DE69800257T2 - Integrierte elektrische programmierbare nichtflüchtige Speicheranordnung mit Konfigurationsregister - Google Patents

Integrierte elektrische programmierbare nichtflüchtige Speicheranordnung mit Konfigurationsregister

Info

Publication number
DE69800257T2
DE69800257T2 DE69800257T DE69800257T DE69800257T2 DE 69800257 T2 DE69800257 T2 DE 69800257T2 DE 69800257 T DE69800257 T DE 69800257T DE 69800257 T DE69800257 T DE 69800257T DE 69800257 T2 DE69800257 T2 DE 69800257T2
Authority
DE
Germany
Prior art keywords
volatile memory
configuration register
memory arrangement
integrated electrical
programmable non
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69800257T
Other languages
English (en)
Other versions
DE69800257D1 (de
Inventor
Laurent Rochard
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SA
Original Assignee
STMicroelectronics SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics SA filed Critical STMicroelectronics SA
Application granted granted Critical
Publication of DE69800257D1 publication Critical patent/DE69800257D1/de
Publication of DE69800257T2 publication Critical patent/DE69800257T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/24—Accessing extra cells, e.g. dummy cells or redundant cells
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
DE69800257T 1997-06-04 1998-06-03 Integrierte elektrische programmierbare nichtflüchtige Speicheranordnung mit Konfigurationsregister Expired - Fee Related DE69800257T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9706893A FR2764426B1 (fr) 1997-06-04 1997-06-04 Circuit integre a memoire non volatile electriquement programmable avec registre de configuration d'options

Publications (2)

Publication Number Publication Date
DE69800257D1 DE69800257D1 (de) 2000-09-21
DE69800257T2 true DE69800257T2 (de) 2000-12-21

Family

ID=9507586

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69800257T Expired - Fee Related DE69800257T2 (de) 1997-06-04 1998-06-03 Integrierte elektrische programmierbare nichtflüchtige Speicheranordnung mit Konfigurationsregister

Country Status (4)

Country Link
US (1) US6104634A (de)
EP (1) EP0883134B1 (de)
DE (1) DE69800257T2 (de)
FR (1) FR2764426B1 (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002015584A (ja) * 2000-06-29 2002-01-18 Sanyo Electric Co Ltd 不揮発性メモリのリードプロテクト回路
US7293703B2 (en) * 2001-03-15 2007-11-13 Walker Digital, Llc Apparatus and methods for enforcing purchase agreements
JP3900979B2 (ja) * 2002-03-14 2007-04-04 セイコーエプソン株式会社 不揮発性レジスタおよび半導体装置
US7778074B2 (en) * 2007-03-23 2010-08-17 Sigmatel, Inc. System and method to control one time programmable memory

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR420388A (fr) * 1910-09-14 1911-01-28 William Filsell Appareil automatique de sureté pour voies ferrées
US4168537A (en) * 1975-05-02 1979-09-18 Tokyo Shibaura Electric Co., Ltd. Nonvolatile memory system enabling nonvolatile data transfer during power on
US4274012A (en) * 1979-01-24 1981-06-16 Xicor, Inc. Substrate coupled floating gate memory cell
US4571709A (en) * 1983-01-31 1986-02-18 Intel Corporation Timing apparatus for non-volatile MOS RAM
JPS60151898A (ja) * 1984-01-18 1985-08-09 Nec Corp 不揮発性ランダムアクセスメモリセル
US5031152A (en) * 1989-09-29 1991-07-09 Sgs-Thomson Microelectronics, Inc. Test circuit for non-volatile storage cell
US5572707A (en) * 1993-05-27 1996-11-05 Intel Corporation Nonvolatile memory with a programmable configuration cell and a configuration logic for temporarily reconfiguring the memory without altering the programmed state of the configuration cell
FR2715782B1 (fr) * 1994-01-31 1996-03-22 Sgs Thomson Microelectronics Bascule bistable non volatile programmable, à état initial prédéfini, notamment pour circuit de redondance de mémoire.
EP0675501B1 (de) * 1994-03-31 2001-06-13 STMicroelectronics S.r.l. Nichtflüchtiges Speicherelement mit doppelt programmierbarer Zelle und entsprechende Leseschaltung für Redundanzschaltung
GB9417268D0 (en) * 1994-08-26 1994-10-19 Inmos Ltd Testing an integrated circuit device
US5602776A (en) * 1994-10-17 1997-02-11 Simtek Corporation Non-Volatile, static random access memory with current limiting

Also Published As

Publication number Publication date
US6104634A (en) 2000-08-15
FR2764426B1 (fr) 1999-07-16
FR2764426A1 (fr) 1998-12-11
EP0883134B1 (de) 2000-08-16
DE69800257D1 (de) 2000-09-21
EP0883134A1 (de) 1998-12-09

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee