EP0886247B1 - Méthode et circuit pour l'examen de pièces de monnaie - Google Patents
Méthode et circuit pour l'examen de pièces de monnaie Download PDFInfo
- Publication number
- EP0886247B1 EP0886247B1 EP98100090A EP98100090A EP0886247B1 EP 0886247 B1 EP0886247 B1 EP 0886247B1 EP 98100090 A EP98100090 A EP 98100090A EP 98100090 A EP98100090 A EP 98100090A EP 0886247 B1 EP0886247 B1 EP 0886247B1
- Authority
- EP
- European Patent Office
- Prior art keywords
- signal
- coin
- secondary coil
- switching steps
- envelopes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Classifications
-
- G—PHYSICS
- G07—CHECKING-DEVICES
- G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
- G07D5/00—Testing specially adapted to determine the identity or genuineness of coins, e.g. for segregating coins which are unacceptable or alien to a currency
- G07D5/08—Testing the magnetic or electric properties
-
- G—PHYSICS
- G07—CHECKING-DEVICES
- G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
- G07D5/00—Testing specially adapted to determine the identity or genuineness of coins, e.g. for segregating coins which are unacceptable or alien to a currency
- G07D5/02—Testing the dimensions, e.g. thickness, diameter; Testing the deformation
Definitions
- the invention relates to a method for testing of coins according to the preamble of claim 1.
- a typical inductive sensor consists of a primary coil and a secondary coil, by their Magnetic field the coins pass through.
- the coin finds an attenuation of the primary signal instead of.
- the damping also depends on the chosen one Frequency of the primary signal.
- a so-called skin effect takes place, and the attenuation caused by such a signal leaves a statement about the surface condition of a Coin too.
- the field penetrates further at low frequencies into the coin so that a statement can be made can about the type of material inside the coin, however also about their thickness.
- a plurality of coils or Probe arrangements require a corresponding one Space in the coin validator, which is often not available.
- the primary coil is also known from EP 0 336 018 to feed a probe arrangement with a transmission signal, that contains even or odd harmonics.
- the secondary coil arrangement consists of a plurality of secondary coils to which frequency filters are assigned are. As a result, output signals appearing simultaneously received different frequency. So that's it possible to make a more precise statement about the nature of the to receive coins to be checked. However, the disadvantage is that a plurality of secondary coils are required which in turn require space and also one cause corresponding effort. Finally results by splitting the transmission signal into the different ones Frequency components a deterioration of the measurement result in terms of its level.
- the invention has for its object a method to test coins to indicate the satisfactory measurement results has the consequence without the mechanical and Space requirements are important.
- the frequency of the transmission signal is used to carry out the method to be chosen so that in the time it takes a coin to run between the primary and secondary coils, generates a large number of periods as a transmission signal becomes.
- the evaluable time is 60 ms or more. Therefore can also be used for this relatively short period of time Frequency of the primary signal a variety of measured values determine per time step.
- the envelopes obtained in this way are characteristic for the nature of a coin and can be in be evaluated accordingly. For example the ratio of the amplitudes of the envelopes characteristic measure. Furthermore, surface integrals of the envelopes are formed, which then with corresponding Setpoints are compared. Furthermore, the Quotients can be determined from two or more envelopes. This type of evaluation is possible because all measuring or Envelopes occur at the same time.
- a good one is also used Preserve independence from the smooth running of the coin.
- a coin during the Pass on the track through the coil assembly does not roll absolutely vibration-free, but in vibrations is offset, which adversely affects the measurement signal can impact.
- harmful effects of such phenomena are largely switched off.
- the number and / or the position of the switching steps can be changed are, and that according to the respective continuous Coin, whereby the first pass phase serves to make a rough determination (e.g. ferromagnetic - not magnetic), if necessary after a corresponding change in to carry out a fine determination in the second phase.
- alternative can upstream measuring systems with their signal specify with which type of switching steps a measurement should be done. In both cases the changeover takes place or Change takes place without delay because neither the transmit signal still the received signal is changed.
- Diameter of the probe can be chosen to be relatively small, which is particularly favorable for the testing of bicolor coins is.
- the measurement statement is not dependent on the invention on the size of the inductor.
- a circuit arrangement for performing the invention Procedural provides for a clock that one Controls curve generator.
- the curve generator creates that Primary or transmit signal given to the primary coil becomes.
- a frequency divider is used to subdivide the Clock signal in a number of switching steps.
- the frequency divider is therefore with a signal processing unit connected, which is the output signal of the secondary coil repeatedly assigned to the switching steps Envelope formation as described above. The way in which the envelopes are evaluated is ultimately depends on which method is the best Results.
- the signal processing unit can be, for example Sample & hold circuit be from a multiplexer is controlled, which acts as a switch for the purpose of assignment of the measured values of the secondary or measurement signal to the individual switching steps.
- a so-called Processor used in the described Digital signal processing. It controls both the primary and secondary coils, i.e. generates the input signal from the desired one Waveform and processes the received signal from the secondary coil.
- the Square wave voltage is generated in the waveform generator 18 which is controlled by a clock 20.
- the clock 20 determines the frequency and the encoder 18 the shape of the voltage signal given to the primary coil 12 becomes.
- a frequency divider stage 22 divides the clock signal into a series of steps, for example eight, as shown in Fig. 1 shown.
- the frequency divider stage 22 is one Multiplexer 24 connected.
- the multiplexer 24 therefore switches the output or secondary or measurement signal in time the timer steps t1 to t8 through to a sample & Hold circuit 26.
- This is with an analog-to-digital converter 28 connected.
- the measured values each are assigned to a time switch step, to a curve shaped, which in turn is converted into digital using the A / D converter Signals can be converted.
- Figures 3 and 4 two examples of such curve shapes are shown.
- Fig. 3 shows the envelopes for a 2 DM coin, which is known to consist of 75% copper and 25% nickel, the core is made of nickel.
- the timing steps 1 eight envelopes are generated, that occur at the same time and differ from each other Mark history.
- the envelopes show that there is a different damping depending on which section of a period or half a period of the transmission signal is considered.
- the envelopes enable a variety of evaluation options, like evaluation of the absolute amplitudes, Comparison of individual amplitudes of the envelopes with each other, surface integrals of the individual envelopes or combination of individual surface integrals, quotients from two or more measurement curves and the like.
- the the respective underlying criteria are accompanied by corresponding reference values stored in the coin validator are compared to form an acceptance or return signal in known way.
- Fig. 4 shows a number of measurement or envelope curves for one so-called bicolor coin, the core of which is made of a different material exists as the ring arranged around the core.
- an evaluation can be carried out like that was indicated above.
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Coins (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Claims (7)
- Procédé de contrôle de pièces de monnaie, comprenant un agencement de capteurs fonctionnant par induction, qui comporte une bobine primaire (12) et une bobine secondaire (14), dont le champ est traversé par une pièce de monnaie (16), dans lequel la bobine primaire est alimentée par un signal d'émission (10) périodique, qui contient de préférence des harmoniques et dans lequel un dispositif d'analyse évalue les signaux de la bobine secondaire en vue de générer un signal d'acceptation ou de renvoi, caractérisé par les étapes suivantes :un nombre de pas de commutation est associé à une partie périodiquement récurrente du signal d'émission,des enveloppantes sont formées à partir des valeurs du signal de réception de la seule bobine secondaire, à chaque pas de commutation se répétant avec la fréquence du signal d'émission,le dispositif d'analyse forme, à partir du nombre d'enveloppantes générés au même moment, un critère en vue de générer le signal d'acceptation ou de renvoi.
- Procédé selon la revendication 1, caractérisé en ce que le nombre et/ou la position des pas de commutation peuvent être variés.
- Procédé selon la revendication 1 ou 2, caractérisé en ce qu'une période entière ou une demi-période du signal d'émission ou une partie de celui-ci est respectivement subdivisé en un nombre de pas de commutation à même distance dans le temps.
- Procédé selon la revendication 2 ou 3, caractérisé en ce que la variation est effectuée pendant le passage de la pièce de monnaie et dépend du critère généré par le dispositif d'analyse dans la première phase de passage de la pièce de monnaie, de préférence jusqu'à la moitié du passage.
- Agencement de circuit destiné à la mise en oeuvre du procédé selon une des revendications 1 à 4, comprenant un générateur de courbes (18), qui est commandé par un générateur de rythme (20) et est relié à une bobine primaire (12), un niveau de diviseur de fréquence (22), qui subdivise une partie de la période du signal du générateur de rythme en un nombre de pas de commutation (t1 à tn), une unité de traitement du signal (26) reliée à une seule bobine secondaire (14), qui associe de manière récurrente des valeurs du signal de sortie de la bobine secondaire (14) aux pas de commutation et génère à partir de là une enveloppante pour chaque pas de commutation récurrente (t1 à tn), et une unité d'analyse qui compare les valeurs de l'enveloppante avec des valeurs de référence en vue de générer un signal d'acceptation ou de renvoi.
- Agencement de circuit selon la revendication 5, caractérisé en ce que l'unité de traitement du signal comporte un multiplexeur (24), qui est commandé par le niveau de diviseur de fréquence (22) et auquel est raccordé un circuit d'échantillonnage et blocage (26).
- Agencement de circuit destiné à la mise en oeuvre du procédé selon une des revendications 1 à 4, caractérisé en ce qu'un microprocesseur est relié à la bobine primaire et à la bobine secondaire pour générer le signal d'émission avec une forme de courbe prédéfinie et la grille de temps souhaitée pour les pas de commutation, ainsi que pour numériser les enveloppantes.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19726449A DE19726449C2 (de) | 1997-06-21 | 1997-06-21 | Verfahren und Schaltungsanordnung zur Prüfung von Münzen |
DE19726449 | 1997-06-21 |
Publications (3)
Publication Number | Publication Date |
---|---|
EP0886247A2 EP0886247A2 (fr) | 1998-12-23 |
EP0886247A3 EP0886247A3 (fr) | 1999-12-01 |
EP0886247B1 true EP0886247B1 (fr) | 2003-05-28 |
Family
ID=7833282
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP98100090A Expired - Lifetime EP0886247B1 (fr) | 1997-06-21 | 1998-01-07 | Méthode et circuit pour l'examen de pièces de monnaie |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP0886247B1 (fr) |
DE (2) | DE19726449C2 (fr) |
ES (1) | ES2196399T3 (fr) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102007046390B3 (de) * | 2007-09-20 | 2008-11-27 | National Rejectors, Inc. Gmbh | Verfahren zum Prüfen von Münzen |
EP3287991A1 (fr) | 2017-07-11 | 2018-02-28 | Azkoyen, S.A. | Détecteur de pièces de monnaie |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19836490C2 (de) | 1998-08-12 | 2002-06-20 | Nat Rejectors Gmbh | Schaltungsanordnung für die Prüfung von Münzen in einem Münzgerät |
DE69931267T2 (de) * | 1999-12-02 | 2007-03-08 | Glory Kogyo K.K., Himeji | Verfahren und Vorrichtung zur Münzidentifizierung |
US6729461B2 (en) * | 2000-09-05 | 2004-05-04 | De La Rue Cash Systems, Inc. | Methods and apparatus for detection of coin denomination and other parameters |
DE10106704A1 (de) * | 2001-02-14 | 2002-08-29 | Nat Rejectors Gmbh | Verfahren zur Erfassung der Betätigung eines Münzrückgabemechanismus in Münzprüfern |
DE10140225C2 (de) | 2001-08-16 | 2003-08-07 | Nat Rejectors Gmbh | Verfahren und Vorrichtung zur Messung des Durchmessers von Münzen |
DE20216785U1 (de) * | 2002-10-31 | 2003-01-09 | Nat Rejectors Gmbh | Spulenanordnung für Münzprüfer |
DE102004013286B4 (de) * | 2004-03-18 | 2006-04-13 | National Rejectors, Inc. Gmbh | Vorrichtung zum Prüfen von Münzen |
DE102004020159A1 (de) * | 2004-04-24 | 2005-11-17 | National Rejectors, Inc. Gmbh | Verfahren zum Prüfen von Münzen |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CA1240056A (fr) * | 1983-12-06 | 1988-08-02 | Adrian Lewis | Jetons, et dispositifs de reception-tri de jetons |
JP2567654B2 (ja) * | 1988-03-31 | 1996-12-25 | 株式会社 日本コンラックス | 硬貨選別方法および装置 |
WO1993007589A1 (fr) * | 1991-09-28 | 1993-04-15 | Anritsu Corporation | Dispositif pour le triage des pieces de monnaie |
DE4339543C2 (de) * | 1993-11-19 | 1998-07-23 | Nat Rejectors Gmbh | Verfahren zur Prüfung von Münzen |
-
1997
- 1997-06-21 DE DE19726449A patent/DE19726449C2/de not_active Expired - Fee Related
-
1998
- 1998-01-07 DE DE59808510T patent/DE59808510D1/de not_active Expired - Lifetime
- 1998-01-07 ES ES98100090T patent/ES2196399T3/es not_active Expired - Lifetime
- 1998-01-07 EP EP98100090A patent/EP0886247B1/fr not_active Expired - Lifetime
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102007046390B3 (de) * | 2007-09-20 | 2008-11-27 | National Rejectors, Inc. Gmbh | Verfahren zum Prüfen von Münzen |
US7708130B2 (en) | 2007-09-20 | 2010-05-04 | National Rejectors, Inc. Gmbh | Method for testing coins |
EP3287991A1 (fr) | 2017-07-11 | 2018-02-28 | Azkoyen, S.A. | Détecteur de pièces de monnaie |
US10262487B2 (en) | 2017-07-11 | 2019-04-16 | Azkoyen, S.A. | Coin sensor |
Also Published As
Publication number | Publication date |
---|---|
DE59808510D1 (de) | 2003-07-03 |
ES2196399T3 (es) | 2003-12-16 |
DE19726449A1 (de) | 1999-01-07 |
DE19726449C2 (de) | 1999-04-15 |
EP0886247A3 (fr) | 1999-12-01 |
EP0886247A2 (fr) | 1998-12-23 |
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