DK54682A - Fremgangsmaade til undersoegelse af overfladekvaliteten af materialer i fast aggregatform og apparat til udoevelse af fremgangsmaaden - Google Patents
Fremgangsmaade til undersoegelse af overfladekvaliteten af materialer i fast aggregatform og apparat til udoevelse af fremgangsmaaden Download PDFInfo
- Publication number
- DK54682A DK54682A DK54682A DK54682A DK54682A DK 54682 A DK54682 A DK 54682A DK 54682 A DK54682 A DK 54682A DK 54682 A DK54682 A DK 54682A DK 54682 A DK54682 A DK 54682A
- Authority
- DK
- Denmark
- Prior art keywords
- procedure
- examining
- exercising
- materials
- surface quality
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/171—Systems in which incident light is modified in accordance with the properties of the material investigated with calorimetric detection, e.g. with thermal lens detection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
- G01B11/0658—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of emissivity or reradiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/72—Investigating presence of flaws
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Description
SAMMENDRAG
En fremgangsmåde til undersøgelse af materialer i fast aggregatform, f.eks. metaller, med hensyn til deres overfladefejl, overfladerevner eller lignende, egenskaberne af belægninger eller overfladekvaliteten af papir. En særlig anvendelse af fremgangsmåden ifølge opfindelsen er måling af tykkelsen af det hærdede overfladelag af stål.
Af hensyn til at forhindre hurtig udligning af temperaturforskelle, der frembringes på materialets overflade er der på materialet (25) rettet en pulserende lysstråle (21) i bølgelængdeområdet for synligt lys, hvorved i det mindste en del af denne lysstråle (21) absorberes i overfladen af materialet (25) og forårsager forøgelse af materialets overfladetemperatur. Overfladen af materialet (25) , der er blevet opvarmet ved virkning af den frembragte, periodiske temperaturvariation udsender en pulserende, infra-rød stråling (26), som modtages med midler (27), der er følsomme for infra-rød stråling.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI801850A FI63115C (fi) | 1980-06-10 | 1980-06-10 | Foerfarande foer undersoekning av ytkvaliteten av material i fasttillstaond och anordning foer genomfoerande av foerfarandet |
PCT/FI1981/000044 WO1981003704A1 (en) | 1980-06-10 | 1981-06-09 | Procedure for examining the surface quality of materials in solid state of aggregation,and means for carrying out the procedure |
Publications (1)
Publication Number | Publication Date |
---|---|
DK54682A true DK54682A (da) | 1982-02-09 |
Family
ID=8513553
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DK54682A DK54682A (da) | 1980-06-10 | 1982-02-09 | Fremgangsmaade til undersoegelse af overfladekvaliteten af materialer i fast aggregatform og apparat til udoevelse af fremgangsmaaden |
Country Status (9)
Country | Link |
---|---|
EP (1) | EP0053167B1 (da) |
JP (1) | JPS57500846A (da) |
AU (1) | AU546814B2 (da) |
BR (1) | BR8108642A (da) |
CA (1) | CA1164242A (da) |
DK (1) | DK54682A (da) |
FI (1) | FI63115C (da) |
IT (1) | IT1168095B (da) |
WO (1) | WO1981003704A1 (da) |
Families Citing this family (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FI64465C (fi) * | 1982-03-15 | 1983-11-10 | Mauri Luukkala | Foerfarande och apparat foer att maeta ytornas egenskaper av fasta tillstaondets materialer |
FI64243C (fi) * | 1982-06-17 | 1983-10-10 | Mauri Luukkala | Foerfarande och apparat foer maetning av tvaerbundenhetsgradeni plast |
US4521118A (en) * | 1982-07-26 | 1985-06-04 | Therma-Wave, Inc. | Method for detection of thermal waves with a laser probe |
US4522510A (en) * | 1982-07-26 | 1985-06-11 | Therma-Wave, Inc. | Thin film thickness measurement with thermal waves |
US4481418A (en) * | 1982-09-30 | 1984-11-06 | Vanzetti Systems, Inc. | Fiber optic scanning system for laser/thermal inspection |
US4578584A (en) * | 1984-01-23 | 1986-03-25 | International Business Machines Corporation | Thermal wave microscopy using areal infrared detection |
FI850870A0 (fi) * | 1985-03-04 | 1985-03-04 | Labsystems Oy | Foerfarande foer maetning av sedimentation. |
DE3820862A1 (de) * | 1988-06-21 | 1989-12-28 | Soelter Hans Joachim Dipl Phys | Verfahren und vorrichtung zur kontaktlosen untersuchung von oberflaechen und inneren strukturen eines festen pruefkoerpers |
DE4030801C2 (de) * | 1990-09-28 | 1998-02-05 | Siemens Ag | Meßanordnung zur berührungslosen Bestimmung der Dicke und/oder thermischen Eigenschaften von Folien und dünnen Oberflächenbeschichtungen |
FR2682757A1 (fr) * | 1991-10-21 | 1993-04-23 | Inst Francais Du Petrole | Dispositif et methode de controle non destructif et continu de l'epaisseur de profiles. |
DE4206499C2 (de) * | 1992-03-02 | 1994-03-10 | Haeusler Gerd | Verfahren und Vorrichtung zur Abstandsmessung |
DE4343076C2 (de) * | 1993-12-16 | 1997-04-03 | Phototherm Dr Petry Gmbh | Vorrichtung zum photothermischen Prüfen einer Oberfläche eines insbesondere bewegten Gegenstandes |
ES2146864T5 (es) † | 1995-01-13 | 2005-07-16 | OPTISENSE GESELLSCHAFT FUR OPTISCHE PROZESSMESSTECHNIK MBH & CO. KG I.G. | Procedimiento y dispositivo para la determinacion del espesor de capa, la conductibilidad y/o la calidad de contacto de capa de capas aplicadas sobre substratos. |
US5709471A (en) * | 1996-02-29 | 1998-01-20 | The Aerospace Corporation | Method for thermally testing with a laser the edge of a sapphire window |
DE19808536A1 (de) * | 1998-02-28 | 1999-09-02 | Ramseier Rubigen Ag | Verfahren und Vorrichtung zum Überwachen einer Ausgangsschichtdicke sowie Verwendung der Vorrichtung |
GB2348279A (en) * | 1999-03-20 | 2000-09-27 | C A Technology Limited | Coating thickness measurement by remote non-contact photothermal method |
FI112881B (fi) * | 1999-12-09 | 2004-01-30 | Metso Paper Inc | Menetelmä ja sovitelma päällystekerroksen profiilin määrittämiseksi |
FI113088B (fi) * | 2000-02-10 | 2004-02-27 | Metso Automation Oy | Menetelmä ja laite paperirainan lämpötilan mittaamiseksi |
CN102353649A (zh) * | 2011-06-30 | 2012-02-15 | 中国科学院长春光学精密机械与物理研究所 | 一种基于二元化光谱分技术的乙醇气体浓度遥测方法 |
DE102014212402A1 (de) * | 2014-06-27 | 2015-12-31 | Robert Bosch Gmbh | Verfahren zum Herstellen eines Bauteilelements |
CN110400311A (zh) * | 2019-08-01 | 2019-11-01 | 中北大学 | 基于脉冲激光热成像的高温合金表面缺陷特征提取方法 |
CN111239154A (zh) * | 2020-01-18 | 2020-06-05 | 哈尔滨工业大学 | 一种横向差动暗场共焦显微测量装置及其方法 |
CN113406009B (zh) * | 2021-06-23 | 2023-07-04 | 电子科技大学 | 一种基于光声信号匹配滤波的金属材料热扩散率测量方法 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1315654A (en) * | 1969-05-21 | 1973-05-02 | Pilkington Brothers Ltd | Detection of faults in transparent material using lasers |
FR2247699A1 (en) * | 1973-10-11 | 1975-05-09 | Anvar | Surface roughness measuring process - compares two different wavelength laser lighted images at third wavelength |
GB1474191A (en) * | 1974-01-21 | 1977-05-18 | Nat Res Dev | Measurement of surface roughness |
JPS6036013B2 (ja) * | 1977-09-30 | 1985-08-17 | 動力炉・核燃料開発事業団 | 金属表面の欠陥検査方法 |
WO1980000099A1 (fr) * | 1978-06-20 | 1980-01-24 | Sumitomo Metal Ind | Methode et appareil de detection supersonique de defauts sans contact |
-
1980
- 1980-06-10 FI FI801850A patent/FI63115C/fi not_active IP Right Cessation
-
1981
- 1981-06-09 BR BR8108642A patent/BR8108642A/pt unknown
- 1981-06-09 EP EP81901711A patent/EP0053167B1/en not_active Expired
- 1981-06-09 JP JP56502070A patent/JPS57500846A/ja active Pending
- 1981-06-09 WO PCT/FI1981/000044 patent/WO1981003704A1/en active IP Right Grant
- 1981-06-09 AU AU72939/81A patent/AU546814B2/en not_active Ceased
- 1981-06-09 CA CA000379400A patent/CA1164242A/en not_active Expired
- 1981-06-10 IT IT22247/81A patent/IT1168095B/it active
-
1982
- 1982-02-09 DK DK54682A patent/DK54682A/da not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
AU7293981A (en) | 1981-01-07 |
JPS57500846A (da) | 1982-05-13 |
FI63115B (fi) | 1982-12-31 |
IT8122247A0 (it) | 1981-06-10 |
EP0053167A1 (en) | 1982-06-09 |
IT1168095B (it) | 1987-05-20 |
FI63115C (fi) | 1983-04-11 |
BR8108642A (pt) | 1982-04-27 |
WO1981003704A1 (en) | 1981-12-24 |
IT8122247A1 (it) | 1982-12-10 |
FI801850A (fi) | 1981-12-11 |
CA1164242A (en) | 1984-03-27 |
EP0053167B1 (en) | 1984-09-19 |
AU546814B2 (en) | 1985-09-19 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
AHB | Application shelved due to non-payment |