DE69939522D1 - Prüfsystem für diskrete leiterbahnnen auf kontinuierlichem substrat aus flexiblem material - Google Patents

Prüfsystem für diskrete leiterbahnnen auf kontinuierlichem substrat aus flexiblem material

Info

Publication number
DE69939522D1
DE69939522D1 DE69939522T DE69939522T DE69939522D1 DE 69939522 D1 DE69939522 D1 DE 69939522D1 DE 69939522 T DE69939522 T DE 69939522T DE 69939522 T DE69939522 T DE 69939522T DE 69939522 D1 DE69939522 D1 DE 69939522D1
Authority
DE
Germany
Prior art keywords
substrate sheet
inspection
inspection zone
draw
roller
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69939522T
Other languages
English (en)
Inventor
Tetsuya Okuchi
Hiroyuki Ishiguro
Yoshio Mori
Takeshi Kitamura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electric Works Co Ltd
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP21330898A external-priority patent/JP3506011B2/ja
Priority claimed from JP11044050A external-priority patent/JP2000106480A/ja
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Application granted granted Critical
Publication of DE69939522D1 publication Critical patent/DE69939522D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/309—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of printed or hybrid circuits or circuit substrates

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Electromagnetism (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Toxicology (AREA)
  • General Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Controlling Rewinding, Feeding, Winding, Or Abnormalities Of Webs (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
  • Measurement Of The Respiration, Hearing Ability, Form, And Blood Characteristics Of Living Organisms (AREA)
  • Control Of Conveyors (AREA)
DE69939522T 1998-07-28 1999-07-28 Prüfsystem für diskrete leiterbahnnen auf kontinuierlichem substrat aus flexiblem material Expired - Lifetime DE69939522D1 (de)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP21330798 1998-07-28
JP21330898A JP3506011B2 (ja) 1998-07-28 1998-07-28 配線パターン欠陥確認装置
JP11044050A JP2000106480A (ja) 1998-07-28 1999-02-23 配線パタ―ン検査装置
PCT/JP1999/004040 WO2000007031A1 (en) 1998-07-28 1999-07-28 Inspection system for inspecting discrete wiring patterns formed on a continuous substrate sheet of a flexible material

Publications (1)

Publication Number Publication Date
DE69939522D1 true DE69939522D1 (de) 2008-10-23

Family

ID=27291770

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69939522T Expired - Lifetime DE69939522D1 (de) 1998-07-28 1999-07-28 Prüfsystem für diskrete leiterbahnnen auf kontinuierlichem substrat aus flexiblem material

Country Status (7)

Country Link
US (1) US6700603B1 (de)
EP (1) EP1027615B1 (de)
KR (2) KR20010030575A (de)
CN (1) CN1212523C (de)
AT (1) ATE408150T1 (de)
DE (1) DE69939522D1 (de)
WO (1) WO2000007031A1 (de)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6950547B2 (en) 2001-02-12 2005-09-27 3M Innovative Properties Company Web inspection method and device
GB2380885A (en) * 2001-10-11 2003-04-16 Hewlett Packard Co Multiple camera arrangement
US7077019B2 (en) * 2003-08-08 2006-07-18 Photon Dynamics, Inc. High precision gas bearing split-axis stage for transport and constraint of large flat flexible media during processing
US7561310B2 (en) * 2003-12-17 2009-07-14 Market Hatch Co., Inc. Method and apparatus for digital scanning and archiving
JP2007517232A (ja) 2003-12-31 2007-06-28 スリーエム イノベイティブ プロパティズ カンパニー ウェブに基づく物品の歩留まりの最大化
US7120515B2 (en) 2003-12-31 2006-10-10 3M Innovative Properties Company Inventory control for web-based articles
US7623699B2 (en) 2004-04-19 2009-11-24 3M Innovative Properties Company Apparatus and method for the automated marking of defects on webs of material
JP4042737B2 (ja) * 2004-10-27 2008-02-06 セイコーエプソン株式会社 パターン形成システム
KR20060097250A (ko) * 2005-03-04 2006-09-14 아주하이텍(주) 자동 광학 검사 시스템 및 방법
EP1731899A1 (de) * 2005-06-06 2006-12-13 Axalto SA Vorrichtung und Verfahren zur optischen Kontrolle elektronischer Modulle
KR100661003B1 (ko) * 2005-07-22 2006-12-22 (주)제노정보시스템 유리기판의 에지 결함 검사장치
KR20070117287A (ko) * 2006-06-08 2007-12-12 삼성전자주식회사 기판 검사 유닛, 이를 갖는 기판 검사 장치 및 이를 이용한기판 검사 방법
DE102007006274A1 (de) * 2007-02-08 2008-08-14 Polyic Gmbh & Co. Kg Messvorrichtung mit einem Messrad
DE102007006275A1 (de) * 2007-02-08 2008-08-14 Polyic Gmbh & Co. Kg Messvorrichtung mit einem Bandspeicher
WO2009011079A1 (ja) * 2007-07-17 2009-01-22 Sharp Kabushiki Kaisha 透明基板の端部検出方法及び端部検出装置並びに処理装置
US7542821B2 (en) 2007-07-26 2009-06-02 3M Innovative Properties Company Multi-unit process spatial synchronization of image inspection systems
CN102221549B (zh) * 2011-03-06 2013-04-03 丘荣意 一种pcb电路板全自动进板光学图像检测装置
CN103165493A (zh) * 2013-04-09 2013-06-19 铜陵三佳山田科技有限公司 Sop类集成电路分离模具检测装置
US9523735B2 (en) * 2014-10-08 2016-12-20 Eastman Kodak Company Electrical test system with vision-guided alignment
CN104316537B (zh) * 2014-10-31 2017-02-22 广州超音速自动化科技股份有限公司 标签打印质量检测装置
CN105203553B (zh) * 2015-09-30 2017-09-12 江苏比微曼智能科技有限公司 缺陷检测机
KR102521372B1 (ko) 2016-02-12 2023-04-14 삼성전자주식회사 마크 위치 예측 방법
CN105738381B (zh) * 2016-02-17 2018-05-04 苏州禾弘电子科技有限公司 柔性线路板用柔性基材的检测装置
CN106524927A (zh) * 2016-10-19 2017-03-22 厦门理工学院 一种自动校正路线的在线测量电池极板厚度的系统及方法
CN110054010B (zh) * 2019-04-22 2020-06-16 浙江中烟工业有限责任公司 一种水松纸纠偏装置的离线调试测试系统
CN111650208B (zh) * 2020-06-01 2021-08-27 东华大学 一种巡游式机织面料疵点在线检测器
KR102560721B1 (ko) * 2022-06-08 2023-07-28 시냅스이미징(주) 이송제어기구를 포함하는 기판검사장치

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3248757A1 (de) 1982-12-31 1984-07-05 Siemens AG, 1000 Berlin und 8000 München Tonerdeporzellanmasse
JPS63163150A (ja) 1986-12-25 1988-07-06 Matsushita Electric Ind Co Ltd プリント基板検査装置
JPS63246642A (ja) 1987-04-01 1988-10-13 Hitachi Chem Co Ltd フレキシブル配線板の回路欠陥検査方法
JPH01227970A (ja) 1988-03-08 1989-09-12 Hitachi Electron Eng Co Ltd フレキシブルプリント基板の固定方法および固定機構
JPH01229947A (ja) 1988-03-10 1989-09-13 Seiko Epson Corp フレキシブル回路基板の位置決め方法
JPH0267948A (ja) 1988-09-02 1990-03-07 Sharp Corp 基板パターン検査装置
JP2892079B2 (ja) 1990-02-21 1999-05-17 ウシオ電機株式会社 フィルム露光装置
JPH06265324A (ja) * 1993-03-16 1994-09-20 Citizen Watch Co Ltd 電子部品実装装置及び電子部品実装状態の検査方法
WO2001032235A2 (en) 1999-11-05 2001-05-10 Tandem Medical, Inc. Medication delivery apparatus and methods for intravenous infusions

Also Published As

Publication number Publication date
ATE408150T1 (de) 2008-09-15
EP1027615A1 (de) 2000-08-16
WO2000007031A1 (en) 2000-02-10
CN1273639A (zh) 2000-11-15
KR100367222B1 (ko) 2003-01-09
US6700603B1 (en) 2004-03-02
EP1027615B1 (de) 2008-09-10
CN1212523C (zh) 2005-07-27
KR20010030575A (ko) 2001-04-16
KR20010023484A (ko) 2001-03-26

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