EP0886247B1 - Verfahren und Schaltungsanordnung zur Prüfung von Münzen - Google Patents
Verfahren und Schaltungsanordnung zur Prüfung von Münzen Download PDFInfo
- Publication number
- EP0886247B1 EP0886247B1 EP98100090A EP98100090A EP0886247B1 EP 0886247 B1 EP0886247 B1 EP 0886247B1 EP 98100090 A EP98100090 A EP 98100090A EP 98100090 A EP98100090 A EP 98100090A EP 0886247 B1 EP0886247 B1 EP 0886247B1
- Authority
- EP
- European Patent Office
- Prior art keywords
- signal
- coin
- secondary coil
- switching steps
- envelopes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Classifications
-
- G—PHYSICS
- G07—CHECKING-DEVICES
- G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
- G07D5/00—Testing specially adapted to determine the identity or genuineness of coins, e.g. for segregating coins which are unacceptable or alien to a currency
- G07D5/08—Testing the magnetic or electric properties
-
- G—PHYSICS
- G07—CHECKING-DEVICES
- G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
- G07D5/00—Testing specially adapted to determine the identity or genuineness of coins, e.g. for segregating coins which are unacceptable or alien to a currency
- G07D5/02—Testing the dimensions, e.g. thickness, diameter; Testing the deformation
Definitions
- the invention relates to a method for testing of coins according to the preamble of claim 1.
- a typical inductive sensor consists of a primary coil and a secondary coil, by their Magnetic field the coins pass through.
- the coin finds an attenuation of the primary signal instead of.
- the damping also depends on the chosen one Frequency of the primary signal.
- a so-called skin effect takes place, and the attenuation caused by such a signal leaves a statement about the surface condition of a Coin too.
- the field penetrates further at low frequencies into the coin so that a statement can be made can about the type of material inside the coin, however also about their thickness.
- a plurality of coils or Probe arrangements require a corresponding one Space in the coin validator, which is often not available.
- the primary coil is also known from EP 0 336 018 to feed a probe arrangement with a transmission signal, that contains even or odd harmonics.
- the secondary coil arrangement consists of a plurality of secondary coils to which frequency filters are assigned are. As a result, output signals appearing simultaneously received different frequency. So that's it possible to make a more precise statement about the nature of the to receive coins to be checked. However, the disadvantage is that a plurality of secondary coils are required which in turn require space and also one cause corresponding effort. Finally results by splitting the transmission signal into the different ones Frequency components a deterioration of the measurement result in terms of its level.
- the invention has for its object a method to test coins to indicate the satisfactory measurement results has the consequence without the mechanical and Space requirements are important.
- the frequency of the transmission signal is used to carry out the method to be chosen so that in the time it takes a coin to run between the primary and secondary coils, generates a large number of periods as a transmission signal becomes.
- the evaluable time is 60 ms or more. Therefore can also be used for this relatively short period of time Frequency of the primary signal a variety of measured values determine per time step.
- the envelopes obtained in this way are characteristic for the nature of a coin and can be in be evaluated accordingly. For example the ratio of the amplitudes of the envelopes characteristic measure. Furthermore, surface integrals of the envelopes are formed, which then with corresponding Setpoints are compared. Furthermore, the Quotients can be determined from two or more envelopes. This type of evaluation is possible because all measuring or Envelopes occur at the same time.
- a good one is also used Preserve independence from the smooth running of the coin.
- a coin during the Pass on the track through the coil assembly does not roll absolutely vibration-free, but in vibrations is offset, which adversely affects the measurement signal can impact.
- harmful effects of such phenomena are largely switched off.
- the number and / or the position of the switching steps can be changed are, and that according to the respective continuous Coin, whereby the first pass phase serves to make a rough determination (e.g. ferromagnetic - not magnetic), if necessary after a corresponding change in to carry out a fine determination in the second phase.
- alternative can upstream measuring systems with their signal specify with which type of switching steps a measurement should be done. In both cases the changeover takes place or Change takes place without delay because neither the transmit signal still the received signal is changed.
- Diameter of the probe can be chosen to be relatively small, which is particularly favorable for the testing of bicolor coins is.
- the measurement statement is not dependent on the invention on the size of the inductor.
- a circuit arrangement for performing the invention Procedural provides for a clock that one Controls curve generator.
- the curve generator creates that Primary or transmit signal given to the primary coil becomes.
- a frequency divider is used to subdivide the Clock signal in a number of switching steps.
- the frequency divider is therefore with a signal processing unit connected, which is the output signal of the secondary coil repeatedly assigned to the switching steps Envelope formation as described above. The way in which the envelopes are evaluated is ultimately depends on which method is the best Results.
- the signal processing unit can be, for example Sample & hold circuit be from a multiplexer is controlled, which acts as a switch for the purpose of assignment of the measured values of the secondary or measurement signal to the individual switching steps.
- a so-called Processor used in the described Digital signal processing. It controls both the primary and secondary coils, i.e. generates the input signal from the desired one Waveform and processes the received signal from the secondary coil.
- the Square wave voltage is generated in the waveform generator 18 which is controlled by a clock 20.
- the clock 20 determines the frequency and the encoder 18 the shape of the voltage signal given to the primary coil 12 becomes.
- a frequency divider stage 22 divides the clock signal into a series of steps, for example eight, as shown in Fig. 1 shown.
- the frequency divider stage 22 is one Multiplexer 24 connected.
- the multiplexer 24 therefore switches the output or secondary or measurement signal in time the timer steps t1 to t8 through to a sample & Hold circuit 26.
- This is with an analog-to-digital converter 28 connected.
- the measured values each are assigned to a time switch step, to a curve shaped, which in turn is converted into digital using the A / D converter Signals can be converted.
- Figures 3 and 4 two examples of such curve shapes are shown.
- Fig. 3 shows the envelopes for a 2 DM coin, which is known to consist of 75% copper and 25% nickel, the core is made of nickel.
- the timing steps 1 eight envelopes are generated, that occur at the same time and differ from each other Mark history.
- the envelopes show that there is a different damping depending on which section of a period or half a period of the transmission signal is considered.
- the envelopes enable a variety of evaluation options, like evaluation of the absolute amplitudes, Comparison of individual amplitudes of the envelopes with each other, surface integrals of the individual envelopes or combination of individual surface integrals, quotients from two or more measurement curves and the like.
- the the respective underlying criteria are accompanied by corresponding reference values stored in the coin validator are compared to form an acceptance or return signal in known way.
- Fig. 4 shows a number of measurement or envelope curves for one so-called bicolor coin, the core of which is made of a different material exists as the ring arranged around the core.
- an evaluation can be carried out like that was indicated above.
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Coins (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Description
- Fig. 1
- zeigt ein Diagramm für ein Meßsignal, das von einer Rechteckspannung erzeugt wird.
- Fig. 2
- zeigt ein Blockschaltbild einer Schaltungsanordnung zur Durchführung des erfindungsgemäßen Verfahrens.
- Fig. 3
- zeigt eine Anzahl von Meßkurven, die mit Hilfe des erfindungsgemäßen Verfahrens für eine 2-DM-Münze erzeugt worden sind.
- Fig. 4
- zeigt eine Anzahl von Meßkurven, die mit einer Bicolormünze erzeugt worden sind.
Claims (7)
- Verfahren zur Prüfung von Münzen mit einer induktiv arbeitenden Sensoranordnung, die eine Primärspule (12) und eine Sekundärspule (14) aufweist, deren Feld von einer Münze (16) durchquert wird, bei dem die Primärspule mit einem periodischen Sendesignal (10) gespeist wird, das vorzugsweise Harmonische enthält und bei dem eine Auswertevorrichtung die Signale der Sekundärspule auswertet zwecks Erzeugung eines Annahme- oder Rückgabesignals, gekennzeichnet durch folgende Verfahrensschritte:Einen periodisch wiederkehrenden Abschnitt des Sendesignals wird in eine Anzahl von Schaltschritten zugeordnetAus den Werten des Empfangssignals der einzigen Sekundärspule werden bei den jeweiligen sich mit der Frequenz des Sendesignals wiederholenden Schaltschritten Hüllkurven gebildet undDie Auswertevorrichtung bildet aus der Anzahl der zeitgleich erzeugten Hüllkurven mindestens ein Kriterium zwecks Erzeugung des Annahme- oder Rückgabesignals.
- Verfahren nach Anspruch 1, dadurch gekennzeichnet, daß die Zahl und/oder die Lage der Schaltschritte veränderbar ist.
- Verfahren nach Anspruch 1 oder 2, dadurch gekennzeichnet, daß eine ganze oder eine halbe Periode des Sendesignals oder ein Abschnitt davon jeweils in einer Anzahl von zeitlich gleich beabstandeten Schaltschritten unterteilt wird.
- Verfahren nach Anspruch 2 oder 3, dadurch gekennzeichnet, daß die Änderung während des Durchlaufs der Münze erfolgt und abhängig ist von dem durch die Auswertevorrichtung gebildeten Kriterium in der ersten Durchlaufphase der Münze, vorzugsweise bis zur Hälfte des Durchlaufs.
- Schaltungsanordnung zur Durchführung des Verfahrens nach einem der Ansprüche 1 bis 4, mit einem von einem Taktgeber (20) angesteuerten Kurvengenerator (18), der mit einer Primärspule (12) verbunden ist, einer Frequenzteilerstufe (22), die einen Abschnitt der Periode des Taktgebersignals in eine Anzahl von Schaltschritten (t1 bis tn) unterteilt, einer mit einer einzigen Sekundärspule (14) verbundenen Signalverareitungseinheit (26), die Werte des Ausgangssignals der Sekundärspule (14) den Schaltschritten wiederkehrend zuordnet und daraus pro wiederkehrendem Schaltschritt (t1 is tn) eine Hüllkurve bildet und eine Auswerteeinheit die Werte der Hüllkurve mit Referenzwerten vergleicht zur Erzeugung eines Annahme- oder Rückgabesignals.
- Schaltungsanordnung nach Anspruch 5, dadurch gekennzeichnet, daß die Signalverarbeitungseinheit von einem von der Frequenzteilerstufe (22) gesteuerten Multiplexer (24) aufweist, an den eine Sample & Hold-Schaltung (26) angeschlossen ist.
- Schaltungsanordnung zur Durchführung des Verfahrens nach einem der Ansprüche 1 bis 4, dadurch gekennzeichnet, daß mit der Primärspule und der Sekundärspule ein Mikroprozessor verbunden ist zur Bildung des Sendesignals mit vorgegebener Kurvenform und des gewünschten Zeitrasters für die Schaltschritte sowie zur Digitalisierung der Hüllkurven.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19726449A DE19726449C2 (de) | 1997-06-21 | 1997-06-21 | Verfahren und Schaltungsanordnung zur Prüfung von Münzen |
DE19726449 | 1997-06-21 |
Publications (3)
Publication Number | Publication Date |
---|---|
EP0886247A2 EP0886247A2 (de) | 1998-12-23 |
EP0886247A3 EP0886247A3 (de) | 1999-12-01 |
EP0886247B1 true EP0886247B1 (de) | 2003-05-28 |
Family
ID=7833282
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP98100090A Expired - Lifetime EP0886247B1 (de) | 1997-06-21 | 1998-01-07 | Verfahren und Schaltungsanordnung zur Prüfung von Münzen |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP0886247B1 (de) |
DE (2) | DE19726449C2 (de) |
ES (1) | ES2196399T3 (de) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102007046390B3 (de) * | 2007-09-20 | 2008-11-27 | National Rejectors, Inc. Gmbh | Verfahren zum Prüfen von Münzen |
EP3287991A1 (de) | 2017-07-11 | 2018-02-28 | Azkoyen, S.A. | Münzsensor |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19836490C2 (de) * | 1998-08-12 | 2002-06-20 | Nat Rejectors Gmbh | Schaltungsanordnung für die Prüfung von Münzen in einem Münzgerät |
EP1104920B1 (de) * | 1999-12-02 | 2006-05-10 | Glory Kogyo Kabushiki Kaisha | Verfahren und Vorrichtung zur Münzidentifizierung |
US6729461B2 (en) * | 2000-09-05 | 2004-05-04 | De La Rue Cash Systems, Inc. | Methods and apparatus for detection of coin denomination and other parameters |
DE10106704A1 (de) * | 2001-02-14 | 2002-08-29 | Nat Rejectors Gmbh | Verfahren zur Erfassung der Betätigung eines Münzrückgabemechanismus in Münzprüfern |
DE10140225C2 (de) | 2001-08-16 | 2003-08-07 | Nat Rejectors Gmbh | Verfahren und Vorrichtung zur Messung des Durchmessers von Münzen |
DE20216785U1 (de) * | 2002-10-31 | 2003-01-09 | National Rejectors, Inc. Gmbh, 21614 Buxtehude | Spulenanordnung für Münzprüfer |
DE102004013286B4 (de) * | 2004-03-18 | 2006-04-13 | National Rejectors, Inc. Gmbh | Vorrichtung zum Prüfen von Münzen |
DE102004020159A1 (de) * | 2004-04-24 | 2005-11-17 | National Rejectors, Inc. Gmbh | Verfahren zum Prüfen von Münzen |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0147099B1 (de) * | 1983-12-06 | 1992-06-17 | Mars Incorporated | Marken und Vorrichtung zur Markenverarbeitung |
JP2567654B2 (ja) * | 1988-03-31 | 1996-12-25 | 株式会社 日本コンラックス | 硬貨選別方法および装置 |
GB2266400B (en) * | 1991-09-28 | 1995-11-22 | Anritsu Corp | Coin discriminating apparatus |
DE4339543C2 (de) * | 1993-11-19 | 1998-07-23 | Nat Rejectors Gmbh | Verfahren zur Prüfung von Münzen |
-
1997
- 1997-06-21 DE DE19726449A patent/DE19726449C2/de not_active Expired - Fee Related
-
1998
- 1998-01-07 DE DE59808510T patent/DE59808510D1/de not_active Expired - Lifetime
- 1998-01-07 EP EP98100090A patent/EP0886247B1/de not_active Expired - Lifetime
- 1998-01-07 ES ES98100090T patent/ES2196399T3/es not_active Expired - Lifetime
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102007046390B3 (de) * | 2007-09-20 | 2008-11-27 | National Rejectors, Inc. Gmbh | Verfahren zum Prüfen von Münzen |
US7708130B2 (en) | 2007-09-20 | 2010-05-04 | National Rejectors, Inc. Gmbh | Method for testing coins |
EP3287991A1 (de) | 2017-07-11 | 2018-02-28 | Azkoyen, S.A. | Münzsensor |
US10262487B2 (en) | 2017-07-11 | 2019-04-16 | Azkoyen, S.A. | Coin sensor |
Also Published As
Publication number | Publication date |
---|---|
ES2196399T3 (es) | 2003-12-16 |
DE19726449A1 (de) | 1999-01-07 |
DE59808510D1 (de) | 2003-07-03 |
EP0886247A3 (de) | 1999-12-01 |
DE19726449C2 (de) | 1999-04-15 |
EP0886247A2 (de) | 1998-12-23 |
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