet sind.
- Münzprüfvorrichtung nach einem der Ansprüche 1 bis 4, dadurch gekennzeichnet, daß an den einen Münzkanal (16a) begrenzenden Wänden (12a, 14a) die Prüfsonden (70, 72) doppelseitig angeordnet sind.
- Münzprüfvorrichtung nach Anspruch 8, dadurch gekennzeichnet, daß die doppelseitigen Sonden (70, 72) eine gemeinsame Achse haben, jedoch einen unterschiedlichen Durchmesser.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19702986A DE19702986C2 (de) | 1997-01-28 | 1997-01-28 | Münzprüfvorrichtung |
DE19702986 | 1997-01-28 |
Publications (3)
Publication Number | Publication Date |
---|---|
EP0862147A2 true EP0862147A2 (de) | 1998-09-02 |
EP0862147A3 EP0862147A3 (de) | 1999-04-28 |
EP0862147B1 EP0862147B1 (de) | 2003-05-28 |
Family
ID=7818545
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP98100034A Expired - Lifetime EP0862147B1 (de) | 1997-01-28 | 1998-01-03 | Münzprüfvorrichtung |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP0862147B1 (de) |
DE (2) | DE19702986C2 (de) |
ES (1) | ES2196398T3 (de) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1999023615A1 (en) * | 1997-11-03 | 1999-05-14 | Coin Controls Ltd. | Coin acceptor |
EP1286313A2 (de) * | 2001-08-16 | 2003-02-26 | National Rejectors, Inc. GmbH | Verfahren und Vorrichtung zur Messung des Durchmessers von Münzen |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10106704A1 (de) * | 2001-02-14 | 2002-08-29 | Nat Rejectors Gmbh | Verfahren zur Erfassung der Betätigung eines Münzrückgabemechanismus in Münzprüfern |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0392110A2 (de) * | 1989-04-10 | 1990-10-17 | Kabushiki Kaisha Nippon Conlux | Münzauswähler |
GB2266400A (en) * | 1991-09-28 | 1993-10-27 | Anritsu Corp | Device for sorting coins |
DE4339543A1 (de) * | 1993-11-19 | 1995-05-24 | Nat Rejectors Gmbh | Verfahren zum Prüfen von Münzen |
JPH09147170A (ja) * | 1995-09-20 | 1997-06-06 | Fuji Electric Co Ltd | 硬貨識別装置 |
EP0780810A2 (de) * | 1995-12-21 | 1997-06-25 | National Rejectors Inc. GmbH | Elektronischer Münzprüfer |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2118344A (en) * | 1982-02-12 | 1983-10-26 | Mars Inc | Coin testing apparatus |
GB2266804B (en) * | 1992-05-06 | 1996-03-27 | Mars Inc | Coin validator |
-
1997
- 1997-01-28 DE DE19702986A patent/DE19702986C2/de not_active Expired - Fee Related
-
1998
- 1998-01-03 ES ES98100034T patent/ES2196398T3/es not_active Expired - Lifetime
- 1998-01-03 EP EP98100034A patent/EP0862147B1/de not_active Expired - Lifetime
- 1998-01-03 DE DE59808501T patent/DE59808501D1/de not_active Expired - Lifetime
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0392110A2 (de) * | 1989-04-10 | 1990-10-17 | Kabushiki Kaisha Nippon Conlux | Münzauswähler |
GB2266400A (en) * | 1991-09-28 | 1993-10-27 | Anritsu Corp | Device for sorting coins |
DE4339543A1 (de) * | 1993-11-19 | 1995-05-24 | Nat Rejectors Gmbh | Verfahren zum Prüfen von Münzen |
JPH09147170A (ja) * | 1995-09-20 | 1997-06-06 | Fuji Electric Co Ltd | 硬貨識別装置 |
EP0780810A2 (de) * | 1995-12-21 | 1997-06-25 | National Rejectors Inc. GmbH | Elektronischer Münzprüfer |
Non-Patent Citations (1)
Title |
---|
PATENT ABSTRACTS OF JAPAN vol. 097, no. 010, 31. Oktober 1997 & JP 09 147170 A (FUJI ELECTRIC CO LTD), 6. Juni 1997 * |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1999023615A1 (en) * | 1997-11-03 | 1999-05-14 | Coin Controls Ltd. | Coin acceptor |
AU745264B2 (en) * | 1997-11-03 | 2002-03-14 | Coin Controls Limited | Coin acceptor |
EP1286313A2 (de) * | 2001-08-16 | 2003-02-26 | National Rejectors, Inc. GmbH | Verfahren und Vorrichtung zur Messung des Durchmessers von Münzen |
EP1286313A3 (de) * | 2001-08-16 | 2004-05-06 | National Rejectors, Inc. GmbH | Verfahren und Vorrichtung zur Messung des Durchmessers von Münzen |
Also Published As
Publication number | Publication date |
---|---|
EP0862147A3 (de) | 1999-04-28 |
DE19702986A1 (de) | 1998-07-30 |
DE19702986C2 (de) | 1999-06-02 |
ES2196398T3 (es) | 2003-12-16 |
EP0862147B1 (de) | 2003-05-28 |
DE59808501D1 (de) | 2003-07-03 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE2654472C2 (de) | ||
EP0293576B1 (de) | Verfahren zum Erfassen von Dimensionsfehlern | |
DE3235114A1 (de) | Muenzpruefgeraet | |
DE3012414C2 (de) | ||
DE19858130A1 (de) | Elektronische Vermessungsvorrichtung umd Meßlatte zur Verwendung mit dieser | |
DE69819532T2 (de) | Verfahren und vorrichtung zum überprüfen von münzen | |
EP2040227B1 (de) | Verfahren zum Prüfen von Münzen | |
CH655810A5 (de) | Muenzpruefer fuer die pruefung unterschiedlicher muenzdicken und/oder muenzdurchmesser und/oder muenzlegierungen. | |
EP0862147B1 (de) | Münzprüfvorrichtung | |
DE60301895T2 (de) | Münzprüfer | |
EP0886247B1 (de) | Verfahren und Schaltungsanordnung zur Prüfung von Münzen | |
DD296770A5 (de) | Verfahren zum pruefen von muenzen | |
EP1589493B1 (de) | Verfahren zum Prüfen von Münzen | |
DE10140225C2 (de) | Verfahren und Vorrichtung zur Messung des Durchmessers von Münzen | |
DE4339543C2 (de) | Verfahren zur Prüfung von Münzen | |
DE19548233C2 (de) | Elektronischer Münzprüfer | |
DE69930750T2 (de) | Oszillatoren | |
DE3436117C2 (de) | ||
DE4035289C2 (de) | Vorrichtung zum Prüfen von Münzen | |
EP0543200B1 (de) | Münzprüfer | |
DE1574253C (de) | Anordnung zur Prüfung der Ab messungen von Münzen | |
EP0818758A2 (de) | Einrichtung zur Prüfung der Echtheit von Münzen,Jetons oder anderen flachen metallischen Gegenständen | |
DE102007061967A1 (de) | Inkrementalweggeber und Verfahren zum Bestimmen einer Verschiebung eines ersten Objekts relativ zu einem zweiten Objekt | |
DE3522229A1 (de) | Elektronischer muenzpruefer | |
EP1233380A2 (de) | Verfahren zur Erfassung der Betätigung eines Münzrückgabemechanismus in Münzprüfern |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
AK | Designated contracting states |
Kind code of ref document: A2 Designated state(s): CH DE ES FR GB IT LI |
|
AX | Request for extension of the european patent |
Free format text: AL;LT;LV;MK;RO;SI |
|
PUAL | Search report despatched |
Free format text: ORIGINAL CODE: 0009013 |
|
AK | Designated contracting states |
Kind code of ref document: A3 Designated state(s): AT BE CH DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE |
|
AX | Request for extension of the european patent |
Free format text: AL;LT;LV;MK;RO;SI |
|
17P | Request for examination filed |
Effective date: 19990925 |
|
AKX | Designation fees paid |
Free format text: CH DE ES FR GB IT LI |
|
17Q | First examination report despatched |
Effective date: 20010302 |
|
GRAH | Despatch of communication of intention to grant a patent |
Free format text: ORIGINAL CODE: EPIDOS IGRA |
|
GRAH | Despatch of communication of intention to grant a patent |
Free format text: ORIGINAL CODE: EPIDOS IGRA |
|
GRAA | (expected) grant |
Free format text: ORIGINAL CODE: 0009210 |
|
RIC1 | Information provided on ipc code assigned before grant |
Ipc: 7G 07D 5/00 B Ipc: 7G 07D 5/08 A |
|
AK | Designated contracting states |
Designated state(s): CH DE ES FR GB IT LI |
|
REG | Reference to a national code |
Ref country code: GB Ref legal event code: FG4D Free format text: NOT ENGLISH |
|
REG | Reference to a national code |
Ref country code: CH Ref legal event code: EP |
|
GBT | Gb: translation of ep patent filed (gb section 77(6)(a)/1977) | ||
REF | Corresponds to: |
Ref document number: 59808501 Country of ref document: DE Date of ref document: 20030703 Kind code of ref document: P |
|
REG | Reference to a national code |
Ref country code: ES Ref legal event code: FG2A Ref document number: 2196398 Country of ref document: ES Kind code of ref document: T3 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: LI Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20040131 Ref country code: CH Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20040131 |
|
ET | Fr: translation filed | ||
PLBE | No opposition filed within time limit |
Free format text: ORIGINAL CODE: 0009261 |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: NO OPPOSITION FILED WITHIN TIME LIMIT |
|
26N | No opposition filed |
Effective date: 20040302 |
|
REG | Reference to a national code |
Ref country code: CH Ref legal event code: PL |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: FR Payment date: 20061129 Year of fee payment: 10 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: IT Payment date: 20080111 Year of fee payment: 11 |
|
REG | Reference to a national code |
Ref country code: FR Ref legal event code: ST Effective date: 20081029 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: FR Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20080131 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: IT Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20090103 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: GB Payment date: 20110121 Year of fee payment: 14 |
|
GBPC | Gb: european patent ceased through non-payment of renewal fee |
Effective date: 20120103 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: GB Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20120103 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: DE Payment date: 20140314 Year of fee payment: 17 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: ES Payment date: 20140122 Year of fee payment: 17 |
|
REG | Reference to a national code |
Ref country code: DE Ref legal event code: R119 Ref document number: 59808501 Country of ref document: DE |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: DE Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20150801 |
|
REG | Reference to a national code |
Ref country code: ES Ref legal event code: FD2A Effective date: 20160226 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: ES Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20150104 |