JPS561340A - X-ray fracture analysis method - Google Patents

X-ray fracture analysis method

Info

Publication number
JPS561340A
JPS561340A JP7682079A JP7682079A JPS561340A JP S561340 A JPS561340 A JP S561340A JP 7682079 A JP7682079 A JP 7682079A JP 7682079 A JP7682079 A JP 7682079A JP S561340 A JPS561340 A JP S561340A
Authority
JP
Japan
Prior art keywords
stress
physical quantity
ray
relations
fracture
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7682079A
Other languages
Japanese (ja)
Other versions
JPS6336459B2 (en
Inventor
Makoto Hayashi
Sadao Nemoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP7682079A priority Critical patent/JPS561340A/en
Publication of JPS561340A publication Critical patent/JPS561340A/en
Publication of JPS6336459B2 publication Critical patent/JPS6336459B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)

Abstract

PURPOSE:To perform a speedy and highly accurate fracture analysis by using the macro-X-ray fractography. CONSTITUTION:The physical quantity is measured from the diffracted X-ray obtained by applying parallel beams to a fixed portion of the fracture of the test piece broken by applying a load having a different stress frequency and amplitude. The relations between the physical quantity and stress amplitude, stress enlargement coefficient, and crack development speed are previously obtained, and the relations between the physical quantity measured from the diffracted X-ray obtained by applying parallel beams to the fracture of a broken material on which an actual fracture analysis is performed, are obtained from the relations between the physical quantity measured from the test piece and stress amplitude, stress enlargement coefficient, and crack development speed.
JP7682079A 1979-06-20 1979-06-20 X-ray fracture analysis method Granted JPS561340A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7682079A JPS561340A (en) 1979-06-20 1979-06-20 X-ray fracture analysis method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7682079A JPS561340A (en) 1979-06-20 1979-06-20 X-ray fracture analysis method

Publications (2)

Publication Number Publication Date
JPS561340A true JPS561340A (en) 1981-01-09
JPS6336459B2 JPS6336459B2 (en) 1988-07-20

Family

ID=13616301

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7682079A Granted JPS561340A (en) 1979-06-20 1979-06-20 X-ray fracture analysis method

Country Status (1)

Country Link
JP (1) JPS561340A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6010406U (en) * 1983-06-30 1985-01-24 井関農機株式会社 Leveling cover in tillage equipment

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01157654U (en) * 1988-04-19 1989-10-31
JPH06225849A (en) * 1993-02-01 1994-08-16 Azuma Kogyo Kk Cleaning tool

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5120894A (en) * 1974-08-09 1976-02-19 Hitachi Ltd
JPS537286A (en) * 1976-07-08 1978-01-23 Hitachi Ltd Quantitative x-ray fracture analysis

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5120894A (en) * 1974-08-09 1976-02-19 Hitachi Ltd
JPS537286A (en) * 1976-07-08 1978-01-23 Hitachi Ltd Quantitative x-ray fracture analysis

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6010406U (en) * 1983-06-30 1985-01-24 井関農機株式会社 Leveling cover in tillage equipment

Also Published As

Publication number Publication date
JPS6336459B2 (en) 1988-07-20

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