DE69519339T2 - Verlängerungsmessung mit einem kontaktlosen Laserextensometer - Google Patents

Verlängerungsmessung mit einem kontaktlosen Laserextensometer

Info

Publication number
DE69519339T2
DE69519339T2 DE69519339T DE69519339T DE69519339T2 DE 69519339 T2 DE69519339 T2 DE 69519339T2 DE 69519339 T DE69519339 T DE 69519339T DE 69519339 T DE69519339 T DE 69519339T DE 69519339 T2 DE69519339 T2 DE 69519339T2
Authority
DE
Germany
Prior art keywords
extension measurement
laser extensometer
contactless laser
contactless
extensometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69519339T
Other languages
English (en)
Other versions
DE69519339D1 (de
Inventor
Masayuki Kamegawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Publication of DE69519339D1 publication Critical patent/DE69519339D1/de
Application granted granted Critical
Publication of DE69519339T2 publication Critical patent/DE69519339T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
DE69519339T 1994-07-27 1995-06-26 Verlängerungsmessung mit einem kontaktlosen Laserextensometer Expired - Fee Related DE69519339T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6175339A JP2692599B2 (ja) 1994-07-27 1994-07-27 レーザー非接触伸び計

Publications (2)

Publication Number Publication Date
DE69519339D1 DE69519339D1 (de) 2000-12-14
DE69519339T2 true DE69519339T2 (de) 2001-05-17

Family

ID=15994340

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69519339T Expired - Fee Related DE69519339T2 (de) 1994-07-27 1995-06-26 Verlängerungsmessung mit einem kontaktlosen Laserextensometer

Country Status (5)

Country Link
US (1) US5568259A (de)
EP (1) EP0694756B1 (de)
JP (1) JP2692599B2 (de)
CN (1) CN1050662C (de)
DE (1) DE69519339T2 (de)

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SE506875C2 (sv) * 1996-04-12 1998-02-23 Bergs Engineering Ab Dragprovmaskin
JPH10185526A (ja) * 1996-12-27 1998-07-14 Japan Atom Energy Res Inst 非接触歪み計
US6088170A (en) * 1997-01-28 2000-07-11 Samsung Electronics Co., Ltd. Optical system for shaping light beams and an optical pickup employing the same
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US5956139A (en) * 1997-08-04 1999-09-21 Ohio Aerospace Institute Cross-correlation method and apparatus for suppressing the effects of multiple scattering
JP3230466B2 (ja) * 1997-09-18 2001-11-19 株式会社島津製作所 光学式伸び計用標線マーク
US5920017A (en) * 1997-10-30 1999-07-06 Westinghouse Savannah River Company Thermal input control and enhancement for laser based residual stress measurements using liquid temperature indicating coatings
US5920383A (en) * 1997-12-05 1999-07-06 Ford Global Technologies, Inc. Microscopic digital imaging strain gauge
US6189386B1 (en) * 1997-12-05 2001-02-20 Ford Global Technologies, Inc. Method of using a microscopic digital imaging strain gauge
US6267011B1 (en) 1999-03-31 2001-07-31 Exponent, Inc. Method and apparatus for determining the true stress and true strain behavior of a ductile polymer
DE19940217C5 (de) * 1999-08-25 2006-08-10 Zwick Gmbh & Co Verfahren zur berührungslosen Messung der Veränderung der räumlichen Gestalt einer Meßprobe, insbesondere zur Messung der Längenänderung der einer äußeren Kraft unterliegenden Meßprobe und Vorrichtung zur Durchführung des Verfahrens
JP3373831B2 (ja) * 2000-01-19 2003-02-04 岸本産業株式会社 試験片の伸び測定方法及び装置
US6431007B1 (en) * 2001-03-12 2002-08-13 United States Of America As Represented By The Secretary Of The Air Force Optical method for measuring poisson's ratio
US6460417B1 (en) 2001-08-24 2002-10-08 General Electric Company Formability testing of small-size coatings and materials
US6499355B1 (en) 2001-08-24 2002-12-31 General Electric Company Elongation and cracking testing and optical characterization of small-size coatings and materials
JP2005279659A (ja) * 2004-03-26 2005-10-13 Toshiba Corp レーザマーキング方法、レーザマーキング装置、マーク読取方法
JP4271160B2 (ja) * 2005-03-23 2009-06-03 ファナック株式会社 生産システムにおけるネットワーク開通方法
US20070277619A1 (en) * 2005-05-02 2007-12-06 Grishaber Randy-David B Method for measuring deformations in test specimens and a system for marking the test specimens
US7377181B2 (en) * 2006-03-10 2008-05-27 Northrop Grumman Corporation In-situ large area optical strain measurement using an encoded dot pattern
US8432537B2 (en) * 2008-06-16 2013-04-30 Duhane Lam Photoelastic coating for structural monitoring
DE102010038062B9 (de) 2010-10-08 2013-08-22 Messphysik Materials Testing Gmbh Ortsbestimmung und Bestimmung der Verschiebung von Orten durch berührungslose Abstandsmessung bei einer Materialprüfung
CN102628718B (zh) * 2011-02-01 2016-03-16 阿尔斯通技术有限公司 用于测量轴变形的设备和方法
EP2679778B1 (de) * 2012-06-27 2019-08-21 Ansaldo Energia IP UK Limited Verfahren zum Messen der Geometrie von Verformungen eines Turbinenbauteils
KR20140038086A (ko) * 2012-09-20 2014-03-28 현대자동차주식회사 정밀 고속 변위 측정 방법 및 장치
US9207154B2 (en) * 2013-10-22 2015-12-08 General Electric Company Method and system for creep measurement
CN104048884A (zh) * 2014-04-29 2014-09-17 太原科技大学 一种非接触的铝片塑性变形位移测量装置
US20170143902A1 (en) * 2014-06-27 2017-05-25 Novo Nordisk A/S Autoinjector having needle shield triggering
CN105277440B (zh) * 2015-11-20 2018-06-29 王旭明 一种空调加热管耐压性检测装置
US20180169974A1 (en) * 2016-12-16 2018-06-21 Siemens Energy, Inc. Method and system for making slot cells by pultrusion
US10877192B2 (en) 2017-04-18 2020-12-29 Saudi Arabian Oil Company Method of fabricating smart photonic structures for material monitoring
US10401155B2 (en) 2017-05-12 2019-09-03 Saudi Arabian Oil Company Apparatus and method for smart material analysis
US10746534B2 (en) 2017-07-03 2020-08-18 Saudi Arabian Oil Company Smart coating device for storage tank monitoring and calibration
CN107576570A (zh) * 2017-09-27 2018-01-12 江苏法尔胜特钢制品有限公司 钢丝绳的拉伸试验机
CN108519402B (zh) * 2018-03-28 2020-12-22 北京工业大学 激光法测量超薄玻璃再热线收缩率的装置和方法
CN109085070B (zh) * 2018-08-09 2020-10-09 河海大学 用于土与结构物剪切特性研究的可视化试验装置和方法
JP2020060394A (ja) * 2018-10-05 2020-04-16 株式会社Ihi 非接触計測装置の計測範囲拡大方法
CN109283046B (zh) * 2018-10-17 2020-09-29 西安电子科技大学 一种非接触式材料弹性应力应变自动测量系统
US11808740B2 (en) * 2019-03-01 2023-11-07 University Of South Carolina Systems and methods for measuring strain using removable reusable markers
US11803943B2 (en) * 2019-06-25 2023-10-31 Illinois Tool Works Inc. Brightness and contrast correction for video extensometer systems and methods
US11725932B2 (en) * 2019-06-25 2023-08-15 Illinois Tool Works Inc. Video extensometer system with reflective back screen
JP2021173633A (ja) * 2020-04-24 2021-11-01 株式会社島津製作所 材料試験機、及び材料試験機における表示方法

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JPS5740603A (en) * 1980-08-22 1982-03-06 Rikagaku Kenkyusho Distortion measurement of object
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JPS603537A (ja) * 1983-06-20 1985-01-09 Sumitomo Chem Co Ltd ゴム・プラスチック用引張試験機
JPS6127681A (ja) 1984-07-17 1986-02-07 Res Dev Corp Of Japan 超格子構造のチヤネル部をもつ電界効果トランジスタ
JPS6358205A (ja) * 1986-08-29 1988-03-14 Mitsubishi Heavy Ind Ltd レ−ザスペツクル歪計測装置
US4967093A (en) * 1988-06-22 1990-10-30 Hamamatsu Photonics Kabushiki Kaisha Deformation measuring method and device using cross-correlation function between speckle patterns with reference data renewal
JPH02150110A (ja) * 1988-11-30 1990-06-08 Japan Radio Co Ltd 複合縦振動メカニカル・フィルタ
JPH04127005A (ja) * 1990-09-19 1992-04-28 Toshiba Corp 光学的歪み計
JPH074928A (ja) * 1993-06-15 1995-01-10 Shimadzu Corp 歪測定装置

Also Published As

Publication number Publication date
JP2692599B2 (ja) 1997-12-17
US5568259A (en) 1996-10-22
CN1050662C (zh) 2000-03-22
DE69519339D1 (de) 2000-12-14
CN1115844A (zh) 1996-01-31
EP0694756B1 (de) 2000-11-08
EP0694756A3 (de) 1997-05-07
JPH0843036A (ja) 1996-02-16
EP0694756A2 (de) 1996-01-31

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee