DE69925768T2 - Stromzellenanordnung - Google Patents

Stromzellenanordnung Download PDF

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Publication number
DE69925768T2
DE69925768T2 DE69925768T DE69925768T DE69925768T2 DE 69925768 T2 DE69925768 T2 DE 69925768T2 DE 69925768 T DE69925768 T DE 69925768T DE 69925768 T DE69925768 T DE 69925768T DE 69925768 T2 DE69925768 T2 DE 69925768T2
Authority
DE
Germany
Prior art keywords
cell
cells
cell array
arrangement
array
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69925768T
Other languages
German (de)
English (en)
Other versions
DE69925768D1 (de
Inventor
William George John Binfield Schofield
Ian Juso Dedic
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Electronics Europe GmbH
Original Assignee
Fujitsu Electronics Europe GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Electronics Europe GmbH filed Critical Fujitsu Electronics Europe GmbH
Publication of DE69925768D1 publication Critical patent/DE69925768D1/de
Application granted granted Critical
Publication of DE69925768T2 publication Critical patent/DE69925768T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
    • H03M1/0634—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale
    • H03M1/0643—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the spatial domain
    • H03M1/0651—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the spatial domain by selecting the quantisation value generators in a non-sequential order, e.g. symmetrical
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
    • H03M1/0634—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale
    • H03M1/0643—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the spatial domain
    • H03M1/0648—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the spatial domain by arranging the quantisation value generators in a non-sequential pattern layout, e.g. symmetrical
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/66—Digital/analogue converters
    • H03M1/74—Simultaneous conversion
    • H03M1/742—Simultaneous conversion using current sources as quantisation value generators
    • H03M1/747—Simultaneous conversion using current sources as quantisation value generators with equal currents which are switched by unary decoded digital signals

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
DE69925768T 1998-01-08 1999-01-06 Stromzellenanordnung Expired - Lifetime DE69925768T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB9800367A GB2333190B (en) 1998-01-08 1998-01-08 Cell array circuitry
GB9800367 1998-01-08

Publications (2)

Publication Number Publication Date
DE69925768D1 DE69925768D1 (de) 2005-07-21
DE69925768T2 true DE69925768T2 (de) 2005-12-01

Family

ID=10825000

Family Applications (2)

Application Number Title Priority Date Filing Date
DE69925768T Expired - Lifetime DE69925768T2 (de) 1998-01-08 1999-01-06 Stromzellenanordnung
DE69933712T Expired - Lifetime DE69933712T2 (de) 1998-01-08 1999-01-06 Stromzellenanordnung

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE69933712T Expired - Lifetime DE69933712T2 (de) 1998-01-08 1999-01-06 Stromzellenanordnung

Country Status (5)

Country Link
US (1) US6236346B1 (enExample)
EP (2) EP1441446B1 (enExample)
JP (2) JP4153115B2 (enExample)
DE (2) DE69925768T2 (enExample)
GB (2) GB2333190B (enExample)

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* Cited by examiner, † Cited by third party
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JP4311511B2 (ja) * 1999-10-25 2009-08-12 日本バーブラウン株式会社 デジタル−アナログ変換の方法および装置
GB2356302B (en) * 1999-11-10 2003-11-05 Fujitsu Ltd Current switching circuitry
EP1100203B1 (en) 1999-11-10 2005-12-28 Fujitsu Limited Noise shaping in segmented mixed-signal circuitry
GB2356301B (en) 1999-11-10 2003-09-10 Fujitsu Ltd Data multiplexing in mixed-signal circuitry
GB2356750B (en) 1999-11-24 2002-12-04 Fujitsu Ltd Reducing jitter in mixed-signal circuitry
JP2001332973A (ja) * 2000-03-16 2001-11-30 Burr-Brown Japan Ltd 共通の重み発生要素を用いたデジタル−アナログ変換の方法および装置
EP1273102B1 (en) * 2000-04-04 2005-11-16 Koninklijke Philips Electronics N.V. A digital to analog converter
USRE41831E1 (en) 2000-05-23 2010-10-19 Marvell International Ltd. Class B driver
US7113121B1 (en) 2000-05-23 2006-09-26 Marvell International Ltd. Communication driver
US6775529B1 (en) 2000-07-31 2004-08-10 Marvell International Ltd. Active resistive summer for a transformer hybrid
US7433665B1 (en) 2000-07-31 2008-10-07 Marvell International Ltd. Apparatus and method for converting single-ended signals to a differential signal, and transceiver employing same
US7095348B1 (en) 2000-05-23 2006-08-22 Marvell International Ltd. Communication driver
US6462688B1 (en) 2000-12-18 2002-10-08 Marvell International, Ltd. Direct drive programmable high speed power digital-to-analog converter
US7312739B1 (en) 2000-05-23 2007-12-25 Marvell International Ltd. Communication driver
US7280060B1 (en) 2000-05-23 2007-10-09 Marvell International Ltd. Communication driver
US7194037B1 (en) 2000-05-23 2007-03-20 Marvell International Ltd. Active replica transformer hybrid
DE10032273C2 (de) * 2000-07-03 2002-07-18 Infineon Technologies Ag Verfahren und Anordnung zur Kompensation von parasitären Stromverlusten
US7606547B1 (en) 2000-07-31 2009-10-20 Marvell International Ltd. Active resistance summer for a transformer hybrid
JP2002100991A (ja) * 2000-09-26 2002-04-05 Nec Kyushu Ltd Ｄ／ａコンバータ
DE10052944C2 (de) * 2000-10-25 2003-04-17 Infineon Technologies Ag Digital/Analog-Wandler
DE60119476T2 (de) 2000-10-26 2006-11-23 Fujitsu Ltd., Kawasaki Segmentierte Schaltungsanordnung
AU2002255056A1 (en) * 2002-05-27 2003-12-12 Nokia Corporation Method for calibrating a digital-to-analog converter and a digital-to-analog converter
DE10331545A1 (de) * 2003-07-11 2005-02-10 Infineon Technologies Ag Digital-Analog-Wandler und Verfahren zur Digital-Analog-Wandlung
US6911930B1 (en) * 2003-12-15 2005-06-28 Infineon Technologies Ag Cell array with mismatch reduction
US7312662B1 (en) 2005-08-09 2007-12-25 Marvell International Ltd. Cascode gain boosting system and method for a transmitter
US7924201B2 (en) * 2006-11-07 2011-04-12 Nec Corporation Current output type digital-analog conversion circuit, and graphic display device
JP5012728B2 (ja) 2008-08-08 2012-08-29 ソニー株式会社 表示パネルモジュール、半導体集積回路、画素アレイ部の駆動方法及び電子機器
JP4618349B2 (ja) * 2008-08-11 2011-01-26 ソニー株式会社 固体撮像素子、撮像方法及び撮像装置
US8446191B2 (en) * 2009-12-07 2013-05-21 Qualcomm Incorporated Phase locked loop with digital compensation for analog integration
US8339165B2 (en) 2009-12-07 2012-12-25 Qualcomm Incorporated Configurable digital-analog phase locked loop
US8766830B2 (en) 2010-04-29 2014-07-01 Agilent Technologies, Inc. Digital waveform synthesizer for NMR phase control
CN102130687B (zh) * 2010-12-29 2014-05-07 上海贝岭股份有限公司 一种数模转换器的电流源开关阵列的序列排布方法
JP5832917B2 (ja) * 2012-02-06 2015-12-16 株式会社メガチップス 半導体集積回路および電流セルの配置方法
CN105448963B (zh) * 2015-12-04 2019-06-04 上海兆芯集成电路有限公司 晶体管以及电流源装置
CN107863966B (zh) * 2017-10-31 2021-02-05 电子科技大学 一种用于智能传感器的逐次逼近模数转换器电容优化方法

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US3995304A (en) * 1972-01-10 1976-11-30 Teledyne, Inc. D/A bit switch
US4658240A (en) * 1984-05-07 1987-04-14 Brooktree Corporation Apparatus for converting data between analog and digital values
JPS61240716A (ja) * 1985-04-17 1986-10-27 Mitsubishi Electric Corp ディジタルアナログコンバ−タ
US4875046A (en) * 1986-07-11 1989-10-17 Brooktree Corporation Centroiding algorithm for networks used in A/D and D/A converters
US4812818A (en) * 1987-02-24 1989-03-14 Brooktree Corporation Digital-to-analog converter
US4859930A (en) * 1988-02-16 1989-08-22 Schouwenaars Hendrikus J Current source arrangement
US5006854A (en) * 1989-02-13 1991-04-09 Silicon Systems, Inc. Method and apparatus for converting A/D nonlinearities to random noise
JP2597712B2 (ja) * 1989-05-22 1997-04-09 株式会社東芝 ディジタル・アナログ変換器
JP2641641B2 (ja) * 1991-05-21 1997-08-20 三菱電機株式会社 Ｄａ変換器
DE4212621C2 (de) * 1992-04-15 1994-06-30 Texas Instruments Deutschland Integrierter Digital/Analog-Umsetzer
US5568145A (en) 1994-10-19 1996-10-22 Analog Devices, Inc. MOS current source layout technique to minimize deviation
US5977897A (en) * 1996-12-31 1999-11-02 Lucent Technologies Inc. Resistor string with equal resistance resistors and converter incorporating the same
US5892471A (en) * 1997-05-14 1999-04-06 Texas Instruments Incorporated Apparatus and method for current steering digital-to-analog converter units
US5949362A (en) * 1997-08-22 1999-09-07 Harris Corporation Digital-to-analog converter including current cell matrix with enhanced linearity and associated methods
DE69721249T2 (de) * 1997-09-19 2004-01-29 Alcatel Sa Verfahren zur Auswahl einer Zellenfolge in einer zweidimensionalen Matrixstruktur eines Digital-Analog-Wandlers und nach diesem Verfahren arbeitender Wandler

Also Published As

Publication number Publication date
JP4153115B2 (ja) 2008-09-17
EP0929158B1 (en) 2005-06-15
DE69925768D1 (de) 2005-07-21
US6236346B1 (en) 2001-05-22
EP0929158A3 (en) 2002-11-06
EP1441446A2 (en) 2004-07-28
EP1441446B1 (en) 2006-10-18
GB2333190A (en) 1999-07-14
GB2368209A (en) 2002-04-24
DE69933712T2 (de) 2007-06-06
EP1441446A3 (en) 2004-08-11
JP4408938B2 (ja) 2010-02-03
GB0202778D0 (en) 2002-03-27
EP0929158A2 (en) 1999-07-14
GB2333190B (en) 2002-03-27
DE69933712D1 (de) 2006-11-30
GB2368209B (en) 2002-06-12
GB9800367D0 (en) 1998-03-04
JPH11243339A (ja) 1999-09-07
JP2008187748A (ja) 2008-08-14

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