DE69615815D1 - Vorrichtung zur magnetischen fehlerdetektion - Google Patents

Vorrichtung zur magnetischen fehlerdetektion

Info

Publication number
DE69615815D1
DE69615815D1 DE69615815T DE69615815T DE69615815D1 DE 69615815 D1 DE69615815 D1 DE 69615815D1 DE 69615815 T DE69615815 T DE 69615815T DE 69615815 T DE69615815 T DE 69615815T DE 69615815 D1 DE69615815 D1 DE 69615815D1
Authority
DE
Germany
Prior art keywords
error detection
magnetic error
magnetic
detection
error
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69615815T
Other languages
English (en)
Other versions
DE69615815T2 (de
Inventor
Yoshihiro Murakami
Akio Nagamune
Hiroharu Kato
Junichi Yotsuji
Kozo Maeda
Kenichi Iwanaga
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Steel Corp
Original Assignee
NKK Corp
Nippon Kokan Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP28387495A external-priority patent/JPH09127217A/ja
Priority claimed from JP30006495A external-priority patent/JP3584452B2/ja
Priority claimed from JP30006595A external-priority patent/JP3584453B2/ja
Application filed by NKK Corp, Nippon Kokan Ltd filed Critical NKK Corp
Publication of DE69615815D1 publication Critical patent/DE69615815D1/de
Application granted granted Critical
Publication of DE69615815T2 publication Critical patent/DE69615815T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9006—Details, e.g. in the structure or functioning of sensors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9013—Arrangements for scanning
    • G01N27/9026—Arrangements for scanning by moving the material
DE69615815T 1995-10-31 1996-10-31 Vorrichtung zur magnetischen fehlerdetektion Expired - Lifetime DE69615815T2 (de)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP28387495A JPH09127217A (ja) 1995-10-31 1995-10-31 探傷用磁気センサ
JP30006495A JP3584452B2 (ja) 1995-11-17 1995-11-17 微小欠陥検出装置
JP30006595A JP3584453B2 (ja) 1995-11-17 1995-11-17 微小欠陥検出装置
PCT/JP1996/003193 WO1997016722A1 (fr) 1995-10-31 1996-10-31 Capteur magnetique, procede et equipement de detection de defauts magnetiques utilisant ce capteur

Publications (2)

Publication Number Publication Date
DE69615815D1 true DE69615815D1 (de) 2001-11-15
DE69615815T2 DE69615815T2 (de) 2002-06-06

Family

ID=27337043

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69615815T Expired - Lifetime DE69615815T2 (de) 1995-10-31 1996-10-31 Vorrichtung zur magnetischen fehlerdetektion

Country Status (7)

Country Link
US (1) US6057684A (de)
EP (1) EP0801304B1 (de)
KR (1) KR100246244B1 (de)
CN (1) CN1146729C (de)
DE (1) DE69615815T2 (de)
TW (1) TW340905B (de)
WO (1) WO1997016722A1 (de)

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JP5387718B2 (ja) * 2011-05-30 2014-01-15 Ｊｆｅスチール株式会社 磁気特性測定方法および磁気特性測定装置
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Also Published As

Publication number Publication date
WO1997016722A1 (fr) 1997-05-09
KR100246244B1 (ko) 2000-04-01
DE69615815T2 (de) 2002-06-06
CN1169776A (zh) 1998-01-07
EP0801304B1 (de) 2001-10-10
EP0801304A4 (de) 1999-01-27
CN1146729C (zh) 2004-04-21
TW340905B (en) 1998-09-21
EP0801304A1 (de) 1997-10-15
US6057684A (en) 2000-05-02

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: JFE ENGINEERING CORP., TOKIO/TOKYO, JP

8327 Change in the person/name/address of the patent owner

Owner name: JFE STEEL CORP., TOKIO/TOKYO, JP