EP0886247A2 - Méthode et circuit pour l'examèn de pièces de monnaie - Google Patents
Méthode et circuit pour l'examèn de pièces de monnaie Download PDFInfo
- Publication number
- EP0886247A2 EP0886247A2 EP98100090A EP98100090A EP0886247A2 EP 0886247 A2 EP0886247 A2 EP 0886247A2 EP 98100090 A EP98100090 A EP 98100090A EP 98100090 A EP98100090 A EP 98100090A EP 0886247 A2 EP0886247 A2 EP 0886247A2
- Authority
- EP
- European Patent Office
- Prior art keywords
- signal
- secondary coil
- coin
- switching steps
- coil
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Classifications
-
- G—PHYSICS
- G07—CHECKING-DEVICES
- G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
- G07D5/00—Testing specially adapted to determine the identity or genuineness of coins, e.g. for segregating coins which are unacceptable or alien to a currency
- G07D5/08—Testing the magnetic or electric properties
-
- G—PHYSICS
- G07—CHECKING-DEVICES
- G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
- G07D5/00—Testing specially adapted to determine the identity or genuineness of coins, e.g. for segregating coins which are unacceptable or alien to a currency
- G07D5/02—Testing the dimensions, e.g. thickness, diameter; Testing the deformation
Definitions
- the invention relates to a method for testing of coins according to the preamble of claim 1.
- a typical inductive sensor consists of a primary coil and a secondary coil, by their Magnetic field the coins pass through.
- the coin finds an attenuation of the primary signal instead of.
- the damping also depends on the selected one Frequency of the primary signal.
- a so-called skin effect takes place, and the attenuation caused by such a signal leaves a statement about the surface condition of a Coin too.
- the field penetrates further at low frequencies into the coin so that a statement can be made can about the type of material inside the coin, however also about their thickness.
- a plurality of coils or Probe arrangements require a corresponding one Space in the coin validator, which is often not available.
- the primary coil is also known from EP 0 336 018 to feed a probe arrangement with a transmission signal, that contains even or odd harmonics.
- the secondary coil arrangement consists of a plurality of secondary coils to which frequency filters are assigned are. As a result, output signals appearing simultaneously received different frequency. So that's it possible to make a more precise statement about the nature of the to receive coins to be checked. However, the disadvantage is that a plurality of secondary coils are required which in turn need space and also one cause corresponding effort. Finally results by splitting the transmission signal into the different ones Frequency components a deterioration of the measurement result in terms of its level.
- the invention has for its object a method to test coins to indicate the satisfactory measurement results has the consequence without the mechanical and Space requirements are important.
- the procedure is the frequency of the transmission signal to be chosen so that in the time a coin takes to pass between the primary and secondary coils, generates a large number of periods as a transmission signal becomes.
- the evaluable time is 60 ms or more. Therefore can also be used for this relatively short period of time Frequency of the primary signal a variety of measured values determine per time step.
- the envelopes obtained in this way are characteristic for the nature of a coin and can be in be evaluated accordingly. For example the ratio of the amplitudes of the envelopes characteristic measure. Surface integrals of the envelopes are formed, which then with corresponding Setpoints are compared. Furthermore, the Quotients can be determined from two or more envelopes. This type of evaluation is possible because all measuring or Envelopes occur absolutely simultaneously.
- the number and / or the position of the switching steps can be changed are, and that according to the respective continuous Coin, whereby the first pass phase serves to make a rough determination (e.g. ferromagnetic - not magnetic), in order, if necessary, after a corresponding change in to carry out a fine determination in the second phase.
- a rough determination e.g. ferromagnetic - not magnetic
- upstream measuring systems with their signal specify the type of switching steps with which a measurement is carried out should be done. In both cases the changeover takes place or Change takes place without delay because neither the transmit signal still the received signal is changed.
- Diameter of the probe can be chosen to be relatively small, which is particularly favorable for the testing of bicolor coins is.
- the measurement statement is not dependent on the invention on the size of the inductance.
- a circuit arrangement for performing the invention Procedural provides for a clock that one Controls curve generator.
- the curve generator creates that Primary or transmit signal given to the primary coil becomes.
- a frequency divider is used to subdivide the Clock signal in a number of switching steps.
- the frequency divider is therefore with a signal processing unit connected which is the output signal of the secondary coil repeatedly assigned to the switching steps Envelope formation as described above. The way in which the envelopes are evaluated is ultimately depends on which method is the best Results.
- the signal processing unit can, for example, be a Sample & hold circuit be from a multiplexer is controlled, which acts as a switch for the purpose of assignment of the measured values of the secondary or measurement signal to the individual switching steps.
- a so-called Processor used in the described Digital signal processing controls both the primary and secondary coils, i.e. generates the input signal of the desired Waveform and processes the received signal from the secondary coil.
- the invention there is a maximum number of disturbing parameters switched off, which otherwise encountered with increased effort had to become. It does not need a resonant circuit that naturally at least one capacitor in addition to the coil and contains a resistor. Affect these components as is known, the measured values. They also increase the settling time for the sensor system.
- the invention needs only one coil and an independently programmable signal generator, which is already part of an inserted Microprocessor.
- the primary coil denoted by 12 and the secondary coil by 14. Between the coils 12, 14, a coin 16 is indicated.
- the Square wave voltage is generated in the waveform generator 18, which is controlled by a clock 20.
- the clock 20 determines the frequency and the encoder 18 the shape of the voltage signal given to the primary coil 12 becomes.
- a frequency divider stage 22 divides the clock signal into a series of steps, for example eight, as shown in Fig. 1 shown.
- the frequency divider stage 22 is one Multiplexer 24 connected.
- the multiplexer 24 therefore switches the output or secondary or measurement signal in time the timer steps t1 to t8 through to a sample & Hold circuit 26.
- This is with an analog-to-digital converter connected.
- the measured values each are assigned to a time switch step, to a curve shaped, which in turn is converted into digital using the A / D converter Signals can be converted.
- Figures 3 and 4 two examples of such curve shapes are shown.
- Fig. 3 shows the envelopes for a 2 DM coin, which is known to consist of 75% copper and 25% nickel, the core is made of nickel.
- the timing steps 1 eight envelopes are generated, that occur at the same time and differ from each other Mark history.
- the envelopes show that there is a different damping depending on which section of a period or half a period of the transmission signal is considered.
- the envelopes enable a variety of evaluation options, like evaluation of the absolute amplitudes, Comparison of individual amplitudes of the envelopes with each other, surface integrals of the individual envelopes or combination of individual surface integrals, quotients from two or more measurement curves and the like.
- the the respective underlying criteria are accompanied by corresponding reference values stored in the coin validator are compared to form an acceptance or return signal in known way.
- Fig. 4 shows a number of measurement or envelope curves for one so-called bicolor coin, the core of which is made of a different material exists as the ring arranged around the core.
- an evaluation can be carried out like that was indicated above.
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Coins (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19726449A DE19726449C2 (de) | 1997-06-21 | 1997-06-21 | Verfahren und Schaltungsanordnung zur Prüfung von Münzen |
DE19726449 | 1997-06-21 |
Publications (3)
Publication Number | Publication Date |
---|---|
EP0886247A2 true EP0886247A2 (fr) | 1998-12-23 |
EP0886247A3 EP0886247A3 (fr) | 1999-12-01 |
EP0886247B1 EP0886247B1 (fr) | 2003-05-28 |
Family
ID=7833282
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP98100090A Expired - Lifetime EP0886247B1 (fr) | 1997-06-21 | 1998-01-07 | Méthode et circuit pour l'examen de pièces de monnaie |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP0886247B1 (fr) |
DE (2) | DE19726449C2 (fr) |
ES (1) | ES2196399T3 (fr) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1104920A1 (fr) * | 1999-12-02 | 2001-06-06 | Glory Kogyo Kabushiki Kaisha | Méthode et dispositif pour identifier une pièce de monnaie |
EP1233380A2 (fr) * | 2001-02-14 | 2002-08-21 | National Rejectors, Inc. GmbH | Méthode pour détecter l'activation d'un mécanisme de retour de pièces dans un système d'examen de pièces |
EP1286313A2 (fr) * | 2001-08-16 | 2003-02-26 | National Rejectors, Inc. GmbH | Procédé et appareil pour mesurer des diamètres de pièces de monnaie |
EP1330793B1 (fr) * | 2000-09-05 | 2008-12-10 | Talaris Inc. | Procedes et appareil destine a determiner le type de pieces et a detecter d'autres parametres |
EP2040227A2 (fr) | 2007-09-20 | 2009-03-25 | National Rejectors, Inc. GmbH | Procédé de vérification de pièces de monnaie |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19836490C2 (de) | 1998-08-12 | 2002-06-20 | Nat Rejectors Gmbh | Schaltungsanordnung für die Prüfung von Münzen in einem Münzgerät |
DE20216785U1 (de) * | 2002-10-31 | 2003-01-09 | National Rejectors, Inc. Gmbh, 21614 Buxtehude | Spulenanordnung für Münzprüfer |
DE102004013286B4 (de) * | 2004-03-18 | 2006-04-13 | National Rejectors, Inc. Gmbh | Vorrichtung zum Prüfen von Münzen |
DE102004020159A1 (de) * | 2004-04-24 | 2005-11-17 | National Rejectors, Inc. Gmbh | Verfahren zum Prüfen von Münzen |
EP3287991B1 (fr) | 2017-07-11 | 2019-07-24 | Azkoyen, S.A. | Détecteur de pièces de monnaie |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0336018A2 (fr) | 1988-03-31 | 1989-10-11 | Nippon Conlux Co., Ltd. | Méthode et dispositif de tri de pièces de monnaie |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
ES8607594A1 (es) * | 1983-12-06 | 1986-05-16 | Mars Inc | Un dispositivo de comunicacion con una ficha de almacenamiento de datos |
GB2266400B (en) * | 1991-09-28 | 1995-11-22 | Anritsu Corp | Coin discriminating apparatus |
DE4339543C2 (de) * | 1993-11-19 | 1998-07-23 | Nat Rejectors Gmbh | Verfahren zur Prüfung von Münzen |
-
1997
- 1997-06-21 DE DE19726449A patent/DE19726449C2/de not_active Expired - Fee Related
-
1998
- 1998-01-07 ES ES98100090T patent/ES2196399T3/es not_active Expired - Lifetime
- 1998-01-07 DE DE59808510T patent/DE59808510D1/de not_active Expired - Lifetime
- 1998-01-07 EP EP98100090A patent/EP0886247B1/fr not_active Expired - Lifetime
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0336018A2 (fr) | 1988-03-31 | 1989-10-11 | Nippon Conlux Co., Ltd. | Méthode et dispositif de tri de pièces de monnaie |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1104920A1 (fr) * | 1999-12-02 | 2001-06-06 | Glory Kogyo Kabushiki Kaisha | Méthode et dispositif pour identifier une pièce de monnaie |
EP1330793B1 (fr) * | 2000-09-05 | 2008-12-10 | Talaris Inc. | Procedes et appareil destine a determiner le type de pieces et a detecter d'autres parametres |
EP1233380A2 (fr) * | 2001-02-14 | 2002-08-21 | National Rejectors, Inc. GmbH | Méthode pour détecter l'activation d'un mécanisme de retour de pièces dans un système d'examen de pièces |
EP1233380A3 (fr) * | 2001-02-14 | 2005-09-14 | National Rejectors, Inc. GmbH | Méthode pour détecter l'activation d'un mécanisme de retour de pièces dans un système d'examen de pièces |
EP1286313A2 (fr) * | 2001-08-16 | 2003-02-26 | National Rejectors, Inc. GmbH | Procédé et appareil pour mesurer des diamètres de pièces de monnaie |
EP1286313A3 (fr) * | 2001-08-16 | 2004-05-06 | National Rejectors, Inc. GmbH | Procédé et appareil pour mesurer des diamètres de pièces de monnaie |
EP2040227A2 (fr) | 2007-09-20 | 2009-03-25 | National Rejectors, Inc. GmbH | Procédé de vérification de pièces de monnaie |
EP2040227A3 (fr) * | 2007-09-20 | 2010-01-13 | National Rejectors, Inc. GmbH | Procédé de vérification de pièces de monnaie |
Also Published As
Publication number | Publication date |
---|---|
DE59808510D1 (de) | 2003-07-03 |
EP0886247B1 (fr) | 2003-05-28 |
DE19726449C2 (de) | 1999-04-15 |
EP0886247A3 (fr) | 1999-12-01 |
ES2196399T3 (es) | 2003-12-16 |
DE19726449A1 (de) | 1999-01-07 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP0213283B1 (fr) | Dispositif pour l'examen de pièces de monnaie | |
DE2350989C2 (fr) | ||
EP0228019B2 (fr) | Commutateur de proximité fonctionnant sans contact | |
DE10130572B4 (de) | Induktiver Wegsensor zur Bestimmung der Position eines Beeinflussungselements und Verfahren zur Bestimmung der Position eines Beeinflussungselements mit einem induktiven Wegsensor | |
DE2656111B2 (de) | Wirbelstrompriifgerät | |
EP0886247B1 (fr) | Méthode et circuit pour l'examen de pièces de monnaie | |
DE3727416A1 (de) | Verfahren und vorrichtung zur detektion von metallobjekten | |
EP0693674B1 (fr) | Appareil pour déterminer la position d'un objet linéairement mobil, avec un transformateur de mesure | |
DE3003339C2 (fr) | ||
EP2040227B1 (fr) | Procédé de vérification de pièces de monnaie | |
DE1498531B2 (de) | Vorrichtung zur bestimmung der massenzahl aus der im spalt des trennmagneten eines massenspektrometers herrschenden feldstaerke | |
DE1917855C3 (de) | Vorrichtung zur zerstörungsfreien Werkstoffprüfung nach der Wirbelstrommethode | |
DE69112398T2 (de) | Verfahren und vorrichtung zum prüfen von münzen. | |
DE2916123C2 (de) | Anordnung zur Prüfung von Münzen | |
DE10140225C2 (de) | Verfahren und Vorrichtung zur Messung des Durchmessers von Münzen | |
EP0122487B1 (fr) | Appareil pour contrôler la surface de pièces métalliques | |
DE19522613C1 (de) | Netzwerkanalysator | |
DE2551321A1 (de) | Automatisch programmierbare schaltung zur pruefung von muenzen | |
EP0473949B1 (fr) | Analyseur, notamment analyseur de réseau, pour la représentation et la mesure selon la fréquence de paramètres de mesure variant avec la fréquence | |
DE2257684C2 (de) | Vorrichtung zur Dickenmessung eines Glasbehälters | |
EP0216142A2 (fr) | Dispositif commutateur pour clavier | |
DE2601150C3 (de) | Verfahren und Schaltungsanordnung zur Bildung von Signalen für die Stillstandskontrolle einer elektromagnetischen Präzisions- und Feinwaage | |
EP0207217B1 (fr) | Dispositif pour mesurer des coordonnées | |
DE2108929C3 (de) | Verfahren und Vorrichtung zum Bestimmen eines Koordinatenwertes | |
DE69712187T2 (de) | Münzdurchmessermessung |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
AK | Designated contracting states |
Kind code of ref document: A2 Designated state(s): CH DE ES FR GB IT LI |
|
AX | Request for extension of the european patent |
Free format text: AL;LT;LV;MK;RO;SI |
|
PUAL | Search report despatched |
Free format text: ORIGINAL CODE: 0009013 |
|
AK | Designated contracting states |
Kind code of ref document: A3 Designated state(s): AT BE CH DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE |
|
AX | Request for extension of the european patent |
Free format text: AL;LT;LV;MK;RO;SI |
|
RIC1 | Information provided on ipc code assigned before grant |
Free format text: 6G 07F 3/02 A |
|
17P | Request for examination filed |
Effective date: 19991224 |
|
AKX | Designation fees paid |
Free format text: CH DE ES FR GB IT LI |
|
GRAH | Despatch of communication of intention to grant a patent |
Free format text: ORIGINAL CODE: EPIDOS IGRA |
|
GRAH | Despatch of communication of intention to grant a patent |
Free format text: ORIGINAL CODE: EPIDOS IGRA |
|
GRAA | (expected) grant |
Free format text: ORIGINAL CODE: 0009210 |
|
RIC1 | Information provided on ipc code assigned before grant |
Ipc: 7G 07D 5/08 A |
|
AK | Designated contracting states |
Designated state(s): CH DE ES FR GB IT LI |
|
REG | Reference to a national code |
Ref country code: GB Ref legal event code: FG4D Free format text: NOT ENGLISH |
|
REG | Reference to a national code |
Ref country code: CH Ref legal event code: EP |
|
REG | Reference to a national code |
Ref country code: CH Ref legal event code: NV Representative=s name: INFINEON TECHNOLOGIES SCHWEIZ AG |
|
REF | Corresponds to: |
Ref document number: 59808510 Country of ref document: DE Date of ref document: 20030703 Kind code of ref document: P |
|
GBT | Gb: translation of ep patent filed (gb section 77(6)(a)/1977) |
Effective date: 20031022 |
|
ET | Fr: translation filed | ||
REG | Reference to a national code |
Ref country code: ES Ref legal event code: FG2A Ref document number: 2196399 Country of ref document: ES Kind code of ref document: T3 |
|
PLBE | No opposition filed within time limit |
Free format text: ORIGINAL CODE: 0009261 |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: NO OPPOSITION FILED WITHIN TIME LIMIT |
|
26N | No opposition filed |
Effective date: 20040302 |
|
REG | Reference to a national code |
Ref country code: CH Ref legal event code: PCAR Free format text: ISLER & PEDRAZZINI AG;POSTFACH 1772;8027 ZUERICH (CH) |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: CH Payment date: 20100125 Year of fee payment: 13 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: FR Payment date: 20100209 Year of fee payment: 13 |
|
REG | Reference to a national code |
Ref country code: CH Ref legal event code: PL |
|
REG | Reference to a national code |
Ref country code: FR Ref legal event code: ST Effective date: 20110930 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: CH Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20110131 Ref country code: LI Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20110131 Ref country code: FR Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20110131 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: GB Payment date: 20161228 Year of fee payment: 20 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: DE Payment date: 20170131 Year of fee payment: 20 |
|
REG | Reference to a national code |
Ref country code: GB Ref legal event code: 732E Free format text: REGISTERED BETWEEN 20170511 AND 20170517 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: ES Payment date: 20170119 Year of fee payment: 20 Ref country code: IT Payment date: 20170117 Year of fee payment: 20 |
|
REG | Reference to a national code |
Ref country code: DE Ref legal event code: R071 Ref document number: 59808510 Country of ref document: DE |
|
REG | Reference to a national code |
Ref country code: GB Ref legal event code: PE20 Expiry date: 20180106 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: GB Free format text: LAPSE BECAUSE OF EXPIRATION OF PROTECTION Effective date: 20180106 |
|
REG | Reference to a national code |
Ref country code: ES Ref legal event code: FD2A Effective date: 20180508 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: ES Free format text: LAPSE BECAUSE OF EXPIRATION OF PROTECTION Effective date: 20180108 |