TW340905B - Magnetic sensor, and magnetic flaw detection method and apparatus using the magnetic sensor - Google Patents

Magnetic sensor, and magnetic flaw detection method and apparatus using the magnetic sensor

Info

Publication number
TW340905B
TW340905B TW085113328A TW85113328A TW340905B TW 340905 B TW340905 B TW 340905B TW 085113328 A TW085113328 A TW 085113328A TW 85113328 A TW85113328 A TW 85113328A TW 340905 B TW340905 B TW 340905B
Authority
TW
Taiwan
Prior art keywords
magnetic
magnetic sensor
detection method
flaw detection
detection
Prior art date
Application number
TW085113328A
Other languages
English (en)
Inventor
Akio Nagamune
Hiroharu Kato
Junichi Yotsutsuji
Kozo Maeda
Kenichi Iwanaga
Original Assignee
Nippon Kokan Kk
Murakami Yoshihiro
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP28387495A external-priority patent/JPH09127217A/ja
Priority claimed from JP30006495A external-priority patent/JP3584452B2/ja
Priority claimed from JP30006595A external-priority patent/JP3584453B2/ja
Application filed by Nippon Kokan Kk, Murakami Yoshihiro filed Critical Nippon Kokan Kk
Application granted granted Critical
Publication of TW340905B publication Critical patent/TW340905B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9006—Details, e.g. in the structure or functioning of sensors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9013—Arrangements for scanning
    • G01N27/9026—Arrangements for scanning by moving the material

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
TW085113328A 1995-10-31 1996-11-01 Magnetic sensor, and magnetic flaw detection method and apparatus using the magnetic sensor TW340905B (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP28387495A JPH09127217A (ja) 1995-10-31 1995-10-31 探傷用磁気センサ
JP30006495A JP3584452B2 (ja) 1995-11-17 1995-11-17 微小欠陥検出装置
JP30006595A JP3584453B2 (ja) 1995-11-17 1995-11-17 微小欠陥検出装置

Publications (1)

Publication Number Publication Date
TW340905B true TW340905B (en) 1998-09-21

Family

ID=27337043

Family Applications (1)

Application Number Title Priority Date Filing Date
TW085113328A TW340905B (en) 1995-10-31 1996-11-01 Magnetic sensor, and magnetic flaw detection method and apparatus using the magnetic sensor

Country Status (7)

Country Link
US (1) US6057684A (zh)
EP (1) EP0801304B1 (zh)
KR (1) KR100246244B1 (zh)
CN (1) CN1146729C (zh)
DE (1) DE69615815T2 (zh)
TW (1) TW340905B (zh)
WO (1) WO1997016722A1 (zh)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI463120B (zh) * 2011-11-15 2014-12-01 China Steel Corp 磁性應變計
TWI623745B (zh) * 2016-03-08 2018-05-11 Toshiba Kk Magnetic flaw detection device, magnetic flaw detection device tilt correction method, and program
TWI663395B (zh) * 2018-11-02 2019-06-21 中國鋼鐵股份有限公司 Steel strip crease detection method

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JP3811039B2 (ja) * 2000-10-18 2006-08-16 Ｊｆｅスチール株式会社 磁気探傷装置の漏洩磁気検出センサ
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US7397238B2 (en) 2005-07-28 2008-07-08 Walters William T Methods and apparatus for inspecting materials
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JP5615831B2 (ja) * 2008-11-14 2014-10-29 アプライド マテリアルズ インコーポレイテッドＡｐｐｌｉｅｄ Ｍａｔｅｒｉａｌｓ，Ｉｎｃｏｒｐｏｒａｔｅｄ 縁部分解能強化渦電流センサ
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JP4686612B2 (ja) * 2009-01-22 2011-05-25 三菱電機株式会社 ワイヤロープ探傷装置
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WO2012057224A1 (ja) * 2010-10-26 2012-05-03 高周波熱錬株式会社 焼入深さ測定方法及び焼入深さ測定装置
CN103119432B (zh) * 2010-12-21 2015-12-02 新东工业株式会社 表面特性评价装置及表面特性评价方法
TWI530679B (zh) * 2011-05-10 2016-04-21 新東工業股份有限公司 表面特性檢查裝置及表面特性檢查方法
JP5387718B2 (ja) * 2011-05-30 2014-01-15 Ｊｆｅスチール株式会社 磁気特性測定方法および磁気特性測定装置
KR101309966B1 (ko) * 2011-12-15 2013-09-17 주식회사 포스코 강판의 결함 탐상 장치
KR101335718B1 (ko) 2012-07-12 2013-12-16 주식회사 네드텍 자기 센서용 롤 구조
CN103544764B (zh) * 2013-09-12 2016-11-16 无锡乐尔科技有限公司 一种用于识别磁性介质的传感器
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CN104697430B (zh) * 2015-03-25 2017-05-03 厦门大学 一种利用动态磁导率特性的钢板厚度测量方法及其系统
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CN105565065B (zh) * 2016-02-04 2018-07-03 广东诚泰交通科技发展有限公司 一种通过现场绕制线圈进行索体检测的装置
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Cited By (3)

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Publication number Priority date Publication date Assignee Title
TWI463120B (zh) * 2011-11-15 2014-12-01 China Steel Corp 磁性應變計
TWI623745B (zh) * 2016-03-08 2018-05-11 Toshiba Kk Magnetic flaw detection device, magnetic flaw detection device tilt correction method, and program
TWI663395B (zh) * 2018-11-02 2019-06-21 中國鋼鐵股份有限公司 Steel strip crease detection method

Also Published As

Publication number Publication date
CN1146729C (zh) 2004-04-21
DE69615815T2 (de) 2002-06-06
CN1169776A (zh) 1998-01-07
US6057684A (en) 2000-05-02
EP0801304B1 (en) 2001-10-10
EP0801304A4 (en) 1999-01-27
EP0801304A1 (en) 1997-10-15
WO1997016722A1 (fr) 1997-05-09
DE69615815D1 (de) 2001-11-15
KR100246244B1 (ko) 2000-04-01

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