EP0376285A2 - Mikrorechner mit einem elektrisch löschbaren und programmierbaren nichtflüchtigen Speicher - Google Patents

Mikrorechner mit einem elektrisch löschbaren und programmierbaren nichtflüchtigen Speicher Download PDF

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Publication number
EP0376285A2
EP0376285A2 EP89124030A EP89124030A EP0376285A2 EP 0376285 A2 EP0376285 A2 EP 0376285A2 EP 89124030 A EP89124030 A EP 89124030A EP 89124030 A EP89124030 A EP 89124030A EP 0376285 A2 EP0376285 A2 EP 0376285A2
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EP
European Patent Office
Prior art keywords
data
data write
write process
signal
memory cell
Prior art date
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Granted
Application number
EP89124030A
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English (en)
French (fr)
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EP0376285B1 (de
EP0376285A3 (en
Inventor
Toshihide Tsuboi
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NEC Corp
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NEC Corp
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Publication of EP0376285A3 publication Critical patent/EP0376285A3/en
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Publication of EP0376285B1 publication Critical patent/EP0376285B1/de
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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/30—Power supply circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/08—Address circuits; Decoders; Word-line control circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/32—Timing circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C2216/00—Indexing scheme relating to G11C16/00 and subgroups, for features not directly covered by these groups
    • G11C2216/12—Reading and writing aspects of erasable programmable read-only memories
    • G11C2216/20—Suspension of programming or erasing cells in an array in order to read other cells in it

Definitions

  • the present invention relates to a microcomputer and, more particularly, to a microcomputer having an electrically erasable and programmable nonvolatile memory (called hereinafter "E2PROM”) as a data memory.
  • E2PROM electrically erasable and programmable nonvolatile memory
  • RAM random access memory
  • E2PROM is employed as a part of that data memory to store and hold data which are required to be kept stored even after a power voltage is cut off.
  • a data write process to E2PROM consists of an erasing operation, which is first performed to initialize the memory cell at an address to be written with new data by erasing the data formerly stored at that address, and a writing operation, which is subsequently performed to write the new data into that address.
  • the erasing and writing operations require a relatively long time duration, about 10 msec, respectively. This time duration is extremely long in comparison with an instruction execution time or a maching cycle time of CPU (Central Processing Unit). If CPU is programmed to perform the data write process to E2PROM, the execution efficiency of the program is deteriorated remarkably.
  • an erasing and writing automaton circuit is provided to control the data write process to E2PROM in place of CPU.
  • CPU receives a data write instruction to E2PROM, it issues the automaton circuit with a data write request including a write address information, data to be written (i.e., write data) and a write command signal.
  • CPU is thereafter shifted to a subsequent operation to execute other instructions.
  • the erasing and writing automaton circuit is initiated by the data write request to first perform the erasing operation in which a so-called Vpp voltage higher than a power voltage applied to the CPU is applied to memory cells of the selected address of E2PROM for the above-mentioned relatively long period.
  • the data which have been stored in those memory cells, are thereby erased.
  • the writing operation is performed to apply the Vpp voltage or ground voltage to the selected memory cells in accordance with data to be written for the relatively long period.
  • the new data is thereby stored in the selected memory cells.
  • the automaton circuit In order to detect each of the erasing and writing operation time durations, the automaton circuit includes a timer for counting a reference clock signal and to generate an operation end signal when a predetermine time has elapsed. In response to this operation end signal, the application of the Vpp voltage to the selected memory cells is terminated to thereby complete the erasing and writing operations.
  • the data write process may be temporarily suspended by the data read request issued from CPU.
  • the automaton circuit automatically completes the erasing and writing operations in response to the operation end signal generated by the timer. For this reason, the application time of the Vpp voltage to the selected memory cells is shortened by the suspended time of the data write process. The data is thereby not substantially written into E2PROM.
  • This drawback can be solved by initializing or resetting the timer in response to the data read request. However, in that case, the data write process is again performed from the beginning, so that a time for preforming the data write process is prolonged undesirably.
  • an object of the present invention is to provide a microcomputer including E2PROM equipped with an improved data erasing, writing and read control circuit.
  • Another object of the present invention is to provide a microcomputer having E2PROM into which data is surely written without prolonging a data write processing time.
  • Still another object of the present invention is to provide an E2PROM equipped with a control circuit which performs a data write process to surely write data into selected memory cells without prolonging a processing time even when a data read request is issued during the data write processing operation.
  • a microcomputer comprises E2PROM, CPU executing a program and issuing a data write request and a data read request to E2PROM, and a data/erasing/writing/reading control circuit including a timer counting a time to generate a processing end signal when a predetermined time has elapsed, a data write process control circuit responding to the data write request to perform a data write process in which data stored in a selected memory cell of E2PROM is first erased and new data is then written into the selected memory cell and responding to the processing end signal to terminate the data write process, a data read control circuit responding to the data read request issued during the data write process to suspend the data write process, read out data from a selected memory cell and resume the suspended data write process, and a timer control circuit suspending the time counting operation of the timer during the suspended period of the data write process.
  • the timer is supended to count a time, not initialized or reset. This is based upon a fact that while the Vpp voltage has to be applied to the memory cell for a preselected time in order to erase data thereof and write new data thereinto, the continuous application of the Vpp voltage over the preselected time is not required and the total application time of the Vpp voltage is required to satisfy the preselected time. For example, assuming that the preselected time is 10 msec, it is required to continuously apply the Vpp voltage for 10 msec, and the Vpp voltage can be applied five times 2 msec by 2 msec.
  • E2PROM 10 is coupled to an address/data multiplex bus 70.
  • the bus 70 is in turn coupled to CPU 20. Further coupled to the bus 70 are a data memory 30 constituted of a static type RAM (SRAM), a program memory 40 constituted of a mask ROM, and a peripheral I/O unit 50 including an A/D converter, a serial interface unit, a timer counter and so forth, all not shown.
  • the unit 50 is also coupled to an I/O bus 80 to controlled devices (not shown).
  • the respective units 10 to 50 are further interconnected via a control bus 60.
  • CPU 20 reads out each instruction from the program memory 40 and by executing it, performs arithmetic and/or logic operation on operand data.
  • CPU 20 further performs data read and write operations to E2PROM 10, data memory 30 and I/O unit 50.
  • E2PROM 10 includes an E2PROM address detector 101, a write address latch circuit 102, a read address latch circuit 103, a write data latch circuit 104 and a bus driver 105 which are connected to the bus 70.
  • the address detector 101 detects whether or not the address information on the bus 70 exists in a memory space allocated to E2PROM 10 and generates a high level address detection signal AED when the address information is detected to exist in the memory space.
  • E2PROM 10 is allocated to a memory space from "500H" to "8FFH” and thus has a memory capacity of 1 K byte.
  • the mark "H" represents a hexiadecimal notation.
  • the detector 101 decodes more significant four bits of the address information on the bus 70 and generates the high level signal AED when the content of those four bits is "5H", “6H", “7H” or “8H”.
  • the latch circuit 102 latches the information on the bus 70 as a write address in response to a write address latch enable signal WALE supplied thereto, and the latch circuit 103 latches the information on the bus as a read address in response to a read address latch enable signal RALE.
  • the latch circuit 104 latches the information on the bus 70 as data to be written (i.e., write data) in response to a write data latch enable signal WDLE.
  • the output address of the latch circuits 102 and 103 are supplied to a multiplexer (MPX) 106 controlled by an address selection signal AS.
  • MPX 106 selects the output address of the latch circuit 102 when the signal AS assumes that low level and selects the output address of the latch circuit 103 when the signal AS assumes the high level.
  • a part of the address selected by MPX 106 is supplied to a row decoder 109 as a row address and the remaining part thereof is supplied to a column selector 110 as a column address.
  • An E2PROM cell array 111 includes a number of E2PROM memory cells arranged in rows and columns. A predetermined number of memory cells are selected by the row decoder 109 and the column selector 110.
  • a data read operation data stored in the selected memory cells are read out therefrom and amplified by a read-out circuit (sense amplifier) 108 responsive to a sense-enable signal SE.
  • the read-out data are then transferred onto the bus 70 via the bus driver 105 in response to an output-enable signal OE.
  • each of the memory cells is constituted of an insulated gate field effect transistor having a floating gate, as shown in Fig. 7.
  • the data erasing operation of the cell is performed with source S being grounded, drain D being opened and control gate being applied with Vpp voltage, as shown in Fig. 7A.
  • the data writing operation of the cell is performed with source being opened, control gate being grounded and drain being applied with Vpp voltage or ground voltage from a write circuit 107 (Fig. 1) in accordance with data to be written, as shown in Fig. 7B.
  • the data reading operation of the cell is performed with source being grounded and control gate being applied with a read-out voltage V RD , and drain is coupled to the sense amplifier 108 via the column selector 110.
  • V RD read-out voltage
  • the E2PROM cell array 11 is supplied with a source control signal SCS and a drain control signal DCS.
  • the high level of the signal SCS grounds source of the selected memory cell and the low level thereof opens it.
  • the high level of the signal DCS coupled to drain of the selected memory cell to the sense amplifier 108 and the write circuit 107 via the column selector 110 and the low level thereof opens it.
  • the write circuit 107 is activated by a write-enable signal WE and then applies Vpp voltage or ground voltage to drain of the selected memory cell in accordance with the data to be written from the latch circuit 104.
  • a gate control signal GCS is supplied to the row decoder 109 which further receives an energizing voltage V sup taking Vpp level in the erasing and writing operation and taking a power voltage level Vcc in the read operation, the power voltage Vcc being applied to E2PROM 10.
  • the row decoder 109 applies Vpp voltage to control gate of the selected memory in the erasing operation and supplies the read-out voltage V RD thereto in the reading operation.
  • the low level of the signal GCS grounds the control gate of the selected memory cell.
  • the energizing voltage Vsup is further supplied to the column selector 110.
  • control signals and energizing voltage are generated by a data erasing/writing/reading control circuit 112.
  • This circuit 112 operates in predetermined sequence in response to the signal AED from the address detector 101 and write and read command signals WR and RD supplied via the control bus 60 from CPU 20.
  • the control circuit 112 includes four AND gates 1121 to 1124, two S-R type flip-flops (F/Fs) 1125 and 1126, a sequencer 1130, a charge-pumping circuit 1131 and a timer 1132.
  • This timer 1132 includes a one-shot pulse generator 1135, an AND gate 1136 and a counter 1137.
  • the AND gate 1122 responds to the write command signal WR, the address detection signal AED and a first CPU maching cycle control signal ⁇ 1 to generate the write address latch enable signal WALE.
  • F/F 1125 is set by the signal WALE to inform the sequencer of the data write request from CPU 20 via a write request signal WCM.
  • the AND gate 1121 responds to the signals WR and WCM and a second CPU machine cycle control signal ⁇ 2 to generates the write data latch enable signal WDLE.
  • F/F 1125 is reset by a data write process end signal WEND from the sequencer 1130.
  • the AND gate 1123 responds to the read command signal RD, the address detection signal AED and the first maching control signal ⁇ 1 to generate the read address latch enable signal RALE.
  • F/F 1126 is set by the signal RALE to inform the sequencer 1130 of the data read request from CPU 20 via a read request signal RCM. This signal RCM is also supplied to MPX 106 as the address selection signal AS.
  • the AND gate 1124 detects a data read bus cycle by the inverted signal RD and the signal ⁇ 1 and resets F/F 1126.
  • the sequencer 1130 responds to the write request signal WCM, read request signal RCM and operation end signal EWEN from the timer 1132 to generate the above control signals SE, OE, WE, GCS, SCS and DCS in accordance with predetermined sequence.
  • the sequence 1130 can be easily constituted of various gate circuits and/or a PLA (programmable logic array) circuit with reference to timing charts shown in Figs. 3 and 4 which will be described later.
  • the sequence 1130 further generates a charge-pumping enable signal CPEN to the charge-­pumping circuit 1131.
  • this circuit 1131 has capacitors and transistor switches and boosts the Vcc voltage up to Vpp level in response to a boosting clock signal (not shown) and the active level of the signal CPEN.
  • the inactive level of CPEN clamps the energizing voltage Vsup at Vcc level.
  • the charge-pumping circuit 113 boosts Vcc voltage up to Vpp voltage
  • the energizing voltage Vsup reaches Vpp level from Vcc level after a voltage raising-up time has elapsed, as shown by "T1" in Fig. 8.
  • T1 voltage raising-up time
  • the erasing/writing operation is terminated.
  • the sum of these times T1 and T2 is a preset time T of the timer 1132.
  • the timer 1132 detects the preset time T by counting a reference clock signal CLK by means of the counter 1137 and generates the operation end signal EWEN.
  • the AND gate 1136 is inserted into the supply line of clock signal CLK. Accordingly, the counter 1137 counts the clock signal CLK during the open state of the gate 1136.
  • the open and closed states of the gate 1136 is controlled by a one-shot pulse signal OSP from the generator 1135.
  • the generator 1135 When F/F 1126 is set, i.e., when the data read request is issued, the generator 1135 changes the signal OSP to the low level during the predetermined time period to close the AND gate 1136.
  • the generator 1135 may be constituted of a CR time constant circuit and an inverter.
  • CPU 20 When CPU 20 executes a data write instruction to E2PROM 10, it generates the write command signal WR and transfers a write address onto the bus 70 in synchronism with the first maching cycle control signal ⁇ 1. CPU 20 thereafter transfers data to be written (write data) onto the bus 70 in synchronism with the second machine cycle control signal ⁇ 2.
  • the AND gates generates the latch enable signal WALE, so that the latch circuit 102 latches the write address.
  • the latch signal WDLE is generated by the AND gate 1121, the latch circuit 104 latches the write data. Since the signal AS assumes the low level, MPX 106 supplies the write address from the latch circuit 102 to the row decoder 109 and column selector 110.
  • F/F 1125 is set by the signal WALE to change the write request signal WCM to the high level.
  • the sequencer 1130 changes the drain control signal DCS to the low level to open drain of each of selected memory cells.
  • the signals GCS and SCS are held at the high level.
  • the sequencer 1130 further generates a reset pulse RS to reset the counter 1137 and changes the charge-pumping enable signal CPEN to the active, high, level.
  • the counter 1137 starts to count to the clock signal CLK.
  • the charge-pumping circuit 1131 starts the boosting operation.
  • the energizing voltage Vsup of Vpp level is supplied to the row decoder 109, which is turn supplies Vpp level to the control gate of each selected memory cell having source grounded and drain opened. The erasing operation thus starts.
  • CPU 20 after issuing the data write request to E2PROM 10, reads out each of subsequent instructions from the program memory 40 and executes it. Therefore, CPU 20 may encounter a data read instruction from E2PROM 10. When CPU 20 encounter such instruction, it generates the read command signal RD and transfers a read address onto the bus 70 in synchronism with the signal ⁇ 1. In response thereto, the AND gate 1123 generates the latch enable signal RALE, so that the read address is latched into the latch circuit 103. F/F 1126 is set by the signal RALE to change the signal AS (RCM) to the high level. MPX 106 selects the latch circuit 103 to supply the read address to the row decoder 109 and column selector 110.
  • the sequencer 1130 changes the signal CPEN to the low level.
  • the charge-pumping circuit 1131 is thereby deactived and the energizing voltage Vsup is clamped, at Vcc level.
  • the sequence 1130 further changes the signal DCS to the high level and then changes the signal SE to the high level to activate the sense amplifier 108.
  • the sequencer 1130 thereafter changes the signal OE to the high level in synchronism with ⁇ 2.
  • the bus driver 105 is thereby activated, so that data stored in memory cells selected by the read address are transferred onto the bus 70.
  • the generator 1135 changes the signal OSP to the low level.
  • the AND gate 1136 is closed and the counter 1137 suspends to count the clock signal CLK.
  • CPU 20 inverts the read command signal RD to the low level in synchronism with ⁇ 1, so that F/F 1126 is reset.
  • As (RCM) signal is thereby changed to the low level.
  • MPX 106 selects the latch circuit 102.
  • the sequencer 1130 inverts SE, OE and DCS signals to the low level and further inverts CPEN signal to the high level. Therefore, the charge-pumping circuit 1131 starts the boosting operation and boosts the voltage Vsup up to Vpp level after the time T1.
  • the OSP signal is held at the low level even after the read request signal RCM is changed to the low level.
  • the charge-­pumping circuit 1131 boosts the voltage Vsup up to Vpp level after T1 time has elapsed. During this time T1, the valid or substantial data erasing is not performed.
  • the signal OSP is held at the low level.
  • the generator 1135 changes the OSP signal to the high level. The counter 1137 thereby resumes to count the clock signal CLK. Since the voltage raising-up time T1 depends on the circuit construction of the charge-pumping circuit 1131 and since the data read bus cycle period is determined by ⁇ 1 and ⁇ 2, the low level period of OSP signal can be easily determined.
  • the time count operation of the timer 1132 is also suspended during the period corresponding to the sum of the data read cycle period and the voltage raising-up time T1.
  • the counter 1137 advances to count the clock signal CLK and, when the time T2 required to erase data has been elapsed, the timer 1132 generates the erasing end signal EWEN, as shown in Fig. 4.
  • the sequencer 1130 produces the low level CPEN signal to clamp the voltage Vsup at Vcc level and then changes GCS, SCS and DCS signals to the low level, low level and high level, respectively.
  • the sequencer 1130 produces the pulse RS to reset the counter and then changes CPEN and WE signals to the high level.
  • the write circuit 107 is thereby activated. Thus, the writing operation starts.
  • the counter 1137 starts to count the clock signal CLK.
  • the timer 1132 When the time T has elapsed, the timer 1132 produces the writing end signal EWEN. In response thereto, the sequencer 1130 inverts CPEN signal to the low level and then changes GCS, SCS and WE signals to high level, high level and low level, respectively. The data write processing end signal WEND is thereafter generated to reset F/F 1125. Thus, the data write process responsive to the data write request is completed.
  • CPU 20 issues the data read request during the writing operation, the writing operation is suspended and the data is then read out of the selected address, the suspended writing operation being thereafter resumed, similarly to Fig. 3.
  • the counter 1137 also suspends the count operation during the period corresponding to the sum of the read bus cycle period and the voltage raising-up time T1.
  • a time 1132′ includes a counter 1138 in place of the one-shot pulse generator 1135 shown in Fig. 2.
  • This counter 1138 is reset by the high level RCM signal.
  • the counter 1138 starts to count the clock pulse CLK and generates a high level overflow signal after the time T1 elapses.
  • the AND gate 1136 is thereby opened.
  • the high level overflow signal is held until the next high level RCM signal is applied to the counter 1138.

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EP89124030A 1988-12-27 1989-12-27 Mikrorechner mit einem elektrisch löschbaren und programmierbaren nichtflüchtigen Speicher Expired - Lifetime EP0376285B1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP331713/88 1988-12-27
JP33171388 1988-12-27

Publications (3)

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EP0376285A2 true EP0376285A2 (de) 1990-07-04
EP0376285A3 EP0376285A3 (en) 1990-09-05
EP0376285B1 EP0376285B1 (de) 1994-03-09

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EP89124030A Expired - Lifetime EP0376285B1 (de) 1988-12-27 1989-12-27 Mikrorechner mit einem elektrisch löschbaren und programmierbaren nichtflüchtigen Speicher

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US (1) US5287469A (de)
EP (1) EP0376285B1 (de)
DE (1) DE68913695T2 (de)

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EP0376285A3 (en) 1990-09-05

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