FI801850A - Fototermisk infraroed mikroskop och kamera - Google Patents

Fototermisk infraroed mikroskop och kamera

Info

Publication number
FI801850A
FI801850A FI801850A FI801850A FI801850A FI 801850 A FI801850 A FI 801850A FI 801850 A FI801850 A FI 801850A FI 801850 A FI801850 A FI 801850A FI 801850 A FI801850 A FI 801850A
Authority
FI
Finland
Prior art keywords
infraroed
fototermisk
och
microscope
camera
Prior art date
Application number
FI801850A
Other languages
English (en)
Other versions
FI63115C (fi
FI63115B (fi
Inventor
Mauri Luukkala
Jorma Leino
Original Assignee
Mauri Luukkala
Valmet Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to FI801850A priority Critical patent/FI63115C/fi
Application filed by Mauri Luukkala, Valmet Oy filed Critical Mauri Luukkala
Priority to DE8181901711T priority patent/DE3166151D1/de
Priority to JP56502070A priority patent/JPS57500846A/ja
Priority to AU72939/81A priority patent/AU546814B2/en
Priority to CA000379400A priority patent/CA1164242A/en
Priority to EP81901711A priority patent/EP0053167B1/en
Priority to PCT/FI1981/000044 priority patent/WO1981003704A1/en
Priority to BR8108642A priority patent/BR8108642A/pt
Priority to IT22247/81A priority patent/IT1168095B/it
Publication of FI801850A publication Critical patent/FI801850A/fi
Priority to DK54682A priority patent/DK54682A/da
Application granted granted Critical
Publication of FI63115B publication Critical patent/FI63115B/fi
Publication of FI63115C publication Critical patent/FI63115C/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/171—Systems in which incident light is modified in accordance with the properties of the material investigated with calorimetric detection, e.g. with thermal lens detection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0658—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of emissivity or reradiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/72—Investigating presence of flaws

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
FI801850A 1980-06-10 1980-06-10 Foerfarande foer undersoekning av ytkvaliteten av material i fasttillstaond och anordning foer genomfoerande av foerfarandet FI63115C (fi)

Priority Applications (10)

Application Number Priority Date Filing Date Title
FI801850A FI63115C (fi) 1980-06-10 1980-06-10 Foerfarande foer undersoekning av ytkvaliteten av material i fasttillstaond och anordning foer genomfoerande av foerfarandet
JP56502070A JPS57500846A (fi) 1980-06-10 1981-06-09
AU72939/81A AU546814B2 (en) 1980-06-10 1981-06-09 Procedure for examining the surface quality of materials in solid state of aggregation, and means for carrying out the procedure
CA000379400A CA1164242A (en) 1980-06-10 1981-06-09 Procedure for examining the surface quality of materials in solid state of aggregation and means for carrying out the procedure
DE8181901711T DE3166151D1 (en) 1980-06-10 1981-06-09 Procedure and apparatus for examining the surface quality of solid materials
EP81901711A EP0053167B1 (en) 1980-06-10 1981-06-09 Procedure and apparatus for examining the surface quality of solid materials
PCT/FI1981/000044 WO1981003704A1 (en) 1980-06-10 1981-06-09 Procedure for examining the surface quality of materials in solid state of aggregation,and means for carrying out the procedure
BR8108642A BR8108642A (pt) 1980-06-10 1981-06-09 Procedimento para exame de qualidade superficial de materiais e estado solido de aglomeracao, e um dispositivo para realizar o procedimento
IT22247/81A IT1168095B (it) 1980-06-10 1981-06-10 Procedimento per esaminare le condizioni superficiali di materiale allo stato solido di aggregazione e mezzi per realizzare il procedimento
DK54682A DK54682A (da) 1980-06-10 1982-02-09 Fremgangsmaade til undersoegelse af overfladekvaliteten af materialer i fast aggregatform og apparat til udoevelse af fremgangsmaaden

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI801850 1980-06-10
FI801850A FI63115C (fi) 1980-06-10 1980-06-10 Foerfarande foer undersoekning av ytkvaliteten av material i fasttillstaond och anordning foer genomfoerande av foerfarandet

Publications (3)

Publication Number Publication Date
FI801850A true FI801850A (fi) 1981-12-11
FI63115B FI63115B (fi) 1982-12-31
FI63115C FI63115C (fi) 1983-04-11

Family

ID=8513553

Family Applications (1)

Application Number Title Priority Date Filing Date
FI801850A FI63115C (fi) 1980-06-10 1980-06-10 Foerfarande foer undersoekning av ytkvaliteten av material i fasttillstaond och anordning foer genomfoerande av foerfarandet

Country Status (9)

Country Link
EP (1) EP0053167B1 (fi)
JP (1) JPS57500846A (fi)
AU (1) AU546814B2 (fi)
BR (1) BR8108642A (fi)
CA (1) CA1164242A (fi)
DK (1) DK54682A (fi)
FI (1) FI63115C (fi)
IT (1) IT1168095B (fi)
WO (1) WO1981003704A1 (fi)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI64465C (fi) * 1982-03-15 1983-11-10 Mauri Luukkala Foerfarande och apparat foer att maeta ytornas egenskaper av fasta tillstaondets materialer
FI64243C (fi) * 1982-06-17 1983-10-10 Mauri Luukkala Foerfarande och apparat foer maetning av tvaerbundenhetsgradeni plast
US4522510A (en) * 1982-07-26 1985-06-11 Therma-Wave, Inc. Thin film thickness measurement with thermal waves
US4521118A (en) * 1982-07-26 1985-06-04 Therma-Wave, Inc. Method for detection of thermal waves with a laser probe
US4481418A (en) * 1982-09-30 1984-11-06 Vanzetti Systems, Inc. Fiber optic scanning system for laser/thermal inspection
US4578584A (en) * 1984-01-23 1986-03-25 International Business Machines Corporation Thermal wave microscopy using areal infrared detection
FI850870A0 (fi) * 1985-03-04 1985-03-04 Labsystems Oy Foerfarande foer maetning av sedimentation.
DE3820862A1 (de) * 1988-06-21 1989-12-28 Soelter Hans Joachim Dipl Phys Verfahren und vorrichtung zur kontaktlosen untersuchung von oberflaechen und inneren strukturen eines festen pruefkoerpers
DE4030801C2 (de) * 1990-09-28 1998-02-05 Siemens Ag Meßanordnung zur berührungslosen Bestimmung der Dicke und/oder thermischen Eigenschaften von Folien und dünnen Oberflächenbeschichtungen
FR2682757A1 (fr) * 1991-10-21 1993-04-23 Inst Francais Du Petrole Dispositif et methode de controle non destructif et continu de l'epaisseur de profiles.
DE4206499C2 (de) * 1992-03-02 1994-03-10 Haeusler Gerd Verfahren und Vorrichtung zur Abstandsmessung
DE4343076C2 (de) * 1993-12-16 1997-04-03 Phototherm Dr Petry Gmbh Vorrichtung zum photothermischen Prüfen einer Oberfläche eines insbesondere bewegten Gegenstandes
WO1996021857A1 (de) † 1995-01-13 1996-07-18 Optikzentrum Nrw Gmbh Verfahren und vorrichtung zur bestimmung der schichtdicke, der leitfähigkeit und/oder der schichtkontaktgüte von auf substraten aufgetragenen schichten
US5709471A (en) * 1996-02-29 1998-01-20 The Aerospace Corporation Method for thermally testing with a laser the edge of a sapphire window
DE19808536A1 (de) * 1998-02-28 1999-09-02 Ramseier Rubigen Ag Verfahren und Vorrichtung zum Überwachen einer Ausgangsschichtdicke sowie Verwendung der Vorrichtung
GB2348279A (en) * 1999-03-20 2000-09-27 C A Technology Limited Coating thickness measurement by remote non-contact photothermal method
FI112881B (fi) 1999-12-09 2004-01-30 Metso Paper Inc Menetelmä ja sovitelma päällystekerroksen profiilin määrittämiseksi
FI113088B (fi) * 2000-02-10 2004-02-27 Metso Automation Oy Menetelmä ja laite paperirainan lämpötilan mittaamiseksi
CN102353649A (zh) * 2011-06-30 2012-02-15 中国科学院长春光学精密机械与物理研究所 一种基于二元化光谱分技术的乙醇气体浓度遥测方法
DE102014212402A1 (de) * 2014-06-27 2015-12-31 Robert Bosch Gmbh Verfahren zum Herstellen eines Bauteilelements
CN110400311A (zh) * 2019-08-01 2019-11-01 中北大学 基于脉冲激光热成像的高温合金表面缺陷特征提取方法
CN111239154A (zh) * 2020-01-18 2020-06-05 哈尔滨工业大学 一种横向差动暗场共焦显微测量装置及其方法
CN113406009B (zh) * 2021-06-23 2023-07-04 电子科技大学 一种基于光声信号匹配滤波的金属材料热扩散率测量方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1315654A (en) * 1969-05-21 1973-05-02 Pilkington Brothers Ltd Detection of faults in transparent material using lasers
FR2247699A1 (en) * 1973-10-11 1975-05-09 Anvar Surface roughness measuring process - compares two different wavelength laser lighted images at third wavelength
GB1474191A (en) * 1974-01-21 1977-05-18 Nat Res Dev Measurement of surface roughness
JPS6036013B2 (ja) * 1977-09-30 1985-08-17 動力炉・核燃料開発事業団 金属表面の欠陥検査方法
DE2952885C2 (de) * 1978-06-20 1986-01-30 Sumitomo Metal Industries, Ltd., Osaka Vorrichtung zur berührungslosen Ultraschallfehlerprüfung

Also Published As

Publication number Publication date
IT8122247A0 (it) 1981-06-10
IT1168095B (it) 1987-05-20
IT8122247A1 (it) 1982-12-10
FI63115C (fi) 1983-04-11
BR8108642A (pt) 1982-04-27
DK54682A (da) 1982-02-09
AU546814B2 (en) 1985-09-19
EP0053167B1 (en) 1984-09-19
JPS57500846A (fi) 1982-05-13
WO1981003704A1 (en) 1981-12-24
EP0053167A1 (en) 1982-06-09
FI63115B (fi) 1982-12-31
CA1164242A (en) 1984-03-27
AU7293981A (en) 1981-01-07

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Legal Events

Date Code Title Description
MM Patent lapsed

Owner name: VALMET OY

Owner name: LUUKKALA, MAURI